TWI792273B - Non-contact detection apparatus for thermal conductive pipes and method thereof - Google Patents
Non-contact detection apparatus for thermal conductive pipes and method thereof Download PDFInfo
- Publication number
- TWI792273B TWI792273B TW110114098A TW110114098A TWI792273B TW I792273 B TWI792273 B TW I792273B TW 110114098 A TW110114098 A TW 110114098A TW 110114098 A TW110114098 A TW 110114098A TW I792273 B TWI792273 B TW I792273B
- Authority
- TW
- Taiwan
- Prior art keywords
- heating
- heat pipe
- module
- score
- temperature
- Prior art date
Links
Images
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Description
本發明係與有關熱導管的檢測,特別有關於熱導管的非接觸式檢測。The invention relates to the detection of heat pipes, in particular to the non-contact detection of heat pipes.
目前對於熱導管的檢測多是採用接觸式的檢測方式。具體而言,接觸式的檢測方式是先將加熱塊加熱至定溫,再將加熱塊接觸熱導管,以藉由熱傳導來對熱導管進行加熱直到熱導管的溫度達到穩態。接著,使用接觸式溫度感測器接觸熱導管上的兩點,以量測此兩點的溫度,並依據此兩點的溫度差來決定熱導管的傳導效果是否良好。At present, most of the detection methods for heat pipes are contact detection methods. Specifically, the contact detection method is to heat the heating block to a constant temperature, and then bring the heating block into contact with the heat pipe to heat the heat pipe through heat conduction until the temperature of the heat pipe reaches a steady state. Then, use a contact temperature sensor to touch two points on the heat pipe to measure the temperature of the two points, and determine whether the heat conduction effect of the heat pipe is good or not according to the temperature difference between the two points.
現有的接觸式的檢測方式至少存在以下問題: 1. 接觸式的檢測方式必須將加熱塊加熱到定溫,並等待熱導管的溫度達到穩態,而大幅增加檢測時間。 2. 加熱塊存在熱量散失問題,且加熱塊與熱導管的接觸力道或面積不同會導致所提供的加熱功率不同,而無法提供穩定的加熱功率至熱導管。 3. 接觸式溫度感測器的溫度通常比加熱後的熱導管的溫度還低,這使得接觸式溫度感測器接觸熱導管時,上述溫差會造成量測誤差;此外,接觸力道大小也會影響熱阻,熱阻不同量測結果也不同。 4. 加熱功率不同,熱導管上的兩點溫差也會不同,這使得檢測結果無法用來判斷傳導效果。 The existing contact detection methods have at least the following problems: 1. The contact detection method must heat the heating block to a constant temperature and wait for the temperature of the heat pipe to reach a steady state, which greatly increases the detection time. 2. There is a problem of heat loss in the heating block, and the different contact force or area between the heating block and the heat pipe will lead to different heating power provided, which cannot provide stable heating power to the heat pipe. 3. The temperature of the contact temperature sensor is usually lower than the temperature of the heated heat pipe, which makes the above-mentioned temperature difference cause measurement errors when the contact temperature sensor contacts the heat pipe; in addition, the contact force will also It affects the thermal resistance, and the measurement results are different for different thermal resistances. 4. With different heating power, the temperature difference between two points on the heat pipe will also be different, which makes the test results unable to be used to judge the conduction effect.
是以,現有接觸式的檢測方式存在上述問題,而亟待更有效的方案被提出。Therefore, the above-mentioned problems exist in the existing contact detection method, and a more effective solution is urgently needed to be proposed.
本發明之主要目的,係在於提供一種熱導管的非接觸式檢測設備及其方法,採用非接觸式加熱與溫度量測,且熱導管的溫度不需達到穩態亦可完成檢測。The main purpose of the present invention is to provide a non-contact detection device and method for heat pipes, which adopts non-contact heating and temperature measurement, and the temperature of the heat pipes does not need to reach a steady state to complete the detection.
本發明提供一種熱導管的非接觸式檢測方法,應用於包括一紅外線加熱模組及一紅外線溫度量測模組的一非接觸式檢測裝置,該方法包括以下步驟:a) 取得一加熱參數及一待測熱導管的一物件資訊;b) 基於該紅外線加熱模組的一紅外線加熱參數與對該待測熱導管的一物件加熱參數計算一停止斜率;c)基於該加熱參數控制該紅外線加熱模組對該待測熱導管進行加熱,並控制該紅外線溫度量測模組量測該待測熱導管的一量測溫度資料;d) 於加熱過程中,監測該量測溫度資料的一溫度斜率;e) 於監測到一停止條件滿足時,基於該溫度斜率執行一評分處理以決定檢測該待測熱導管的一評分,其中該停止條件包括該溫度斜率收斂至該停止斜率;及f) 於該待測熱導管的該評分優於一評分門檻時,判定該待測熱導管為良品,並於該評分不優於該評分門檻時,判定該待測熱導管為劣品。The present invention provides a non-contact detection method for heat pipes, which is applied to a non-contact detection device including an infrared heating module and an infrared temperature measurement module. The method includes the following steps: a) obtaining a heating parameter and An object information of a heat pipe to be tested; b) calculating a stop slope based on an infrared heating parameter of the infrared heating module and an object heating parameter of the heat pipe to be tested; c) controlling the infrared heating based on the heating parameter The module heats the heat pipe to be tested, and controls the infrared temperature measurement module to measure a measured temperature data of the heat pipe to be tested; d) monitors a temperature of the measured temperature data during the heating process slope; e) when a stop condition is detected to be met, perform a scoring process based on the temperature slope to determine a score for detecting the heat pipe under test, wherein the stop condition includes the temperature slope converging to the stop slope; and f) When the score of the heat pipe under test is better than a score threshold, it is determined that the heat pipe under test is a good product, and when the score is not better than the score threshold, it is determined that the heat pipe under test is a bad product.
