TWI371589B - Parallel calibration system for an electronic tester or a test device and method for operating an electronic test device - Google Patents
Parallel calibration system for an electronic tester or a test device and method for operating an electronic test deviceInfo
- Publication number
- TWI371589B TWI371589B TW094108059A TW94108059A TWI371589B TW I371589 B TWI371589 B TW I371589B TW 094108059 A TW094108059 A TW 094108059A TW 94108059 A TW94108059 A TW 94108059A TW I371589 B TWI371589 B TW I371589B
- Authority
- TW
- Taiwan
- Prior art keywords
- test device
- electronic
- operating
- calibration system
- tester
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/886,848 US7106081B2 (en) | 2004-07-08 | 2004-07-08 | Parallel calibration system for a test device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200602649A TW200602649A (en) | 2006-01-16 |
TWI371589B true TWI371589B (en) | 2012-09-01 |
Family
ID=35540652
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094108059A TWI371589B (en) | 2004-07-08 | 2005-03-16 | Parallel calibration system for an electronic tester or a test device and method for operating an electronic test device |
Country Status (3)
Country | Link |
---|---|
US (1) | US7106081B2 (zh) |
CN (1) | CN1719275A (zh) |
TW (1) | TWI371589B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108291937A (zh) * | 2015-11-20 | 2018-07-17 | 泰拉丁公司 | 用于自动测试设备的校准装置 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004052246B3 (de) * | 2004-10-27 | 2006-06-14 | Infineon Technologies Ag | Halbleiterbauelement, Anordnung und Verfahren zur Charakterisierung eines Prüfgerätes für Halbleiterbauelemente |
US20070132471A1 (en) * | 2005-12-13 | 2007-06-14 | Carlson Gregory F | Method and apparatus for testing integrated circuits over a range of temperatures |
US7362632B2 (en) * | 2006-01-17 | 2008-04-22 | Infineon Technologies Ag | Test parallelism increase by tester controllable switching of chip select groups |
US7502974B2 (en) | 2006-02-22 | 2009-03-10 | Verigy (Singapore) Pte. Ltd. | Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets |
KR100736680B1 (ko) * | 2006-08-10 | 2007-07-06 | 주식회사 유니테스트 | 반도체 소자 테스트 장치의 캘리브레이션 방법 |
CN101453279B (zh) * | 2007-11-29 | 2012-09-05 | 纮华电子科技(上海)有限公司 | 共享标准校正表的平行测试系统及方法 |
US7680615B2 (en) * | 2008-01-25 | 2010-03-16 | Azurewave Technologies, Inc. | Parallel testing system with shared golden calibration table and method thereof |
CN102340427B (zh) * | 2010-07-28 | 2016-04-27 | 中山市云创知识产权服务有限公司 | 网络接口测试电路 |
TW201401810A (zh) * | 2012-06-29 | 2014-01-01 | Askey Computer Corp | 無線網路裝置測試設備的檢驗方法 |
CN103780314A (zh) * | 2012-10-18 | 2014-05-07 | 富葵精密组件(深圳)有限公司 | 射频特性测试设备 |
CN104833678A (zh) * | 2014-02-11 | 2015-08-12 | 京元电子股份有限公司 | 半导体元件测试系统及其影像处理加速方法 |
CN104535950B (zh) * | 2014-12-19 | 2018-01-16 | 中国船舶重工集团公司第七0九研究所 | 集成电路测试系统的多通道对称校准的方法及其接口转换装置 |
TWI591362B (zh) * | 2015-02-13 | 2017-07-11 | 何恆春 | 自動調校半導體元件測試機台之方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3832575A (en) * | 1972-12-27 | 1974-08-27 | Ibm | Data bus transmission line termination circuit |
US5083083A (en) * | 1986-09-19 | 1992-01-21 | Actel Corporation | Testability architecture and techniques for programmable interconnect architecture |
US5212443A (en) * | 1990-09-05 | 1993-05-18 | Schlumberger Technologies, Inc. | Event sequencer for automatic test equipment |
US5262716A (en) * | 1992-04-21 | 1993-11-16 | Hewlett-Packard Company | Tester calibration procedure which includes fixturing |
US5550466A (en) * | 1994-09-30 | 1996-08-27 | Hewlett-Packard Company | Hinged conduit for routing cables in an electronic circuit tester |
US5539305A (en) * | 1994-10-03 | 1996-07-23 | Botka; Julius K. | Calibration board for an electronic circuit tester |
US6192496B1 (en) * | 1997-11-26 | 2001-02-20 | Agilent Technologies, Inc. | System for verifying signal timing accuracy on a digital testing device |
US6025708A (en) * | 1997-11-26 | 2000-02-15 | Hewlett Packard Company | System for verifying signal voltage level accuracy on a digital testing device |
US6114869A (en) * | 1998-05-21 | 2000-09-05 | Cerprobe Corporation | Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards |
US6492797B1 (en) * | 2000-02-28 | 2002-12-10 | Schlumberger Technologies, Inc. | Socket calibration method and apparatus |
CN1677123A (zh) * | 2001-06-07 | 2005-10-05 | 株式会社艾德温特斯特 | 半导体试验装置的校准方法 |
US6570397B2 (en) | 2001-08-07 | 2003-05-27 | Agilent Technologies, Inc. | Timing calibration and timing calibration verification of electronic circuit testers |
US6876938B2 (en) * | 2003-01-07 | 2005-04-05 | Guide Technology, Inc. | Method to provide a calibrated path for multi-signal cables in testing of integrated circuits |
US6931338B2 (en) * | 2003-01-07 | 2005-08-16 | Guide Technology, Inc. | System for providing a calibrated path for multi-signal cables in testing of integrated circuits |
US6956365B2 (en) * | 2003-04-08 | 2005-10-18 | Credence Systems Corporation | System and method for calibration of testing equipment using device photoemission |
DE10333101B4 (de) * | 2003-07-21 | 2008-05-21 | Qimonda Ag | Kalibrierungseinrichtung für die Kalibrierung eines Testerkanals einer Testereinrichtung, Testersystem und Verfahren zum Kalibrieren eines Testerkanals |
-
2004
- 2004-07-08 US US10/886,848 patent/US7106081B2/en not_active Expired - Lifetime
-
2005
- 2005-03-16 TW TW094108059A patent/TWI371589B/zh active
- 2005-03-22 CN CN200510056470.0A patent/CN1719275A/zh active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108291937A (zh) * | 2015-11-20 | 2018-07-17 | 泰拉丁公司 | 用于自动测试设备的校准装置 |
Also Published As
Publication number | Publication date |
---|---|
CN1719275A (zh) | 2006-01-11 |
US20060006896A1 (en) | 2006-01-12 |
US7106081B2 (en) | 2006-09-12 |
TW200602649A (en) | 2006-01-16 |
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