TW200633510A - Programmable reference voltage calibration design - Google Patents

Programmable reference voltage calibration design

Info

Publication number
TW200633510A
TW200633510A TW094141135A TW94141135A TW200633510A TW 200633510 A TW200633510 A TW 200633510A TW 094141135 A TW094141135 A TW 094141135A TW 94141135 A TW94141135 A TW 94141135A TW 200633510 A TW200633510 A TW 200633510A
Authority
TW
Taiwan
Prior art keywords
row
reference value
reference voltage
pixels
applying
Prior art date
Application number
TW094141135A
Other languages
English (en)
Other versions
TWI294740B (en
Inventor
Zhihong Zhang
Jiafu Luo
Original Assignee
Ess Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ess Technology Inc filed Critical Ess Technology Inc
Publication of TW200633510A publication Critical patent/TW200633510A/zh
Application granted granted Critical
Publication of TWI294740B publication Critical patent/TWI294740B/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
TW094141135A 2004-12-01 2005-11-23 Programmable reference voltage calibration design TWI294740B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/000,411 US20060114343A1 (en) 2004-12-01 2004-12-01 Programmable reference voltage calibration design

Publications (2)

Publication Number Publication Date
TW200633510A true TW200633510A (en) 2006-09-16
TWI294740B TWI294740B (en) 2008-03-11

Family

ID=36565587

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094141135A TWI294740B (en) 2004-12-01 2005-11-23 Programmable reference voltage calibration design

Country Status (3)

Country Link
US (1) US20060114343A1 (zh)
TW (1) TWI294740B (zh)
WO (1) WO2006060307A2 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4687155B2 (ja) * 2005-03-09 2011-05-25 ソニー株式会社 固体撮像装置およびその駆動方法
JP4208892B2 (ja) * 2006-05-01 2009-01-14 キヤノン株式会社 固体撮像装置
US7760258B2 (en) * 2007-03-07 2010-07-20 Altasens, Inc. Apparatus and method for stabilizing image sensor black level
US8275213B2 (en) * 2008-05-08 2012-09-25 Altasens, Inc. Apparatus and method for gain correction
JP5282543B2 (ja) * 2008-11-28 2013-09-04 ソニー株式会社 固体撮像装置、固体撮像装置の駆動方法および撮像装置
TWI393428B (zh) * 2009-04-20 2013-04-11 Pixart Imaging Inc 影像校正方法及使用此方法的影像處理系統
JP5403369B2 (ja) * 2010-03-31 2014-01-29 ソニー株式会社 固体撮像素子および駆動方法、並びに電子機器
JP6052622B2 (ja) * 2011-04-22 2016-12-27 パナソニックＩｐマネジメント株式会社 固体撮像装置及びその駆動方法
US9591242B2 (en) * 2013-01-31 2017-03-07 Taiwan Semiconductor Manufacturing Company, Ltd. Black level control for image sensors

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6791610B1 (en) * 1996-10-24 2004-09-14 Lockheed Martin Ir Imaging Systems, Inc. Uncooled focal plane array sensor
US6630674B2 (en) * 2000-03-17 2003-10-07 Infrared Components Corporation Method and apparatus for correction of microbolometer output
US6816196B1 (en) * 2001-06-18 2004-11-09 Ess Technology, Inc. CMOS imager with quantized correlated double sampling

Also Published As

Publication number Publication date
US20060114343A1 (en) 2006-06-01
WO2006060307A2 (en) 2006-06-08
WO2006060307A3 (en) 2007-03-08
TWI294740B (en) 2008-03-11

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