TW200632927A - Memory circuit - Google Patents

Memory circuit

Info

Publication number
TW200632927A
TW200632927A TW095102833A TW95102833A TW200632927A TW 200632927 A TW200632927 A TW 200632927A TW 095102833 A TW095102833 A TW 095102833A TW 95102833 A TW95102833 A TW 95102833A TW 200632927 A TW200632927 A TW 200632927A
Authority
TW
Taiwan
Prior art keywords
data sets
memory circuit
error detection
data
error correction
Prior art date
Application number
TW095102833A
Other languages
English (en)
Inventor
Toshikazu Suzuki
Original Assignee
Matsushita Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Ind Co Ltd filed Critical Matsushita Electric Ind Co Ltd
Publication of TW200632927A publication Critical patent/TW200632927A/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/24—Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1044—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Detection And Correction Of Errors (AREA)
TW095102833A 2005-01-31 2006-01-25 Memory circuit TW200632927A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005023307A JP2006209900A (ja) 2005-01-31 2005-01-31 メモリ回路

Publications (1)

Publication Number Publication Date
TW200632927A true TW200632927A (en) 2006-09-16

Family

ID=36817053

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095102833A TW200632927A (en) 2005-01-31 2006-01-25 Memory circuit

Country Status (5)

Country Link
US (1) US7500171B2 (zh)
JP (1) JP2006209900A (zh)
KR (1) KR20060088036A (zh)
CN (1) CN1825493A (zh)
TW (1) TW200632927A (zh)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7099221B2 (en) * 2004-05-06 2006-08-29 Micron Technology, Inc. Memory controller method and system compensating for memory cell data losses
US7116602B2 (en) * 2004-07-15 2006-10-03 Micron Technology, Inc. Method and system for controlling refresh to avoid memory cell data losses
US7894289B2 (en) * 2006-10-11 2011-02-22 Micron Technology, Inc. Memory system and method using partial ECC to achieve low power refresh and fast access to data
US7900120B2 (en) * 2006-10-18 2011-03-01 Micron Technology, Inc. Memory system and method using ECC with flag bit to identify modified data
JP2008139908A (ja) * 2006-11-29 2008-06-19 Matsushita Electric Ind Co Ltd メモリ制御装置、コンピュータシステム及びデータ再生記録装置
KR100914236B1 (ko) * 2007-06-28 2009-08-26 삼성전자주식회사 테스트 어드레스 생성회로를 가지는 반도체 메모리 장치 및테스트 방법.
JP2009093714A (ja) * 2007-10-04 2009-04-30 Panasonic Corp 半導体記憶装置
US8122320B2 (en) * 2008-01-22 2012-02-21 Qimonda Ag Integrated circuit including an ECC error counter
CN102165533B (zh) * 2008-09-30 2015-01-28 株式会社半导体能源研究所 半导体存储器件
US20130086444A1 (en) * 2010-03-05 2013-04-04 Bao Liu Error detection code enhanced self-timed/asynchronous nanoelectronic circuits
KR101862379B1 (ko) * 2013-04-19 2018-07-05 삼성전자주식회사 Ｅｃｃ 동작과 리던던시 리페어 동작을 공유하는 메모리 장치
KR102140592B1 (ko) * 2013-10-18 2020-08-03 에스케이하이닉스 주식회사 데이터 저장 장치
JP5657079B1 (ja) * 2013-10-24 2015-01-21 ウィンボンド エレクトロニクス コーポレーション 半導体記憶装置
KR102238706B1 (ko) * 2014-11-28 2021-04-09 삼성전자주식회사 반도체 메모리 장치 및 이를 포함하는 메모리 시스템
KR20210092986A (ko) * 2020-01-17 2021-07-27 삼성전자주식회사 스토리지 컨트롤러, 이를 포함하는 스토리지 시스템 및 스토리지 컨트롤러의 동작 방법

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61214298A (ja) * 1985-03-20 1986-09-24 Toshiba Corp 誤り訂正機能を備えた半導体記憶装置
JPH0287398A (ja) * 1988-09-22 1990-03-28 Hitachi Micro Comput Eng Ltd 記憶装置
JP2821278B2 (ja) * 1991-04-15 1998-11-05 日本電気アイシーマイコンシステム株式会社 半導体集積回路
JPH05324492A (ja) * 1992-05-14 1993-12-07 Fujitsu Ltd 半導体記憶装置
US5379413A (en) * 1992-06-19 1995-01-03 Intel Corporation User selectable word/byte input architecture for flash EEPROM memory write and erase operations
US5459850A (en) * 1993-02-19 1995-10-17 Conner Peripherals, Inc. Flash solid state drive that emulates a disk drive and stores variable length and fixed lenth data blocks
JP4877894B2 (ja) 2001-07-04 2012-02-15 ルネサスエレクトロニクス株式会社 半導体装置
JP3984209B2 (ja) * 2003-07-31 2007-10-03 株式会社東芝 半導体記憶装置

Also Published As

Publication number Publication date
US20060184856A1 (en) 2006-08-17
CN1825493A (zh) 2006-08-30
KR20060088036A (ko) 2006-08-03
US7500171B2 (en) 2009-03-03
JP2006209900A (ja) 2006-08-10

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