TWI792273B - Non-contact detection apparatus for thermal conductive pipes and method thereof - Google Patents

Non-contact detection apparatus for thermal conductive pipes and method thereof Download PDF

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TWI792273B
TWI792273B TW110114098A TW110114098A TWI792273B TW I792273 B TWI792273 B TW I792273B TW 110114098 A TW110114098 A TW 110114098A TW 110114098 A TW110114098 A TW 110114098A TW I792273 B TWI792273 B TW I792273B
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heating
heat pipe
module
score
temperature
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TW110114098A
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TW202242401A (en
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王智陞
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台達電子工業股份有限公司
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Abstract

A non-contact detection apparatus for heat pipes and a method thereof are provided. The disclosure controls an infrared heating module to heat a thermal conductive pipe to be tested based on a heating parameter, and controls an infrared temperature measurement module to collect the measurement temperature data of the thermal conductive pipe. The disclosure monitors the temperature slopes of the measurement temperature data during heating, calculates a score based on the temperature slopes when the temperature slopes converge on a stop slope, and determines a quality of the thermal conductive pipe based on its score. The disclosure can detect the conductive quality of the thermal conductive objects.

Description

熱導管的非接觸式檢測設備及其方法Non-contact detection device and method for heat pipe

本發明係與有關熱導管的檢測,特別有關於熱導管的非接觸式檢測。The invention relates to the detection of heat pipes, in particular to the non-contact detection of heat pipes.

目前對於熱導管的檢測多是採用接觸式的檢測方式。具體而言,接觸式的檢測方式是先將加熱塊加熱至定溫,再將加熱塊接觸熱導管,以藉由熱傳導來對熱導管進行加熱直到熱導管的溫度達到穩態。接著,使用接觸式溫度感測器接觸熱導管上的兩點,以量測此兩點的溫度,並依據此兩點的溫度差來決定熱導管的傳導效果是否良好。At present, most of the detection methods for heat pipes are contact detection methods. Specifically, the contact detection method is to heat the heating block to a constant temperature, and then bring the heating block into contact with the heat pipe to heat the heat pipe through heat conduction until the temperature of the heat pipe reaches a steady state. Then, use a contact temperature sensor to touch two points on the heat pipe to measure the temperature of the two points, and determine whether the heat conduction effect of the heat pipe is good or not according to the temperature difference between the two points.

現有的接觸式的檢測方式至少存在以下問題: 1. 接觸式的檢測方式必須將加熱塊加熱到定溫,並等待熱導管的溫度達到穩態,而大幅增加檢測時間。 2. 加熱塊存在熱量散失問題,且加熱塊與熱導管的接觸力道或面積不同會導致所提供的加熱功率不同,而無法提供穩定的加熱功率至熱導管。 3. 接觸式溫度感測器的溫度通常比加熱後的熱導管的溫度還低,這使得接觸式溫度感測器接觸熱導管時,上述溫差會造成量測誤差;此外,接觸力道大小也會影響熱阻,熱阻不同量測結果也不同。 4. 加熱功率不同,熱導管上的兩點溫差也會不同,這使得檢測結果無法用來判斷傳導效果。 The existing contact detection methods have at least the following problems: 1. The contact detection method must heat the heating block to a constant temperature and wait for the temperature of the heat pipe to reach a steady state, which greatly increases the detection time. 2. There is a problem of heat loss in the heating block, and the different contact force or area between the heating block and the heat pipe will lead to different heating power provided, which cannot provide stable heating power to the heat pipe. 3. The temperature of the contact temperature sensor is usually lower than the temperature of the heated heat pipe, which makes the above-mentioned temperature difference cause measurement errors when the contact temperature sensor contacts the heat pipe; in addition, the contact force will also It affects the thermal resistance, and the measurement results are different for different thermal resistances. 4. With different heating power, the temperature difference between two points on the heat pipe will also be different, which makes the test results unable to be used to judge the conduction effect.

是以,現有接觸式的檢測方式存在上述問題,而亟待更有效的方案被提出。Therefore, the above-mentioned problems exist in the existing contact detection method, and a more effective solution is urgently needed to be proposed.

本發明之主要目的,係在於提供一種熱導管的非接觸式檢測設備及其方法,採用非接觸式加熱與溫度量測,且熱導管的溫度不需達到穩態亦可完成檢測。The main purpose of the present invention is to provide a non-contact detection device and method for heat pipes, which adopts non-contact heating and temperature measurement, and the temperature of the heat pipes does not need to reach a steady state to complete the detection.

本發明提供一種熱導管的非接觸式檢測方法,應用於包括一紅外線加熱模組及一紅外線溫度量測模組的一非接觸式檢測裝置,該方法包括以下步驟:a) 取得一加熱參數及一待測熱導管的一物件資訊;b) 基於該紅外線加熱模組的一紅外線加熱參數與對該待測熱導管的一物件加熱參數計算一停止斜率;c)基於該加熱參數控制該紅外線加熱模組對該待測熱導管進行加熱,並控制該紅外線溫度量測模組量測該待測熱導管的一量測溫度資料;d) 於加熱過程中,監測該量測溫度資料的一溫度斜率;e) 於監測到一停止條件滿足時,基於該溫度斜率執行一評分處理以決定檢測該待測熱導管的一評分,其中該停止條件包括該溫度斜率收斂至該停止斜率;及f) 於該待測熱導管的該評分優於一評分門檻時,判定該待測熱導管為良品,並於該評分不優於該評分門檻時,判定該待測熱導管為劣品。The present invention provides a non-contact detection method for heat pipes, which is applied to a non-contact detection device including an infrared heating module and an infrared temperature measurement module. The method includes the following steps: a) obtaining a heating parameter and An object information of a heat pipe to be tested; b) calculating a stop slope based on an infrared heating parameter of the infrared heating module and an object heating parameter of the heat pipe to be tested; c) controlling the infrared heating based on the heating parameter The module heats the heat pipe to be tested, and controls the infrared temperature measurement module to measure a measured temperature data of the heat pipe to be tested; d) monitors a temperature of the measured temperature data during the heating process slope; e) when a stop condition is detected to be met, perform a scoring process based on the temperature slope to determine a score for detecting the heat pipe under test, wherein the stop condition includes the temperature slope converging to the stop slope; and f) When the score of the heat pipe under test is better than a score threshold, it is determined that the heat pipe under test is a good product, and when the score is not better than the score threshold, it is determined that the heat pipe under test is a bad product.

本發明還提供一種熱導管的非接觸式檢測設備,包括一紅外線加熱模組、一紅外線溫度量測模組及電性連接該紅外線加熱模組及該紅外線溫度量測模組的一控制模組。該紅外線加熱模組被配置來基於一加熱參數對一待測熱導管進行加熱;該紅外線溫度量測模組被配置來量測該待測熱導管的一量測溫度資料;該控制模組被配置來取得一加熱參數及該待測熱導管的一物件資訊,該控制模組被配置來基於該紅外線加熱模組的一紅外線加熱參數與對該待測熱導管的一物件加熱參數計算一停止斜率,該控制模組被配置來於加熱過程中監測該量測溫度資料的一溫度斜率,並於一停止條件滿足時,基於該溫度斜率決定檢測該待測熱導管的一評分,,該控制模組被配置來於該待測熱導管的該評分優於一評分門檻時,判定該待測熱導管為良品,並於該評分不優於該評分門檻時,判定該待測熱導管為劣品其中該停止條件包括該溫度斜率收斂至該停止斜率。The present invention also provides a non-contact detection device for heat pipes, including an infrared heating module, an infrared temperature measurement module, and a control module electrically connected to the infrared heating module and the infrared temperature measurement module . The infrared heating module is configured to heat a heat pipe under test based on a heating parameter; the infrared temperature measurement module is configured to measure a measured temperature data of the heat pipe under test; the control module is configured to configured to obtain a heating parameter and an object information of the heat pipe under test, the control module is configured to calculate a stop based on an infrared heating parameter of the infrared heating module and an object heating parameter of the heat pipe under test slope, the control module is configured to monitor a temperature slope of the measured temperature data during the heating process, and determine a score for detecting the heat pipe under test based on the temperature slope when a stop condition is satisfied, the control The module is configured to determine that the heat pipe under test is a good product when the score of the heat pipe under test is higher than a score threshold, and determine that the heat pipe under test is inferior when the score is not better than the score threshold wherein the stopping condition includes the temperature slope converging to the stopping slope.

本發明可有效對熱導管的傳導性的優劣進行判斷。The invention can effectively judge whether the conductivity of the heat pipe is good or bad.

茲就本發明之一較佳實施例,配合圖式,詳細說明如後。A preferred embodiment of the present invention will be described in detail below with reference to the drawings.

本發明提出一種非接觸式檢測設備與方法,是透過紅外線加熱與紅外線溫度量測來實現非接觸式加熱與溫度量測,藉以提供穩定的加熱功率並免除「接觸式溫度感測器與熱導管的溫差會造成量測誤差」的問題。The present invention proposes a non-contact detection device and method, which realizes non-contact heating and temperature measurement through infrared heating and infrared temperature measurement, thereby providing stable heating power and eliminating the need for "contact temperature sensors and heat pipes." The temperature difference will cause the problem of measurement error.

並且,本發明基於溫度變化的斜率來對熱導管的熱傳導性進行評比,不僅具有高準確度,還不須等待熱導管達到穩態溫度即可完成檢測,而可以大幅減少檢測時間。Moreover, the present invention evaluates the thermal conductivity of the heat pipe based on the slope of the temperature change, which not only has high accuracy, but also does not need to wait for the heat pipe to reach a steady state temperature to complete the detection, and can greatly reduce the detection time.

請參閱圖1,為本發明一實施例的非接觸式檢測設備的架構圖。Please refer to FIG. 1 , which is a structural diagram of a non-contact detection device according to an embodiment of the present invention.

本實施例的非接觸式檢測設備1包括紅外線加熱模組11、紅外線溫度量測模組12與電性連接上述模組的控制模組10。The non-contact detection device 1 of this embodiment includes an infrared heating module 11 , an infrared temperature measuring module 12 and a control module 10 electrically connected to the above modules.

紅外線加熱模組11,如鹵素加熱器、短波紅外線加熱器、快中波紅外線加熱器、碳中波紅外線加熱器、(二氧化碳)雷射加熱器或其他類型的紅外線加熱器,受控制來基於加熱參數對物件進行加熱。Infrared heating modules 11, such as halogen heaters, short wave infrared heaters, fast medium wave infrared heaters, carbon medium wave infrared heaters, (carbon dioxide) laser heaters or other types of infrared heaters, are controlled to heat based on parameter to heat the object.

