TW200628785A - Device and method for measuring thermal conductivity - Google Patents

Device and method for measuring thermal conductivity

Info

Publication number
TW200628785A
TW200628785A TW094103796A TW94103796A TW200628785A TW 200628785 A TW200628785 A TW 200628785A TW 094103796 A TW094103796 A TW 094103796A TW 94103796 A TW94103796 A TW 94103796A TW 200628785 A TW200628785 A TW 200628785A
Authority
TW
Taiwan
Prior art keywords
heat
thermal conductivity
conducting slab
measuring thermal
carrying
Prior art date
Application number
TW094103796A
Other languages
English (en)
Other versions
TWI310833B (en
Inventor
Chun-Yi Chang
Original Assignee
Hon Hai Prec Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Hai Prec Ind Co Ltd filed Critical Hon Hai Prec Ind Co Ltd
Priority to TW94103796A priority Critical patent/TWI310833B/zh
Publication of TW200628785A publication Critical patent/TW200628785A/zh
Application granted granted Critical
Publication of TWI310833B publication Critical patent/TWI310833B/zh

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
TW94103796A 2005-02-04 2005-02-04 Device and method for measuring thermal conductivity TWI310833B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94103796A TWI310833B (en) 2005-02-04 2005-02-04 Device and method for measuring thermal conductivity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94103796A TWI310833B (en) 2005-02-04 2005-02-04 Device and method for measuring thermal conductivity

Publications (2)

Publication Number Publication Date
TW200628785A true TW200628785A (en) 2006-08-16
TWI310833B TWI310833B (en) 2009-06-11

Family

ID=45072317

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94103796A TWI310833B (en) 2005-02-04 2005-02-04 Device and method for measuring thermal conductivity

Country Status (1)

Country Link
TW (1) TWI310833B (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI792273B (zh) * 2021-04-20 2023-02-11 台達電子工業股份有限公司 熱導管的非接觸式檢測設備及其方法
TWI817505B (zh) * 2022-05-17 2023-10-01 致茂電子股份有限公司 熱介面材料之老化測試方法以及具備熱介面材料老化測試功能之電子元件檢測設備
US11774385B2 (en) 2021-04-20 2023-10-03 Delta Electronics, Inc. Contactless inspection apparatus of heat pipe and method thereof

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI800032B (zh) * 2021-10-13 2023-04-21 長聖儀器股份有限公司 熱介面材料測試裝置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI792273B (zh) * 2021-04-20 2023-02-11 台達電子工業股份有限公司 熱導管的非接觸式檢測設備及其方法
US11774385B2 (en) 2021-04-20 2023-10-03 Delta Electronics, Inc. Contactless inspection apparatus of heat pipe and method thereof
TWI817505B (zh) * 2022-05-17 2023-10-01 致茂電子股份有限公司 熱介面材料之老化測試方法以及具備熱介面材料老化測試功能之電子元件檢測設備

Also Published As

Publication number Publication date
TWI310833B (en) 2009-06-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees