TW200630622A - Sensor, inspection device, and inspection method - Google Patents

Sensor, inspection device, and inspection method

Info

Publication number
TW200630622A
TW200630622A TW095101333A TW95101333A TW200630622A TW 200630622 A TW200630622 A TW 200630622A TW 095101333 A TW095101333 A TW 095101333A TW 95101333 A TW95101333 A TW 95101333A TW 200630622 A TW200630622 A TW 200630622A
Authority
TW
Taiwan
Prior art keywords
sensor
inspection
sensor circuit
signal substrate
inspecting
Prior art date
Application number
TW095101333A
Other languages
English (en)
Inventor
Masato Ikeda
Shuji Yamaoka
Shogo Ishioka
Original Assignee
Oht Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oht Inc filed Critical Oht Inc
Publication of TW200630622A publication Critical patent/TW200630622A/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
TW095101333A 2005-01-14 2006-01-13 Sensor, inspection device, and inspection method TW200630622A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005008068A JP2006194786A (ja) 2005-01-14 2005-01-14 センサ、検査装置および検査方法

Publications (1)

Publication Number Publication Date
TW200630622A true TW200630622A (en) 2006-09-01

Family

ID=36692331

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095101333A TW200630622A (en) 2005-01-14 2006-01-13 Sensor, inspection device, and inspection method

Country Status (3)

Country Link
JP (1) JP2006194786A (zh)
TW (1) TW200630622A (zh)
WO (1) WO2006077950A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI825300B (zh) * 2019-04-02 2023-12-11 日商村田機械股份有限公司 磁氣式線性感測器

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007248202A (ja) * 2006-03-15 2007-09-27 Micronics Japan Co Ltd 表示用基板の検査に用いるセンサ基板及びこれを用いる表示用基板の検査方法
JP5269482B2 (ja) * 2008-05-28 2013-08-21 株式会社日本マイクロニクス センサ基板及び検査装置
CN113406423B (zh) * 2021-06-30 2022-09-06 武汉普赛斯电子技术有限公司 电子器件老化试验系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07120694B2 (ja) * 1987-07-31 1995-12-20 シャープ株式会社 液晶表示装置の検査装置及びその検査方法
JPH10239348A (ja) * 1997-02-26 1998-09-11 Hitachi Ltd 接続装置、その製造方法および検査装置
JP4743945B2 (ja) * 2000-09-01 2011-08-10 株式会社神戸製鋼所 接続装置の製造方法
JP3448290B2 (ja) * 2002-08-21 2003-09-22 三菱重工業株式会社 液晶パネル検査装置
JP4307872B2 (ja) * 2003-03-18 2009-08-05 オリンパス株式会社 基板検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI825300B (zh) * 2019-04-02 2023-12-11 日商村田機械股份有限公司 磁氣式線性感測器

Also Published As

Publication number Publication date
JP2006194786A (ja) 2006-07-27
WO2006077950A1 (ja) 2006-07-27

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