值得一提的是,相較於熱風爐是透過熱風對流進行間接加熱而加熱效率較差,本發明的紅外線加熱模組11透過紅外線照射熱導管來進行直接加熱,可提供更佳的加熱效率。It is worth mentioning that, compared to the indirect heating through hot air convection of the hot air stove, which has poor heating efficiency, the infrared heating module 11 of the present invention performs direct heating through infrared radiation on the heat pipe, which can provide better heating efficiency.

紅外線溫度量測模組12,如單點紅外線測溫儀、多點紅外線測溫儀、雷射測溫儀或其他類型的紅外線測溫器,用來連續量測熱導管的表面溫度。The infrared temperature measurement module 12, such as a single-point infrared thermometer, a multi-point infrared thermometer, a laser thermometer or other types of infrared thermometers, is used to continuously measure the surface temperature of the heat pipe.

控制模組10(如電腦、處理器、微控制器、控制盒等),用來控制非接觸式檢測設備1以實現本發明之非接觸式檢測。The control module 10 (such as computer, processor, microcontroller, control box, etc.) is used to control the non-contact detection device 1 to realize the non-contact detection of the present invention.

請參閱圖2,為本發明另一實施例的非接觸式檢測設備的架構圖。Please refer to FIG. 2 , which is a structural diagram of a non-contact detection device according to another embodiment of the present invention.

如圖2所示,控制模組10可為電腦系統(如個人電腦、平板電腦、智慧型手機、筆記型電腦等通用電腦系統),並透過通訊裝置101連接紅外線加熱模組11與紅外線溫度量測模組12。As shown in Figure 2, the control module 10 can be a computer system (such as a general-purpose computer system such as a personal computer, a tablet computer, a smart phone, a notebook computer), and connects the infrared heating module 11 and the infrared temperature sensor through a communication device 101. Measuring module 12.

控制模組10可包括通訊裝置101、人機介面102、儲存裝置103與電性連接上述裝置的處理器100(如中央處理器)。The control module 10 may include a communication device 101 , a man-machine interface 102 , a storage device 103 and a processor 100 (such as a central processing unit) electrically connected to the above devices.

通訊裝置101(如網路卡、Wi-Fi介面、藍芽介面、USB介面、乙太網介面、ZigBee介面、RS232介面等通訊介面或其任意組合)用來以連接外部裝置以進行通訊。The communication device 101 (such as a network card, a Wi-Fi interface, a Bluetooth interface, a USB interface, an Ethernet interface, a ZigBee interface, an RS232 interface, or any combination thereof) is used to connect external devices for communication.

人機介面102(如鍵盤、滑鼠、觸控板等輸入裝置,顯示器、揚聲器、蜂鳴器、指示燈等輸出裝置或觸控螢幕等輸出入裝置的任意組合)用來接受用戶輸入並輸出資訊。The man-machine interface 102 (such as keyboard, mouse, touch panel and other input devices, display, speaker, buzzer, indicator light and other output devices or touch screen and other input and output devices) is used to accept user input and output Information.

儲存裝置103(如磁碟硬碟、固態硬碟、快閃記憶體、RAM、EEPROM等儲存模組)用以儲存資料。The storage device 103 (such as storage modules such as disk hard disk, solid state disk, flash memory, RAM, EEPROM, etc.) is used for storing data.

處理器100用來操控各裝置與模組實現本發明之非接觸式檢測(容後詳述)。The processor 100 is used to control various devices and modules to implement the non-contact detection of the present invention (details will be described later).

請參閱圖3,為本發明另一實施例的處理器的架構圖。本發明之處理器100可包括以下全部或部分模組30-38,模組30-38分別用以實現不同功能。Please refer to FIG. 3 , which is an architecture diagram of a processor according to another embodiment of the present invention. The processor 100 of the present invention may include all or part of the following modules 30-38, and the modules 30-38 are respectively used to realize different functions.

1. 加熱控制模組30:被配置來控制紅外線加熱模組11。1. Heating control module 30 : configured to control the infrared heating module 11 .

2. 量測控制模組31:被配置來控制紅外線溫度量測模組12。2. Measurement control module 31 : configured to control the infrared temperature measurement module 12 .

3. 停止監測模組32:被配置來監測預設的停止條件是否滿足。3. Stop monitoring module 32: configured to monitor whether a preset stop condition is met.

4. 評分模組33:被配置來對本次檢測進行評分處理。4. Scoring module 33: configured to score this test.

於一實施例中,評分模組33可包括加熱評分模組34、傳導評分模組35與對流評分模組36。加熱評分模組34被配置來對本次檢測的加熱狀態進行評分。傳導評分模組35被配置來對所加熱的傳導物件的傳導性進行評分。對流評分模組36被配置來對本次檢測的環境狀態(如熱對流)進行評分。In one embodiment, the scoring module 33 may include a heating scoring module 34 , a conduction scoring module 35 and a convection scoring module 36 . The heating scoring module 34 is configured to score the heating state detected this time. Conductivity scoring module 35 is configured to score the conductivity of heated conductive objects. The convection scoring module 36 is configured to score the detected environmental state (such as thermal convection).

5. 門檻計算模組37:被配置來計算評分門檻(如加熱評分門檻、傳導評分門檻與對流評分門檻),前述評分門檻是用來作為判斷基準,以判斷加熱狀態、環境狀態或傳導性等屬性的優劣。5. Threshold calculation module 37: configured to calculate scoring thresholds (such as heating scoring thresholds, conduction scoring thresholds, and convection scoring thresholds). The aforementioned scoring thresholds are used as judgment criteria to judge heating status, environmental status, or conductivity, etc. pros and cons of attributes.

6. 初始化模組38:被配置來執行檢測前的初始化設定。6. Initialization module 38: configured to perform initialization settings before testing.

前述模組30-38是相互連接(可為電性連接與資訊連接),並可為硬體模組(如電子電路模組、積體電路模組、SoC等等)、軟體模組(如韌體、作業系統或應用程式)或軟硬體模組混搭,不加以限定。The aforementioned modules 30-38 are interconnected (which can be electrical connection and information connection), and can be hardware modules (such as electronic circuit modules, integrated circuit modules, SoC, etc.), software modules (such as firmware, operating system, or application) or a mix of hardware and software modules, without limitation.

值得一提的是,當前述模組30-38為軟體模組(如應用程式)時儲存裝置103可包括非暫態電腦可讀取記錄媒體,前述非暫態電腦可讀取記錄媒體儲存有電腦程式,電腦程式記錄有電腦可執行之程式碼,當處理器100執行前述程式碼後,可實現前述模組30-38之功能。It is worth mentioning that when the aforementioned modules 30-38 are software modules (such as application programs), the storage device 103 may include a non-transitory computer-readable recording medium, and the aforementioned non-transitory computer-readable recording medium stores Computer program, the computer program records computer-executable program codes, and when the processor 100 executes the aforementioned program codes, the functions of the aforementioned modules 30-38 can be realized.

復請參閱圖2,於一實施例中,控制模組10僅用來控制紅外線加熱模組11的加熱與紅外線溫度量測模組12的溫度量測,但不執行評分處理。Referring again to FIG. 2 , in one embodiment, the control module 10 is only used to control the heating of the infrared heating module 11 and the temperature measurement of the infrared temperature measurement module 12 , but does not perform scoring processing.

具體而言,模組33-38可建置於運算平台20(如雲端運算服務平台或遠端伺服器),控制模組10可透過通訊裝置101連接運算平台20,來取得初始化相關資料(如後述之評分門檻、停止條件等等),並將所收集的資料(如溫度量測資料或斜率資料)上傳至運算平台20,以由運算平台20計算處理來獲得各項評分。藉此,由於高負載運算是由運算平台20負責執行,控制模組10僅需具備一般處理能力,而可採用較低階的處理器。Specifically, the modules 33-38 can be built on the computing platform 20 (such as a cloud computing service platform or a remote server), and the control module 10 can connect to the computing platform 20 through the communication device 101 to obtain initialization related data (such as Scoring thresholds, stop conditions, etc. described later), and upload the collected data (such as temperature measurement data or slope data) to the computing platform 20, so as to be calculated and processed by the computing platform 20 to obtain various scores. In this way, since the high-load calculation is performed by the computing platform 20, the control module 10 only needs to have general processing capability, and a lower-level processor can be used.

於一實施例中,紅外線加熱模組11可包括一或多個加熱元件(圖2是以一個加熱元件110為例),如紅外光源與鏡頭的組合。各加熱元件110可對熱導管上的單點或小區域(加熱面積視紅外線投影面積而定)進行加熱。藉此,當提供多個加熱元件110時,可同時對熱導管22上的多點或大區域進行加熱,而提升加熱功率。In one embodiment, the infrared heating module 11 may include one or more heating elements (a heating element 110 is taken as an example in FIG. 2 ), such as a combination of an infrared light source and a lens. Each heating element 110 can heat a single point or a small area on the heat pipe (the heating area depends on the infrared projected area). In this way, when multiple heating elements 110 are provided, multiple points or large areas on the heat pipe 22 can be heated at the same time, thereby increasing the heating power.

於一實施例中,紅外線溫度量測模組12可包括一或多個量測元件(圖2是以兩個量測元件120-121為例)。各量測元件120-121可例如為一組紅外線測溫儀,可對熱導管22上的單點進行溫度量測。藉此,當提供多個量測元件120-121時,可同時對熱導管上的多點進行溫度量測,而取得更多溫度量測資料。In one embodiment, the infrared temperature measurement module 12 may include one or more measuring elements (FIG. 2 is an example of two measuring elements 120-121). Each measuring element 120 - 121 can be, for example, a set of infrared thermometers, which can measure the temperature of a single point on the heat pipe 22 . Thereby, when multiple measuring elements 120 - 121 are provided, temperature measurement can be performed on multiple points on the heat pipe at the same time, so as to obtain more temperature measurement data.

於一實施例中,非接觸式檢測設備1還包括定位治具21。定位治具21用來固定待測熱導管22,以使於加熱過程中,紅外線加熱模組11可對熱導管22的相同位置連續加熱,並且,紅外線溫度量測模組12可對熱導管22的相同位置連續測溫。In one embodiment, the non-contact detection device 1 further includes a positioning jig 21 . The positioning fixture 21 is used to fix the heat pipe 22 to be measured, so that during the heating process, the infrared heating module 11 can continuously heat the same position of the heat pipe 22, and the infrared temperature measurement module 12 can heat the heat pipe 22. Continuous temperature measurement at the same position.

請參閱圖8,為本發明一實施例的非接觸式檢測的設置示意圖。如圖所示,定位治具21可包括第一安裝結構211、第二安裝結構212、設置於第一安裝結構211與第二安裝結構212之間的第三安裝結構210與底座213。Please refer to FIG. 8 , which is a schematic diagram of a non-contact detection setup according to an embodiment of the present invention. As shown in the figure, the positioning jig 21 may include a first installation structure 211 , a second installation structure 212 , a third installation structure 210 and a base 213 disposed between the first installation structure 211 and the second installation structure 212 .

當要對待測熱導管22進行檢測時,是將紅外線加熱模組1的加熱元件110固定裝設於第一安裝結構211,將紅外線溫度量測模組12的量測元件120-121固定裝設於第二安裝結構212,並將待測熱導管22固定夾持在第三安裝結構210。When the heat pipe 22 to be tested is to be tested, the heating element 110 of the infrared heating module 1 is fixedly installed on the first installation structure 211, and the measuring elements 120-121 of the infrared temperature measurement module 12 are fixedly installed. on the second installation structure 212 , and fix and clamp the heat pipe 22 to be tested on the third installation structure 210 .

藉此,加熱元件110可對熱導管22的一面的加熱位置A1進行加熱,量測元件120-121可對熱導管22的另一面(不同面)的多個量測位置A2、A3進行測溫。In this way, the heating element 110 can heat the heating position A1 on one side of the heat pipe 22, and the measuring elements 120-121 can measure the temperature of multiple measurement positions A2, A3 on the other side (different side) of the heat pipe 22. .

於一實施例中,其中一量測位置A2是位於加熱位置A1的正後方以量測近加熱點的溫度,並且,至少一量測位置A3是遠離加熱位置A1正後方以量測遠離加熱點的溫度。藉由上述配置,本發明可取得量測位置A2、A3的溫差,並以此溫差來對熱導管22的傳導性進行評分(容後詳述)。In one embodiment, one of the measurement positions A2 is located directly behind the heating position A1 to measure the temperature near the heating point, and at least one measurement position A3 is away from the directly behind the heating position A1 to measure the temperature far from the heating point temperature. With the above configuration, the present invention can obtain the temperature difference between the measurement locations A2 and A3, and use this temperature difference to score the conductivity of the heat pipe 22 (details will be described later).

於一實施例中,熱導管22於加熱位置A1與量測位置A2、A3上塗佈有深色輻射漆,前述深色輻射漆可提升輻射熱的吸收而可提升加熱效率,並提升測溫成功率與精確度。In one embodiment, the heat pipe 22 is coated with dark radiant paint on the heating position A1 and the measurement positions A2 and A3. The dark radiant paint can improve the absorption of radiant heat, thereby improving the heating efficiency and improving the success of temperature measurement. rate and accuracy.

於一實施例中,加熱位置A1的深色輻射漆的塗佈面積大於加熱元件110的(雷射)紅外線光照面積D1,以使加熱紅外線可完全照射在深色輻射漆上。並且,各量測位置A2、A3的深色輻射漆的塗佈面積大於量測元件120、120的量測面積D2、D3,以使測溫紅外線可完全照射在深色輻射漆上。In one embodiment, the coating area of the dark radiant paint at the heating position A1 is larger than the (laser) infrared irradiation area D1 of the heating element 110 , so that the heating infrared rays can completely irradiate the dark radiant paint. Moreover, the coating area of the dark radiant paint at each measuring position A2, A3 is larger than the measuring areas D2, D3 of the measuring elements 120, 120, so that the temperature measuring infrared rays can be completely irradiated on the dark radiant paint.

於一實施例中,加熱元件110與熱導管22之間的距離L1(第一距離)是基於加熱元件110的鏡頭的焦距所調整,如等於鏡頭焦距,而使得熱紅外線可有效聚焦於加熱位置A1。In one embodiment, the distance L1 (first distance) between the heating element 110 and the heat pipe 22 is adjusted based on the focal length of the lens of the heating element 110, such as equal to the focal length of the lens, so that the thermal infrared rays can be effectively focused on the heating position A1.

此外,量測元件120、121與熱導管22之間的距離L2(第二距離)是基於量測元件120、121的鏡頭的焦距所調整,如等於鏡頭焦距,而使得測溫紅外線可有效聚焦於量測位置A2、A3。In addition, the distance L2 (second distance) between the measuring elements 120, 121 and the heat pipe 22 is adjusted based on the focal length of the lens of the measuring element 120, 121, such as equal to the focal length of the lens, so that the temperature measuring infrared rays can be effectively focused At measurement positions A2 and A3.

於一實施例中,量測元件120、121與熱導管22之間的第二距離是相等的,如同為距離L2,藉以排除量測距離不同所造成的測溫誤差。In one embodiment, the second distances between the measurement elements 120 , 121 and the heat pipe 22 are equal, such as the distance L2 , so as to eliminate temperature measurement errors caused by different measurement distances.

請參閱圖9與圖10,圖9為本發明一實施例的熱導管的一面的外觀示意圖,圖10為圖9的熱導管的另一面的外觀示意圖。Please refer to FIGS. 9 and 10 . FIG. 9 is a schematic view of one side of the heat pipe according to an embodiment of the present invention, and FIG. 10 is a schematic view of the other side of the heat pipe of FIG. 9 .

本發明特別適用於超薄均熱板(Vapor Chamber,VC)的熱傳導檢測。具體而言,本發明可以超薄均熱板的一面的加熱位置H(圖10)進行加熱,並對另一面的量測位置T1、T2進行測溫,其中量測位置T1位於加熱位置H的正背面。The invention is particularly suitable for the heat conduction detection of an ultra-thin vapor chamber (VC). Specifically, the present invention can heat the heating position H (Figure 10) on one side of the ultra-thin vapor chamber, and measure the temperature of the measurement positions T1 and T2 on the other side, wherein the measurement position T1 is located at the heating position H front and back.

並且,當對超薄均熱板的加熱位置H進行加熱時,加熱位置H端的壁面下的液體吸熱後變為蒸氣並往壓力低的其他位置(如量測位置T2端),透過接觸量測位置T2端的壁面吸收熱量後再次冷凝回液體,再回流到加熱位置H端,形成熱循環,即實現散熱功能。Moreover, when the heating position H of the ultra-thin vapor chamber is heated, the liquid under the wall surface at the heating position H end absorbs heat and turns into vapor and moves to other positions with low pressure (such as the measurement position T2 end), through contact measurement The wall surface at the T2 end absorbs heat and condenses back to liquid again, and then flows back to the H end at the heating position to form a thermal cycle, that is, to realize the heat dissipation function.

請參閱圖4,為本發明一實施例的非接觸式檢測方法的流程圖。Please refer to FIG. 4 , which is a flowchart of a non-contact detection method according to an embodiment of the present invention.

步驟S10:處理器100取得加熱參數、停止斜率及待測熱導管22的物件資訊。Step S10: The processor 100 obtains the heating parameter, the stop slope, and the object information of the heat pipe 22 to be tested.

前述加熱參數是用來控制紅外線加熱模組11輸出的加熱功率。停止斜率用來判斷是否停止檢測。物件資訊可包括但不限於熱導管22的質量、面積、比熱容、目標溫度等。The aforementioned heating parameters are used to control the heating power output by the infrared heating module 11 . The stop slope is used to judge whether to stop the detection. The object information may include but not limited to the mass, area, specific heat capacity, target temperature, etc. of the heat pipe 22 .

前述加熱參數、停止斜率及物件資訊可為預先設定並儲存於儲存裝置103,或用戶手動輸入,不加以限定。The aforementioned heating parameters, stop slope and object information can be preset and stored in the storage device 103, or manually input by the user, without limitation.

於一實施例中,處理器100可取得紅外線加熱模組11的紅外線加熱參數(即紅外線加熱模組11的加熱能力)與對熱導管22的物件加熱參數(即熱導管22的溫度變化能力),並依據紅外線加熱參數與物件加熱參數計算前述停止斜率。In one embodiment, the processor 100 can obtain the infrared heating parameters of the infrared heating module 11 (ie, the heating capability of the infrared heating module 11 ) and the object heating parameters of the heat pipe 22 (ie, the temperature change capability of the heat pipe 22 ). , and calculate the stop slope according to the infrared heating parameter and the object heating parameter.

步驟S11:處理器100透過加熱控制模組30基於加熱參數控制紅外線加熱模組11對熱導管22進行加熱,並透過量測控制模組31控制紅外線溫度量測模組12連續量測加熱中的熱導管22的溫度以獲得量測位置的量測溫度資料。Step S11: The processor 100 controls the infrared heating module 11 to heat the heat pipe 22 through the heating control module 30 based on the heating parameters, and controls the infrared temperature measurement module 12 to continuously measure the heating temperature through the measurement control module 31 The temperature of the heat pipe 22 is used to obtain the measurement temperature data of the measurement position.

於一實施例中,處理器100可控制紅外線溫度量測模組12的多個量測元件120-121來同時對熱導管22的多個量測位置A2-A3進行量測來獲得多個量測位置A2-A3的多個量測溫度資料。In one embodiment, the processor 100 can control the multiple measurement elements 120-121 of the infrared temperature measurement module 12 to simultaneously measure multiple measurement positions A2-A3 of the heat pipe 22 to obtain multiple measurements. A plurality of measured temperature data of measuring positions A2-A3.

步驟S12:於加熱過程中,處理器100透過量測控制模組31取得紅外線溫度量測模組12的量測溫度資料,並即時監測量測溫度資料的溫度斜率,如計算連續兩個時間點(如0.5秒、1秒、5秒、10秒等)之間的溫度變化所對應的斜率。Step S12: During the heating process, the processor 100 obtains the measured temperature data of the infrared temperature measurement module 12 through the measurement control module 31, and monitors the temperature slope of the measured temperature data in real time, such as calculating two consecutive time points (such as the slope corresponding to the temperature change between 0.5 seconds, 1 second, 5 seconds, 10 seconds, etc.).

步驟S13:處理器100透過停止監測模組32監測預設的停止條件是否滿足。Step S13: The processor 100 monitors whether a preset stop condition is met through the stop monitoring module 32.

於一實施例中,前述停止條件包括溫度斜率收斂至停止斜率(如溫度斜率逐漸降低至停止斜率),即停止監測模組32監測到即時的溫度斜率收斂至停止斜率時判定停止檢測。In one embodiment, the aforementioned stop conditions include that the temperature slope converges to the stop slope (such as the temperature slope gradually decreases to the stop slope), that is, the stop monitoring module 32 determines to stop the detection when it detects that the instantaneous temperature slope converges to the stop slope.

於一實施例中,停止條件包括累積加熱時間(即加熱持續時間)達到檢測時間上限(如1分鐘、5分鐘、30分鐘等) ,即停止監測模組32監測到累積加熱時間逾時,便判定停止檢測。In one embodiment, the stop condition includes that the accumulated heating time (ie, the heating duration) reaches the upper detection time limit (such as 1 minute, 5 minutes, 30 minutes, etc.), that is, the stop monitoring module 32 detects that the accumulated heating time is overtime, and then Determined to stop detection.