本發明還提供一種熱導管的非接觸式檢測設備,包括一紅外線加熱模組、一紅外線溫度量測模組及電性連接該紅外線加熱模組及該紅外線溫度量測模組的一控制模組。該紅外線加熱模組被配置來基於一加熱參數對一待測熱導管進行加熱;該紅外線溫度量測模組被配置來量測該待測熱導管的一量測溫度資料;該控制模組被配置來取得一加熱參數及該待測熱導管的一物件資訊,該控制模組被配置來基於該紅外線加熱模組的一紅外線加熱參數與對該待測熱導管的一物件加熱參數計算一停止斜率,該控制模組被配置來於加熱過程中監測該量測溫度資料的一溫度斜率,並於一停止條件滿足時,基於該溫度斜率決定檢測該待測熱導管的一評分,,該控制模組被配置來於該待測熱導管的該評分優於一評分門檻時,判定該待測熱導管為良品,並於該評分不優於該評分門檻時,判定該待測熱導管為劣品其中該停止條件包括該溫度斜率收斂至該停止斜率。The present invention also provides a non-contact detection device for heat pipes, including an infrared heating module, an infrared temperature measurement module, and a control module electrically connected to the infrared heating module and the infrared temperature measurement module . The infrared heating module is configured to heat a heat pipe under test based on a heating parameter; the infrared temperature measurement module is configured to measure a measured temperature data of the heat pipe under test; the control module is configured to configured to obtain a heating parameter and an object information of the heat pipe under test, the control module is configured to calculate a stop based on an infrared heating parameter of the infrared heating module and an object heating parameter of the heat pipe under test slope, the control module is configured to monitor a temperature slope of the measured temperature data during the heating process, and determine a score for detecting the heat pipe under test based on the temperature slope when a stop condition is satisfied, the control The module is configured to determine that the heat pipe under test is a good product when the score of the heat pipe under test is higher than a score threshold, and determine that the heat pipe under test is inferior when the score is not better than the score threshold wherein the stopping condition includes the temperature slope converging to the stopping slope.
本發明可有效對熱導管的傳導性的優劣進行判斷。The invention can effectively judge whether the conductivity of the heat pipe is good or bad.
茲就本發明之一較佳實施例,配合圖式,詳細說明如後。A preferred embodiment of the present invention will be described in detail below with reference to the drawings.
本發明提出一種非接觸式檢測設備與方法,是透過紅外線加熱與紅外線溫度量測來實現非接觸式加熱與溫度量測,藉以提供穩定的加熱功率並免除「接觸式溫度感測器與熱導管的溫差會造成量測誤差」的問題。The present invention proposes a non-contact detection device and method, which realizes non-contact heating and temperature measurement through infrared heating and infrared temperature measurement, thereby providing stable heating power and eliminating the need for "contact temperature sensors and heat pipes." The temperature difference will cause the problem of measurement error.
並且,本發明基於溫度變化的斜率來對熱導管的熱傳導性進行評比,不僅具有高準確度,還不須等待熱導管達到穩態溫度即可完成檢測,而可以大幅減少檢測時間。Moreover, the present invention evaluates the thermal conductivity of the heat pipe based on the slope of the temperature change, which not only has high accuracy, but also does not need to wait for the heat pipe to reach a steady state temperature to complete the detection, and can greatly reduce the detection time.
請參閱圖1,為本發明一實施例的非接觸式檢測設備的架構圖。Please refer to FIG. 1 , which is a structural diagram of a non-contact detection device according to an embodiment of the present invention.
本實施例的非接觸式檢測設備1包括紅外線加熱模組11、紅外線溫度量測模組12與電性連接上述模組的控制模組10。The
紅外線加熱模組11,如鹵素加熱器、短波紅外線加熱器、快中波紅外線加熱器、碳中波紅外線加熱器、(二氧化碳)雷射加熱器或其他類型的紅外線加熱器,受控制來基於加熱參數對物件進行加熱。
值得一提的是,相較於熱風爐是透過熱風對流進行間接加熱而加熱效率較差,本發明的紅外線加熱模組11透過紅外線照射熱導管來進行直接加熱,可提供更佳的加熱效率。It is worth mentioning that, compared to the indirect heating through hot air convection of the hot air stove, which has poor heating efficiency, the
紅外線溫度量測模組12,如單點紅外線測溫儀、多點紅外線測溫儀、雷射測溫儀或其他類型的紅外線測溫器,用來連續量測熱導管的表面溫度。The infrared
控制模組10(如電腦、處理器、微控制器、控制盒等),用來控制非接觸式檢測設備1以實現本發明之非接觸式檢測。The control module 10 (such as computer, processor, microcontroller, control box, etc.) is used to control the
請參閱圖2,為本發明另一實施例的非接觸式檢測設備的架構圖。Please refer to FIG. 2 , which is a structural diagram of a non-contact detection device according to another embodiment of the present invention.
如圖2所示,控制模組10可為電腦系統(如個人電腦、平板電腦、智慧型手機、筆記型電腦等通用電腦系統),並透過通訊裝置101連接紅外線加熱模組11與紅外線溫度量測模組12。As shown in Figure 2, the
控制模組10可包括通訊裝置101、人機介面102、儲存裝置103與電性連接上述裝置的處理器100(如中央處理器)。The
通訊裝置101(如網路卡、Wi-Fi介面、藍芽介面、USB介面、乙太網介面、ZigBee介面、RS232介面等通訊介面或其任意組合)用來以連接外部裝置以進行通訊。The communication device 101 (such as a network card, a Wi-Fi interface, a Bluetooth interface, a USB interface, an Ethernet interface, a ZigBee interface, an RS232 interface, or any combination thereof) is used to connect external devices for communication.
人機介面102(如鍵盤、滑鼠、觸控板等輸入裝置,顯示器、揚聲器、蜂鳴器、指示燈等輸出裝置或觸控螢幕等輸出入裝置的任意組合)用來接受用戶輸入並輸出資訊。The man-machine interface 102 (such as keyboard, mouse, touch panel and other input devices, display, speaker, buzzer, indicator light and other output devices or touch screen and other input and output devices) is used to accept user input and output Information.
儲存裝置103(如磁碟硬碟、固態硬碟、快閃記憶體、RAM、EEPROM等儲存模組)用以儲存資料。The storage device 103 (such as storage modules such as disk hard disk, solid state disk, flash memory, RAM, EEPROM, etc.) is used for storing data.
處理器100用來操控各裝置與模組實現本發明之非接觸式檢測(容後詳述)。The
請參閱圖3,為本發明另一實施例的處理器的架構圖。本發明之處理器100可包括以下全部或部分模組30-38,模組30-38分別用以實現不同功能。Please refer to FIG. 3 , which is an architecture diagram of a processor according to another embodiment of the present invention. The
1. 加熱控制模組30:被配置來控制紅外線加熱模組11。1. Heating control module 30 : configured to control the
2. 量測控制模組31:被配置來控制紅外線溫度量測模組12。2. Measurement control module 31 : configured to control the infrared
3. 停止監測模組32:被配置來監測預設的停止條件是否滿足。3. Stop monitoring module 32: configured to monitor whether a preset stop condition is met.
4. 評分模組33:被配置來對本次檢測進行評分處理。4. Scoring module 33: configured to score this test.
於一實施例中,評分模組33可包括加熱評分模組34、傳導評分模組35與對流評分模組36。加熱評分模組34被配置來對本次檢測的加熱狀態進行評分。傳導評分模組35被配置來對所加熱的傳導物件的傳導性進行評分。對流評分模組36被配置來對本次檢測的環境狀態(如熱對流)進行評分。In one embodiment, the
5. 門檻計算模組37:被配置來計算評分門檻(如加熱評分門檻、傳導評分門檻與對流評分門檻),前述評分門檻是用來作為判斷基準,以判斷加熱狀態、環境狀態或傳導性等屬性的優劣。5. Threshold calculation module 37: configured to calculate scoring thresholds (such as heating scoring thresholds, conduction scoring thresholds, and convection scoring thresholds). The aforementioned scoring thresholds are used as judgment criteria to judge heating status, environmental status, or conductivity, etc. pros and cons of attributes.
6. 初始化模組38:被配置來執行檢測前的初始化設定。6. Initialization module 38: configured to perform initialization settings before testing.
前述模組30-38是相互連接(可為電性連接與資訊連接),並可為硬體模組(如電子電路模組、積體電路模組、SoC等等)、軟體模組(如韌體、作業系統或應用程式)或軟硬體模組混搭,不加以限定。The aforementioned modules 30-38 are interconnected (which can be electrical connection and information connection), and can be hardware modules (such as electronic circuit modules, integrated circuit modules, SoC, etc.), software modules (such as firmware, operating system, or application) or a mix of hardware and software modules, without limitation.
值得一提的是,當前述模組30-38為軟體模組(如應用程式)時儲存裝置103可包括非暫態電腦可讀取記錄媒體,前述非暫態電腦可讀取記錄媒體儲存有電腦程式,電腦程式記錄有電腦可執行之程式碼,當處理器100執行前述程式碼後,可實現前述模組30-38之功能。It is worth mentioning that when the aforementioned modules 30-38 are software modules (such as application programs), the
復請參閱圖2,於一實施例中,控制模組10僅用來控制紅外線加熱模組11的加熱與紅外線溫度量測模組12的溫度量測,但不執行評分處理。Referring again to FIG. 2 , in one embodiment, the
具體而言,模組33-38可建置於運算平台20(如雲端運算服務平台或遠端伺服器),控制模組10可透過通訊裝置101連接運算平台20,來取得初始化相關資料(如後述之評分門檻、停止條件等等),並將所收集的資料(如溫度量測資料或斜率資料)上傳至運算平台20,以由運算平台20計算處理來獲得各項評分。藉此,由於高負載運算是由運算平台20負責執行,控制模組10僅需具備一般處理能力,而可採用較低階的處理器。Specifically, the modules 33-38 can be built on the computing platform 20 (such as a cloud computing service platform or a remote server), and the
於一實施例中,紅外線加熱模組11可包括一或多個加熱元件(圖2是以一個加熱元件110為例),如紅外光源與鏡頭的組合。各加熱元件110可對熱導管上的單點或小區域(加熱面積視紅外線投影面積而定)進行加熱。藉此,當提供多個加熱元件110時,可同時對熱導管22上的多點或大區域進行加熱,而提升加熱功率。In one embodiment, the
於一實施例中,紅外線溫度量測模組12可包括一或多個量測元件(圖2是以兩個量測元件120-121為例)。各量測元件120-121可例如為一組紅外線測溫儀,可對熱導管22上的單點進行溫度量測。藉此,當提供多個量測元件120-121時,可同時對熱導管上的多點進行溫度量測,而取得更多溫度量測資料。In one embodiment, the infrared
於一實施例中,非接觸式檢測設備1還包括定位治具21。定位治具21用來固定待測熱導管22,以使於加熱過程中,紅外線加熱模組11可對熱導管22的相同位置連續加熱,並且,紅外線溫度量測模組12可對熱導管22的相同位置連續測溫。In one embodiment, the
請參閱圖8,為本發明一實施例的非接觸式檢測的設置示意圖。如圖所示,定位治具21可包括第一安裝結構211、第二安裝結構212、設置於第一安裝結構211與第二安裝結構212之間的第三安裝結構210與底座213。Please refer to FIG. 8 , which is a schematic diagram of a non-contact detection setup according to an embodiment of the present invention. As shown in the figure, the
當要對待測熱導管22進行檢測時,是將紅外線加熱模組1的加熱元件110固定裝設於第一安裝結構211,將紅外線溫度量測模組12的量測元件120-121固定裝設於第二安裝結構212,並將待測熱導管22固定夾持在第三安裝結構210。When the
藉此,加熱元件110可對熱導管22的一面的加熱位置A1進行加熱,量測元件120-121可對熱導管22的另一面(不同面)的多個量測位置A2、A3進行測溫。In this way, the
於一實施例中,其中一量測位置A2是位於加熱位置A1的正後方以量測近加熱點的溫度,並且,至少一量測位置A3是遠離加熱位置A1正後方以量測遠離加熱點的溫度。藉由上述配置,本發明可取得量測位置A2、A3的溫差,並以此溫差來對熱導管22的傳導性進行評分(容後詳述)。In one embodiment, one of the measurement positions A2 is located directly behind the heating position A1 to measure the temperature near the heating point, and at least one measurement position A3 is away from the directly behind the heating position A1 to measure the temperature far from the heating point temperature. With the above configuration, the present invention can obtain the temperature difference between the measurement locations A2 and A3, and use this temperature difference to score the conductivity of the heat pipe 22 (details will be described later).
