TW200606396A - Portable optical 3-D surface profilometer and method for same - Google Patents
Portable optical 3-D surface profilometer and method for sameInfo
- Publication number
- TW200606396A TW200606396A TW093123484A TW93123484A TW200606396A TW 200606396 A TW200606396 A TW 200606396A TW 093123484 A TW093123484 A TW 093123484A TW 93123484 A TW93123484 A TW 93123484A TW 200606396 A TW200606396 A TW 200606396A
- Authority
- TW
- Taiwan
- Prior art keywords
- light pattern
- structured light
- image
- structured
- profile
- Prior art date
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
Abstract
This invention relates to a portable optical 3-D surface profilometer and method for the same, to be implemented in a variety of fields, such as the general manufacturing process, quality control and inspection of precision components or devices in an on-line process or a compact area, or biomedical examination, for performing non-contact measurement of a surface profile of a 3-D object and outputting the 2-D image and 3-D profile dimensions of the object to be measured, including: an optical projection unit, for generating a structured light pattern; a portable miniaturized measurement probe unit, for receiving the structured light pattern transmitted by an image fiber, enlarging the structured light pattern to be projected onto a surface of an object for profile measurement, and capturing a deformed structured fringe image from the object; and a main control unit, connected to the optical projection unit and the portable miniaturized measurement probe unit, for modulating and outputting the structured light pattern and capturing and analyzing the deformed structured fringe image.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW93123484A TWI258000B (en) | 2004-08-05 | 2004-08-05 | Portable optical 3-D surface profilometer and method for same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW93123484A TWI258000B (en) | 2004-08-05 | 2004-08-05 | Portable optical 3-D surface profilometer and method for same |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200606396A true TW200606396A (en) | 2006-02-16 |
TWI258000B TWI258000B (en) | 2006-07-11 |
Family
ID=37765130
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW93123484A TWI258000B (en) | 2004-08-05 | 2004-08-05 | Portable optical 3-D surface profilometer and method for same |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI258000B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI463106B (en) * | 2011-09-22 | 2014-12-01 | Omron Tateisi Electronics Co | Optical measuring apparatus |
TWI490444B (en) * | 2009-01-23 | 2015-07-01 | Univ Nat Taipei Technology | Slit-scan microscopic system and method using the same |
US11644296B1 (en) | 2021-12-17 | 2023-05-09 | Industrial Technology Research Institute | 3D measuring equipment and 3D measuring method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5753500B2 (en) * | 2012-01-27 | 2015-07-22 | 新日鐵住金株式会社 | Brake disc waviness measuring device for railway wheels with brake disc |
-
2004
- 2004-08-05 TW TW93123484A patent/TWI258000B/en not_active IP Right Cessation
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI490444B (en) * | 2009-01-23 | 2015-07-01 | Univ Nat Taipei Technology | Slit-scan microscopic system and method using the same |
TWI463106B (en) * | 2011-09-22 | 2014-12-01 | Omron Tateisi Electronics Co | Optical measuring apparatus |
US11644296B1 (en) | 2021-12-17 | 2023-05-09 | Industrial Technology Research Institute | 3D measuring equipment and 3D measuring method |
TWI806294B (en) * | 2021-12-17 | 2023-06-21 | 財團法人工業技術研究院 | 3d measuring equipment and 3d measuring method |
Also Published As
Publication number | Publication date |
---|---|
TWI258000B (en) | 2006-07-11 |
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Legal Events
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MM4A | Annulment or lapse of patent due to non-payment of fees |