CN205656249U - Pad contact resistance and point contact aging testing device - Google Patents
Pad contact resistance and point contact aging testing device Download PDFInfo
- Publication number
- CN205656249U CN205656249U CN201620276877.8U CN201620276877U CN205656249U CN 205656249 U CN205656249 U CN 205656249U CN 201620276877 U CN201620276877 U CN 201620276877U CN 205656249 U CN205656249 U CN 205656249U
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- resistance
- contact pads
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Abstract
The utility model discloses a pad contact resistance and point contact aging testing device, which comprises a base, a first support, and a second support, the second support, straight line drive arrangement, treater and more than one contact probe, base one side is located to first support and second support branch, first support is used for the test pad that treats on the fixed external circuit board, the contact probe is located on the second support, it has first interface and second interface to open on the base, the one end of contact probe is connected with the treater electricity through the electric wire that passes first interface, the other end of contact probe corresponds with the test pad position of fixing on the external circuit board on first support of treating, and treat that test pad is connected with the treater electricity through the electric wire that passes the second interface, second support and base sliding fit, straight line drive arrangement's output is connected with the 2nd bracket driver. The utility model discloses can test the ageing contact resistance with the pad of the point contact of pad.
Description
Technical field
This utility model belongs to PCB field, particularly relates to a kind of contact pads resistance and point cantact
Ageing tester.
Background technology
PCB pad is typically to weld with the component pin on circuit board, it is achieved element is in circuit
Electrical connection.Wherein, component pin is in addition to welding with PCB, it is also possible to make component pin
With the electrical connection purpose that the pad being located on pcb board realizes element with the way of contact.In order to protect
Card electric property, component pin completely connects best with the copper face of pad, but in component pin and weldering
After the multiple-contact of rosette copper face, the contact resistance of pad and element can be made to increase so that pad with
Component pin electrical connection performance of component pin and pad after multiple-contact declines, i.e. pad
Point cantact aging.Therefore, for reasonable employment pad, need the point cantact to pad aging
Test with the contact resistance of pad.
Utility model content
For the deficiencies in the prior art, the purpose of this utility model is intended to provide a kind of pad to connect
Get an electric shock resistance and point cantact ageing tester, can be to the point cantact of pad by this test device
Aging and pad contact resistance is tested.
For achieving the above object, this utility model adopts the following technical scheme that
A kind of contact pads resistance and point cantact ageing tester, including pedestal, the first support,
Second support, linear drive apparatus, processor and more than one contact probe, first
Frame and the second support are divided into pedestal side, and the first support is for fixing treating on the external circuit board
Testing weld pad, contact probe is located on the second support, pedestal has first interface and second and connects
Mouthful, one end of contact probe is electrically connected with processor by the electric wire through first interface, contact
The other end of probe and the pad position to be tested on the external circuit board being fixed on the first support
Put correspondence, and for making electrical contact with pad to be tested, and pad to be tested is by connecing through second
The electric wire of mouth electrically connects with processor, and the second support is slidably matched with pedestal, linear drive apparatus
Outfan and the second carriage drive connect, be used for ordering about the second support away from near first
The side of support moves upward.
Preferably, above-mentioned a kind of contact pads resistance and point cantact ageing tester also include
Strap, this strap and the first support removably connect, strap and external pads
Removably connect.
Preferably, above-mentioned a kind of contact pads resistance and point cantact ageing tester fixing
Clamping plate are provided with a cavity, and this cavity and the first support enclose a groove, this groove for
External pads clamping.
Preferably, above-mentioned a kind of contact pads resistance and point cantact ageing tester also include
The more than one guide rail being fixed on pedestal, this guide rail and the second bracket slide coordinate.
Preferably, above-mentioned a kind of contact pads resistance and point cantact ageing tester also include
The more than one limit switch being located on guide rail.
Preferably, above-mentioned a kind of contact pads resistance and point cantact ageing tester spacing
Switch includes that limit base, location bar and surface are provided with the connector of scale, and limit base is located at pedestal
On, connector is stretched out by the side of the second support and covers on limit base, and limit base has limit
Position groove, connector has the port corresponding with stopper slot, and location bar runs through port and with spacing
Groove abuts and coordinates.
Preferably, above-mentioned a kind of contact pads resistance and the process of point cantact ageing tester
Device is a micro-ohm gauge.
Preferably, above-mentioned a kind of contact pads resistance and point cantact ageing tester also include
Controller, this controller electrically connects with linear drive apparatus.
Preferably, above-mentioned a kind of contact pads resistance and point cantact ageing tester fixing
The quantity of clamping plate is two or more.
Compared to existing technology, the beneficial effects of the utility model are:
Pad to be tested on the external circuit board is fixed, directly by this utility model by the first support
The outfan of line driving means drives the second support transporting away from near the direction of the first support
Dynamic, thus drive contact probe and pad to be tested electrical contact or disconnection, thus realize pad
Contact resistance and the aging test of point cantact.
Accompanying drawing explanation
Fig. 1 is overall structure figure of the present utility model；
Fig. 2 is strap structural representation of the present utility model；
In figure: 1, pedestal；2, the first support；3, the second support；4, contact probe；5,
One interface；6, the second interface；7, strap；71, cavity；8, guide rail；9, spacing
Switch；91, connector；92, location bar；93, port.
Detailed description of the invention
Below, in conjunction with accompanying drawing and detailed description of the invention, this utility model is described further:
Refer to Fig. 1 and Fig. 2, a kind of contact pads resistance and point cantact ageing tester,
Including pedestal the 1, first support the 2, second support 3, linear drive apparatus, processor and
More than one contact probe 4, the first support 2 and the second support 3 be divided into pedestal 1 side,
First support 2 is for fixing the pad to be tested on the external circuit board, and contact probe 4 is located at the
On two supports 3, pedestal 1 has first interface 5 and the second interface 6, contact probe 4
One end by electrically connecting through the electric wire of first interface 5 with processor, another of contact probe 4
Hold corresponding with the pad locations to be tested on the external circuit board being fixed on the first support 2, and
For making electrical contact with pad to be tested, and this pad to be tested is by the electricity through the second interface 6
Line electrically connects with processor, and the second support 3 is slidably matched with pedestal 1, linear drive apparatus
Outfan and the second support 3 drive connection, be used for ordering about the second support 3 away from near the
The side of one support 2 moves upward.
During use, drive the second support 3 towards near first by the outfan of linear drive apparatus
The direction motion of support 2, until contact probe 4 and the external electrical being fixed on the first support 2
Pad to be tested electrical contact on the plate of road, and make end and the outer member pin of contact probe 4
Contact point on external pads is corresponding, so, and processor and first interface 5, contact probe
4, pad to be tested and the second interface 6 sequentially turn on, and the existing letter that processor is built-in
One way sequence can calculate bond pad surface by the magnitude of voltage of bond pad surface to be tested and current value
Average contact resistance value, the outfan of linear drive apparatus drives the second support 3 away from afterwards
One support 2, contact probe 4 disconnects with pad to be tested, completes once to test.Treating
During the point cantact burn-in test of testing weld pad, only need to repeat above-mentioned test action, until processor
When the contact resistance value calculated and for the first time test obtain contact resistance value there is some difference,
Complete point cantact burn-in test.The difference set in the present embodiment is as when resistance change rate≤10%
Time, pad point cantact burn-in test to be tested is complete, wherein resistance change rate=(survey for the first time
The contact resistance value of contact resistance value-record for the last time)/contact the electricity that records for the first time
Resistance × 100%.Above-mentioned difference is not limited in the present embodiment regulation, it is also possible to according to be measured
Test weld dish electric property different from outer member sets.
Change the pad to be tested on the external circuit board on the first support 2 for convenience, as
A kind of preferred version, is also additionally arranged strap 7, by making strap 7 in the present embodiment
Removably connect with the first support 2, strap 7 and the dismounting of the first support 2 can be facilitated,
And by making strap 7 and the external circuit board removably connect, it is not only convenient for the external circuit board
With the dismounting of strap 7, also allow for changing the external circuit board being fixed on the first support 2
On pad to be tested.As a kind of preferred version, the present embodiment sets on strap 7
There is a cavity 71, and make this cavity 71 and the first support 2 enclose a groove, so can make
External pads and groove clamping, and groove bottom land is in test process, can abut with external pads,
Limit the movement of external pads, improve the degree of accuracy of test.
In order to limit the motion of the second support 3, as a kind of preferred version, in the present embodiment
It is fixed with more than one guide rail 8 on pedestal 1, and makes this guide rail 8 slide with the second support 3
Coordinate.
During in order to make contact probe 4 make electrical contact with external pads, contact probe 4 gives external pads
The pressure on surface is certain, as a kind of preferred version, is provided with in the present embodiment on guide rail 8
More than one limit switch 9, this limit switch 9 is possible not only to play treats testing weld pad
Position limitation protection effect, and contact probe 4 can be made to act on the pressure one on external pads surface
Fixed, improve test accuracy.Limit switch 9 in the present embodiment includes limit base, location bar
92 and surface be provided with the connector 91 of scale, limit base is located on pedestal 1, connector 91 by
The side of the second support 3 is stretched out and covers on limit base, and limit base has stopper slot, connects
Have the port 93 corresponding with stopper slot on part 91, location bar 92 run through port 93 and with limit
Position groove abuts and coordinates, and so, according to bar 92 position, scale regulation location, can conveniently set
Guard space.The limit switch 9 of other structures can certainly be used.
In order to improve measuring accuracy, can make processor is a micro-ohm gauge but it also may be it
His equipment.
In order to realize automatization, improve testing efficiency and accuracy, it is also possible to set up controller, and
Making controller electrically connect with linear drive apparatus, so, the existing simple program in controller is i.e.
Can control the outfan of linear drive apparatus according to the pressing speed set, compression frequency, by
The test parameterss such as the pressure degree of depth drive contact probe 4 to move, it is not necessary to people's manual operation, Ji Kejian
Single efficiently completing is tested.
In order to improve testing efficiency, it is also possible to the quantity making strap 7 is two or more, as
This just can carry out the test job of polylith pad to be tested simultaneously.
It will be apparent to those skilled in the art that can technical scheme as described above and structure
Think, make other various corresponding changes and deformation, and all these changes and deformation
Within all should belonging to this utility model scope of the claims.
Claims (9)
1. a contact pads resistance and point cantact ageing tester, it is characterised in that bag
Include pedestal, the first support, the second support, linear drive apparatus, processor and more than one
Contact probe, the first support and the second support be divided into pedestal side, and the first support is for solid
Determining the pad to be tested on the external circuit board, contact probe is located on the second support, pedestal is opened
Have first interface and the second interface, one end of contact probe by through first interface electric wire with
Processor electrically connects, the other end of contact probe and the external circuit board being fixed on the first support
On pad locations to be tested corresponding, and for making electrical contact with pad to be tested, and test weld to be measured
Dish is by electrically connecting through the electric wire of the second interface with processor, and the second support slides with pedestal and joins
Closing, the outfan of linear drive apparatus and the second carriage drive connect, and are used for ordering about the second support
Moving upward away from the side near the first support.
A kind of contact pads resistance the most according to claim 1 and point cantact burn-in test
Device, it is characterised in that also include strap, this strap and the first support are detachable
Connecting, strap removably connects with external pads.
A kind of contact pads resistance the most according to claim 2 and point cantact burn-in test
Device, it is characterised in that strap is provided with a cavity, this cavity and the first support enclose
Becoming a groove, this groove is used for and external pads clamping.
A kind of contact pads resistance the most according to claim 1 and point cantact burn-in test
Device, it is characterised in that also include the more than one guide rail being fixed on pedestal, this guide rail
Coordinate with the second bracket slide.
A kind of contact pads resistance the most according to claim 4 and point cantact burn-in test
Device, it is characterised in that also include the more than one limit switch being located on guide rail.
A kind of contact pads resistance the most according to claim 5 and point cantact burn-in test
Device, it is characterised in that limit switch includes that limit base, location bar and surface are provided with scale
Connector, limit base is located on pedestal, and connector is stretched out by the side of the second support and covers in limit
On the seat of position, limit base has stopper slot, connector has the port corresponding with stopper slot,
Location bar runs through port and abuts cooperation with stopper slot.
A kind of contact pads resistance the most according to claim 1 and point cantact burn-in test
Device, it is characterised in that processor is a micro-ohm gauge.
8. connect according to a kind of contact pads resistance described in claim 1-7 any one and point
Touch ageing tester, it is characterised in that also include controller, this controller and linear drives
Device electrically connects.
9. connect according to a kind of contact pads resistance described in claim 1-7 any one and point
Touch ageing tester, it is characterised in that the quantity of strap is two or more.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620276877.8U CN205656249U (en) | 2016-04-01 | 2016-04-01 | Pad contact resistance and point contact aging testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620276877.8U CN205656249U (en) | 2016-04-01 | 2016-04-01 | Pad contact resistance and point contact aging testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205656249U true CN205656249U (en) | 2016-10-19 |
Family
ID=57390788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620276877.8U Active CN205656249U (en) | 2016-04-01 | 2016-04-01 | Pad contact resistance and point contact aging testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205656249U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108241116A (en) * | 2016-12-27 | 2018-07-03 | 南宁富桂精密工业有限公司 | Circuit board testing device |
| CN109541467A (en) * | 2018-12-19 | 2019-03-29 | 深圳市正德智控股份有限公司 | A kind of test fixture of outer rotating motor stator |
| CN113589145A (en) * | 2020-11-20 | 2021-11-02 | 珠海艾派克微电子有限公司 | Tooling equipment and test system |
-
2016
- 2016-04-01 CN CN201620276877.8U patent/CN205656249U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108241116A (en) * | 2016-12-27 | 2018-07-03 | 南宁富桂精密工业有限公司 | Circuit board testing device |
| CN109541467A (en) * | 2018-12-19 | 2019-03-29 | 深圳市正德智控股份有限公司 | A kind of test fixture of outer rotating motor stator |
| CN113589145A (en) * | 2020-11-20 | 2021-11-02 | 珠海艾派克微电子有限公司 | Tooling equipment and test system |
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|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |