TW200602649A - Parallel calibration system for a test device - Google Patents

Parallel calibration system for a test device

Info

Publication number
TW200602649A
TW200602649A TW094108059A TW94108059A TW200602649A TW 200602649 A TW200602649 A TW 200602649A TW 094108059 A TW094108059 A TW 094108059A TW 94108059 A TW94108059 A TW 94108059A TW 200602649 A TW200602649 A TW 200602649A
Authority
TW
Taiwan
Prior art keywords
test
calibration system
test device
parallel calibration
device under
Prior art date
Application number
TW094108059A
Other languages
English (en)
Other versions
TWI371589B (en
Inventor
Romi Mayder
Todd Sholl
Nasser Ali Jafari
Andrew Tse
Randy L Bailey
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of TW200602649A publication Critical patent/TW200602649A/zh
Application granted granted Critical
Publication of TWI371589B publication Critical patent/TWI371589B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
TW094108059A 2004-07-08 2005-03-16 Parallel calibration system for an electronic tester or a test device and method for operating an electronic test device TWI371589B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/886,848 US7106081B2 (en) 2004-07-08 2004-07-08 Parallel calibration system for a test device

Publications (2)

Publication Number Publication Date
TW200602649A true TW200602649A (en) 2006-01-16
TWI371589B TWI371589B (en) 2012-09-01

Family

ID=35540652

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094108059A TWI371589B (en) 2004-07-08 2005-03-16 Parallel calibration system for an electronic tester or a test device and method for operating an electronic test device

Country Status (3)

Country Link
US (1) US7106081B2 (zh)
CN (1) CN1719275A (zh)
TW (1) TWI371589B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI493904B (zh) * 2012-10-18 2015-07-21 Zhen Ding Technology Co Ltd 射頻特性測試設備

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DE102004052246B3 (de) * 2004-10-27 2006-06-14 Infineon Technologies Ag Halbleiterbauelement, Anordnung und Verfahren zur Charakterisierung eines Prüfgerätes für Halbleiterbauelemente
US20070132471A1 (en) * 2005-12-13 2007-06-14 Carlson Gregory F Method and apparatus for testing integrated circuits over a range of temperatures
US7362632B2 (en) * 2006-01-17 2008-04-22 Infineon Technologies Ag Test parallelism increase by tester controllable switching of chip select groups
US7502974B2 (en) 2006-02-22 2009-03-10 Verigy (Singapore) Pte. Ltd. Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets
KR100736680B1 (ko) * 2006-08-10 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치의 캘리브레이션 방법
CN101453279B (zh) * 2007-11-29 2012-09-05 纮华电子科技（上海）有限公司 共享标准校正表的平行测试系统及方法
US7680615B2 (en) * 2008-01-25 2010-03-16 Azurewave Technologies, Inc. Parallel testing system with shared golden calibration table and method thereof
CN102340427B (zh) * 2010-07-28 2016-04-27 中山市云创知识产权服务有限公司 网络接口测试电路
TW201401810A (zh) * 2012-06-29 2014-01-01 Askey Computer Corp 無線網路裝置測試設備的檢驗方法
CN104833678A (zh) * 2014-02-11 2015-08-12 京元电子股份有限公司 半导体元件测试系统及其影像处理加速方法
CN104535950B (zh) * 2014-12-19 2018-01-16 中国船舶重工集团公司第七0九研究所 集成电路测试系统的多通道对称校准的方法及其接口转换装置
TWI591362B (zh) * 2015-02-13 2017-07-11 何恆春 自動調校半導體元件測試機台之方法
US10345418B2 (en) * 2015-11-20 2019-07-09 Teradyne, Inc. Calibration device for automatic test equipment

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US3832575A (en) * 1972-12-27 1974-08-27 Ibm Data bus transmission line termination circuit
US5083083A (en) * 1986-09-19 1992-01-21 Actel Corporation Testability architecture and techniques for programmable interconnect architecture
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5262716A (en) * 1992-04-21 1993-11-16 Hewlett-Packard Company Tester calibration procedure which includes fixturing
US5550466A (en) * 1994-09-30 1996-08-27 Hewlett-Packard Company Hinged conduit for routing cables in an electronic circuit tester
US5539305A (en) * 1994-10-03 1996-07-23 Botka; Julius K. Calibration board for an electronic circuit tester
US6192496B1 (en) * 1997-11-26 2001-02-20 Agilent Technologies, Inc. System for verifying signal timing accuracy on a digital testing device
US6025708A (en) * 1997-11-26 2000-02-15 Hewlett Packard Company System for verifying signal voltage level accuracy on a digital testing device
US6114869A (en) * 1998-05-21 2000-09-05 Cerprobe Corporation Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards
US6492797B1 (en) * 2000-02-28 2002-12-10 Schlumberger Technologies, Inc. Socket calibration method and apparatus
CN100573176C (zh) * 2001-06-07 2009-12-23 株式会社艾德温特斯特 半导体试验装置的校准方法
US6570397B2 (en) * 2001-08-07 2003-05-27 Agilent Technologies, Inc. Timing calibration and timing calibration verification of electronic circuit testers
US6931338B2 (en) * 2003-01-07 2005-08-16 Guide Technology, Inc. System for providing a calibrated path for multi-signal cables in testing of integrated circuits
US6876938B2 (en) * 2003-01-07 2005-04-05 Guide Technology, Inc. Method to provide a calibrated path for multi-signal cables in testing of integrated circuits
US6956365B2 (en) * 2003-04-08 2005-10-18 Credence Systems Corporation System and method for calibration of testing equipment using device photoemission
DE10333101B4 (de) * 2003-07-21 2008-05-21 Qimonda Ag Kalibrierungseinrichtung für die Kalibrierung eines Testerkanals einer Testereinrichtung, Testersystem und Verfahren zum Kalibrieren eines Testerkanals

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI493904B (zh) * 2012-10-18 2015-07-21 Zhen Ding Technology Co Ltd 射頻特性測試設備

Also Published As

Publication number Publication date
US7106081B2 (en) 2006-09-12
US20060006896A1 (en) 2006-01-12
CN1719275A (zh) 2006-01-11
TWI371589B (en) 2012-09-01

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