於一實施例中,熱導管22於加熱位置A1與量測位置A2、A3上塗佈有深色輻射漆,前述深色輻射漆可提升輻射熱的吸收而可提升加熱效率,並提升測溫成功率與精確度。In one embodiment, the
於一實施例中,加熱位置A1的深色輻射漆的塗佈面積大於加熱元件110的(雷射)紅外線光照面積D1,以使加熱紅外線可完全照射在深色輻射漆上。並且,各量測位置A2、A3的深色輻射漆的塗佈面積大於量測元件120、120的量測面積D2、D3,以使測溫紅外線可完全照射在深色輻射漆上。In one embodiment, the coating area of the dark radiant paint at the heating position A1 is larger than the (laser) infrared irradiation area D1 of the
於一實施例中,加熱元件110與熱導管22之間的距離L1(第一距離)是基於加熱元件110的鏡頭的焦距所調整,如等於鏡頭焦距,而使得熱紅外線可有效聚焦於加熱位置A1。In one embodiment, the distance L1 (first distance) between the
此外,量測元件120、121與熱導管22之間的距離L2(第二距離)是基於量測元件120、121的鏡頭的焦距所調整,如等於鏡頭焦距,而使得測溫紅外線可有效聚焦於量測位置A2、A3。In addition, the distance L2 (second distance) between the measuring
於一實施例中,量測元件120、121與熱導管22之間的第二距離是相等的,如同為距離L2,藉以排除量測距離不同所造成的測溫誤差。In one embodiment, the second distances between the
請參閱圖9與圖10,圖9為本發明一實施例的熱導管的一面的外觀示意圖,圖10為圖9的熱導管的另一面的外觀示意圖。Please refer to FIGS. 9 and 10 . FIG. 9 is a schematic view of one side of the heat pipe according to an embodiment of the present invention, and FIG. 10 is a schematic view of the other side of the heat pipe of FIG. 9 .
本發明特別適用於超薄均熱板(Vapor Chamber,VC)的熱傳導檢測。具體而言,本發明可以超薄均熱板的一面的加熱位置H(圖10)進行加熱,並對另一面的量測位置T1、T2進行測溫,其中量測位置T1位於加熱位置H的正背面。The invention is particularly suitable for the heat conduction detection of an ultra-thin vapor chamber (VC). Specifically, the present invention can heat the heating position H (Figure 10) on one side of the ultra-thin vapor chamber, and measure the temperature of the measurement positions T1 and T2 on the other side, wherein the measurement position T1 is located at the heating position H front and back.
並且,當對超薄均熱板的加熱位置H進行加熱時,加熱位置H端的壁面下的液體吸熱後變為蒸氣並往壓力低的其他位置(如量測位置T2端),透過接觸量測位置T2端的壁面吸收熱量後再次冷凝回液體,再回流到加熱位置H端,形成熱循環,即實現散熱功能。Moreover, when the heating position H of the ultra-thin vapor chamber is heated, the liquid under the wall surface at the heating position H end absorbs heat and turns into vapor and moves to other positions with low pressure (such as the measurement position T2 end), through contact measurement The wall surface at the T2 end absorbs heat and condenses back to liquid again, and then flows back to the H end at the heating position to form a thermal cycle, that is, to realize the heat dissipation function.
請參閱圖4,為本發明一實施例的非接觸式檢測方法的流程圖。Please refer to FIG. 4 , which is a flowchart of a non-contact detection method according to an embodiment of the present invention.
步驟S10:處理器100取得加熱參數、停止斜率及待測熱導管22的物件資訊。Step S10: The
前述加熱參數是用來控制紅外線加熱模組11輸出的加熱功率。停止斜率用來判斷是否停止檢測。物件資訊可包括但不限於熱導管22的質量、面積、比熱容、目標溫度等。The aforementioned heating parameters are used to control the heating power output by the
前述加熱參數、停止斜率及物件資訊可為預先設定並儲存於儲存裝置103,或用戶手動輸入,不加以限定。The aforementioned heating parameters, stop slope and object information can be preset and stored in the
於一實施例中,處理器100可取得紅外線加熱模組11的紅外線加熱參數(即紅外線加熱模組11的加熱能力)與對熱導管22的物件加熱參數(即熱導管22的溫度變化能力),並依據紅外線加熱參數與物件加熱參數計算前述停止斜率。In one embodiment, the
步驟S11:處理器100透過加熱控制模組30基於加熱參數控制紅外線加熱模組11對熱導管22進行加熱,並透過量測控制模組31控制紅外線溫度量測模組12連續量測加熱中的熱導管22的溫度以獲得量測位置的量測溫度資料。Step S11: The
於一實施例中,處理器100可控制紅外線溫度量測模組12的多個量測元件120-121來同時對熱導管22的多個量測位置A2-A3進行量測來獲得多個量測位置A2-A3的多個量測溫度資料。In one embodiment, the
步驟S12:於加熱過程中,處理器100透過量測控制模組31取得紅外線溫度量測模組12的量測溫度資料,並即時監測量測溫度資料的溫度斜率,如計算連續兩個時間點(如0.5秒、1秒、5秒、10秒等)之間的溫度變化所對應的斜率。Step S12: During the heating process, the
步驟S13:處理器100透過停止監測模組32監測預設的停止條件是否滿足。Step S13: The
於一實施例中,前述停止條件包括溫度斜率收斂至停止斜率(如溫度斜率逐漸降低至停止斜率),即停止監測模組32監測到即時的溫度斜率收斂至停止斜率時判定停止檢測。In one embodiment, the aforementioned stop conditions include that the temperature slope converges to the stop slope (such as the temperature slope gradually decreases to the stop slope), that is, the
於一實施例中,停止條件包括累積加熱時間(即加熱持續時間)達到檢測時間上限(如1分鐘、5分鐘、30分鐘等) ,即停止監測模組32監測到累積加熱時間逾時,便判定停止檢測。In one embodiment, the stop condition includes that the accumulated heating time (ie, the heating duration) reaches the upper detection time limit (such as 1 minute, 5 minutes, 30 minutes, etc.), that is, the
於一實施例中,停止條件包括溫度斜率收斂至停止斜率與累積加熱時間,即溫度斜率收斂至停止斜率或者累積加熱時間逾時,停止監測模組32都會判定停止檢測。In one embodiment, the stop condition includes the temperature slope converges to the stop slope and the accumulated heating time, that is, the temperature slope converges to the stop slope or the accumulated heating time expires, the
若停止條件不滿足,則重複執行步驟S13以持續加熱、測溫、監視溫度斜率,並監視停止條件是否滿足。If the stop condition is not satisfied, repeat step S13 to continue heating, temperature measurement, monitor temperature slope, and monitor whether the stop condition is satisfied.
若停止條件滿足,則執行步驟S14:處理器100透過加熱控制模組30控制紅外線加熱模組11停止加熱,並透過量測控制模組31控制紅外線溫度量測模組12停止測溫。If the stop condition is satisfied, step S14 is executed: the
值得一提的是,步驟S14並非必要步驟。於一實施例中,本發明可於停止條件滿足後持續加熱與測溫,並直接執行步驟S15來以停止條件滿足前的資料對熱導管22進行評分。It is worth mentioning that step S14 is not a necessary step. In one embodiment, the present invention can continue heating and temperature measurement after the stop condition is met, and directly execute step S15 to score the
步驟S15:處理器100透過評分模組33基於的量測溫度資料的溫度斜率執行評分處理以決定檢測熱導管22的評分。前述評分可為數值,數值的大小表示性質(如傳導狀態、對流狀態或加熱狀態)的優劣,如數值越大表示越佳,或者數值越小表示越佳。Step S15 : The
於一實施例中,評分模組33可進一步將檢測熱導管22的評分與預先設定的評分門檻進行比較,並於評分優於評分門檻時,判定熱導管22為良品,於評分不優於評分門檻時,判定熱導管22為劣品。前述評分可以被設定為數值越大表示品質越佳,或者數值越小表示品質越佳,不加以限定。In one embodiment, the scoring
於一實施例中,評分模組33可將量測溫度資料的一或多個溫度斜率(斜率資料)與預設的一或多個良品斜率進行比較,並依據符合程度來評比分數。In one embodiment, the scoring
於一實施例中,當累積加熱時間逾時,表示熱導管22可能因傳導性差,而無法於指定時間內找出明顯的傳導特徵。對此,評分模組33可直接給予此熱導管22 較差的評分(如劣品等級的評分)或直接判定為劣品。In one embodiment, when the accumulated heating time is over, it means that the
藉此,本發明可透過非接觸檢測方式來檢測熱導管的傳導性。Therefore, the present invention can detect the conductivity of the heat pipe through a non-contact detection method.
請一併參閱圖4與圖5,圖5為本發明另一實施例的非接觸式檢測方法的部分流程圖。相較於圖4的實施例,圖5的實施例的步驟S10更包括具體的初始化步驟S20-S23,其中步驟S21-S23的執行順序可依用戶需求任意變更,或同時執行。Please refer to FIG. 4 and FIG. 5 together. FIG. 5 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention. Compared with the embodiment in FIG. 4 , step S10 in the embodiment in FIG. 5 further includes specific initialization steps S20 - S23 , wherein the execution sequence of steps S21 - S23 can be changed arbitrarily according to user requirements, or executed simultaneously.
步驟S20:處理器100透過初始化模組38設定物件資訊與目標溫度。Step S20: The
於一實施例中,用戶可透過人機介面102直接輸入熱導管22的物件資訊(如質量、尺寸、材質、比熱容、單面面積或全面積等),並可輸入目標溫度(如攝氏60、70或80度等)。In one embodiment, the user can directly input the object information of the heat pipe 22 (such as mass, size, material, specific heat capacity, single surface area or total area, etc.) through the man-
於一實施例中,初始化模組38可自儲存裝置103讀取預存的多個物件資訊與多個目標溫度並顯示於人機介面102,以供用戶使用人機介面102進行選擇。In one embodiment, the
步驟S21:處理器100透過初始化模組38計算紅外線加熱模組11的加熱參數。Step S21 : The
於一實施例中,加熱參數包括紅外線加熱模組11的加熱輸入電壓,透過調整加熱輸入電壓可以調整紅外線加熱模組11輸出的加熱功率。In one embodiment, the heating parameters include the heating input voltage of the
具體而言,初始化模組38可基於熱導管22的質量及比熱容取得對此熱導管22的物件加熱參數,再基於物件加熱參數與紅外線加熱模組11的紅外線加熱參數(如紅外線加熱器功率、紅外線發射率與輻射衰減率)計算加熱輸入電壓,以作為加熱參數。Specifically, the
於一實施例中,對熱導管22的物件加熱參數
可基於紅外線加熱器功率
、紅外線發射率
與輻射衰減率σ等因子的全部或部分,來計算獲得,但不以此限定。
In one embodiment, the object heating parameters of the
於一實施例中,對熱導管22的物件加熱參數
還可基於熱導管22的質量
、熱導管22的比熱容
與熱導管22的量測溫度
等因子的全部或部分,來計算獲得,但不以此限定。
In one embodiment, the object heating parameters of the
因此,透過上述關係,本發明可以獲得紅外線發射率 。 Therefore, through the above relationship, the present invention can obtain infrared emissivity .
於一實施例中,初始化模組38可基於下述(式一)、(式二)來計算紅外線加熱器功率。
--------------(式一)
---------------(式二)
其中,
為對熱導物件22的物件加熱參數;
為紅外線加熱器功率;
為紅外線發射率;σ為輻射衰減率;
為熱導物件22的質量;
為熱導物件22的比熱容;
為熱導物件22的量測溫度。
In one embodiment, the
請參閱圖11,為本發明一實施例的加熱功率-電壓的關係曲線圖。於算出紅外線加熱器功率後,初始化模組38可依據紅外線加熱模組11的規格(如圖11),推算出對應的加熱輸入電壓以作為加熱參數。舉例來說,當紅外線加熱器功率為10W時,加熱輸入電壓為7.5V。Please refer to FIG. 11 , which is a graph showing the relationship between heating power and voltage according to an embodiment of the present invention. After calculating the power of the infrared heater, the
復請參閱圖5,步驟S22:處理器100透過初始化模組38計算檢測時間上限。前述檢測時間上限可用來作為停止條件的一部分。Referring again to FIG. 5 , step S22 : the
具體而言,初始化模組38於取得所設定的目標溫度,並基於目標溫度與環境溫度之間的溫差、熱導管22的物件資訊與物件加熱參數及環境對流參數計算檢測時間上限。Specifically, the
於一實施例中,檢測時間上限
可基於熱導管22的質量
、熱導管22的比熱容
、目標溫度
、環境溫度
、對熱導管22的物件加熱參數
、熱導管22的單面面積
、環境對流係數
(一般介於20-40(
)之間)等因子的全部或部分,來計算獲得,但不以此限定。
In one embodiment, the detection time upper limit may be based on the mass of the
於一實施例中,初始化模組38可基於下述(式三)來計算檢測時間上限。
--------------(式三)
其中,
為檢測時間上限;
為熱導物件22的質量;
為熱導物件22的比熱容;
為目標溫度;
為環境溫度;
為對熱導物件22的物件加熱參數;
為熱導物件22的單面面積;
為環境對流係數,一般介於20-40(
)。
In one embodiment, the
步驟S23:處理器100透過初始化模組38計算停止斜率。前述停止斜率用來作為停止條件的一部分。Step S23: The
請參閱圖12,為本發明一實施例的溫度斜率-時間的關係曲線圖。Please refer to FIG. 12 , which is a graph showing the relationship between temperature slope and time according to an embodiment of the present invention.
具體而言,初始化模組38可基於目標溫度與環境溫度之間的溫差、待測熱導管的物件資訊與物件加熱參數及環境對流參數模擬計算熱導管22的時間-溫度模擬變化(如圖12所示),並基於此時間-溫度模擬變化及檢測時間上限設定停止斜率。舉例來說,可選擇斜率4(對應時間50秒)或斜率2.8(對應時間100秒)。Specifically, the
於一實施例中,停止斜率大於1,即於熱導管22的溫度達到穩態前結束檢測。In one embodiment, the stop slope is greater than 1, that is, the detection ends before the temperature of the
藉此,本發明可完成初始化設定。In this way, the present invention can complete the initialization setting.
請一併參閱圖4與圖6,圖6為本發明另一實施例的非接觸式檢測方法的部分流程圖。相較於圖4的實施例,圖6的實施例的步驟S15更包括具體的初始化步驟S30-S33,其中步驟S31-S33的執行順序可依用戶需求任意變更,或同時執行。Please refer to FIG. 4 and FIG. 6 together. FIG. 6 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention. Compared with the embodiment in FIG. 4 , step S15 in the embodiment in FIG. 6 further includes specific initialization steps S30 - S33 , wherein the execution sequence of steps S31 - S33 can be changed arbitrarily according to user requirements, or executed simultaneously.
步驟S30:處理器100透過評分模組33計算所獲取的量測溫度資料的斜率資料,前述斜率資料包括多個斜率,多個斜率分別對應熱導管22於加熱過程中的不同時間區間的溫度變化程度。Step S30: The
步驟S31:處理器100透過加熱評分模組34基於斜率資料的多個斜率計算紅外線加熱模組11於本次檢測中的加熱評分。Step S31 : The
於一實施例中,加熱評分模組34可選取斜率資料的多個斜率的全部或部分(如指定的時間區間),並對所選取的多個斜率計算平均來獲得前述加熱評分。In one embodiment, the
於一實施例中,如圖8,當同時對熱導管22的多個量測為至進行測溫時,加熱評分模組34可選取加熱位置A1正後方(或最接近)的量測位置A2的溫度量測資料來計算前述加熱評分,以使加熱評分更為貼近紅外線加熱模組11的加熱表現。In one embodiment, as shown in FIG. 8 , when measuring the temperature of
步驟S32:處理器100透過對流評分模組36計算檢測環境的對流評分。Step S32: The
步驟S33:處理器100透過傳導評分模組35計算熱導管22的傳導評分。Step S33 : The
於一實施例中,如圖8,當對多個量測位置A2、A3進行量測,而獲得多個量測位置A2、A3的多個溫度量測資料(如開始加熱至停止條件滿足,這段期間的量測位置A2、A3的兩組溫度曲線,或者開始加熱指定期間(如開始加熱後3秒)至停止條件滿足,這段期間的量測位置A2、A3的兩組溫度曲線)時,處理器100透過對流評分模組36與傳導評分模組35先計算多個量測溫度資料之間的溫差資料(如對兩筆量測溫度資料執行相減以獲得量測位置A2、A3之間的溫差資料),再基於斜率資料及溫差資料計算前述對流評分與傳導評分。In one embodiment, as shown in Figure 8, when multiple measurement locations A2, A3 are measured, multiple temperature measurement data of multiple measurement locations A2, A3 are obtained (such as starting to heat until the stop condition is satisfied, Two sets of temperature curves of measurement positions A2 and A3 during this period, or two sets of temperature curves of measurement positions A2 and A3 during this period from the specified period of starting heating (such as 3 seconds after starting heating) until the stop condition is met) At this time, the
於一實施例中,對流評分模組36與傳導評分模組35先將斜率資料除以溫差資料以獲得特性資料(如對流特性資料或傳導特性資料),再對特性資料計算迴歸(如最小平方法)來獲得指數衰減式(如將特性資料擬合至一組曲線來獲得此曲線的指數衰減式),並基於指數衰減式決定前述對流評分及前述傳導評分。In one embodiment, the
更進一步地,如圖8,當有多個量測位置A2、A3時,上述計算是選取加熱位置A1正後方(或最接近)的量測位置A2的溫度量測資料的斜率資料來除以溫差資料以獲得特性資料,但不以此限定,亦可採用較遠的量測位置A2的溫度量測資料。Further, as shown in Figure 8, when there are multiple measurement positions A2 and A3, the above calculation is to select the slope data of the temperature measurement data of the measurement position A2 directly behind (or closest to) the heating position A1 to divide by The temperature difference data is used to obtain the characteristic data, but it is not limited thereto, and the temperature measurement data at a far measurement location A2 can also be used.
值得一提的是,前述指數衰減式是包括底數部分與指數部分,本發明是基於底數部份決定前述傳導評分,並基於指數部分決定對流評分。It is worth mentioning that the aforementioned exponential decay formula includes a base part and an exponent part, and the present invention determines the conduction score based on the base part, and determines the convection score based on the exponent part.
藉此,本發明可決定不同類型的評分。In this way, the present invention can determine different types of scoring.
圖6的實施例中,更包括用以基於評分判定檢測結果的S40-S45,其中步驟S40-S42的執行順序可依用戶需求任意變更,或同時執行。The embodiment in FIG. 6 further includes steps S40-S45 for judging detection results based on scores, wherein the execution order of steps S40-S42 can be changed arbitrarily according to user requirements, or executed simultaneously.
步驟S40:處理器100透過加熱評分模組34判斷加熱評分是否差於預設的加熱評分門檻。Step S40: The
若加熱評分差於加熱評分門檻,則執行步驟S44:處理器100透過人機介面102發出警示以提示用戶加熱狀態不佳。If the heating score is worse than the heating score threshold, step S44 is executed: the
若加熱評分優於加熱評分門檻,表示本次加熱狀態良好(如加熱功率穩定),執行步驟S41:處理器100透過對流評分模組36判斷對流評分是否差於預設的對流評分門檻。If the heating score is better than the heating score threshold, it means that the heating state is good (eg, the heating power is stable), and step S41 is executed: the
若對流評分差於對流評分門檻,則執行步驟S44:處理器100透過人機介面102發出警示以提示用戶環境狀態(尤其是對流狀態)不佳。If the convection score is worse than the convection score threshold, step S44 is executed: the
於執行步驟S44之後,處理器100可接著執行步驟S42來接續判斷傳導評分是否合格,但不以此限定。After executing step S44, the
於另一實施例中,於加熱狀態或環境狀態不佳時,所檢測的傳導評分可能無法正確反應熱導管22的傳導性良劣。對此,處理器100可於執行步驟S4後,直接結束本次檢測,而不評斷熱導管22的良劣。In another embodiment, when the heating state or the environmental state is not good, the detected conductivity score may not correctly reflect whether the
若對流評分優於對流評分門檻,表示本次環境狀態良好,執行步驟S42:處理器100透過評分模組33(傳導評分模組35)判斷熱導管22的評分(傳導評分)是否優於評分門檻(傳導評分門檻),以判斷熱導管22為良品或劣品(瑕疵品)。If the convection score is better than the convection score threshold, it means that the current environmental status is good, and step S42 is executed: the
若傳導評分差於傳導評分門檻,表示傳導性不佳,執行步驟S43:處理器100透過傳導評分模組35判定熱導管22為瑕疵品,並可進一步透過人機介面102顯示瑕疵品通知。If the conductivity score is lower than the conductivity score threshold, it means that the conductivity is not good, and step S43 is executed: the
若傳導評分優於傳導評分門檻,表示傳導性良好,執行步驟S45:處理器100透過傳導評分模組35判定熱導管22為良品,並可進一步透過人機介面102顯示良品通知。If the conductivity score is higher than the conductivity score threshold, it means that the conductivity is good, and step S45 is executed: the
本發明可有效對熱導管22的傳導性進行檢測,並自動產生檢測結果。The present invention can effectively detect the conductivity of the
此外,本發明可同時對加熱狀態與環境狀態進行檢測,以避免因加熱狀態或環境狀態不佳導致檢測結果的誤判。In addition, the present invention can detect the heating state and the environmental state at the same time, so as to avoid misjudgment of the detection result due to the bad heating state or the environmental state.
請一併參閱圖4-7,圖7為本發明另一實施例的非接觸式檢測方法的部分流程圖。相較於圖4的實施例,圖7的實施例進一步提供評分門檻的計算功能,可以透過對同類型的良品進行檢測來獲得對應良品的評分門檻。本實施例的方法更包括以下步驟。Please refer to FIGS. 4-7 together. FIG. 7 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention. Compared with the embodiment in FIG. 4 , the embodiment in FIG. 7 further provides a scoring threshold calculation function, and the scoring threshold of the corresponding good product can be obtained by detecting the same type of good product. The method of this embodiment further includes the following steps.
步驟S50:用戶可於非接觸式檢測設備1上對與待測熱導管22相同類型的良品熱導管執行多次檢測(透過執行步驟S10-S15至少兩次)以獲得多個良品評分(透過執行S30-S33),如多次檢測獲得的多個加熱良品評分、多個對流良品評分與多個傳導良品評分。Step S50: The user can perform multiple inspections on the
步驟S51:處理器100透過門檻計算模組37取得上述多個良品評分,並基於多個良品評分設定評分門檻。Step S51: The
於一實施例中,門檻計算模組37是基於多個加熱良品評分計算加熱評分門檻,基於多個對流良品評分計算對流評分門檻,基於多個傳導良品評分計算傳導評分門檻。In one embodiment, the
於一實施例中,門檻計算模組37是計算多個良品評分的平均值(如加權平均或一般平均),並適度調整平均值。In one embodiment, the
舉例來說,若評分越高表示越佳,則可以平均值降低20%、降低10%,或±10%的範圍來做為評分門檻。For example, if the higher the score is, the better it is, the average value can be lowered by 20%, lowered by 10%, or the range of ±10% can be used as the scoring threshold.
於另一例子中,若評分越低表示越佳,則可以平均值提升20%、提升10%,或±15%的範圍來做為評分門檻。In another example, if the lower the score is, the better it is, the average increase of 20%, the increase of 10%, or the range of ±15% can be used as the score threshold.
藉此,本發明可有效設定各類型的評分門檻,而有利於判斷檢測結果的可用性。Thereby, the present invention can effectively set various types of scoring thresholds, which is beneficial for judging the usability of the detection results.
以上所述僅為本發明之較佳具體實例,非因此即侷限本發明之申請專利範圍,故舉凡運用本發明內容所為之等效變化,均同理皆包含於本發明之範圍內,合予陳明。The above descriptions are only preferred specific examples of the present invention, and are not intended to limit the patent scope of the present invention. Therefore, all equivalent changes made by using the content of the present invention are all included in the scope of the present invention in the same way. Chen Ming.
1:非接觸式檢測設備1: Non-contact detection equipment
10:控制模組10: Control Module
11:紅外線加熱模組11: Infrared heating module
12:紅外線溫度量測模組12: Infrared temperature measurement module
10:控制模組10: Control Module
100:處理器100: Processor
101:通訊裝置101: Communication device
102:人機介面102: Human-machine interface
103:儲存裝置103: storage device
11:紅外線加熱模組11: Infrared heating module
110:加熱元件110: heating element
12:紅外線溫度量測模組12: Infrared temperature measurement module
120:量測元件120: Measuring element
121:量測元件121: Measuring element
20:運算平台20: Computing platform
21:定位治具21: Positioning fixture
210-212:安裝結構210-212: Installation structure
213:底座213: base
22:熱導管22: heat pipe
30:加熱控制模組30: heating control module
31:量測控制模組31: Measurement control module
32:停止監測模組32: stop monitoring module
33:評分模組33: Scoring Module
34:加熱評分模組34: Heat Scoring Module
35:傳導評分模組35: Conduction Scoring Module
36:對流評分模組36: Convection Scoring Mod
37:門檻計算模組37: Threshold calculation module
38:初始化模組38: Initialize the module
A1-A3、T1、T2、H:位置A1-A3, T1, T2, H: Position
L1、L2:距離L1, L2: Distance
D1-D3:面積D1-D3: Area
S10-S15:加熱與檢測步驟S10-S15: heating and detection steps
S20-S23:初始化步驟S20-S23: Initialization steps
S30-S33:評分步驟S30-S33: Scoring Steps
S40-S45:判斷步驟S40-S45: Judgment steps
S50-S51:門檻取得步驟S50-S51: Threshold acquisition steps
圖1為本發明一實施例的非接觸式檢測設備的架構圖。FIG. 1 is a structural diagram of a non-contact detection device according to an embodiment of the present invention.
圖2為本發明另一實施例的非接觸式檢測設備的架構圖。FIG. 2 is a structural diagram of a non-contact detection device according to another embodiment of the present invention.
圖3為本發明另一實施例的處理器的架構圖。FIG. 3 is a structural diagram of a processor according to another embodiment of the present invention.
圖4為本發明一實施例的非接觸式檢測方法的流程圖。FIG. 4 is a flowchart of a non-contact detection method according to an embodiment of the present invention.
圖5為本發明另一實施例的非接觸式檢測方法的部分流程圖。FIG. 5 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention.
圖6為本發明另一實施例的非接觸式檢測方法的部分流程圖。FIG. 6 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention.
圖7為本發明另一實施例的非接觸式檢測方法的部分流程圖。FIG. 7 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention.
圖8為本發明一實施例的非接觸式檢測的設置示意圖。FIG. 8 is a schematic diagram of a non-contact detection setup according to an embodiment of the present invention.
圖9為本發明一實施例的熱導管的一面的外觀示意圖。FIG. 9 is a schematic view of one side of the heat pipe according to an embodiment of the present invention.
圖10為圖9的熱導管的另一面的外觀示意圖。FIG. 10 is a schematic view of the appearance of the other side of the heat pipe in FIG. 9 .
圖11為本發明一實施例的加熱功率-電壓的關係曲線圖。Fig. 11 is a graph showing the relationship between heating power and voltage according to an embodiment of the present invention.
圖12為本發明一實施例的溫度斜率-時間的關係曲線圖。FIG. 12 is a graph showing the relationship between temperature slope and time according to an embodiment of the present invention.
S10-S15:加熱與檢測步驟S10-S15: heating and detection steps
Claims (20)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW110114098A TWI792273B (en) | 2021-04-20 | 2021-04-20 | Non-contact detection apparatus for thermal conductive pipes and method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW110114098A TWI792273B (en) | 2021-04-20 | 2021-04-20 | Non-contact detection apparatus for thermal conductive pipes and method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202242401A TW202242401A (en) | 2022-11-01 |
TWI792273B true TWI792273B (en) | 2023-02-11 |
Family
ID=85793256
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110114098A TWI792273B (en) | 2021-04-20 | 2021-04-20 | Non-contact detection apparatus for thermal conductive pipes and method thereof |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI792273B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI832732B (en) * | 2023-03-22 | 2024-02-11 | 國立臺灣大學 | External positioning error checking system and method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200628785A (en) * | 2005-02-04 | 2006-08-16 | Hon Hai Prec Ind Co Ltd | Device and method for measuring thermal conductivity |
US20100046574A1 (en) * | 2004-11-05 | 2010-02-25 | International Business Machines Corporation | Apparatus for thermal characterization under non-uniform heat load |
TW201925768A (en) * | 2017-12-04 | 2019-07-01 | 行政院原子能委員會核能研究所 | Apparatus of heat pipe quality detection by using infrared thermal imager and method thereof |
-
2021
- 2021-04-20 TW TW110114098A patent/TWI792273B/en active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100046574A1 (en) * | 2004-11-05 | 2010-02-25 | International Business Machines Corporation | Apparatus for thermal characterization under non-uniform heat load |
TW200628785A (en) * | 2005-02-04 | 2006-08-16 | Hon Hai Prec Ind Co Ltd | Device and method for measuring thermal conductivity |
TW201925768A (en) * | 2017-12-04 | 2019-07-01 | 行政院原子能委員會核能研究所 | Apparatus of heat pipe quality detection by using infrared thermal imager and method thereof |
Also Published As
Publication number | Publication date |
---|---|
TW202242401A (en) | 2022-11-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI792273B (en) | Non-contact detection apparatus for thermal conductive pipes and method thereof | |
CN110553758A (en) | temperature detection device and method | |
JP5847102B2 (en) | Heating control device and heating control method for specimen to be heated | |
US11920988B2 (en) | Improving, detecting and indicating stability in an industrial temperature dry block calibrator | |
CN106940205B (en) | Calibration method for humidity sensor in high-humidity environment | |
CN111858206B (en) | Temperature control method, device, equipment and storage medium of memory chip | |
WO2018179779A1 (en) | Skin simulation device, electronic device evaluation method, and electronic device evaluation system | |
US11774385B2 (en) | Contactless inspection apparatus of heat pipe and method thereof | |
JP6283637B2 (en) | Thermal transmissivity estimation system, thermal transmissivity estimation device, and thermal transmissivity estimation program | |
CN210720572U (en) | Rapid measuring device for resistance temperature coefficient of heating element | |
JP6652429B2 (en) | Insulation performance inspection device | |
Peeters et al. | Finite element optimization by pulsed thermography with adaptive response surfaces | |
JP2018115874A (en) | Inspection device, inspection method, inspection program, storage medium and inspection system | |
JP2014032160A (en) | Flaw detection method and flaw detection device | |
CN116242878A (en) | Integrated test system and method for performance of thermal protection material | |
CN112649752B (en) | Derating curve measuring method and system | |
JP6634546B2 (en) | Thermal conductivity measuring device, thermal conductivity measuring method, and vacuum degree evaluation device | |
CN112379166A (en) | Device and method for rapidly measuring resistance temperature coefficient of heating element | |
JP6022623B2 (en) | Thermal conductivity estimation system, method and program, and thermal conductivity test apparatus | |
CN207318394U (en) | A kind of Measured Results of Thermal Conductivity experimental system | |
CN108709653A (en) | A kind of heating furnace board briquette detection method and terminal device | |
WO2022246908A1 (en) | Handheld leakage detector | |
JP6022624B2 (en) | Thermal conductivity estimation system, method and program, and thermal conductivity test apparatus | |
JP7363989B2 (en) | Measuring device, measuring method, and program | |
CN220933408U (en) | Temperature control system and kitchen appliance |