TW200628785A - Device and method for measuring thermal conductivity - Google Patents
Device and method for measuring thermal conductivityInfo
- Publication number
- TW200628785A TW200628785A TW094103796A TW94103796A TW200628785A TW 200628785 A TW200628785 A TW 200628785A TW 094103796 A TW094103796 A TW 094103796A TW 94103796 A TW94103796 A TW 94103796A TW 200628785 A TW200628785 A TW 200628785A
- Authority
- TW
- Taiwan
- Prior art keywords
- heat
- thermal conductivity
- conducting slab
- measuring thermal
- carrying
- Prior art date
Links
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94103796A TWI310833B (en) | 2005-02-04 | 2005-02-04 | Device and method for measuring thermal conductivity |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94103796A TWI310833B (en) | 2005-02-04 | 2005-02-04 | Device and method for measuring thermal conductivity |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200628785A true TW200628785A (en) | 2006-08-16 |
TWI310833B TWI310833B (en) | 2009-06-11 |
Family
ID=45072317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW94103796A TWI310833B (en) | 2005-02-04 | 2005-02-04 | Device and method for measuring thermal conductivity |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI310833B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI792273B (zh) * | 2021-04-20 | 2023-02-11 | 台達電子工業股份有限公司 | 熱導管的非接觸式檢測設備及其方法 |
TWI817505B (zh) * | 2022-05-17 | 2023-10-01 | 致茂電子股份有限公司 | 熱介面材料之老化測試方法以及具備熱介面材料老化測試功能之電子元件檢測設備 |
US11774385B2 (en) | 2021-04-20 | 2023-10-03 | Delta Electronics, Inc. | Contactless inspection apparatus of heat pipe and method thereof |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI800032B (zh) * | 2021-10-13 | 2023-04-21 | 長聖儀器股份有限公司 | 熱介面材料測試裝置 |
-
2005
- 2005-02-04 TW TW94103796A patent/TWI310833B/zh not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI792273B (zh) * | 2021-04-20 | 2023-02-11 | 台達電子工業股份有限公司 | 熱導管的非接觸式檢測設備及其方法 |
US11774385B2 (en) | 2021-04-20 | 2023-10-03 | Delta Electronics, Inc. | Contactless inspection apparatus of heat pipe and method thereof |
TWI817505B (zh) * | 2022-05-17 | 2023-10-01 | 致茂電子股份有限公司 | 熱介面材料之老化測試方法以及具備熱介面材料老化測試功能之電子元件檢測設備 |
Also Published As
Publication number | Publication date |
---|---|
TWI310833B (en) | 2009-06-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |