TW200606432A - Method and apparatus for picking up an electric component under test - Google Patents

Method and apparatus for picking up an electric component under test

Info

Publication number
TW200606432A
TW200606432A TW093124111A TW93124111A TW200606432A TW 200606432 A TW200606432 A TW 200606432A TW 093124111 A TW093124111 A TW 093124111A TW 93124111 A TW93124111 A TW 93124111A TW 200606432 A TW200606432 A TW 200606432A
Authority
TW
Taiwan
Prior art keywords
under test
electric component
component under
picking
pads
Prior art date
Application number
TW093124111A
Other languages
Chinese (zh)
Other versions
TWI251081B (en
Inventor
Chiu-Fang Chang
Yuan-Chi Lin
Shih-Bou Chang
Diann-Fang Lin
Original Assignee
King Yuan Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by King Yuan Electronics Co Ltd filed Critical King Yuan Electronics Co Ltd
Priority to TW93124111A priority Critical patent/TWI251081B/en
Publication of TW200606432A publication Critical patent/TW200606432A/en
Application granted granted Critical
Publication of TWI251081B publication Critical patent/TWI251081B/en

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

By using two springs with different coefficients of elasticity, two stage compressions can be made. With the first stage compression, an electric component under test can be sucked and be pulled into a specific position surrounded with the floating site. At the meanwhile, each pair of the pads of the electric component under test and the pogo pins for testing the electric components are not contacted with each other, thus the electric component under test will not fall down because of the vacuum break. After moving the electric component under test to the tester, each pair of the pads and the pogo pins can be electrically coupled by the second stage compression.
TW93124111A 2004-08-11 2004-08-11 Method and apparatus for picking up an electric component under test TWI251081B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW93124111A TWI251081B (en) 2004-08-11 2004-08-11 Method and apparatus for picking up an electric component under test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW93124111A TWI251081B (en) 2004-08-11 2004-08-11 Method and apparatus for picking up an electric component under test

Publications (2)

Publication Number Publication Date
TW200606432A true TW200606432A (en) 2006-02-16
TWI251081B TWI251081B (en) 2006-03-11

Family

ID=37433510

Family Applications (1)

Application Number Title Priority Date Filing Date
TW93124111A TWI251081B (en) 2004-08-11 2004-08-11 Method and apparatus for picking up an electric component under test

Country Status (1)

Country Link
TW (1) TWI251081B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI625289B (en) * 2017-10-27 2018-06-01 Variable pressure crimping device and test classification device
TWI710768B (en) * 2019-09-04 2020-11-21 創意電子股份有限公司 Testing apparatus and testing flow using the same
CN112444723A (en) * 2019-09-04 2021-03-05 创意电子股份有限公司 Test device and test flow using same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI625289B (en) * 2017-10-27 2018-06-01 Variable pressure crimping device and test classification device
TWI710768B (en) * 2019-09-04 2020-11-21 創意電子股份有限公司 Testing apparatus and testing flow using the same
CN112444723A (en) * 2019-09-04 2021-03-05 创意电子股份有限公司 Test device and test flow using same

Also Published As

Publication number Publication date
TWI251081B (en) 2006-03-11

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