200535431 五、發明說明（1) 【發明所屬之技術領域】 本發明係提供一種各取料機構係獨立作動，可易於提 升組裝精度及載送速度，進而更加提高檢測效率之I C檢 測裝置（二）。 【先前技術】 按，請參閱第1〜5圖所示，係為申請人先前申請之 台灣專利申請第88217626號「I C檢測裝置」專利案，其 係於測試台1之上方設有一橫移機構2及二升降機構3、 4 ，該橫移機構2係於機架兩側設有橫向滑塊5供具橫向 滑座7之直立板體6滑置組裝，而各直立板體6間設有一 ® 支架8 ，該支架8以螺套螺合一橫向螺桿9 ，該橫向螺桿 9由一馬達1 0驅動，進而可帶動支架8及直立板體6橫 移作動，另於直立板體6側面設有直立滑塊1 1 ，供二升 降機構3 、4之橫向支架1 2 、1 3以直立滑座1 4、 1 5滑置組裝，另於各支架1 2 、1 3之底面設有吸嘴 1 6 、1 7 ，並於頂面設有一貫穿橫移機構2支架8之縱 向螺桿1 8 、1 9 ，該縱向螺桿1 8 、1 9由二馬達 2 0、2 1驅動，進而二升降機構3 、4可分別帶動吸嘴 1 6 、1 7升降作動，又該測試台1之兩側設有具數載台 修 之載台機構22 、23 ，該二載台機構22 、23之前、 後方設有一入料機構2 4及取料機構2 5 ;藉此，當一載 台機構2 2之載台將I C載送至測試台1側方時，二組升 降機構3 、4即同步下降，令一組升降機構3之吸嘴1 6 吸取I C ，而後該橫移機構2即帶動二組升降機構3 、4200535431 V. Description of the invention (1) [Technical field to which the invention belongs] The present invention provides an IC detection device that independently operates each reclaiming mechanism, which can easily improve assembly accuracy and loading speed, and further improve detection efficiency (2) . [Prior technology] Press, please refer to Figures 1 to 5, which are Taiwan patent application No. 88217626 "IC testing device" patent application previously applied by the applicant, which is provided with a traverse mechanism above the test bench 1. 2 and 2 lifting mechanisms 3 and 4, the traverse mechanism 2 is provided with lateral sliders 5 on both sides of the frame, and the vertical plates 6 provided with the horizontal slide 7 are assembled by sliding, and each of the vertical plates 6 is provided with a ® bracket 8, the bracket 8 is screwed with a transverse screw 9, which is driven by a motor 10, which can drive the bracket 8 and the upright plate 6 to move laterally, and the side of the upright plate 6 is provided There are upright sliders 1 1 for the horizontal brackets 1 2 and 1 3 of the two lifting mechanisms 3 and 4 to be assembled by upright sliding seats 1 4 and 1 5. There are suction nozzles on the bottom surface of each bracket 1 2 and 1 3 1 6, 1 7, and a longitudinal screw 1 8, 1 9 penetrating through the bracket 8 of the traverse mechanism 2 is provided on the top surface. The longitudinal screws 1 8, 19 are driven by two motors 20, 21, and then two lifting mechanisms. 3 and 4 can drive the suction nozzles 1 6 and 1 7 to move up and down respectively, and two sides of the test bench 1 are provided with a carrier mechanism 22 and 23 with a number of carrier repairs. Before and after the two carrier mechanisms 22 and 23, a feeding mechanism 24 and a reclaiming mechanism 25 are provided; thereby, when the carrier of the carrier mechanism 2 2 carries the IC to the side of the test platform 1, The two groups of lifting mechanisms 3 and 4 descend simultaneously, so that the suction nozzles 16 of one group of lifting mechanisms 3 suck the IC, and then the traverse mechanism 2 drives the two groups of lifting mechanisms 3 and 4.
第5頁 200535431 五、發明說明（2) 同步反向位移，使已吸取丨c 置入於測試台1中進行測試，而另：：構3下降’將1 c 之載台機構2 3上吸取丨c，' 升降機構4則於同側 機構2再次帶動二組升降 ？ 松剩完畢後，該橫移 “、！7下降分別作放=及2向位移’令各吸嘴 檢測裝置雖可提升工〇測 =:I C動作；惟’該 機構係以支架橫向遠 〃、 產率，但由於二升降 各機斷搭配：ir度；：：=而相互同t作動，其 易且費時，若組裝精度較 °以致組裝上相當不 ，以令各機構間可順r二:=減緩各機構之載送 :測:式作業時間缩短至最佳化，另動’致使無法有效 日守，即相互牽動而敕w另田其—機構稍有卡掣 改良。 …作動之順暢性，故實有待加以 【發明内容】 本發明之φ西 ί係於刪試台之兩：：ίί:ι 1。檢測裝置（-) 该第一、二 侧5又有具取料器之第一— （一）， 構，並由=σ料機構於機架上均設有g ~取料機構， 位f 一驅動源驅動，册 尹' 矛夕結構及升 匕進而該第1:機：；取料器各別作 構吸取IC，；：謂試，而第二取料機並 I出料機構上出取料，構於I C測試完畢後私至入料機 二挪試，此時第二而第二取料機構即將I 、則載送至 本發明之久 取料機構再會费 、 c戰送至測1 之各取料機構係：：：重覆進行取料作举㈣4 獨立作動，元件搭配級！。此， I 間易，毋Page 5 200535431 V. Description of the invention (2) Synchronous reverse displacement, so that the sucked 丨 c is placed in the test bench 1 for testing, and the other :: structure 3 is lowered 'and the 1 c carrier mechanism 2 3 is sucked up丨 c, 'The lifting mechanism 4 drives the two sets of lifting again on the same side mechanism 2? After the loosening is completed, the traverse ",! 7 drop and put down = and two-way displacement, respectively" so that each nozzle detection device can improve the work. Measure =: IC action; but 'The mechanism uses the bracket horizontally far away, Yield, but because the two lifts are broken together: ir degrees; :: = and act on each other at the same time, it is easy and time consuming, if the assembly accuracy is relatively °, so that the assembly is quite different, so that the agencies can go smoothly: = Slow down the loading and unloading of various agencies: Measurement: The type of operation time has been shortened to the optimal level, and other actions have made it impossible to effectively guard the day, that is, they are intertwined with each other—the agency has slightly improved the mechanism. Therefore, it needs to be added. [Content of the invention] The invention of the present invention is to delete the two test benches :: ί: ι 1. Detection device (-) The first and two sides 5 have a first with a picker- (1), the structure is equipped with a g ~ reclaiming mechanism on the frame by the = σ material mechanism, and is driven by a driving source f, and the structure and lifting mechanism of the yinxian and the first machine: Each of the feeders is configured to pick up the IC ;: Pre-test, and the second picker is used to pick up the material on the discharge mechanism. The feeder 2 is moved to test. At this time, the second and second reclaiming mechanism is about to be delivered to the long-term reclaiming mechanism of the present invention, and the repayment fee and c are sent to test 1. Repeat the picking operation. 4 Independent operation, component matching level! Therefore, I is easy, no
第6頁 200535431 五、發明說明（3) 須費時組裝，而易於提升組裝精度，以增快各取料機構之 位移速度，而縮短載送時間，達到更加有效提高檢測效率 之實用效益。 【實施方式】 為使 貴審查委員對本發明作更進一步之瞭解，茲舉 一較佳實施例並配合圖式，詳述如后： 請參閱第6〜1 1圖所示，該檢測裝置包含有測試台 3 〇、第一、二取料機構4 0、5 0及入、出料機構 6 0 、7 0 ，其中，該測試台3 0之兩側設有第一、二取 料機構4 0、5 0 ，各取料機構均設有相互組裝之橫移結 構及升降結構，各橫移結構係於機架上設有橫向滑執 4 1 、5 1及橫向螺桿4 2、5 2 ，而橫向螺桿4 2、 5 2由一馬達4 3 、5 3驅動，一具有螺套4 4 1 、 5 4 1及橫向滑座4 4 2、5 4 2之滑動件4 4、5 4 ， 係滑置且螺合於橫向滑執4 1 、5 1及橫向螺桿4 2、 5 2上，並於另面設有縱向滑座4 4 3 、5 4 3 ，而升降 結構係於一底面具吸嘴之取料器4 5 、5 5側面設有縱向 滑執4 5 1 、5 5 1 ，以滑置於滑動件4 4、5 4之縱向 滑座4 4 3 、5 4 3中，該橫移結構另於取料器4 5 、 5 5之頂面設有一橫向滑座4 5 2 、5 5 2 ，以滑置於一 支架4 6 、5 6之橫向滑軌4 6 1 、5 6 1上，而升降結 構並於該支架4 6 、5 6之另面設有二縱向滑座4 6 2 、 ’ 5 6 2及一螺套4 6 3 、5 6 3 ，以分別組裝於機架之縱 向滑執4 7、5 7及縱向螺桿4 8、5 8上，而縱向螺桿 200535431 五、發明說明（4) 48 、58由一馬達49 、 之馬達4 3 、5 3驅動橫向 動件4 4、5 4之橫向滑座 4 5 、5 5之橫向滑座4 5 軌41 、51及支架46、 5 6 1上作X方向往復位移 4 9、5 9驅動縱向螺桿4 4 6 、5 6之縱向滑座4 6 5 5之縱向滑執4 5 1 、5 4 7、5 7及滑動件4 4、 5 4 3上作Z方向往復位移 構7 0係分別設於測試台3 台6 1 、7 1之載台結構， 6 2、7 2之取放結構，用 藉此，請參閱第1 2 、 之吸嘴6 2係將I C放置於 至第一取料機構4 0之取料 4 0之馬達4 9即驅動縱向 取料器4 5下降，令取料器 1C，並上升復位，而載台 I C ； 請參閱第1 1 、1 3 、 40之二馬達49 、43即 4 2 ，以帶動支架4 6 、滑 9驅動，進而當各橫移結構 桿4 2 、5 2時，即帶動滑 42 、542及取料器 、5 5 2 ，於機架之橫向滑 6之橫向滑執4 6 1 、 而當各升降結構之馬達 、5 8時，即帶動支架 、5 6 2及取料器4 5、 1 ，於機架之縱向滑執 4之縱向滑座4 4 3、 另該入料機構6 0及出料機 之前、後方，各設有一具載 以載送I C ，及一具有吸嘴 取放I C， 3圖所示，該入料機構6 0 台61上，以載台61載送 4 5下方，該第一取料機構 桿4 8 ，以帶動支架4 6及 5之吸嘴於載台6 1上吸取 1再反向位移復位以承載 4圖所示，該第一取料機構 別驅動縱、橫向螺桿4 8 、 件4 4及取料器4 5同步作 200535431 五、發明說明（5) X -- Z方向位移，將取料器4 5上之I C置入於測試台 3 0中進行測試作業，在此同時，入料機構6 0之載台 6 1再載送另一 I C至測試台3 0之側方，而第二取料機 構5 0之馬達5 3即驅動橫向螺桿5 2 ，以帶動滑動件 5 4及取料器5 5作X方向位移，令取料器5 5位於入料 機構6 0之載台6 1上方，再以另一馬達5 9驅動縱向螺 桿5 8 ，而帶動支架5 6及取料器5 5下降，令取料器 5 5之吸嘴吸取I C，並反向位移復位； 請參閱第1 1 、1 5 、1 6圖所示，當第一取料機構 4 0之I C檢測完畢後，即由二馬達4 9 、4 3驅動縱、® 橫向螺桿4 8、4 2 ，以帶動取料器4 5於各橫向滑軌 4 1 、4 6 1上橫向位移至出料機構7 0之載台7 1上 方，並令取料器4 5下降將I C放置於載台7 1上送出， 在此同時，第二取料機構5 0之二馬達5 9 、5 3即分別 驅動縱、橫向螺桿5 8 、5 2 ，以帶動支架5 6 、滑動件 5 4及取料器5 5同步作X — Z方向位移，將取料器5 5 上之I C置入於測試台3 0中進行測試作業，當第二取料 機構5 0之I C作測試時，該第一取料機構4 0之取料器 4 5即反向位移作動，而再次於入料機構6 0之載台6 1 φ 上吸附I C ，當第二取料機構5 0之取料器5 5將測試完 之I C放置於出料機構7 0之載台7 1上送出時，第一取 料機構4 0即可將I C置入於測試台3 0中進行測試，因 此，該第一、二取料機構4 0、5 0可依序迅速載送I C 進行測試作業。Page 6 200535431 V. Description of the invention (3) It takes time to assemble, and it is easy to improve the accuracy of assembly, so as to speed up the displacement speed of each reclaiming mechanism, shorten the loading time, and achieve the practical benefit of more effectively improving the detection efficiency. [Embodiment] In order for your reviewing committee to further understand the present invention, a preferred embodiment will be given in conjunction with the drawings, which will be described in detail as follows: Please refer to Figs. 6 ~ 11, the detection device includes The test bench 30, the first and second reclaiming mechanisms 40, 50, and the input and output mechanisms 60, 70. Among them, the test bench 30 is provided with the first and second reclaiming mechanisms 40 on both sides. , 50, each reclaiming mechanism is provided with a horizontal movement structure and a lifting structure that are assembled with each other. Each horizontal movement structure is provided with a horizontal slide handle 4 1, 5 1 and a horizontal screw 4 2, 5 2 on the frame, and The horizontal screws 4 2 and 5 2 are driven by a motor 4 3 and 5 3, and a sliding member 4 4 and 5 4 with screw sleeves 4 4 1 and 5 4 1 and a horizontal slide 4 4 2 and 5 4 2 are slipped. It is placed and screwed on the horizontal sliding handles 4 1 and 5 1 and the horizontal screws 4 2 and 5 2, and the other side is provided with vertical sliding seats 4 4 3 and 5 4 3, and the lifting structure is attached to a bottom mask nozzle The side of the reclaimer 4 5 and 5 5 are provided with longitudinal sliding handles 4 5 1 and 5 5 1 to slide into the longitudinal sliding seats 4 4 3 and 5 4 3 of the sliding members 4 4 and 5 4. The structure is on the top surface of the reclaimers 4 5 and 5 5 There is a lateral slide 4 5 2, 5 5 2 to slide on the lateral slide rails 4 6 1, 5 6 1 of a bracket 4 6, 5 6, and the lifting structure is placed on the bracket 4 6, 5 6 The surface is provided with two longitudinal slides 4 6 2, 5 2 and a screw sleeve 4 6 3, 5 6 3 to be assembled on the rack's longitudinal slides 4 7 and 5 7 and longitudinal screws 4 8 and 5 8 And the longitudinal screw 200535431 V. Description of the invention (4) 48, 58 The motors 4 and 5 3 drive the lateral moving members 4 4, 5 4 and 4 5 and 5 5 4 5 rail 41, 51 and brackets 46, 5 6 1 make reciprocating displacement in X direction 4 9, 5 9 drive longitudinal screw 4 4 6, 5 6 vertical slide seat 4 6 5 5 vertical slide 4 5 1, 5 4 7, 5 7 and sliding parts 4 4, 5 4 3 are used for reciprocating displacement in the Z direction. 7 0 are set on the test bench 3, 6 1 and 7 1 carrier structure, 6 2 and 7 2 pick and place structure. In order to use this, please refer to No. 12, Nozzle 6 2 is to place the IC on the motor 4 9 to the first reclaiming mechanism 4 0, the motor 4 9 drives the vertical reclaimer 4 5 to lower, Feeder 1C, and rise and reset, but the carrier IC; please refer to Sections 1 1, 1 3, 40 The two motors 49 and 43 are 4 2 and are driven by driving the bracket 4 6 and slide 9. When each of the structural rods 4 2 and 5 2 is moved laterally, the slides 42 and 542 and the reclaimer 5 5 2 are driven. The horizontal slide 6 of the rack is 4 6 1, and when the motor of each lifting structure, 5 8, the bracket, 5 6 2 and the take-out device 4 5, 1 are driven, and the vertical slide 4 of the rack is held. Longitudinal slide 4 4 3. In addition, the feeding mechanism 60 and the front and rear of the unloading machine are each provided with a IC for carrying IC and a nozzle for picking and placing IC. As shown in Figure 3, the feeding mechanism On the 60 platform 61, the carrier 61 carries 4 5 below, the first picking mechanism lever 4 8 is used to drive the nozzles of the brackets 4 6 and 5 to suck 1 on the platform 6 1 and then reverse the displacement to reset. As shown in Figure 4, the first picking mechanism drives the vertical and horizontal screws 4 8, 4 4 and the picker 4 5 simultaneously. 200535431 V. Description of the invention (5) X-Z direction displacement, will pick up the material The IC on the device 45 is placed in the test bench 30 for testing. At the same time, the carrier 61 of the feeding mechanism 60 carries another IC to the side of the test bench 30, and the second Retrieving mechanism 5 of 0 When it reaches 5 3, it drives the horizontal screw 5 2 to drive the slider 5 4 and the reclaimer 5 5 to move in the X direction, so that the reclaimer 5 5 is located above the loading platform 6 1 of the feeding mechanism 60, and then another The motor 5 9 drives the longitudinal screw 5 8, and drives the bracket 5 6 and the take-out device 5 5 to lower, so that the nozzle of the take-out device 5 5 sucks the IC and resets in the opposite direction; please refer to sections 1 1, 1 5, 1 As shown in Figure 6, when the IC of the first picking mechanism 40 is tested, the two motors 4 9 and 4 3 drive the vertical and horizontal screws 4 8 and 4 2 to drive the picker 4 5 in each horizontal direction. The slide rails 4 1 and 4 6 1 are laterally displaced above the carrier 7 1 of the discharging mechanism 70, and the feeder 4 5 is lowered to place the IC on the carrier 7 1 and sent out. At the same time, the second take The feeding mechanism 50 bis motors 5 9 and 5 3 respectively drive the longitudinal and transverse screws 5 8 and 5 2 to drive the bracket 5 6, the sliding member 5 4 and the reclaimer 5 5 to make X-Z synchronous displacement, and The IC on the reclaimer 5 5 is placed in the test bench 30 for testing. When the IC of the second reclaimer 50 is tested, the reclaimer 4 5 of the first reclaimer 40 is reversed. Actuating towards displacement and again The IC is adsorbed on the carrier 6 1 φ of the feeding mechanism 60, and when the feeder 5 5 of the second picking mechanism 50 places the tested IC on the carrier 7 1 of the discharging mechanism 70 and sends it out The first picking mechanism 40 can put the IC into the test bench 30 for testing. Therefore, the first and second picking mechanisms 40 and 50 can quickly carry the IC in order for testing.
第9頁 200535431 五、發明說明（6) 綜上所述，本發明深具實用性及進步性，然未見有相 同之產品及刊物公開，從而允符發明專利申請要件，爰依 法提出申請。 200535431 圖式簡單說明 第1圖··係習式第8 8 2 1 7 6 2 6號專利案之示 第2圖：係第1圖之局部俯視圖。 第3圖：係第1圖之取料示意圖。 第4圖：係第1圖之I C檢測及另一取料 第5圖：係第1圖之放料及檢測示意圖。 第6圖：本發明各機構之配置圖。 第7圖··本發明之第一、二取料機構示意 第8 — 1圖.係弟一取料機構之不意圖。 第8 — 2圖·係弟^一取料機構之側視圖。 第9 一 1圖.係弟二取料機構之不意圖。 第9 一 2圖·係弟二取料機構之側視圖。 第1 0圖：係第一、二取料機構之正視圖 第1 1圖：係第一、二取料機構之俯視圖 第1 2圖：係載送I c之示意圖。 第1 3圖：係第一取料機構吸取I C之示 第1 4圖：係第一、二取料機構分別作I 一 I C之示意圖。 第1 5圖：係第一、二取料機構分別作另 I C出料之示意圖。 第1 6圖：係第一、二取料機構分別作再 I C出料之示意圖。 件號索引： 〔習式〕 測試台=1 意圖。 I C示意圖。 圖。 意圖。 C測試及吸取另 一 I C測試及 次吸取I C及 橫移機構：2 200535431 圖式簡單說明 升降機構：3、4 橫向滑座：7 支架：8 馬達：1〇 橫向支架：1 2 、1 3 吸嘴：1 6、1 7 馬達：2 0 、2 1 入料機構· 2 4 〔本發明〕 測試台：3 0 第二取料機構：5 0 橫向螺桿：4 2 、5 2 滑動件：4 4、5 4 橫向滑座：4 4 2 、5 4 2 取料器·· 4 5 、5 5 橫向滑座：4 5 2 、5 5 2 橫向滑執4 6 1 、5 6 1 螺套：4 6 3 、5 6 3 縱向螺桿：4 8 、5 8 入料機構：6 0 載台：6 1 、7 1 橫向滑塊：5 直立板體：6 橫向螺桿：9 直立滑塊：1 1 直立滑座：1 4、1 5 縱向螺桿：1 8、1 9 載台機構：2 2、2 3 取料機構：2 5 第一取料機構：4 0 橫向滑執：4 1 、5 1 馬達：4 3、5 3 螺套：4 4 1 、5 4 1 縱向滑座：4 4 3 、5 4 3 縱向滑執：4 5 1 、5 5 1 支架：4 6 、5 6 縱向滑座：4 6 2 、5 6 2 縱向滑軌：4 7、5 7 馬達：4 9 、5 9 出料機構：7 0 吸嘴：6 2、7 2Page 9 200535431 V. Description of the invention (6) In summary, the present invention is highly practical and progressive, but the same products and publications have not been disclosed, thereby allowing the invention patent application requirements to be met and the application filed according to law. 200535431 Brief Description of Drawings Figure 1 · Shows the conventional patent No. 8 8 2 1 7 6 2 6 Figure 2: It is a partial plan view of Figure 1. Figure 3: Schematic drawing of material drawing in Figure 1. Fig. 4: IC detection and another material drawing in Fig. 1 Fig. 5: Schematic drawing of material discharging and detection in Fig. 1. Figure 6: Configuration diagram of each mechanism of the present invention. Fig. 7 ... Schematic diagram of the first and second reclaiming mechanisms of the present invention Fig. 8-1 is the intention of the first reclaiming mechanism of the younger brother. Fig. 8-2 · Side view of the sibling ^ a reclaiming mechanism. Fig. 9-1 Fig. 1. The intention of the second picking mechanism. Fig. 9 1 2 · Side view of the second picking mechanism. Fig. 10 is a front view of the first and second reclaiming mechanisms. Fig. 11 is a top view of the first and second reclaiming mechanisms. Fig. 12 is a schematic diagram of carrying I c. Fig. 13: It shows the drawing of I C by the first reclaiming mechanism. Fig. 14: It shows the drawing of I and I C by the first and second reclaiming mechanisms. Fig. 15: It is a schematic diagram of the first and second reclaiming mechanisms making other IC discharges respectively. Figure 16: It is a schematic diagram of the first and second reclaiming mechanisms for re-IC discharge. Part Number Index: [Habit] Test Bench = 1 Intent. IC schematic diagram. Illustration. intention. C test and suction another IC test and second suction IC and traverse mechanism: 2 200535431 Brief description of the drawing Lifting mechanism: 3, 4 Lateral slide: 7 Bracket: 8 Motor: 10 Horizontal bracket: 1 2 1 3 Mouth: 1 6, 1 7 Motor: 2 0, 2 1 Feeding mechanism · 2 4 [Invention] Test bench: 3 0 Second picking mechanism: 5 0 Lateral screw: 4 2, 5 2 Slider: 4 4 , 5 4 horizontal slide: 4 4 2, 5 4 2 reclaimer · 4 5, 5 5 horizontal slide: 4 5 2, 5 5 2 horizontal slide 4 6 1, 5 6 1 screw sleeve: 4 6 3, 5 6 3 Longitudinal screw: 4 8, 5 8 Feeding mechanism: 6 0 Stage: 6 1, 7 1 Horizontal slider: 5 Vertical plate: 6 Horizontal screw: 9 Vertical slider: 1 1 Vertical slide : 1 4, 1 5 Longitudinal screw: 1 8, 1 9 Carrier mechanism: 2 2, 2 3 Picking mechanism: 2 5 First picking mechanism: 4 0 Lateral slide: 4 1, 5 1 Motor: 4 3 , 5 3 Screw sleeve: 4 4 1, 5 4 1 Vertical slide: 4 4 3, 5 4 3 Vertical slide: 4 5 1, 5 5 1 Bracket: 4 6, 5 6 Vertical slide: 4 6 2, 5 6 2 Vertical slide rail: 4 7, 5 7 Motor: 4 9, 5 9 Discharging mechanism: 7 0 Nozzle: 6 2, 7 2