TW200606396A - Portable optical 3-D surface profilometer and method for same - Google Patents

Portable optical 3-D surface profilometer and method for same

Info

Publication number
TW200606396A
TW200606396A TW093123484A TW93123484A TW200606396A TW 200606396 A TW200606396 A TW 200606396A TW 093123484 A TW093123484 A TW 093123484A TW 93123484 A TW93123484 A TW 93123484A TW 200606396 A TW200606396 A TW 200606396A
Authority
TW
Taiwan
Prior art keywords
light pattern
structured light
image
structured
profile
Prior art date
Application number
TW093123484A
Other languages
Chinese (zh)
Other versions
TWI258000B (en
Inventor
Liang-Chia Chen
Chung-Chih Huang
Original Assignee
Univ Nat Taipei Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Nat Taipei Technology filed Critical Univ Nat Taipei Technology
Priority to TW93123484A priority Critical patent/TWI258000B/en
Publication of TW200606396A publication Critical patent/TW200606396A/en
Application granted granted Critical
Publication of TWI258000B publication Critical patent/TWI258000B/en

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  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

This invention relates to a portable optical 3-D surface profilometer and method for the same, to be implemented in a variety of fields, such as the general manufacturing process, quality control and inspection of precision components or devices in an on-line process or a compact area, or biomedical examination, for performing non-contact measurement of a surface profile of a 3-D object and outputting the 2-D image and 3-D profile dimensions of the object to be measured, including: an optical projection unit, for generating a structured light pattern; a portable miniaturized measurement probe unit, for receiving the structured light pattern transmitted by an image fiber, enlarging the structured light pattern to be projected onto a surface of an object for profile measurement, and capturing a deformed structured fringe image from the object; and a main control unit, connected to the optical projection unit and the portable miniaturized measurement probe unit, for modulating and outputting the structured light pattern and capturing and analyzing the deformed structured fringe image.
TW93123484A 2004-08-05 2004-08-05 Portable optical 3-D surface profilometer and method for same TWI258000B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW93123484A TWI258000B (en) 2004-08-05 2004-08-05 Portable optical 3-D surface profilometer and method for same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW93123484A TWI258000B (en) 2004-08-05 2004-08-05 Portable optical 3-D surface profilometer and method for same

Publications (2)

Publication Number Publication Date
TW200606396A true TW200606396A (en) 2006-02-16
TWI258000B TWI258000B (en) 2006-07-11

Family

ID=37765130

Family Applications (1)

Application Number Title Priority Date Filing Date
TW93123484A TWI258000B (en) 2004-08-05 2004-08-05 Portable optical 3-D surface profilometer and method for same

Country Status (1)

Country Link
TW (1) TWI258000B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI463106B (en) * 2011-09-22 2014-12-01 Omron Tateisi Electronics Co Optical measuring apparatus
TWI490444B (en) * 2009-01-23 2015-07-01 Univ Nat Taipei Technology Slit-scan microscopic system and method using the same
US11644296B1 (en) 2021-12-17 2023-05-09 Industrial Technology Research Institute 3D measuring equipment and 3D measuring method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5753500B2 (en) * 2012-01-27 2015-07-22 新日鐵住金株式会社 Brake disc waviness measuring device for railway wheels with brake disc

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI490444B (en) * 2009-01-23 2015-07-01 Univ Nat Taipei Technology Slit-scan microscopic system and method using the same
TWI463106B (en) * 2011-09-22 2014-12-01 Omron Tateisi Electronics Co Optical measuring apparatus
US11644296B1 (en) 2021-12-17 2023-05-09 Industrial Technology Research Institute 3D measuring equipment and 3D measuring method
TWI806294B (en) * 2021-12-17 2023-06-21 財團法人工業技術研究院 3d measuring equipment and 3d measuring method

Also Published As

Publication number Publication date
TWI258000B (en) 2006-07-11

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