TW200628785A - Device and method for measuring thermal conductivity - Google Patents
Device and method for measuring thermal conductivityInfo
- Publication number
- TW200628785A TW200628785A TW094103796A TW94103796A TW200628785A TW 200628785 A TW200628785 A TW 200628785A TW 094103796 A TW094103796 A TW 094103796A TW 94103796 A TW94103796 A TW 94103796A TW 200628785 A TW200628785 A TW 200628785A
- Authority
- TW
- Taiwan
- Prior art keywords
- heat
- thermal conductivity
- conducting slab
- measuring thermal
- carrying
- Prior art date
Links
Abstract
A device for measuring thermal conductivity includes a carrying part, a pressing part and a plurality of buckles. The carrying part includes a first heat-conducting slab. The first heat-conducting slab includes a carrying surface. The pressing part includes a second heat-conducting slab. The second heat-conducting slab includes a pressing surface corresponding to the carrying surface and a thermal couple. The two ends of each buckle can clip the first heat-conducting slab and the second heat-conducting slab.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94103796A TWI310833B (en) | 2005-02-04 | 2005-02-04 | Device and method for measuring thermal conductivity |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94103796A TWI310833B (en) | 2005-02-04 | 2005-02-04 | Device and method for measuring thermal conductivity |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200628785A true TW200628785A (en) | 2006-08-16 |
TWI310833B TWI310833B (en) | 2009-06-11 |
Family
ID=45072317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW94103796A TWI310833B (en) | 2005-02-04 | 2005-02-04 | Device and method for measuring thermal conductivity |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI310833B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI792273B (en) * | 2021-04-20 | 2023-02-11 | 台達電子工業股份有限公司 | Non-contact detection apparatus for thermal conductive pipes and method thereof |
TWI817505B (en) * | 2022-05-17 | 2023-10-01 | 致茂電子股份有限公司 | Method of aging test for thermal interface material and electronic device testing apparatus with thermal interface material aging test function |
US11774385B2 (en) | 2021-04-20 | 2023-10-03 | Delta Electronics, Inc. | Contactless inspection apparatus of heat pipe and method thereof |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI800032B (en) * | 2021-10-13 | 2023-04-21 | 長聖儀器股份有限公司 | Thermal interface material testing device |
-
2005
- 2005-02-04 TW TW94103796A patent/TWI310833B/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI792273B (en) * | 2021-04-20 | 2023-02-11 | 台達電子工業股份有限公司 | Non-contact detection apparatus for thermal conductive pipes and method thereof |
US11774385B2 (en) | 2021-04-20 | 2023-10-03 | Delta Electronics, Inc. | Contactless inspection apparatus of heat pipe and method thereof |
TWI817505B (en) * | 2022-05-17 | 2023-10-01 | 致茂電子股份有限公司 | Method of aging test for thermal interface material and electronic device testing apparatus with thermal interface material aging test function |
Also Published As
Publication number | Publication date |
---|---|
TWI310833B (en) | 2009-06-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |