TW200611072A - Mask blank, manufacturing method and transfer plate manufacturing method - Google Patents
Mask blank, manufacturing method and transfer plate manufacturing methodInfo
- Publication number
- TW200611072A TW200611072A TW094118141A TW94118141A TW200611072A TW 200611072 A TW200611072 A TW 200611072A TW 094118141 A TW094118141 A TW 094118141A TW 94118141 A TW94118141 A TW 94118141A TW 200611072 A TW200611072 A TW 200611072A
- Authority
- TW
- Taiwan
- Prior art keywords
- mask
- manufacturing
- mask blank
- transfer plate
- thin film
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/48—Protective coatings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Troubles due to foreign material directly adhered on a substrate surface during mask blank or mask manufacture process or at the time of storage, transfer, transport, etc. are prevented. On a mask blank main plane on a side whereupon a mask-functioning thin film and/or thin film to be used in the mask manufacturing process is formed, a cover-like dust-proof protector is removably fixed to form an airtight space by having contact with a non-effective area but not with an effective area whereupon a mask pattern is to be formed.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004164099 | 2004-06-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200611072A true TW200611072A (en) | 2006-04-01 |
Family
ID=35783674
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094118141A TW200611072A (en) | 2004-06-02 | 2005-06-02 | Mask blank, manufacturing method and transfer plate manufacturing method |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPWO2006006318A1 (en) |
KR (1) | KR20070039910A (en) |
TW (1) | TW200611072A (en) |
WO (1) | WO2006006318A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI627110B (en) * | 2013-05-13 | 2018-06-21 | Miraial Co Ltd | Package structure for packaging substrate storage container |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007099910A1 (en) * | 2006-02-28 | 2007-09-07 | Hoya Corporation | Photomask blank and photomask, and their manufacturing method |
NL1036193A1 (en) * | 2007-12-06 | 2009-06-09 | Asml Netherlands Bv | Imprint lithography. |
JP5169206B2 (en) * | 2007-12-21 | 2013-03-27 | 日本電気株式会社 | Photomask acceptor and resist inspection method and apparatus using the same |
US10670959B2 (en) | 2017-05-10 | 2020-06-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Pellicle and method of using the same |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5962856A (en) * | 1982-10-04 | 1984-04-10 | Hitachi Ltd | Photomask |
JPS6231855A (en) * | 1985-08-02 | 1987-02-10 | Fujitsu Ltd | Mask blank with pellicle |
JPH03179351A (en) * | 1989-12-07 | 1991-08-05 | Fujitsu Ltd | Production of photomask |
JPH05188583A (en) * | 1992-01-17 | 1993-07-30 | Fujitsu Ltd | Pellicle |
JPH0619122A (en) * | 1992-07-02 | 1994-01-28 | Seiko Epson Corp | Structure of blanks and production of photomask |
JP3071348B2 (en) * | 1993-10-21 | 2000-07-31 | 信越化学工業株式会社 | Pellicle and its peeling method |
-
2005
- 2005-06-01 WO PCT/JP2005/010076 patent/WO2006006318A1/en active Application Filing
- 2005-06-01 KR KR1020077000004A patent/KR20070039910A/en not_active Application Discontinuation
- 2005-06-01 JP JP2006528432A patent/JPWO2006006318A1/en active Pending
- 2005-06-02 TW TW094118141A patent/TW200611072A/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI627110B (en) * | 2013-05-13 | 2018-06-21 | Miraial Co Ltd | Package structure for packaging substrate storage container |
Also Published As
Publication number | Publication date |
---|---|
JPWO2006006318A1 (en) | 2008-04-24 |
KR20070039910A (en) | 2007-04-13 |
WO2006006318A1 (en) | 2006-01-19 |
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