於一實施例中,停止條件包括溫度斜率收斂至停止斜率與累積加熱時間,即溫度斜率收斂至停止斜率或者累積加熱時間逾時,停止監測模組32都會判定停止檢測。In one embodiment, the stop condition includes the temperature slope converges to the stop slope and the accumulated heating time, that is, the temperature slope converges to the stop slope or the accumulated heating time expires, the stop monitoring module 32 will determine to stop the detection.

若停止條件不滿足,則重複執行步驟S13以持續加熱、測溫、監視溫度斜率,並監視停止條件是否滿足。If the stop condition is not satisfied, repeat step S13 to continue heating, temperature measurement, monitor temperature slope, and monitor whether the stop condition is satisfied.

若停止條件滿足,則執行步驟S14:處理器100透過加熱控制模組30控制紅外線加熱模組11停止加熱,並透過量測控制模組31控制紅外線溫度量測模組12停止測溫。If the stop condition is satisfied, step S14 is executed: the processor 100 controls the infrared heating module 11 to stop heating through the heating control module 30 , and controls the infrared temperature measurement module 12 to stop temperature measurement through the measurement control module 31 .

值得一提的是,步驟S14並非必要步驟。於一實施例中,本發明可於停止條件滿足後持續加熱與測溫,並直接執行步驟S15來以停止條件滿足前的資料對熱導管22進行評分。It is worth mentioning that step S14 is not a necessary step. In one embodiment, the present invention can continue heating and temperature measurement after the stop condition is met, and directly execute step S15 to score the heat pipe 22 with the data before the stop condition is met.

步驟S15:處理器100透過評分模組33基於的量測溫度資料的溫度斜率執行評分處理以決定檢測熱導管22的評分。前述評分可為數值,數值的大小表示性質(如傳導狀態、對流狀態或加熱狀態)的優劣,如數值越大表示越佳,或者數值越小表示越佳。Step S15 : The processor 100 performs scoring processing based on the temperature slope of the measured temperature data by the scoring module 33 to determine a score for detecting the heat pipe 22 . The aforementioned score can be a numerical value, and the magnitude of the numerical value indicates the quality of the property (such as the state of conduction, convection or heating), such as a larger value means better, or a smaller value means better.

於一實施例中,評分模組33可進一步將檢測熱導管22的評分與預先設定的評分門檻進行比較,並於評分優於評分門檻時,判定熱導管22為良品,於評分不優於評分門檻時,判定熱導管22為劣品。前述評分可以被設定為數值越大表示品質越佳,或者數值越小表示品質越佳,不加以限定。In one embodiment, the scoring module 33 can further compare the score of the detected heat pipe 22 with a preset scoring threshold, and determine that the heat pipe 22 is a good product when the score is higher than the scoring threshold, and determine that the heat pipe 22 is a good product if the score is not better than the scoring threshold. When the threshold is exceeded, it is determined that the heat pipe 22 is inferior. The aforementioned score can be set such that a larger numerical value indicates better quality, or a smaller numerical value indicates better quality, which is not limited.

於一實施例中,評分模組33可將量測溫度資料的一或多個溫度斜率(斜率資料)與預設的一或多個良品斜率進行比較,並依據符合程度來評比分數。In one embodiment, the scoring module 33 can compare one or more temperature slopes (slope data) of the measured temperature data with one or more preset good product slopes, and score according to the matching degree.

於一實施例中,當累積加熱時間逾時,表示熱導管22可能因傳導性差,而無法於指定時間內找出明顯的傳導特徵。對此,評分模組33可直接給予此熱導管22 較差的評分(如劣品等級的評分)或直接判定為劣品。In one embodiment, when the accumulated heating time is over, it means that the heat pipe 22 may not be able to find obvious conduction characteristics within the specified time due to poor conduction. For this, the scoring module 33 can directly give the heat pipe 22 a poor score (such as a score of inferior grade) or directly determine that it is inferior.

藉此,本發明可透過非接觸檢測方式來檢測熱導管的傳導性。Therefore, the present invention can detect the conductivity of the heat pipe through a non-contact detection method.

請一併參閱圖4與圖5,圖5為本發明另一實施例的非接觸式檢測方法的部分流程圖。相較於圖4的實施例,圖5的實施例的步驟S10更包括具體的初始化步驟S20-S23,其中步驟S21-S23的執行順序可依用戶需求任意變更,或同時執行。Please refer to FIG. 4 and FIG. 5 together. FIG. 5 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention. Compared with the embodiment in FIG. 4 , step S10 in the embodiment in FIG. 5 further includes specific initialization steps S20 - S23 , wherein the execution sequence of steps S21 - S23 can be changed arbitrarily according to user requirements, or executed simultaneously.

步驟S20:處理器100透過初始化模組38設定物件資訊與目標溫度。Step S20: The processor 100 sets the object information and the target temperature through the initialization module 38 .

於一實施例中,用戶可透過人機介面102直接輸入熱導管22的物件資訊(如質量、尺寸、材質、比熱容、單面面積或全面積等),並可輸入目標溫度(如攝氏60、70或80度等)。In one embodiment, the user can directly input the object information of the heat pipe 22 (such as mass, size, material, specific heat capacity, single surface area or total area, etc.) through the man-machine interface 102, and can input the target temperature (such as 60 degrees Celsius, 70 or 80 degrees, etc.).

於一實施例中,初始化模組38可自儲存裝置103讀取預存的多個物件資訊與多個目標溫度並顯示於人機介面102,以供用戶使用人機介面102進行選擇。In one embodiment, the initialization module 38 can read a plurality of pre-stored object information and a plurality of target temperatures from the storage device 103 and display them on the man-machine interface 102 for the user to use the man-machine interface 102 to select.

步驟S21:處理器100透過初始化模組38計算紅外線加熱模組11的加熱參數。Step S21 : The processor 100 calculates the heating parameters of the infrared heating module 11 through the initialization module 38 .

於一實施例中,加熱參數包括紅外線加熱模組11的加熱輸入電壓,透過調整加熱輸入電壓可以調整紅外線加熱模組11輸出的加熱功率。In one embodiment, the heating parameters include the heating input voltage of the infrared heating module 11 , and the heating power output by the infrared heating module 11 can be adjusted by adjusting the heating input voltage.

具體而言,初始化模組38可基於熱導管22的質量及比熱容取得對此熱導管22的物件加熱參數,再基於物件加熱參數與紅外線加熱模組11的紅外線加熱參數(如紅外線加熱器功率、紅外線發射率與輻射衰減率)計算加熱輸入電壓,以作為加熱參數。Specifically, the initialization module 38 can obtain the object heating parameters of the heat pipe 22 based on the mass and specific heat capacity of the heat pipe 22, and then based on the object heating parameters and the infrared heating parameters of the infrared heating module 11 (such as infrared heater power, Infrared emissivity and radiation attenuation rate) to calculate the heating input voltage as a heating parameter.

於一實施例中,對熱導管22的物件加熱參數

Figure 02_image001
可基於紅外線加熱器功率
Figure 02_image003
、紅外線發射率
Figure 02_image005
與輻射衰減率σ等因子的全部或部分,來計算獲得,但不以此限定。 In one embodiment, the object heating parameters of the heat pipe 22
Figure 02_image001
Can be based on infrared heater power
Figure 02_image003
, infrared emissivity
Figure 02_image005
All or part of factors such as the radiation attenuation rate σ can be obtained by calculation, but not limited thereto.

於一實施例中,對熱導管22的物件加熱參數

Figure 02_image001
還可基於熱導管22的質量
Figure 02_image007
、熱導管22的比熱容
Figure 02_image009
與熱導管22的量測溫度
Figure 02_image011
等因子的全部或部分,來計算獲得,但不以此限定。 In one embodiment, the object heating parameters of the heat pipe 22
Figure 02_image001
can also be based on the mass of the heat pipe 22
Figure 02_image007
, the specific heat capacity of the heat pipe 22
Figure 02_image009
The measured temperature with the heat pipe 22
Figure 02_image011
All or part of the equal factors are obtained by calculation, but not limited thereto.

因此,透過上述關係,本發明可以獲得紅外線發射率

Figure 02_image005
。 Therefore, through the above relationship, the present invention can obtain infrared emissivity
Figure 02_image005
.

於一實施例中,初始化模組38可基於下述(式一)、(式二)來計算紅外線加熱器功率。

Figure 02_image013
--------------(式一)
Figure 02_image015
---------------(式二) 其中,
Figure 02_image001
為對熱導物件22的物件加熱參數;
Figure 02_image003
為紅外線加熱器功率;
Figure 02_image005
為紅外線發射率;σ為輻射衰減率;
Figure 02_image007
為熱導物件22的質量;
Figure 02_image009
為熱導物件22的比熱容;
Figure 02_image011
為熱導物件22的量測溫度。 In one embodiment, the initialization module 38 can calculate the power of the infrared heater based on the following (Formula 1) and (Formula 2).
Figure 02_image013
--------------(Formula 1)
Figure 02_image015
---------------(Formula 2) Among them,
Figure 02_image001
is the object heating parameter for the thermally conductive object 22;
Figure 02_image003
is the infrared heater power;
Figure 02_image005
is the infrared emissivity; σ is the radiation attenuation rate;
Figure 02_image007
Be the quality of heat conduction object 22;
Figure 02_image009
is the specific heat capacity of the thermally conductive object 22;
Figure 02_image011
is the measured temperature of the thermally conductive object 22 .

請參閱圖11,為本發明一實施例的加熱功率-電壓的關係曲線圖。於算出紅外線加熱器功率後,初始化模組38可依據紅外線加熱模組11的規格(如圖11),推算出對應的加熱輸入電壓以作為加熱參數。舉例來說,當紅外線加熱器功率為10W時,加熱輸入電壓為7.5V。Please refer to FIG. 11 , which is a graph showing the relationship between heating power and voltage according to an embodiment of the present invention. After calculating the power of the infrared heater, the initialization module 38 can calculate the corresponding heating input voltage as the heating parameter according to the specification of the infrared heating module 11 (as shown in FIG. 11 ). For example, when the power of the infrared heater is 10W, the heating input voltage is 7.5V.

復請參閱圖5,步驟S22:處理器100透過初始化模組38計算檢測時間上限。前述檢測時間上限可用來作為停止條件的一部分。Referring again to FIG. 5 , step S22 : the processor 100 calculates the detection time limit through the initialization module 38 . The aforementioned upper detection time limit can be used as part of the stop condition.

具體而言,初始化模組38於取得所設定的目標溫度,並基於目標溫度與環境溫度之間的溫差、熱導管22的物件資訊與物件加熱參數及環境對流參數計算檢測時間上限。Specifically, the initialization module 38 obtains the set target temperature, and calculates the detection time limit based on the temperature difference between the target temperature and the ambient temperature, the object information of the heat pipe 22 , the object heating parameters, and the ambient convection parameters.

於一實施例中,檢測時間上限

Figure 02_image017
可基於熱導管22的質量
Figure 02_image007
、熱導管22的比熱容
Figure 02_image009
、目標溫度
Figure 02_image019
、環境溫度
Figure 02_image021
、對熱導管22的物件加熱參數
Figure 02_image001
、熱導管22的單面面積
Figure 02_image023
、環境對流係數
Figure 02_image025
(一般介於20-40(
Figure 02_image027
)之間)等因子的全部或部分,來計算獲得,但不以此限定。 In one embodiment, the detection time upper limit
Figure 02_image017
may be based on the mass of the heat pipe 22
Figure 02_image007
, the specific heat capacity of the heat pipe 22
Figure 02_image009
, target temperature
Figure 02_image019
, ambient temperature
Figure 02_image021
, the object heating parameters of the heat pipe 22
Figure 02_image001
, the single-sided area of the heat pipe 22
Figure 02_image023
, Environmental convection coefficient
Figure 02_image025
(Generally between 20-40(
Figure 02_image027
) between) and other factors are obtained by calculation, but not limited thereto.

於一實施例中,初始化模組38可基於下述(式三)來計算檢測時間上限。

Figure 02_image029
--------------(式三) 其中,
Figure 02_image017
為檢測時間上限;
Figure 02_image007
為熱導物件22的質量;
Figure 02_image009
為熱導物件22的比熱容;
Figure 02_image019
為目標溫度;
Figure 02_image021
為環境溫度;
Figure 02_image001
為對熱導物件22的物件加熱參數;
Figure 02_image023
為熱導物件22的單面面積;
Figure 02_image025
為環境對流係數,一般介於20-40(
Figure 02_image027
)。 In one embodiment, the initialization module 38 can calculate the detection time limit based on the following (Formula 3).
Figure 02_image029
--------------(Formula 3) Among them,
Figure 02_image017
is the upper limit of detection time;
Figure 02_image007
is the mass of the thermally conductive object 22;
Figure 02_image009
is the specific heat capacity of the thermally conductive object 22;
Figure 02_image019
is the target temperature;
Figure 02_image021
is the ambient temperature;
Figure 02_image001
is the object heating parameter for the thermally conductive object 22;
Figure 02_image023
is the single-sided area of the thermally conductive object 22;
Figure 02_image025
is the environmental convection coefficient, generally between 20-40 (
Figure 02_image027
).

步驟S23:處理器100透過初始化模組38計算停止斜率。前述停止斜率用來作為停止條件的一部分。Step S23: The processor 100 calculates the stop slope through the initialization module 38 . The aforementioned stop slope is used as part of the stop condition.

請參閱圖12,為本發明一實施例的溫度斜率-時間的關係曲線圖。Please refer to FIG. 12 , which is a graph showing the relationship between temperature slope and time according to an embodiment of the present invention.

具體而言,初始化模組38可基於目標溫度與環境溫度之間的溫差、待測熱導管的物件資訊與物件加熱參數及環境對流參數模擬計算熱導管22的時間-溫度模擬變化(如圖12所示),並基於此時間-溫度模擬變化及檢測時間上限設定停止斜率。舉例來說,可選擇斜率4(對應時間50秒)或斜率2.8(對應時間100秒)。Specifically, the initialization module 38 can simulate and calculate the time-temperature simulation change of the heat pipe 22 based on the temperature difference between the target temperature and the ambient temperature, the object information of the heat pipe to be tested, the object heating parameters, and the environmental convection parameters (as shown in FIG. 12 . shown), and set the stop slope based on this time-temperature analog change and the upper detection time limit. For example, a slope of 4 (corresponding to a time of 50 seconds) or a slope of 2.8 (corresponding to a time of 100 seconds) may be selected.

於一實施例中,停止斜率大於1,即於熱導管22的溫度達到穩態前結束檢測。In one embodiment, the stop slope is greater than 1, that is, the detection ends before the temperature of the heat pipe 22 reaches a steady state.

藉此,本發明可完成初始化設定。In this way, the present invention can complete the initialization setting.

請一併參閱圖4與圖6,圖6為本發明另一實施例的非接觸式檢測方法的部分流程圖。相較於圖4的實施例,圖6的實施例的步驟S15更包括具體的初始化步驟S30-S33,其中步驟S31-S33的執行順序可依用戶需求任意變更,或同時執行。Please refer to FIG. 4 and FIG. 6 together. FIG. 6 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention. Compared with the embodiment in FIG. 4 , step S15 in the embodiment in FIG. 6 further includes specific initialization steps S30 - S33 , wherein the execution sequence of steps S31 - S33 can be changed arbitrarily according to user requirements, or executed simultaneously.

步驟S30:處理器100透過評分模組33計算所獲取的量測溫度資料的斜率資料,前述斜率資料包括多個斜率,多個斜率分別對應熱導管22於加熱過程中的不同時間區間的溫度變化程度。Step S30: The processor 100 calculates the slope data of the obtained measured temperature data through the scoring module 33. The aforementioned slope data includes multiple slopes, and the multiple slopes correspond to the temperature changes of the heat pipe 22 in different time intervals during the heating process. degree.

步驟S31:處理器100透過加熱評分模組34基於斜率資料的多個斜率計算紅外線加熱模組11於本次檢測中的加熱評分。Step S31 : The processor 100 calculates the heating score of the infrared heating module 11 in this test through the heating scoring module 34 based on multiple slopes of the slope data.

於一實施例中,加熱評分模組34可選取斜率資料的多個斜率的全部或部分(如指定的時間區間),並對所選取的多個斜率計算平均來獲得前述加熱評分。In one embodiment, the heating score module 34 can select all or part of multiple slopes of the slope data (such as a specified time interval), and calculate the average of the selected multiple slopes to obtain the aforementioned heating score.

於一實施例中,如圖8,當同時對熱導管22的多個量測為至進行測溫時,加熱評分模組34可選取加熱位置A1正後方(或最接近)的量測位置A2的溫度量測資料來計算前述加熱評分,以使加熱評分更為貼近紅外線加熱模組11的加熱表現。In one embodiment, as shown in FIG. 8 , when measuring the temperature of multiple heat pipes 22 at the same time, the heating scoring module 34 can select the measurement position A2 directly behind (or closest to) the heating position A1 The aforementioned heating score is calculated based on the temperature measurement data, so that the heating score is closer to the heating performance of the infrared heating module 11 .

步驟S32:處理器100透過對流評分模組36計算檢測環境的對流評分。Step S32: The processor 100 calculates the convection score of the detection environment through the convection score module 36 .

步驟S33:處理器100透過傳導評分模組35計算熱導管22的傳導評分。Step S33 : The processor 100 calculates the conduction score of the heat pipe 22 through the conduction score module 35 .

於一實施例中,如圖8,當對多個量測位置A2、A3進行量測,而獲得多個量測位置A2、A3的多個溫度量測資料(如開始加熱至停止條件滿足,這段期間的量測位置A2、A3的兩組溫度曲線,或者開始加熱指定期間(如開始加熱後3秒)至停止條件滿足,這段期間的量測位置A2、A3的兩組溫度曲線)時,處理器100透過對流評分模組36與傳導評分模組35先計算多個量測溫度資料之間的溫差資料(如對兩筆量測溫度資料執行相減以獲得量測位置A2、A3之間的溫差資料),再基於斜率資料及溫差資料計算前述對流評分與傳導評分。In one embodiment, as shown in Figure 8, when multiple measurement locations A2, A3 are measured, multiple temperature measurement data of multiple measurement locations A2, A3 are obtained (such as starting to heat until the stop condition is satisfied, Two sets of temperature curves of measurement positions A2 and A3 during this period, or two sets of temperature curves of measurement positions A2 and A3 during this period from the specified period of starting heating (such as 3 seconds after starting heating) until the stop condition is met) At this time, the processor 100 first calculates the temperature difference data between multiple measured temperature data through the convection scoring module 36 and the conduction scoring module 35 (for example, subtracting two measured temperature data to obtain the measurement positions A2, A3 The temperature difference data between them), and then calculate the aforementioned convection score and conduction score based on the slope data and the temperature difference data.

於一實施例中,對流評分模組36與傳導評分模組35先將斜率資料除以溫差資料以獲得特性資料(如對流特性資料或傳導特性資料),再對特性資料計算迴歸(如最小平方法)來獲得指數衰減式(如將特性資料擬合至一組曲線來獲得此曲線的指數衰減式),並基於指數衰減式決定前述對流評分及前述傳導評分。In one embodiment, the convection scoring module 36 and the conduction scoring module 35 firstly divide the slope data by the temperature difference data to obtain characteristic data (such as convection characteristic data or conduction characteristic data), and then calculate the regression on the characteristic data (such as the minimum average method) to obtain an exponential decay formula (such as fitting the characteristic data to a set of curves to obtain the exponential decay formula of the curve), and determine the aforementioned convection score and the aforementioned conduction score based on the exponential decay formula.

更進一步地,如圖8,當有多個量測位置A2、A3時,上述計算是選取加熱位置A1正後方(或最接近)的量測位置A2的溫度量測資料的斜率資料來除以溫差資料以獲得特性資料,但不以此限定,亦可採用較遠的量測位置A2的溫度量測資料。Further, as shown in Figure 8, when there are multiple measurement positions A2 and A3, the above calculation is to select the slope data of the temperature measurement data of the measurement position A2 directly behind (or closest to) the heating position A1 to divide by The temperature difference data is used to obtain the characteristic data, but it is not limited thereto, and the temperature measurement data at a far measurement location A2 can also be used.

值得一提的是,前述指數衰減式是包括底數部分與指數部分,本發明是基於底數部份決定前述傳導評分,並基於指數部分決定對流評分。It is worth mentioning that the aforementioned exponential decay formula includes a base part and an exponent part, and the present invention determines the conduction score based on the base part, and determines the convection score based on the exponent part.

藉此,本發明可決定不同類型的評分。In this way, the present invention can determine different types of scoring.

圖6的實施例中,更包括用以基於評分判定檢測結果的S40-S45,其中步驟S40-S42的執行順序可依用戶需求任意變更,或同時執行。The embodiment in FIG. 6 further includes steps S40-S45 for judging detection results based on scores, wherein the execution order of steps S40-S42 can be changed arbitrarily according to user requirements, or executed simultaneously.

步驟S40:處理器100透過加熱評分模組34判斷加熱評分是否差於預設的加熱評分門檻。Step S40: The processor 100 determines whether the heating score is lower than a preset heating score threshold through the heating score module 34.

若加熱評分差於加熱評分門檻,則執行步驟S44:處理器100透過人機介面102發出警示以提示用戶加熱狀態不佳。If the heating score is worse than the heating score threshold, step S44 is executed: the processor 100 issues a warning through the man-machine interface 102 to remind the user that the heating state is not good.

若加熱評分優於加熱評分門檻,表示本次加熱狀態良好(如加熱功率穩定),執行步驟S41:處理器100透過對流評分模組36判斷對流評分是否差於預設的對流評分門檻。If the heating score is better than the heating score threshold, it means that the heating state is good (eg, the heating power is stable), and step S41 is executed: the processor 100 determines whether the convection score is worse than the preset convection score threshold through the convection score module 36 .

若對流評分差於對流評分門檻,則執行步驟S44:處理器100透過人機介面102發出警示以提示用戶環境狀態(尤其是對流狀態)不佳。If the convection score is worse than the convection score threshold, step S44 is executed: the processor 100 issues a warning through the man-machine interface 102 to remind the user that the environment state (especially the convection state) is not good.

於執行步驟S44之後,處理器100可接著執行步驟S42來接續判斷傳導評分是否合格,但不以此限定。After executing step S44, the processor 100 may then execute step S42 to continuously determine whether the conduction score is qualified, but not limited thereto.

於另一實施例中,於加熱狀態或環境狀態不佳時,所檢測的傳導評分可能無法正確反應熱導管22的傳導性良劣。對此,處理器100可於執行步驟S4後,直接結束本次檢測,而不評斷熱導管22的良劣。In another embodiment, when the heating state or the environmental state is not good, the detected conductivity score may not correctly reflect whether the heat pipe 22 has good or bad conductivity. In this regard, the processor 100 may end the detection directly after executing step S4 without evaluating whether the heat pipe 22 is good or bad.

若對流評分優於對流評分門檻,表示本次環境狀態良好,執行步驟S42:處理器100透過評分模組33(傳導評分模組35)判斷熱導管22的評分(傳導評分)是否優於評分門檻(傳導評分門檻),以判斷熱導管22為良品或劣品(瑕疵品)。If the convection score is better than the convection score threshold, it means that the current environmental status is good, and step S42 is executed: the processor 100 judges whether the score (conduction score) of the heat pipe 22 is better than the score threshold through the scoring module 33 (conduction scoring module 35) (conduction scoring threshold) to determine whether the heat pipe 22 is a good product or a bad product (defective product).

若傳導評分差於傳導評分門檻,表示傳導性不佳,執行步驟S43:處理器100透過傳導評分模組35判定熱導管22為瑕疵品,並可進一步透過人機介面102顯示瑕疵品通知。If the conductivity score is lower than the conductivity score threshold, it means that the conductivity is not good, and step S43 is executed: the processor 100 determines that the heat pipe 22 is a defective product through the conduction scoring module 35 , and can further display a defective product notification through the man-machine interface 102 .

若傳導評分優於傳導評分門檻,表示傳導性良好,執行步驟S45:處理器100透過傳導評分模組35判定熱導管22為良品,並可進一步透過人機介面102顯示良品通知。If the conductivity score is higher than the conductivity score threshold, it means that the conductivity is good, and step S45 is executed: the processor 100 determines that the heat pipe 22 is a good product through the conduction score module 35 , and can further display a good product notification through the man-machine interface 102 .

本發明可有效對熱導管22的傳導性進行檢測,並自動產生檢測結果。The present invention can effectively detect the conductivity of the heat pipe 22 and automatically generate detection results.

此外,本發明可同時對加熱狀態與環境狀態進行檢測,以避免因加熱狀態或環境狀態不佳導致檢測結果的誤判。In addition, the present invention can detect the heating state and the environmental state at the same time, so as to avoid misjudgment of the detection result due to the bad heating state or the environmental state.

請一併參閱圖4-7,圖7為本發明另一實施例的非接觸式檢測方法的部分流程圖。相較於圖4的實施例,圖7的實施例進一步提供評分門檻的計算功能,可以透過對同類型的良品進行檢測來獲得對應良品的評分門檻。本實施例的方法更包括以下步驟。Please refer to FIGS. 4-7 together. FIG. 7 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention. Compared with the embodiment in FIG. 4 , the embodiment in FIG. 7 further provides a scoring threshold calculation function, and the scoring threshold of the corresponding good product can be obtained by detecting the same type of good product. The method of this embodiment further includes the following steps.

步驟S50:用戶可於非接觸式檢測設備1上對與待測熱導管22相同類型的良品熱導管執行多次檢測(透過執行步驟S10-S15至少兩次)以獲得多個良品評分(透過執行S30-S33),如多次檢測獲得的多個加熱良品評分、多個對流良品評分與多個傳導良品評分。Step S50: The user can perform multiple inspections on the non-contact testing device 1 for good heat pipes of the same type as the heat pipe 22 to be tested (by performing steps S10-S15 at least twice) to obtain multiple good product scores (by executing S30-S33), such as multiple heating good product scores, multiple convection good product scores and multiple conduction good product scores obtained from multiple inspections.

步驟S51:處理器100透過門檻計算模組37取得上述多個良品評分,並基於多個良品評分設定評分門檻。Step S51: The processor 100 obtains the above-mentioned multiple good product scores through the threshold calculation module 37, and sets a scoring threshold based on the multiple good product scores.

於一實施例中,門檻計算模組37是基於多個加熱良品評分計算加熱評分門檻,基於多個對流良品評分計算對流評分門檻,基於多個傳導良品評分計算傳導評分門檻。In one embodiment, the threshold calculation module 37 calculates the heating score threshold based on a plurality of heating good product scores, calculates the convection score threshold based on a plurality of convective good product scores, and calculates the conduction score threshold based on a plurality of conduction good product scores.

於一實施例中,門檻計算模組37是計算多個良品評分的平均值(如加權平均或一般平均),並適度調整平均值。In one embodiment, the threshold calculation module 37 calculates the average value (such as weighted average or general average) of multiple good product scores, and moderately adjusts the average value.

舉例來說,若評分越高表示越佳,則可以平均值降低20%、降低10%,或±10%的範圍來做為評分門檻。For example, if the higher the score is, the better it is, the average value can be lowered by 20%, lowered by 10%, or the range of ±10% can be used as the scoring threshold.

於另一例子中,若評分越低表示越佳,則可以平均值提升20%、提升10%,或±15%的範圍來做為評分門檻。In another example, if the lower the score is, the better it is, the average increase of 20%, the increase of 10%, or the range of ±15% can be used as the score threshold.

藉此,本發明可有效設定各類型的評分門檻,而有利於判斷檢測結果的可用性。Thereby, the present invention can effectively set various types of scoring thresholds, which is beneficial for judging the usability of the detection results.

以上所述僅為本發明之較佳具體實例,非因此即侷限本發明之申請專利範圍,故舉凡運用本發明內容所為之等效變化,均同理皆包含於本發明之範圍內,合予陳明。The above descriptions are only preferred specific examples of the present invention, and are not intended to limit the patent scope of the present invention. Therefore, all equivalent changes made by using the content of the present invention are all included in the scope of the present invention in the same way. Chen Ming.

1:非接觸式檢測設備1: Non-contact detection equipment

10:控制模組10: Control Module

11:紅外線加熱模組11: Infrared heating module

12:紅外線溫度量測模組12: Infrared temperature measurement module

10:控制模組10: Control Module

100:處理器100: Processor

101:通訊裝置101: Communication device

102:人機介面102: Human-machine interface

103:儲存裝置103: storage device

11:紅外線加熱模組11: Infrared heating module

110:加熱元件110: heating element

12:紅外線溫度量測模組12: Infrared temperature measurement module

120:量測元件120: Measuring element

121:量測元件121: Measuring element

20:運算平台20: Computing platform

21:定位治具21: Positioning fixture

210-212:安裝結構210-212: Installation structure

213:底座213: base

22:熱導管22: heat pipe

30:加熱控制模組30: heating control module

31:量測控制模組31: Measurement control module

32:停止監測模組32: stop monitoring module

33:評分模組33: Scoring Module

34:加熱評分模組34: Heat Scoring Module

35:傳導評分模組35: Conduction Scoring Module

36:對流評分模組36: Convection Scoring Mod

37:門檻計算模組37: Threshold calculation module

38:初始化模組38: Initialize the module

A1-A3、T1、T2、H:位置A1-A3, T1, T2, H: Position

L1、L2:距離L1, L2: Distance

D1-D3:面積D1-D3: Area

S10-S15:加熱與檢測步驟S10-S15: heating and detection steps

S20-S23:初始化步驟S20-S23: Initialization steps

S30-S33:評分步驟S30-S33: Scoring Steps

S40-S45:判斷步驟S40-S45: Judgment steps

S50-S51:門檻取得步驟S50-S51: Threshold acquisition steps

圖1為本發明一實施例的非接觸式檢測設備的架構圖。FIG. 1 is a structural diagram of a non-contact detection device according to an embodiment of the present invention.

圖2為本發明另一實施例的非接觸式檢測設備的架構圖。FIG. 2 is a structural diagram of a non-contact detection device according to another embodiment of the present invention.

圖3為本發明另一實施例的處理器的架構圖。FIG. 3 is a structural diagram of a processor according to another embodiment of the present invention.

圖4為本發明一實施例的非接觸式檢測方法的流程圖。FIG. 4 is a flowchart of a non-contact detection method according to an embodiment of the present invention.

圖5為本發明另一實施例的非接觸式檢測方法的部分流程圖。FIG. 5 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention.

圖6為本發明另一實施例的非接觸式檢測方法的部分流程圖。FIG. 6 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention.

圖7為本發明另一實施例的非接觸式檢測方法的部分流程圖。FIG. 7 is a partial flowchart of a non-contact detection method according to another embodiment of the present invention.

圖8為本發明一實施例的非接觸式檢測的設置示意圖。FIG. 8 is a schematic diagram of a non-contact detection setup according to an embodiment of the present invention.

圖9為本發明一實施例的熱導管的一面的外觀示意圖。FIG. 9 is a schematic view of one side of the heat pipe according to an embodiment of the present invention.

圖10為圖9的熱導管的另一面的外觀示意圖。FIG. 10 is a schematic view of the appearance of the other side of the heat pipe in FIG. 9 .

圖11為本發明一實施例的加熱功率-電壓的關係曲線圖。Fig. 11 is a graph showing the relationship between heating power and voltage according to an embodiment of the present invention.

圖12為本發明一實施例的溫度斜率-時間的關係曲線圖。FIG. 12 is a graph showing the relationship between temperature slope and time according to an embodiment of the present invention.

S10-S15:加熱與檢測步驟S10-S15: heating and detection steps

Claims (20)

一種熱導管的非接觸式檢測方法,應用於包括一紅外線加熱模組及一紅外線溫度量測模組的一非接觸式檢測裝置,該方法包括以下步驟: a) 取得一加熱參數及一待測熱導管的一物件資訊; b) 基於該紅外線加熱模組的一紅外線加熱參數與對該待測熱導管的一物件加熱參數計算一停止斜率; c) 基於該加熱參數控制該紅外線加熱模組對該待測熱導管進行加熱,並控制該紅外線溫度量測模組量測該待測熱導管的一量測溫度資料; d) 於加熱過程中,監測該量測溫度資料的一溫度斜率; e) 於監測到一停止條件滿足時,基於該溫度斜率執行一評分處理以決定檢測該待測熱導管的一評分,其中該停止條件包括該溫度斜率收斂至該停止斜率;及 f) 於該待測熱導管的該評分優於一評分門檻時,判定該待測熱導管為良品,並於該評分不優於該評分門檻時,判定該待測熱導管為劣品。 A non-contact detection method for a heat pipe is applied to a non-contact detection device including an infrared heating module and an infrared temperature measurement module. The method includes the following steps: a) obtaining a heating parameter and an object information of a heat pipe to be tested; b) calculating a stop slope based on an infrared heating parameter of the infrared heating module and an object heating parameter of the heat pipe to be tested; c) controlling the infrared heating module to heat the heat pipe under test based on the heating parameter, and controlling the infrared temperature measurement module to measure a measured temperature data of the heat pipe under test; d) During the heating process, monitor a temperature slope of the measured temperature data; e) when a stop condition is detected to be satisfied, performing a scoring process based on the temperature slope to determine a score for detecting the heat pipe under test, wherein the stop condition includes the temperature slope converging to the stop slope; and f) When the score of the heat pipe under test is higher than a score threshold, it is determined that the heat pipe under test is a good product, and when the score is not better than the score threshold, it is determined that the heat pipe under test is a bad product. 如請求項1所述之方法,其中該步驟a)包括以下步驟: g1) 基於該待測熱導管的質量及比熱容取得該物件加熱參數;及 g2) 基於該物件加熱參數與該紅外線加熱參數取得該紅外線加熱模組的一加熱輸入電壓作為該加熱參數。 The method as described in claim 1, wherein the step a) comprises the following steps: g1) Obtain the heating parameters of the object based on the mass and specific heat capacity of the heat pipe to be tested; and g2) Obtain a heating input voltage of the infrared heating module as the heating parameter based on the object heating parameter and the infrared heating parameter. 如請求項1所述之方法,其中該停止條件包括累積加熱時間達到一檢測時間上限; 其中,該步驟c)之前更包括以下步驟: h1) 基於用戶操作設定一目標溫度;及 h2) 基於該目標溫度與環境溫度之間的一溫差、該物件資訊、該物件加熱參數及一環境對流參數取得該檢測時間上限。 The method as claimed in item 1, wherein the stop condition includes that the accumulated heating time reaches an upper detection time limit; Wherein, the step c) further includes the following steps: h1) setting a target temperature based on user operations; and h2) Obtaining the detection time limit based on a temperature difference between the target temperature and the ambient temperature, the object information, the object heating parameter, and an ambient convection parameter. 如請求項1所述之方法,其中該步驟b)包括以下步驟: i1) 基於一目標溫度與環境溫度之間的一溫差、該物件資訊、該物件加熱參數、該紅外線加熱參數及一環境對流參數模擬計算該待測熱導管的一時間-溫度模擬變化;及 i2) 基於該時間-溫度模擬變化及該檢測時間上限設定該停止斜率,其中該停止斜率大於1。 The method as described in claim 1, wherein the step b) comprises the following steps: i1) based on a temperature difference between a target temperature and ambient temperature, the object information, the object heating parameter, the infrared heating parameter and an ambient convection parameter simulation calculation of a time-temperature simulation change of the heat pipe under test; and i2) Set the stop slope based on the time-temperature analog change and the detection time upper limit, wherein the stop slope is greater than 1. 如請求項1所述之方法,於該步驟e)之前更包括以下步驟: j1) 基於該加熱參數控制該紅外線加熱模組對與該待測熱導管相同類型的一良品熱導管進行加熱,並控制該紅外線溫度量測模組量測該良品熱導管的一量測溫度資料; j2) 基於該良品熱導管的該量測溫度資料計算該良品熱導管的一良品評分; j3) 重複執行該步驟 j1)、j2)至少兩次,以獲得多個該良品評分;及 j4) 基於該多個良品評分設定該評分門檻。 The method described in claim 1 further includes the following steps before the step e): j1) Controlling the infrared heating module to heat a good heat pipe of the same type as the heat pipe to be tested based on the heating parameters, and controlling the infrared temperature measurement module to measure a measured temperature data of the good heat pipe ; j2) calculating a good score of the good heat pipe based on the measured temperature data of the good heat pipe; j3) Repeat steps j1), j2) at least twice to obtain multiple good product scores; and j4) Set the scoring threshold based on the multiple good product scores. 如請求項1所述之方法,其中該評分處理包括: k1) 計算該量測溫度資料的一斜率資料;及 k2) 基於該斜率資料的多個斜率計算一加熱評分,其中該多個斜率分別對應該加熱過程的不同時間區間; 其中,該步驟e)包括一步驟l1) 於該加熱評分差於一加熱評分門檻時,發出警示以提示加熱狀態不佳。 The method as described in Claim 1, wherein the scoring process includes: k1) calculating a slope data of the measured temperature data; and k2) calculating a heating score based on multiple slopes of the slope data, wherein the multiple slopes correspond to different time intervals of the heating process; Wherein, the step e) includes a step l1) when the heating score is lower than a heating score threshold, issuing an alarm to indicate that the heating state is not good. 如請求項1所述之方法,其中該步驟c)是控制該紅外線溫度量測模組對該待測熱導管的多個量測位置進行量測來獲得該多個量測位置的該多個量測溫度資料; 其中,該評分處理包括: m1) 計算該量測溫度資料的一斜率資料; m2) 計算該多個量測溫度資料之間的一溫差資料;及 m3) 基於該斜率資料及該溫差資料計算一對流評分及一傳導評分; 其中,該步驟e)包括以下步驟: n1) 於該對流評分差於一對流評分門檻時,發出警示以提示環境狀態不佳; n2) 於該傳導評分優於一傳導評分門檻時,判定該待測熱導管為良品;及 n3) 於該傳導評分差於該傳導評分門檻時,判定該待測熱導管為劣品。 The method as described in claim 1, wherein the step c) is to control the infrared temperature measurement module to measure a plurality of measurement positions of the heat pipe to be measured to obtain the plurality of measurement positions of the plurality of measurement positions Measure temperature data; Among them, the scoring process includes: m1) calculating a slope data of the measured temperature data; m2) calculating a temperature difference data between the plurality of measured temperature data; and m3) calculating a convection score and a conduction score based on the slope data and the temperature difference data; Wherein, the step e) comprises the following steps: n1) When the convection score is worse than the convection score threshold, a warning is issued to indicate that the environmental state is not good; n2) When the conduction score is better than a conduction score threshold, it is determined that the heat pipe under test is a good product; and n3) When the conduction score is worse than the conduction score threshold, it is determined that the heat pipe under test is inferior. 如請求項7所述之方法,其中該步驟m3)是將該斜率資料除以該溫差資料以獲得一特性資料,對該特性資料計算迴歸來獲得一指數衰減式,並基於該指數衰減式決定該對流評分及該傳導評分。The method as described in claim 7, wherein the step m3) is to divide the slope data by the temperature difference data to obtain a characteristic data, calculate a regression on the characteristic data to obtain an exponential decay formula, and determine based on the exponential decay formula The convection score and the conduction score. 如請求項1所述之方法,其中該步驟c)是控制該紅外線加熱模組對該待測熱導管的一面的一加熱位置進行加熱,並控制該紅外線溫度量測模組對該待測熱導管的另一面的多個量測位置進行量測來獲得該多個量測位置的該多個量測溫度資料; 其中,該加熱位置位於其中一該量測位置的正後方,該加熱位置與該多個量測位置塗佈有深色輻射漆,該加熱位置的該深色輻射漆的面積大於該紅外線加熱模組的雷射光照面積,各該量測位置的該深色輻射漆的面積大於該紅外線加熱模組的量測面積。 The method as described in claim 1, wherein the step c) is to control the infrared heating module to heat a heating position on one side of the heat pipe to be measured, and control the infrared temperature measurement module to heat the heat pipe to be measured. performing measurements at a plurality of measurement positions on the other side of the conduit to obtain the plurality of measurement temperature data at the plurality of measurement positions; Wherein, the heating position is located directly behind one of the measuring positions, the heating position and the plurality of measuring positions are coated with dark radiation paint, and the area of the dark radiation paint at the heating position is larger than that of the infrared heating mold The laser irradiation area of the group, the area of the dark radiation paint at each measurement position is larger than the measurement area of the infrared heating module. 如請求項9所述之方法,其中該待測熱導管為超薄均熱板(VC),該步驟c)是對該待測熱導管的該加熱位置進行加熱,以使該加熱位置的壁面下的液體吸熱後變為蒸氣並往壓力低的其他位置,透過接觸其他位置的壁面吸收熱量後再次冷凝回液體,再回流到該加熱位置,形成熱循環。The method as described in claim 9, wherein the heat pipe to be tested is an ultra-thin vapor chamber (VC), and the step c) is to heat the heating position of the heat pipe to be tested so that the wall surface of the heat pipe The liquid below absorbs heat and turns into vapor and goes to other locations with low pressure, absorbs heat through contact with the walls of other locations, condenses back to liquid again, and then flows back to the heated location to form a thermal cycle. 一種熱導管的非接觸式檢測設備,包括: 一紅外線加熱模組,被配置來基於一加熱參數對一待測熱導管進行加熱; 一紅外線溫度量測模組,被配置來量測該待測熱導管的一量測溫度資料;及 一控制模組,電性連接該紅外線加熱模組及該紅外線溫度量測模組,被配置來取得一加熱參數及該待測熱導管的一物件資訊,該控制模組被配置來基於該紅外線加熱模組的一紅外線加熱參數與對該待測熱導管的一物件加熱參數計算一停止斜率,該控制模組被配置來於加熱過程中監測該量測溫度資料的一溫度斜率,並於一停止條件滿足時,基於該溫度斜率決定檢測該待測熱導管的一評分,該控制模組被配置來於該待測熱導管的該評分優於一評分門檻時,判定該待測熱導管為良品,並於該評分不優於該評分門檻時,判定該待測熱導管為劣品,其中該停止條件包括該溫度斜率收斂至該停止斜率。 A non-contact detection device for heat pipes, comprising: an infrared heating module configured to heat a heat pipe under test based on a heating parameter; an infrared temperature measurement module configured to measure a measured temperature data of the heat pipe to be tested; and A control module, electrically connected to the infrared heating module and the infrared temperature measurement module, is configured to obtain a heating parameter and an object information of the heat pipe to be measured, and the control module is configured to obtain a heating parameter based on the infrared An infrared heating parameter of the heating module and an object heating parameter of the heat pipe to be tested calculate a stop slope, the control module is configured to monitor a temperature slope of the measured temperature data during the heating process, and in a When the stop condition is satisfied, a score of the heat pipe under test is determined based on the temperature slope, and the control module is configured to determine that the heat pipe under test is when the score of the heat pipe under test is higher than a score threshold. Good product, and when the score is not higher than the score threshold, it is determined that the heat pipe under test is a bad product, wherein the stop condition includes that the temperature slope converges to the stop slope. 如請求項11所述之非接觸式檢測設備,其中該控制模組包括:一初始化模組,被配置來基於該待測熱導管的質量及比熱容取得該物件加熱參數,並基於該物件加熱參數與該紅外線加熱參數取得該紅外線加熱模組的一加熱輸入電壓作為該加熱參數,該初始化模組被配置來基於一目標溫度與環境溫度之間的一溫差、該物件資訊、該物件加熱參數及一環境對流參數模擬計算該待測熱導管的一時間-溫度模擬變化,並基於該時間-溫度模擬變化及該檢測時間上限設定該停止斜率,其中該停止斜率大於1。The non-contact detection device as described in claim 11, wherein the control module includes: an initialization module configured to obtain the object heating parameter based on the mass and specific heat capacity of the heat pipe to be tested, and based on the object heating parameter Obtaining a heating input voltage of the infrared heating module as the heating parameter with the infrared heating parameter, the initialization module is configured based on a temperature difference between a target temperature and ambient temperature, the object information, the object heating parameter and An environmental convection parameter simulation calculates a time-temperature simulation change of the heat pipe to be tested, and sets the stop slope based on the time-temperature simulation change and the detection time upper limit, wherein the stop slope is greater than 1. 如請求項11所述之非接觸式檢測設備,其中該停止條件更包括累積加熱時間達到一檢測時間上限; 其中,該控制模組包括: 一初始化模組,被配置來基於用戶操作設定一目標溫度,基於該目標溫度與環境溫度之間的一溫差、該物件資訊、該物件加熱參數及一環境對流參數取得一檢測時間上限。 The non-contact detection device as described in claim 11, wherein the stop condition further includes that the accumulated heating time reaches an upper detection time limit; Among them, the control module includes: An initialization module is configured to set a target temperature based on user operations, and obtain a detection time limit based on a temperature difference between the target temperature and ambient temperature, the object information, the object heating parameter, and an ambient convection parameter. 如請求項11所述之非接觸式檢測設備,其中該控制模組包括: 一加熱控制模組,被配置來控制該紅外線加熱模組進行加熱; 一量測控制模組,被配置來控制該紅外線溫度量測模組進行溫度量測; 一停止監測模組,被配置來監測是否該停止條件滿足; 一評分模組,被配置來於計算該評分,並被配置來比較該評分與該評分門檻;及 一門檻計算模組,被配置來透過該加熱控制模組、該量測控制模組、該停止監測模組及該評分模組對與該待測熱導管相同類型的一良品熱導管執行多次加熱檢測以獲得多個該良品評分,並基於該多個良品評分設定一評分門檻。 The non-contact detection device as described in claim 11, wherein the control module includes: a heating control module configured to control the infrared heating module for heating; a measurement control module configured to control the infrared temperature measurement module to perform temperature measurement; a stop monitoring module configured to monitor whether the stop condition is met; a scoring module configured to calculate the score and configured to compare the score to the scoring threshold; and a threshold calculation module configured to execute multiple times on a good heat pipe of the same type as the heat pipe under test through the heating control module, the measurement control module, the stop monitoring module and the scoring module A plurality of good product scores are obtained through heating inspection, and a scoring threshold is set based on the plurality of good product scores. 如請求項11所述之非接觸式檢測設備,其中該控制模組包括: 一加熱評分模組,被配置來基於該量測溫度資料的一斜率資料的多個斜率計算一加熱評分,並於該加熱評分差於一加熱評分門檻時,發出警示以提示加熱狀態不佳,其中該多個斜率分別對應該加熱過程的不同時間區間。 The non-contact detection device as described in claim 11, wherein the control module includes: a heating score module configured to calculate a heating score based on a plurality of slopes of a slope data of the measured temperature data, and when the heating score is lower than a heating score threshold, an alarm is issued to indicate that the heating state is not good, Wherein the plurality of slopes respectively correspond to different time intervals of the heating process. 如請求項11所述之非接觸式檢測設備,其中該紅外線溫度量測模組包括多個量測元件,該多個量測元件用來對該待測熱導管的多個量測位置進行量測來獲得該多個量測位置的該多個量測溫度資料; 其中,該控制模組包括: 一傳導評分模組,被配置來基於該量測溫度資料的一斜率資料及該多個量測溫度資料之間的一溫差資料計算一傳導評分,於該傳導評分優於一傳導評分門檻時,判定該待測熱導管為良品,並於該傳導評分差於該傳導評分門檻時,判定該待測熱導管為劣品;及 一對流評分模組,被配置來基於該斜率資料及該溫差資料計算一對流評分,並於該對流評分差於一對流評分門檻時,發出警示以提示環境狀態不佳。 The non-contact detection device as described in claim 11, wherein the infrared temperature measurement module includes a plurality of measurement elements, and the plurality of measurement elements are used to measure the plurality of measurement positions of the heat pipe to be measured Obtain the plurality of measured temperature data of the plurality of measurement positions by measuring; Among them, the control module includes: a conductance scoring module configured to calculate a conductance score based on a slope data of the measured temperature data and a temperature difference data among the plurality of measured temperature data, when the conductance score is better than a conductance score threshold, Determining that the heat pipe under test is a good product, and when the conduction score is lower than the conduction score threshold, determining that the heat pipe under test is a bad product; and The convection score module is configured to calculate the convection score based on the slope data and the temperature difference data, and when the convection score is worse than the convection score threshold, an alarm is issued to indicate that the environmental state is not good. 如請求項11所述之非接觸式檢測設備,更包括一定位治具,該定位治具包括: 一第一安裝結構,用以裝設該紅外線加熱模組,以使該紅外線加熱模組對該待測熱導管的一面的一加熱位置進行加熱; 一第二安裝結構,用以裝設該紅外線溫度量測模組,以使該紅外線溫度量測模組的多個量測元件對該待測熱導管的另一面的多個量測位置進行量測;及 一第三安裝結構,設置於該第一安裝結構與該第二安裝結構之間,用以固定該待測熱導管; 其中,裝設於該第一安裝結構的該紅外線加熱模組與裝設於該第二安裝結構的該紅外線溫度量測模組是分別朝向放置於該第三安裝結構的該待測熱導管的不同面。 The non-contact detection equipment as described in claim 11 further includes a positioning fixture, and the positioning fixture includes: A first mounting structure for installing the infrared heating module so that the infrared heating module heats a heating position on one side of the heat pipe to be tested; A second installation structure is used to install the infrared temperature measurement module, so that the multiple measurement elements of the infrared temperature measurement module measure the multiple measurement positions on the other side of the heat pipe to be measured test; and A third installation structure, arranged between the first installation structure and the second installation structure, for fixing the heat pipe to be tested; Wherein, the infrared heating module installed in the first installation structure and the infrared temperature measurement module installed in the second installation structure are respectively facing the heat pipe to be measured placed in the third installation structure. Different sides. 如請求項17所述之非接觸式檢測設備,其中該加熱位置位於其中一該量測位置的正後方,至少一該量測位置是遠離該加熱位置的正後方; 其中,該待測熱導管於該加熱位置與該多個量測位置塗佈有深色輻射漆,該加熱位置的該深色輻射漆的面積大於該紅外線加熱模組的雷射光照面積,各該量測位置的該深色輻射漆的面積大於該紅外線加熱模組的量測面積。 The non-contact detection device as described in claim 17, wherein the heating position is located directly behind one of the measuring positions, and at least one of the measuring positions is away from the directly behind the heating position; Wherein, the heat pipe to be tested is coated with dark radiation paint on the heating position and the plurality of measurement positions, and the area of the dark radiation paint on the heating position is larger than the laser irradiation area of the infrared heating module, each The area of the dark radiant paint at the measuring position is larger than the measuring area of the infrared heating module. 如請求項17所述之非接觸式檢測設備,其中裝設於該第一安裝結構的該紅外線加熱模組與該放置於該第三安裝結構的該待測熱導管之間的一第一距離是基於該紅外線加熱模組的一鏡頭的焦距所調整; 其中,裝設於該第二安裝結構的該紅外線溫度量測模組與該放置於該第三安裝結構的該待測熱導管之間的一第二距離是基於該紅外線溫度量測模組的一預設量測距離所調整。 The non-contact detection device as claimed in claim 17, wherein there is a first distance between the infrared heating module installed in the first installation structure and the heat pipe to be tested placed in the third installation structure It is adjusted based on the focal length of a lens of the infrared heating module; Wherein, a second distance between the infrared temperature measurement module installed in the second installation structure and the heat pipe to be measured placed in the third installation structure is based on the infrared temperature measurement module A preset measuring distance is adjusted. 如請求項11所述之非接觸式檢測設備,其中該待測熱導管為超薄均熱板(VC),該紅外線加熱模組用來對對該待測熱導管的該加熱位置進行加熱,以使該加熱位置的壁面下的液體吸熱後變為蒸氣並往壓力低的其他位置,透過接觸其他位置的壁面吸收熱量後再次冷凝回液體,再回流到該加熱位置,形成熱循環。The non-contact detection device as described in claim 11, wherein the heat pipe to be tested is an ultra-thin vapor chamber (VC), and the infrared heating module is used to heat the heating position of the heat pipe to be tested, So that the liquid under the wall of the heating position absorbs heat and turns into vapor and goes to other positions with low pressure, absorbs heat through contact with the wall of other positions, condenses back to liquid again, and then flows back to the heating position to form a heat cycle.
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