TW200603682A - Ion balancing sensor - Google Patents

Ion balancing sensor

Info

Publication number
TW200603682A
TW200603682A TW094118718A TW94118718A TW200603682A TW 200603682 A TW200603682 A TW 200603682A TW 094118718 A TW094118718 A TW 094118718A TW 94118718 A TW94118718 A TW 94118718A TW 200603682 A TW200603682 A TW 200603682A
Authority
TW
Taiwan
Prior art keywords
ion
antenna
charged
balance
gate electrode
Prior art date
Application number
TW094118718A
Other languages
English (en)
Other versions
TWI304710B (zh
Inventor
Kazuo Okano
Original Assignee
Kazuo Okano
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kazuo Okano filed Critical Kazuo Okano
Publication of TW200603682A publication Critical patent/TW200603682A/zh
Application granted granted Critical
Publication of TWI304710B publication Critical patent/TWI304710B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/403—Cells and electrode assemblies
    • G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/403—Cells and electrode assemblies
    • G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
    • G01N27/4148—Integrated circuits therefor, e.g. fabricated by CMOS processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Immunology (AREA)
  • Electrochemistry (AREA)
  • Computer Hardware Design (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Elimination Of Static Electricity (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
TW094118718A 2004-07-05 2005-06-07 Ion balancing sensor TW200603682A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004198346A JP4097633B2 (ja) 2004-07-05 2004-07-05 イオンバランスセンサ

Publications (2)

Publication Number Publication Date
TW200603682A true TW200603682A (en) 2006-01-16
TWI304710B TWI304710B (zh) 2008-12-21

Family

ID=35782589

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094118718A TW200603682A (en) 2004-07-05 2005-06-07 Ion balancing sensor

Country Status (6)

Country Link
US (1) US20070229087A1 (zh)
JP (1) JP4097633B2 (zh)
KR (1) KR101217004B1 (zh)
CN (1) CN100543467C (zh)
TW (1) TW200603682A (zh)
WO (1) WO2006003777A1 (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4861126B2 (ja) * 2006-11-06 2012-01-25 一雄 岡野 空間電荷バランス制御システム
JP2009053074A (ja) * 2007-08-28 2009-03-12 Shishido Seidenki Kk 電界検出装置
US8735887B2 (en) * 2010-06-03 2014-05-27 Sharp Kabushiki Kaisha Ion sensor and display device
FR2969294A1 (fr) * 2010-12-17 2012-06-22 Alcatel Lucent Procede de regeneration d'un capteur d'hydrogene
MX2018002063A (es) 2018-02-19 2018-08-01 Orlando Castro Cabrera Luis Proceso para hacer resistente a tiodicarb (carbamato) y bifentrina (piretroide) a un consorcio de bacterias nitrificantes, solubilizadores de fosforo y antagonistas de algunos patogenos, para ser usados en bioabonos liquidos para ser aplicados de manera edafica y/o foliar.
MX2018002087A (es) 2018-02-19 2018-08-01 Orlando Castro Cabrera Luis Proceso para hacer resistentes a tiodicarb (carbamato) y bifentrina (piretroide) a un consorcio de hongos solubilizadores de fosforo y antagonistas de algunos patogenos, para ser usados en bioabonos liquidos para ser aplicados de manera edafica y/o foliar.
MX2018002120A (es) 2018-02-19 2018-08-01 Orlando Castro Cabrera Luis Consorcio de bacterias mineralizadoras de lipidos, almidones y azucares (hidratos de carbono) resistentes a dosis letales de tiodicarb (carbamato) y bifentrina (piretroides) para ser inoculado en materia organica de diferente procedencia.
JP7190129B2 (ja) * 2018-10-01 2022-12-15 ヒューグルエレクトロニクス株式会社 イオン分布可視化装置及びイオン分布可視化システム
KR102005759B1 (ko) * 2018-12-06 2019-07-31 서종호 정전기 제거장치 및 정전기 제거장치의 제조방법
KR102295099B1 (ko) * 2019-10-04 2021-08-31 한국전자기술연구원 이온밸런스 측정센서 및 그 측정방법, 이온밸런스 측정센서를 이용한 이온밸런스 조절장치 및 그 조절방법
WO2022092376A1 (ko) * 2020-11-02 2022-05-05 한국전자기술연구원 이온밸런스 측정센서 및 그 측정방법, 이온밸런스 측정센서를 이용한 이온밸런스 조절장치 및 그 조절방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4213088A (en) * 1978-10-20 1980-07-15 Rca Corporation Voltage measuring circuit
US4367948A (en) * 1979-04-24 1983-01-11 Canon Kabushiki Kaisha Surface potential electrometer and image forming apparatus using the same
JPS61160051A (ja) * 1985-01-07 1986-07-19 Mikuni Kiden Kogyo Kk 陰陽イオン検出器
JP2000046799A (ja) * 1998-07-24 2000-02-18 Katsuo Ebara イオンセンサ
US6252756B1 (en) * 1998-09-18 2001-06-26 Illinois Tool Works Inc. Low voltage modular room ionization system
JP4412764B2 (ja) * 1999-06-29 2010-02-10 フィーサ株式会社 正負イオン量測定装置
JP2004063427A (ja) * 2002-07-31 2004-02-26 Sunx Ltd 除電装置

Also Published As

Publication number Publication date
KR101217004B1 (ko) 2012-12-31
TWI304710B (zh) 2008-12-21
JP4097633B2 (ja) 2008-06-11
KR20070042117A (ko) 2007-04-20
WO2006003777A1 (ja) 2006-01-12
JP2006019650A (ja) 2006-01-19
CN100543467C (zh) 2009-09-23
CN1950697A (zh) 2007-04-18
US20070229087A1 (en) 2007-10-04

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees