TW200628795A - Measuring module suitable for all kind of electric characteristics and small measuring point - Google Patents
Measuring module suitable for all kind of electric characteristics and small measuring pointInfo
- Publication number
- TW200628795A TW200628795A TW094102985A TW94102985A TW200628795A TW 200628795 A TW200628795 A TW 200628795A TW 094102985 A TW094102985 A TW 094102985A TW 94102985 A TW94102985 A TW 94102985A TW 200628795 A TW200628795 A TW 200628795A
- Authority
- TW
- Taiwan
- Prior art keywords
- clamp pin
- layer
- pin layer
- guide
- carrier plate
- Prior art date
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94102985A TWI267641B (en) | 2005-02-01 | 2005-02-01 | Measuring module suitable for all kind of electric characteristics and small measuring point |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94102985A TWI267641B (en) | 2005-02-01 | 2005-02-01 | Measuring module suitable for all kind of electric characteristics and small measuring point |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200628795A true TW200628795A (en) | 2006-08-16 |
TWI267641B TWI267641B (en) | 2006-12-01 |
Family
ID=38220398
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW94102985A TWI267641B (en) | 2005-02-01 | 2005-02-01 | Measuring module suitable for all kind of electric characteristics and small measuring point |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI267641B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111487465A (zh) * | 2020-03-25 | 2020-08-04 | 桂林电子科技大学 | 探针间距校准方法、接触电阻率和界面电阻率的测试方法 |
-
2005
- 2005-02-01 TW TW94102985A patent/TWI267641B/zh not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111487465A (zh) * | 2020-03-25 | 2020-08-04 | 桂林电子科技大学 | 探针间距校准方法、接触电阻率和界面电阻率的测试方法 |
CN111487465B (zh) * | 2020-03-25 | 2022-08-26 | 桂林电子科技大学 | 探针间距校准方法、接触电阻率和界面电阻率的测试方法 |
Also Published As
Publication number | Publication date |
---|---|
TWI267641B (en) | 2006-12-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |