TW200524490A - Method for fabricating electrically conductive via of build-up type packaging substrate by laser drilling - Google Patents

Method for fabricating electrically conductive via of build-up type packaging substrate by laser drilling Download PDF

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TW200524490A
TW200524490A TW93100865A TW93100865A TW200524490A TW 200524490 A TW200524490 A TW 200524490A TW 93100865 A TW93100865 A TW 93100865A TW 93100865 A TW93100865 A TW 93100865A TW 200524490 A TW200524490 A TW 200524490A
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Taiwan
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layer
conductive
circuit board
build
blind hole
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TW93100865A
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Chinese (zh)
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TWI260188B (en
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Lin-Yin Wong
Kun-Chen Tsai
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Phoenix Prec Technology Corp
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Publication of TWI260188B publication Critical patent/TWI260188B/en

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Abstract

A method for fabricating electrically conductive via of build-up type packaging substrate is proposed, which includes: providing an inner substrate having at least an inner circuit layer and a laminated layer with a conductive metal layer formed on the surface of the inner substrate; oxidizing the conductive metal layer by Brown Oxidation to form a rough oxidized layer with laser reflection smaller than thereon. Laser ablating the rough oxidized layer and the laminated layer to form a plurality of blind vias through the laminated layer, and then forming another build-up circuit layer onto the circuit layer including above vias. Adding the rough laminated layer can reduce laser reflection of surface of metal layer, to directly ablate the conductive metal layer by CO2 laser. Therefore, the conductive metal layer is unnecessary to be patterned prior to laser drilling, so as to simplify processes of conductive vias.

Description

200524490 五、發明說明(1) 【發明所屬之技術領域】: 本發明係關於一種電路板導電盲孔之製造方法,尤指 一種適用於球栅陣列式(Ball Grid Array, BGA)封裝基 板中,以雷射鑽孔製程形成導電盲孔(E 1 e c t r 1 c a 1 1 y Conductive Via)之製造方法。 【先前技術】: P过著電子產業蓬动舍展’電子產品也逐漸邁入多功能 、高速度的研發趨勢。為滿足半導體封裝件高度積集化以 及微型化的封裝需求’封裝電路板層數正逐步增加以形成 絕緣層和導電層交相堆疊之多層板(Multl — layer B〇ard) 結構,而此多層板結構之上、下電路層間可以透過開設在 各絕緣層内的複數導電盲孔(ElectricaHy conductive V i a)相互導接,進而擴大線路的佈線密度。 惟在多層板層間設置導電盲孔(g^ctrically Conducts Ve Via),盲孔(B1 lnd Via)必須貫穿不同材 質之上層導電層及絕緣層才能暴露出下層電路層;且為符 合高密度佈線^細間距(Fme Pltch)以及電^板尺;二 型化的封裝趨勢_,盲孔的孔徑現已縮小到1〇〇微 —,為 而須使用能量…集中之雷射光作為鑽孔工具。 以下,第3Α圖至第3Η圖即詳細說明以彳t ^ 射(C〇2 Laser)方法鑽製封裝電路板之辦溫 田 導電盲孔之製作流程。 “層電路板中, 如第3 A圖所示,首先預備一内層電路拓 . 々久 ^ 0 Γ Τππργ200524490 V. Description of the invention (1) [Technical field to which the invention belongs]: The present invention relates to a method for manufacturing a conductive blind hole of a circuit board, and particularly to a ball grid array (BGA) package substrate. A manufacturing method for forming a conductive blind hole (E 1 ectr 1 ca 1 1 y Conductive Via) by a laser drilling process. [Previous technology]: P is living in the electronics industry, and electronic products have gradually entered the trend of multi-functional and high-speed research and development. In order to meet the packaging requirements of highly integrated and miniaturized semiconductor packages, the number of packaging circuit board layers is gradually increasing to form a multi-layer (Multl — layer B0ard) structure in which insulating layers and conductive layers are stacked alternately, and this multilayer The upper and lower circuit layers of the board structure can be connected to each other through a plurality of conductive blind vias (Electrica Hy conductive Vias) provided in each insulation layer, thereby increasing the wiring density of the circuit. However, a conductive blind via (g ^ ctrically Conducts Ve Via) is provided between the layers of the multilayer board. The blind via (B1 lnd Via) must penetrate the upper conductive layer and the insulating layer of different materials to expose the lower circuit layer; and it is in line with high-density wiring ^ Fine pitch (Fme Pltch) and electrical board ruler; the trend of two-type packaging _, the hole diameter of the blind hole has been reduced to 100 micrometers, in order to use the energy ... focused laser light as a drilling tool. In the following, FIGS. 3A to 3D are detailed descriptions of the manufacturing process of Wen Tian conductive blind vias for drilling packaged circuit boards by the Co2 Laser method. "In the layer circuit board, as shown in Figure 3A, first prepare an inner layer circuit topology. 々 久 ^ 0 Γ Τππργ

Circuits Board),該内層電路板3 0之卜τ 士 卜表面分別形成Circuits Board), the inner surface of the inner circuit board 30 and the surface of the board are formed separately.

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17556全懋.ptd 第7頁 200524490 五、發明說明(2) 有一内層線路層3卜且該内層線路層31上形成有一壓合層 3 2 ’泫壓合層3 2係包括一絕緣層3 2 0及一銅箔層3 2 1,且該 ’銅箔層321之厚度幾與該内層電路板3〇表面之^層線路層^ • 31厚度一致。 3 曰 如第3 B圖所示,然後於該壓合層3 2表面之銅箱層3 2 1 上實施一表面微蝕製程(Surface Unifonn Etching Process, SUEP),將銅猪微蝕以提高銅落層321與其上之 接合層的接合性’並令该銅層3 2 1之厚度維持均—。 如弟3 C圖所示’接著覆蓋一例如乾膜(d r y F i 1 m > -參阻層3 3至該壓合層3 2之銅fg層3 2 1表面,並如第3 D圖之 -示,進行曝光( Exposure)、顯影(Development)等制 程,以藉由光阻層3 3之開口 3 3 0來決定各盲孔的形成位= 0 如第3 E圖所示’而後’以物理或化學#刻技術飿除夕卜 露於該光阻層3 3開口 3 3 0部位之銅箔層3 2 1,使得該铜落 3 2 1蝕刻完以後,該銅箔層3 2 1開口可暴露位於銅箔層3 2 f 底下之絕緣層j 2 0,而如第3 F圖所示。 如第3 G圖所示’之後,移除光阻層(未圖示)部利’ -‘ · 乂不丨j用 穿透性較弱之r·二氧化5反雷射姓除掉暴露在該銅馆層3 2丨卩, 處之絕緣層3 2 0,俾形成連續貫穿該銅箔層3 2 1及纟邑緣#層 3 2 0之盲孔3 4 ( B 1 i n d V i a) ’使得埋設在該絕緣層3 2 q下 方之部分内層線路層3 1顯露於該盲孔3 4。 如第3 Η圖所示,最後,以無電解電鍍方式於各盲孔3< 及銅落層321表面形成晶種層36 ( Seed Layer),並形成17556 全懋 .ptd Page 7 200524490 V. Description of the invention (2) There is an inner circuit layer 3b and a compression layer 3 2 is formed on the inner circuit layer 31. The 'compression layer 3 2 includes an insulating layer 3 2 0 and a copper foil layer 321, and the thickness of the 'copper foil layer 321 is almost the same as the thickness of the circuit layer ^ 31 on the surface of the inner circuit board 30. 3 As shown in Figure 3B, a surface Unifonn Etching Process (SUEP) is then performed on the copper box layer 3 2 1 on the surface of the bonding layer 3 2 to micro-etch copper pigs to improve copper. The adhesion between the falling layer 321 and the bonding layer thereon is maintained, and the thickness of the copper layer 3 2 1 is maintained uniform. As shown in Figure 3C ', then cover a surface such as a dry film (dry F i 1 m >-reference resistance layer 3 3 to the copper fg layer 3 2 1 of the laminated layer 3 2 and as shown in Figure 3 D -Show, perform processes such as exposure, development, etc., to determine the formation position of each blind hole by the opening 3 3 0 of the photoresist layer 3 3 = 0 as shown in Figure 3E A physical or chemical #engraving technique is used to remove the copper foil layer 3 2 1 exposed on the photoresist layer 3 3 opening 3 3 0, so that the copper foil 3 2 1 is etched, and the copper foil layer 3 2 1 is opened. The insulating layer j 2 0 under the copper foil layer 3 2 f can be exposed, as shown in Fig. 3 F. As shown in Fig. 3 G, 'After that, the photoresist layer (not shown) is removed.'- '乂 不 丨 j Use a weaker penetrating r · dioxide 5 anti-laser surname to remove the exposed layer 3 2 丨 卩, the insulating layer 3 2 0, and 馆 form a continuous penetration of the copper foil Layer 3 2 1 and 纟 邑 缘 # Layer 3 2 0 of the blind hole 3 4 (B 1 ind V ia) 'makes part of the inner circuit layer 3 1 buried under the insulating layer 3 2 q exposed in the blind hole 3 4 As shown in Figure 3, finally, electroless plating 3 & lt blind bore; off layer and copper seed layer 321 formed on the surface 36 (Seed Layer), and forming

17556全想.ptd 第8頁 200524490 五、發明說曰戸 (3) 一 圖 案 化 電 鍍 阻 層 ( 圖 中 未 示)至該 晶 種 層 3 6上 1 再 以 電 鍍 技 術 於 該 晶 種 層 3 6上 鍍 設 足夠厚度 之 金 屬 層 接 著 移 除 電 鍍 阻 層 ( 圖 中 未 示 ) 與 覆 於其下之 晶 種 層 3 6即 可 製 得 圖 案 化 導 電 線 路 層 38, 並 可 完 成導電盲 孔 ( E 1 e C t r i c a 11 y Com i u C: t i v e Vi< a) 之 製 作 〇 惟 以 上 述 方 法 製 作 增 層 電路板之 導 電 盲 孔 ( E 1 e 2 t r i 3 a 11, y 二〇 adi J C t i v e Via)時 ,由於銅: Ατλτ 泊表〗 面^ 射 雷 射 光 致 使 穿 透 力 較 弱 之二氧化 碳 雷 射 # %> 法 熔 1虫 銅 箔 而 必 須 先 實 施 圖 案 化 步 驟 移 除掉部分 銅 箔 , 令 該 絕 緣 層 外 露 後 , 才 能 再 以 二 氧 化 碳 田 射熔#該 絕 緣 層 5 製 程 太 過 繁 複 y 而 且 光 阻 圖 案 化 ( P a 11 e r η)時產生的對位誤差亦 容 易 導 致 鑽 孔 位 置 偏 移 而 傷 及線路, 進 而 降 低 增 層 電 路 板 之 製 程 良 率 0 [ 發 明 内 容 ] ·· 鑒 於 以 上 所 述 習 知 技 術 之缺點, 本 發 明 之 主 要 @ 的 在 於 提 供 一 種 可 提 昇 雷 射 光 對 導電金屬 層 之 穿 透 力 使 電 路 板 表 面 以 雷 射 鑽 孔 技 術 (I ;e r Drill i n g )開 設 盲 孔 (V lal痛 時 得 免 除 圖 化 製 程 以 移 除部分導 電 金 屬 層 藉 此 降 低 路 板 製 程 繁-複 性 之 增 層 路板之導 電 盲 孔 製 造 方 法 〇 , 本 發 明 之 另 g 的 在 於 提供一種 可 提 昇 雷 射 光 對 導 電 金 屬 層 之 穿 透 力 使 電 路 板 表面以雷 射 鑽 孔 技 術 開 5又 盲 孔 時 , 須 實 施 圖 案 化 俾 減 少圖案化 各 層 重 疊 時 因 對 位 誤 差 而 導 致 孔 位 偏 移 等 問 題 之 增層電路 板 之 導 電 盲 孔 製 造 方 法 017556 全 想 .ptd Page 8 200524490 V. Invention description (3) A patterned plating resist layer (not shown in the figure) is applied to the seed layer 3 6 1 and then the plating layer is applied to the seed layer 3 6 A metal layer with sufficient thickness is plated, and then the plating resist layer (not shown) and the seed layer 36 overlying it are removed to obtain a patterned conductive circuit layer 38, and a conductive blind hole (E 1 e C trica 11 y Com iu C: Production of tive Vi < a). However, when the conductive blind hole (E 1 e 2 tri 3 a 11, y 20di JC tive Via) of the build-up circuit board is made by the above method. Due to the copper: Ατλτ berth surface, the carbon dioxide laser with weak penetration caused by laser light #% > Method to melt 1 insect copper foil, you must first perform a patterning step to remove some of the copper foil to make the insulation The carbon dioxide field can only be used for melting after the exposed layer is exposed. The insulation layer 5 is too complicated and the photoresist pattern The alignment error generated during the case (P a 11 er η) can easily lead to the deviation of the drilling position and damage the line, which will further reduce the process yield of the build-up circuit board. 0 [Inventive Content] ·· In view of the above-mentioned habits Knowing the disadvantages of the technology, the main thing of the present invention is to provide a method for improving the penetrating power of laser light to the conductive metal layer so that the surface of the circuit board can be opened with blind drilling (V lal pain) by laser drilling technology (I; er drilling ing). It is sometimes necessary to dispense with a patterning process to remove a part of the conductive metal layer, thereby reducing the complexity of the circuit board manufacturing process. A method for manufacturing a conductive blind hole of an increased layer circuit board. Another aspect of the present invention is to provide a method for improving the laser light pair. The penetrating force of the conductive metal layer causes the circuit board surface to be opened with laser drilling technology and blind holes. Patterning must be implemented. This reduces the problem of hole displacement caused by misalignment when the patterned layers overlap. Blind hole manufacturing method for layered circuit board

]7556全想.ptd 第9頁 200524490 五 、發明說明 (4) 本 發 明 增 層 路 板 之 導 電 盲 孔 ( E 1 e c t r i c a 11 y C〇n( i u :t i v e Vi a) 製 造 方 法 , 係 包 括 以 下 步 驟 先 預 備 一 具 有 内 層 線 路 層 之 内 層 電 路 板 該 内 層 電 .路 板 表 面 形 成 有 — 壓 合 層 , 且 該 壓 合 層 至 少 包 含 一 導 電 金 屬 層 y 對 該 導 電 金 屬 層 實 施 例 如 栋 化 製 程 (Bn own 1 Ox i da t i on ) 之 氧 化 處 理 > 以 在 該 導 金 屬 層 上 形 成 一 粗 面 氧 化 層 雷 射 熔 ik 該 粗 面 氧 化 層 及 壓 合 層 1 以 形 成 貫 穿 該 壓 合 層 並 暴 路 出 埋 在 該 壓 合 層 底 下 之 導 電 線 路 層 之 複 數 個 盲 以 及 於 各 盲 孔 及 該 導 電 金 屬 層 上 形 成 一 圖 案 化 導 電 線 路 層 , 以 形 成 複 數 個 電 性 連 接 該 增 層 電 路 板 層 間 之 導 電 盲 孔 〇 相 較 於 傳 統 田 射 鑽 孔 技 術 中 因 為 氧 化 碳 雷 射 穿 透 力 不 足 5 而 導 致 鑽 孔 前 必 須 先 將 導 電 金 屬 層 圖 案 化 所 產 生 的 種 種 問 題 本 發 明 捨 棄 圖 案 化 製 程 5 改 用 氧 化 方 式 於 該 導 電 金 屬 層 ( 例 如 銅 層 ) 上 形 成 一 粗 面 氧 化 層 7 以 利 用 進 行 標 化 製 程 以 後 金 屬 表 面 顏 色 加 深 J 致 使 田 射 光 反 射 性— 爲 低 > 吸 光 性 增 加 而 導 致 穿 透 力 較 弱 的 二 氧 化 碳 雷 射 光 也 可 以 直 接 熔 蚀-該 導 電 金 屬 層 而 不 需 要 在 田 射 熔 名虫 前 先 予 • 圖 案 化 如 此 可 以 簡 化 製 程 降 低 成 本 0 [ 實 施 方 式 ] : 以 下 係 藉 由 特 定 的 具 體 實 施 例 說 明 本 發 明 之 實 施 方 式 熟 習 此 技 藝 之 人 士 可 由 本 說 明 書 所 揭 示 之 内 容 輕 易 地 瞭 解 本 發 明 之 其 他 優 點 與 功 效 〇 本 發 明 亦 可 藉 由 其 他 不 同 的] 7556 全 想 .ptd Page 9 200524490 V. Description of the invention (4) The manufacturing method of the conductive blind hole (E 1 ectrica 11 y Coon (iu: tive Vi a)) of the layered circuit board of the present invention includes the following steps: An inner layer circuit board with an inner circuit layer is prepared first. The inner layer of the circuit board is formed with a pressure-bonding layer, and the pressure-bonding layer includes at least a conductive metal layer y. The conductive metal layer is subjected to, for example, a Bn own process. 1 Ox i da ti on) oxidation treatment> to form a rough oxide layer on the metal conducting layer for laser fusion ik the rough oxide layer and the laminated layer 1 to form a through layer and pass through the laminated layer A plurality of blinds of the conductive circuit layer buried under the bonding layer and forming a patterned conductive circuit layer on each blind hole and the conductive metal layer to form a plurality of electrical connections The conductive blind holes between the layers of the build-up circuit board are different from those in traditional field drilling technology because the carbon oxide laser has a penetrating power of less than 5 and causes the conductive metal layer to be patterned before drilling. The invention abandoned the patterning process 5 and changed to oxidation to form a rough oxide layer 7 on the conductive metal layer (such as a copper layer) to make the surface color of the metal darker after the standardization process J, resulting in the reflectivity of the field light — low> Carbon dioxide laser light with weaker penetrability due to increased light absorption can also be directly eroded-the conductive metal layer does not need to be pre-arranged in the name of Takima • Patterning can simplify the process and reduce costs 0 [Implementation] : The following is a description of specific embodiments of the present invention. Those skilled in the art can use this SHEET reveals the content of the light and easy to understand the present invention and the advantages which he efficacy of the present invention also square by means of which he may be different

17556全懋.ptd 第10頁 20052449017556 懋 .ptd Page 10 200524490

200524490 五、發明說明(6) 膠銅% ( R C C)加以說明。 如第1 C圖所示,接著,在該導電金屬層121上進行一 表面微I虫製程(Surface Uniform Etching Process,SUEP -),使得導電金屬層厚度變薄;另使導電金屬層1 2 1表面 經微蝕過後與其上之接合層具有較佳之接合性,又使該導 電金屬層1 2 1之平整度較均勻。 如第1 D圖所示,然後,於該導電金屬層1 2 1進行微蝕 的同時,進行一例如棕化製程(B r〇w η〇X i d a t i〇η)或黑 化製程(B 1 ack Ox i da t i on)等金屬氧化製程,俾於該導 “·金屬層1 2 1表面上形成一雷射光反射性低於該導電金屬 -層121之粗面氧化層122。 如第1 E圖所示,再而,將形成有該粗面氧化層1 2 2之 電路板半成品移入一定位機台1 3執行粗定位,使得設有對 位墊1 1 0之壓合層1 2外緣緊鄰於該定位機台1 3上所設之定 位插梢130 ( Pin)。 如第1 F圖所示,接著,執行一雷射挖靶技術,移除覆 蓋在該對位墊J 1 0表面之壓合層1 2,該壓合層1 2之移除_面_< 積至少大於粗定位所產生的對位誤差(一般約1 0 0微米), 使隱藏在絕緣層1 2 0下方之靶點(此處靶點即指該對位.墊 _1 0)裸露。然後,以C C D自動掃描機(未圖示)掃描並搜 尋出正確的對位墊1 1 0位置,即完成細定位。 如第1 G圖所示,而後,根據CCD自動掃描機(未圖示 )偵測到的靶點位置計算開孔距離,俾定義出各盲孔之預 定形成位置;再運用二氧化碳雷射1 5以鑽設複數個連通内200524490 V. Description of the invention (6) The copper percentage (RCC) is explained. As shown in FIG. 1C, a surface Uniform Etching Process (SUEP-) is performed on the conductive metal layer 121 to reduce the thickness of the conductive metal layer; and the conductive metal layer 1 2 1 After the surface is slightly etched, it has better bonding with the bonding layer thereon, and the flatness of the conductive metal layer 1 2 1 is more uniform. As shown in FIG. 1D, then, while the conductive metal layer 1 2 1 is micro-etched, a browning process (B r0w η〇X idati〇η) or a blackening process (B 1 ack) is performed. Ox i da ti on) and other metal oxidation processes, a rough surface oxide layer 122 having a laser light reflectivity lower than that of the conductive metal-layer 121 is formed on the surface of the conductive metal layer 1 2 1. As shown in FIG. 1 E As shown, further, the semi-finished circuit board with the rough oxide layer 1 2 2 formed is moved into a positioning machine 13 to perform rough positioning, so that the outer edge of the pressing layer 1 2 provided with the alignment pad 1 10 is immediately adjacent A positioning pin 130 (Pin) is provided on the positioning machine 13. As shown in FIG. 1F, a laser excavation target technique is performed to remove the surface of the positioning pad J 1 0. Compression layer 12 whose removal_surface_ < product is at least larger than the alignment error caused by coarse positioning (generally about 100 microns), so that it is hidden under the insulation layer 12 The target point (here the target point refers to the alignment. Pad_1 0) is exposed. Then, scan with a CCD automatic scanner (not shown) and search for the correct position of the alignment pad 1 1 0, which is complete. Positioning: As shown in Figure 1G, the opening distance is calculated based on the target position detected by the CCD automatic scanner (not shown), and the predetermined formation position of each blind hole is defined; then a carbon dioxide laser is used. 1 5 to drill a plurality of connected

17556全懋.ptd 第12頁 200524490 五、發明說明(7) 層線路層1 1之盲孔1 4。 如第1 Η圖所示,之後,梦卜兩 广土闰-、冰/曰兮道 私除屯路板表面之粗面氧化層 (未圖不)’使付该導電金屬層m重新外露。 如第1 I,所不’接箸1無電解電鑛技術於各盲孔i 4 及該導電金屬層121表面沉積一晶種層i6(Seed Layer),該 晶種層1 6主要作為後續進行電鍍線路層所需之電流傳導路 徑,型態可由金屬、合金或沉積數層金屬層所構成,其材 質可選自銅、錫、鎳、鉻、鈦及銅鉻合金所組組群之一者 所形成。該晶種層1 6亦可藉由物理氣相沉積(p v D )、化學 氣相 /儿積(CVD)、錢鍛(Sputtering)、蒸鑛(Evaporation )、電弧蒸氣沉積(A r c V a ρ 〇 r D e p 〇 s i t丨〇 n)、離子束濺 鍍(Ion Bean Sputtering)、雷射熔蝕沉積(Laser Ab 1 a t i ο n D e ρo s i 11 οn)或電漿促進之化學氣相沉積等方 法形成。 而後,即進行圖案化線路增層製程。本發明增層電路 板之圖案化導電線路層較佳者係分別以第1 j至1 L圖所示之 加成法(A d d i立i ν e),及第1 J ’至1 Μ ’圖所示之減去法 Su b t r a c t i ν e)製得,因此,下述製程步驟將以第1 J至1 L 圖及第1 J’至iM’圖分開敘述之。 如第1 J圖所示,在該晶種層1 6上覆蓋一形成圖案化之 電鍍阻層1 7,該電鍍阻層1 7可為乾膜及液態光阻之其中一 者,並以習知之微影製程(Photol 1 thography)將一預先 設計之細線路圖案轉移至該電鍍阻層1 7上,使得該電鍍阻 層1 7具有開口 1 7 0以外露出部分晶種層1 6。17556 全懋 .ptd Page 12 200524490 V. Description of the invention (7) Blind hole 14 of layer 11 of circuit layer. As shown in the first figure, after that, Mengbu and Guangxi, Bing / Yi Xi Road privately removed the rough oxide layer on the surface of the road board (not shown), so that the conductive metal layer m was exposed again. As in the first I, the next step is to use the electroless mining technology to deposit a seed layer i6 (Seed Layer) on each of the blind holes i 4 and the conductive metal layer 121. The seed layer 16 is mainly used as a follow-up process. The current conduction path required for the plating circuit layer. The type can be composed of metal, alloy or deposited several metal layers. Its material can be selected from one of the group consisting of copper, tin, nickel, chromium, titanium and copper-chromium alloy. Formed. The seed layer 16 can also be formed by physical vapor deposition (pv D), chemical vapor phase (CVD), sputtering, evaporation, arc vapor deposition (A rc V a ρ 〇r D ep 〇sit 丨 〇n), ion beam sputtering (Ion Bean Sputtering), laser ablation deposition (Laser Ab 1 ati ο n D e ρo si 11 οn) or plasma-assisted chemical vapor deposition, etc. Method formation. Then, the patterned circuit layer-adding process is performed. The patterned conductive circuit layer of the build-up circuit board of the present invention is preferably the addition method (A ddi li i ν e) shown in Figures 1 j to 1 L, and the figures 1 J 'to 1 Μ', respectively. The subtraction method Su btracti ν e) shown is obtained. Therefore, the following process steps will be described separately with the first J to 1 L diagrams and the first J 'to iM' diagrams. As shown in FIG. 1J, the seed layer 16 is covered with a patterned plating resist layer 17. The plating resist layer 17 may be one of a dry film and a liquid photoresist. The known lithography process (Photol 1 thography) transfers a pre-designed thin circuit pattern onto the plating resist layer 17 so that the plating resist layer 17 has an opening 17 and a part of the seed layer 16 is exposed.

17556 全懋.ptd 第13頁 200524490 五、發明說明(8) 如第1 K圖所示,然後,進行電鍍製程,俾使外露出該 電鍍阻層1 7開口 1 7 0之晶種層1 6上堆積有例如金屬銅之導 _電線路層1 8。另亦可不須鍍滿金屬於該電鍍阻層1 7開口 _ 170° 如第1 L圖所示,最後,移除電鑛阻層1 7及受到該電鍍 阻層1 7覆蓋之晶種層1 6及其下之導電金屬層1 2 1,即完成 增層電路板之導電盲孔製作,而使得盲孔下方的内層線路 層1 1能夠藉由以本發明方法製得之導電盲孔電性連接至盲 孔上方的導電線路層1 8。 本實施例所揭露之另一項圖案化線路增層技術,係使 -用減去法(Subtractive)來形成導電線路層18。 如第1 I圖及1 J ’圖所示,於晶種層1 6表面上進行電鍍 製程,以使該晶種層1 6表面形成有具足夠厚度之電鍍金屬 層19,且該電鍍金屬層1 9較佳為一金屬銅箔。 如第1 K ’圖所示,而後,於該電鍍金屬層1 9上形成有 一圖案化之阻層1 9 0 (與上述電鍍阻層類似),該阻層1 9 0 係利用曝光、灝影及烘烤等技術,將一預先設計之細象爲 圖案轉移到阻層1 9 0上,以使該阻層1 9 0上形成複數開口而 暴露出部分I凝金屬層1 9。 鲁 如第1 L ’圖所示,接著,以姓刻技術(E t c h i n g) #除 掉暴露於各阻層1 9 0開口之電鍍金屬層1 9及晶種層1 6及其 下之導電金屬層121,使得未受阻層19 0覆蓋之壓合層1 2其 絕緣層1 2 0外露。 如第1 Μ ’圖所示,最後,移除該阻層1 9 0,即形成一導17556 Quan 懋 .ptd Page 13 200524490 V. Description of the invention (8) As shown in Figure 1K, then the plating process is performed to expose the plating resist layer 1 7 opening 1 7 0 seed layer 1 6 A conductive_electrical circuit layer 18, such as metallic copper, is deposited thereon. It is also not necessary to plate full metal in the plating resist layer 17 opening _ 170 ° As shown in Figure 1L, finally, remove the electric resistance layer 17 and the seed layer 1 covered by the plating resist layer 17 6 and the conductive metal layer 1 2 1 below, that is, the conductive blind hole of the build-up circuit board is completed, so that the inner layer circuit layer 1 1 under the blind hole can be electrically conductive by the conductive blind hole prepared by the method of the present invention. Connected to the conductive circuit layer 18 above the blind via. Another patterned circuit layer increasing technology disclosed in this embodiment is to form the conductive circuit layer 18 by using a subtractive method. As shown in FIGS. 1I and 1J ′, a plating process is performed on the surface of the seed layer 16 so that the surface of the seed layer 16 is formed with an electroplated metal layer 19 having a sufficient thickness, and the electroplated metal layer 19 is preferably a metal copper foil. As shown in FIG. 1K ′, a patterned resist layer 19 (similar to the above-mentioned plating resist layer) is formed on the electroplated metal layer 19, and the resist layer 19 0 uses exposure, shadowing And baking technology, a pre-designed fine image is transferred to the resist layer 190 as a pattern, so that a plurality of openings are formed in the resist layer 190 to expose a part of the condensed metal layer 19. As shown in the first L ′ diagram, the electroplated metal layer 19 and the seed layer 16 and the conductive metals underneath the openings of the resist layers 1 90 are removed by the etching technique (E tching) #. Layer 121 so that the pressure-resistant layer 12 covered by the unobstructed layer 19 0 has its insulating layer 12 exposed. As shown in Fig. 1M ', finally, the resist layer 190 is removed to form a conductive layer.

17556 全懋.ptd 第14頁 200524490 五、發明說明(9) 電線路層1 8而完成本發明導電盲孔之製作流程。 相較於傳統雷射鑽孔技術中,因為二氧化碳雷射穿透 力不足,而導致鑽孔前必須先將導電金屬層圖案化所產生 的種種問題,本發明捨棄圖案化製程,改用氧化方式於該 導電金屬層(例如銅層)上形成一粗面氧化層,以利用進 行棕化製程以後金屬表面顏色加深,致使雷射光反射性降 低、吸光性增加,而導致穿透力較弱的二氧化碳雷射光也 可以直接熔I虫該導電金屬層,而不需要在雷射炫姓前先予 以圖案化,如此可以簡化製程降低成本。 第二實施例: 第2 A至2 J ’圖係顯示本發明導電盲孔製造方法之另一 實施例,本實施例與前述實施例大致相同,其不同處在於 該盲孔係以U V雷射取代二氧化碳雷射方式形成,故本實施 例僅敘述與前述實施例不同之部分,並以第2 A圖至第2 J ’ 圖表示之。 如第2 A圖所示,首先預備一内層電路板2 0 ( I η n e r Circuits Bo ajd),該内層電路板2 0之上表面及/或下表$ 面上形成有至少一内層線路層21( Inner Circuit Layer ),另該内層一電路板2 0表面至少包含一對位塾210。 如第2 B圖所示,然後,於該内層線路層2 1上實施一增 層製程(Build-up Process),俾藉由壓合或塗佈等技術 在該内層線路層2 1上形成一具有導電金屬層2 2 1之絕緣層 22 0所構成之壓合層22。該具有導電金屬層221之壓合層22 係可例如在玻璃纖維(G 1 a s s F i b e r)、驗聚酯17556 Quan 懋 .ptd Page 14 200524490 V. Description of the Invention (9) The electric circuit layer 18 completes the manufacturing process of the conductive blind hole of the present invention. Compared with the traditional laser drilling technology, due to the insufficient penetrating power of carbon dioxide laser, various problems caused by the patterning of the conductive metal layer before drilling are required. The present invention abandons the patterning process and uses an oxidation method instead. A rough oxide layer is formed on the conductive metal layer (for example, a copper layer) to make the surface color of the metal darker after the browning process, resulting in a decrease in laser light reflectivity and an increase in light absorption, resulting in a weak penetrating carbon dioxide. Laser light can also directly melt the conductive metal layer without patterning before the laser light, so it can simplify the process and reduce costs. Second Embodiment: The 2A to 2J 'diagrams show another embodiment of the method for manufacturing a conductive blind hole of the present invention. This embodiment is substantially the same as the previous embodiment, except that the blind hole is UV laser. Instead of the carbon dioxide laser, it is only described in this embodiment that is different from the previous embodiment, and it is shown in Figures 2A to 2J '. As shown in FIG. 2A, an inner circuit board 20 (Inner Circuits Bo ajd) is first prepared. At least one inner circuit layer 21 is formed on the upper surface and / or the lower surface of the inner circuit board 20. (Inner Circuit Layer). In addition, the surface of a circuit board 20 on the inner layer includes at least a pair of bit 210. As shown in FIG. 2B, a build-up process is then performed on the inner circuit layer 21, and a technique such as lamination or coating is used to form a build-up process on the inner circuit layer 21. Compression layer 22 composed of an electrically conductive metal layer 2 2 1 and an insulating layer 22 0. The pressure-bonding layer 22 having the conductive metal layer 221 may be, for example, a glass fiber (G 1 a s s F i b e r), a polyester

17556 全®.Ptd 第15頁 200524490 五、發明說明(10) (Phenolic Polyester)或環氧樹脂層上沉積一銅層,或 利用背膠銅落(Resin Coated Copper, RCC)予以製作, 當然也可直接在内層線路層2 1上先壓合絕緣層2 2 0,再於 ,§亥、纟巴緣層2 2 0上壓合一例如銅羯之導電金屬層2 2 1。惟為利 於後續電鍍線路著附,本實施例係以背膠銅箔(RCC)加 以說明。 如第 表面微姓 ),使得 φ微蝕過 電金屬層 如第 台2 3執行 鄰於該定 一雷射挖 2 2,該壓 誤差(一 點(此處 機(未圖 細定位 2 C圖所示,接著,在該導電金屬層2 2 1上進行一17556 Quan®.Ptd Page 15 200524490 V. Description of the invention (10) (Phenolic Polyester) or a copper layer deposited on the epoxy resin layer, or made with Resin Coated Copper (RCC), but it can also be made. The insulating layer 2 2 0 is first laminated directly on the inner circuit layer 21, and then, a conductive metal layer 2 2 1 such as copper is laminated on the § 19 and the lamella edge layer 2 2 0. However, in order to facilitate the attachment of subsequent plating lines, this embodiment is described by using adhesive-backed copper foil (RCC). (Such as the first surface micro surname), so that φ slightly etched the overlying metal layer as the first stage 2 3 performs next to the fixed laser excavation 2 2, the pressure error (one point (here the machine (not shown in Figure 2C)) Shown, and then, performing a step on the conductive metal layer 2 2 1

製程(Surface Uniform Etching Process, SUEP 導電金屬層厚度變薄;另使導電金屬層221表面 後與其上之接合層具有較佳之接合性,又使該導 221之平整度較均勻。 2 所不,然後,將電路板半成品移入一定位機 粗疋位,使得設有對位墊2丨〇之壓合層2 2外緣緊 位機台2 3上所設之定伋插梢2 3 〇 ( p i n),復執 靶技術,移除覆盍在該對位墊2 1 〇表面之壓合岸 合層22之移除面積至少大於粗定位所產生的對曰位 觳約J 0 0微米),以使隱藏在絕緣層2 2 〇下方之 靶點係:指該對位墊2 1 裸露,再以CCD自動掃卜 不_掃描並搜尋出正確的對位墊2丨0位置,即完田 如第2E圖所示,而後,根據CCD自動掃描機(未圖 偵測到的靶點位置計算開孔距離, 定 層 形成位置;再運用二氧化碳雷射25以鑽設複^個連通 線路層2 1之盲孔2 4。(Surface Uniform Etching Process, SUEP thinner conductive metal layer; In addition, the conductive metal layer 221 has a better bonding property with the bonding layer on the surface, and the flatness of the conductive 221 is more uniform. 2 No, then , The semi-finished circuit board product is moved into a rough position of a positioning machine, so that a compression layer 2 2 2 of the alignment pad 2 丨 is provided on the outer edge of the clamping table 2 3 fixed pin 2 3 〇 (pin) (Recommended target technology) to remove the area of the compressed shoreline layer 22 covering the surface of the alignment pad 2 10 is at least larger than the alignment position (approximately J 0 0 μm produced by coarse positioning) so that The target point hidden under the insulating layer 2 2 〇 means that the alignment pad 2 1 is exposed, and then scanned by the CCD automatically _ scan and search for the correct position of the alignment pad 2 丨 0, that is, Wantian as the 2E As shown in the figure, the opening distance is calculated based on the position of the CCD automatic scanner (not shown in the figure), and the position of the formation layer is determined. Then, a carbon dioxide laser 25 is used to drill a plurality of blind lines connecting the layers 21 Hole 2 4.

200524490 五、發明說明(11) 如第2 F圖所示,接著,以無電解電鍍技術於各盲孔2 4 及該導電金屬層221表面沉積一晶種層26(Seed Layer), 該晶種層2 6主要作為後續進行電鍍線路層所需之電流傳導 路徑,型態可由金屬、合金或沉積數層金屬層所構成,其 材質可選自銅、錫、鎳、鉻、鈦及銅鉻合金所組組群之一 者所形成。該晶種層26亦可藉由物理氣相沉積(PVD)、 化學氣相沉積(C V D)、濺鍍(S p u 11 e r i n g )、蒸鍍( Evaporation)、電?瓜 f矣氣 ί冗積(Arc Vapor Deposition )、離子束藏鍍(Ion Bean Sputtering)、雷射炼#沉 積(Laser Ablation Deposition)或電漿促進之化學氣 相沉積等方法形成。 而後,即進行圖案化線路增層製程。本發明增層電路 板之圖案化增層線路層較佳者係分別以第2 G至2 I圖所示之 加成法(Additive),及第2G’至2J’圖所示之減去法( Subtractive)製得,因此,下述製程步驟將以第2G至21 圖及第2 G ’至2 J ’圖分開敘述之。 如第2 G圖所示’在該晶種層2 6上覆蓋一形成圖案化 電鍍阻層2 7,該_電鍍阻層2 7可為乾膜及液態光阻之其中二 者’並以習知-之微影製程(Photolithography)將一預先 設計之細線路圖案轉移至該電鍍阻層2 7上,使得該電鍍阻 層2 7具有開口 2 7 0以外露出部分晶種層2 6。 如第2H圖所示,然後,進.行電鍍製程,俾使外露出該 電鍍阻層2 7開口 2 7 0之晶種層2 6上堆積有例如金屬銅之導 電線路層2 8。另亦可不須鍍滿金屬於該電鍍阻層2 7開口200524490 V. Description of the invention (11) As shown in FIG. 2F, a seed layer 26 (Seed Layer) is deposited on the surface of each of the blind holes 24 and the conductive metal layer 221 by electroless plating technology. Layer 2 6 is mainly used as the current conduction path required for subsequent plating circuit layers. The type can be composed of metal, alloy, or several metal layers deposited. Its material can be selected from copper, tin, nickel, chromium, titanium and copper-chromium alloy. Formed by one of the groups. The seed layer 26 can also be formed by physical vapor deposition (PVD), chemical vapor deposition (C V D), sputtering (S p u 11 e r i n g), evaporation (evaporation), electricity? Melons are formed by Arc Vapor Deposition, Ion Bean Sputtering, Laser Ablation Deposition, or plasma-assisted chemical vapor deposition. Then, the patterned circuit layer-adding process is performed. The patterned layered circuit layer of the layered circuit board of the present invention is preferably the additive method shown in Figures 2G to 2I and the subtractive method shown in Figures 2G 'to 2J'. (Subtractive), therefore, the following process steps will be described separately with Figures 2G to 21 and 2G 'to 2J'. As shown in Fig. 2G, "the seed layer 26 is covered with a patterned plating resist layer 27, and the _plating resist layer 27 can be both a dry film and a liquid photoresist". The known-lithography process (Photolithography) transfers a pre-designed thin circuit pattern onto the plating resist layer 27 so that the plating resist layer 27 has an opening 2 7 0 and a part of the seed layer 26 is exposed. As shown in FIG. 2H, a plating process is performed to expose the plating resist layer 2 7 openings 2 7 0 to the seed layer 26. A conductive circuit layer 28 such as copper is deposited on the seed layer 26. It is also not necessary to plate full metal in the opening of the plating resist layer 2 7

17556全懋.ptd 第17頁 200524490 五、發明說明(12) 2 7 0 ° 如第21圖所示,最後,移除電鍍阻層(如前圖27)及 ~受到該電鍍阻層覆蓋之晶種層2 6及其下之導電金屬層2 2 1 -,即完成增層電路板之導電盲孔製作,而使得盲孔下方的 内層線路層2 1能夠藉由以本發明方法製得之導電盲孔電性 連接至盲孔上方的導電線路層2 8。 本實施例所揭露之另一項圖案化線路增層技術,係使 用減去法(Subtractive)來形成導電線路層。 如第2 F圖及第2 G ’圖所示,於晶種層2 6表面上進行電 製程,以使該晶種層2 6表面形成有具足夠厚度之電鍍金 -屬層29。該電鍍金屬層2 9較佳為一金屬銅層。另佈設一阻 層2 9 0於電鍍金屬層2 9上。 如第2 Η ’圖所示,而後,於晶種層2 6上方之電鍍金屬 層2 9上覆蓋一形成有圖案化之阻層290(與上述電鍍阻層 類似),該阻層2 9 0係利用習知曝光、顯影及烘烤等技術 ,將一預先設計之細線路圖案轉移到阻層2 9 0上,以使該 阻層2 9 0上形成複數開口而暴露出部分電鍍金屬層2 9。_ 如第2 Γ圖所示,接著,以習用蝕刻技術(Etching) 蝕除掉暴露於…各阻層2 9 0開口之電鍍金屬層2 9及晶種層· 2 6 _其下之導電金屬層221,使得未受阻層29 0覆蓋之壓合層 2 2其絕緣層2 2 0外露。 如第2 J ’圖所示,最後,移除該阻層2 9 0,即形成一導 電線路層2 8而完成本發明導電盲孔之製作流程。 本發明之前揭步驟並未僅限於實施例所述方法,其他17556 全懋 .ptd Page 17 200524490 V. Description of the Invention (12) 2 7 0 ° As shown in Figure 21, finally, remove the plating resist (as shown in Figure 27 above) and ~ the crystals covered by the plating resist The seed layer 26 and the conductive metal layer 2 2 1-underneath, that is, the conductive blind hole of the build-up circuit board is completed, so that the inner circuit layer 21 under the blind hole can be made conductive by the method of the present invention. The blind hole is electrically connected to the conductive circuit layer 28 above the blind hole. Another patterned circuit layer increasing technology disclosed in this embodiment uses a subtractive method to form a conductive circuit layer. As shown in FIG. 2F and FIG. 2G ', an electrical process is performed on the surface of the seed layer 26, so that the surface of the seed layer 26 has an electroplated gold-metal layer 29 with a sufficient thickness. The electroplated metal layer 29 is preferably a metallic copper layer. A second resist layer 290 is disposed on the electroplated metal layer 29. As shown in FIG. 2 (a), the electroplated metal layer 29 above the seed layer 26 is covered with a patterned resist layer 290 (similar to the above-mentioned plating resist layer), and the resist layer 2 9 0 It is to transfer a pre-designed thin circuit pattern onto the resist layer 2 90 using conventional exposure, development and baking techniques, so that a plurality of openings are formed in the resist layer 2 90 to expose part of the electroplated metal layer 2 9. _ As shown in Figure 2 Γ, the conventional etching technique (Etching) is used to etch away the electroplated metal layer 29 and the seed layer exposed to the openings of each of the resist layers 2 9 0. 2 6 _ The conductive metal below Layer 221, so that the non-resistive layer 29 0 covers the laminated layer 22 and the insulating layer 2 2 0 is exposed. As shown in FIG. 2 J ′, finally, the resist layer 290 is removed to form a conductive circuit layer 28 to complete the manufacturing process of the conductive blind hole of the present invention. The previous disclosure steps of the present invention are not limited to the method described in the embodiments, other

17556全懋.ptd 第18頁 200524490 五、發明說明(13) 電路板製程、設備或材料之等效替代步驟,例如改變多層 封裝電路板之製備層數等亦包含於本發明之可實施範圍。 上述實施例僅為例示性說明本發明之原理及其功效,而非 用於限制本發明。任何熟習此技藝之人士均可在不違背本 發明之精神及範疇下,對上述實施例進行修飾與變化。因 此,本發明之權利保護範圍,應如後述之申請專利範圍所 列。17556 全懋 .ptd Page 18 200524490 V. Description of the invention (13) Equivalent substitution steps of the circuit board process, equipment or materials, such as changing the number of layers of the multilayer package circuit board, etc. are also included in the scope of the present invention. The above-mentioned embodiments are merely illustrative for explaining the principle of the present invention and its effects, and are not intended to limit the present invention. Anyone skilled in the art can modify and change the above embodiments without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the rights of the present invention should be as listed in the scope of patent application mentioned later.

17556 全懋.ptd 第19頁 200524490 圖式簡單說明 【圖式簡單說明】: • 第1 A圖至第1 L圖係本發明第一實施例之增層電路板之 導電盲孔製造方法以加成法形成圖案化增層線路之流程圖 第1 A圖至第1 I圖及第1 J’圖至第1M’圖,係本發明第一 實施例之增層電路板之導電盲孔製造方法以減去法形成圖 案化增層線路之流程圖; 第2 A圖至第2 I圖,係本發明第二實施例之增層電路板 之導電盲孔製造方法以加成法形成圖案化增層線路之流程 第2 A圖至第2 F圖及第2 G ’圖至第2 J ’圖,係本發明第二 貫施例之增層電路板之導電盲孔製造方法以減去法形成圖 案化增層線路之流程圖;以及 第3A圖至第3H圖係習知盲孔製造方法之流程圖。 10,20,30 内層電路板 11, 21, 31 妁層線路層 110,210 對位墊 1 2, 2 2, 3 2 - 壓合層 • 0,2 2 0,3 2 0 絕緣層 121,221 導電金屬層 122 粗面氧化層 13,23 定位機台 1 3 0,2 3 0 定位插梢17556 Quan 懋 .ptd Page 19 200524490 Brief description of the drawings [Simplified description of the drawings]: Figures 1A to 1L are the manufacturing method of the conductive blind hole of the build-up circuit board of the first embodiment of the present invention to add 1A to 1I and 1J 'to 1M' diagrams of the method for forming a patterned build-up circuit by the method, which are manufacturing methods of conductive blind holes of the build-up circuit board according to the first embodiment of the present invention Flow chart for forming patterned build-up circuit by subtractive method; FIGS. 2A to 2I are the manufacturing method of the conductive blind hole of the build-up circuit board according to the second embodiment of the present invention. 2A to 2F and 2G 'to 2J' diagrams of the flow of the layer circuit, which are formed by subtracting the conductive blind hole manufacturing method of the layer-added circuit board according to the second embodiment of the present invention. A flowchart of patterning the layer-increasing circuit; and FIGS. 3A to 3H are flowcharts of a conventional method for manufacturing blind holes. 10,20,30 Inner circuit board 11, 21, 31 妁 layer circuit layer 110,210 Alignment pad 1 2, 2 2, 3 2-Lamination layer • 0, 2 2 0, 3 2 0 Insulating layer 121, 221 Conductive metal layer 122 Rough surface oxide layer 13,23 Positioning machine 1 3 0,2 3 0 Positioning pin

17556全®. ptd 第20頁 20052449017556All®.ptd Page 20 200524490

圖式簡單說明 14,24,34 盲孑L 15,25 二氧化碳雷 16, 26, 36 晶種層 17,27 電鍍阻層 1 7 0,2 7 0 開口 18,28,38 導電線路層 19,29 電鍍金屬層 1 9 0,2 9 0 阻層 321 銅箔層 33 光阻層 330 光阻層開口 17556 全懋.ptd 第21頁Brief description of the drawings 14,24,34 Blind L 15,25 Carbon dioxide lightning 16, 26, 36 Seed layer 17, 27 Plating resist 1 7 0, 2 7 0 Opening 18, 28, 38 Conductive circuit layer 19, 29 Electroplated metal layer 1 9 0, 2 9 0 Resistive layer 321 Copper foil layer 33 Photoresistive layer 330 Photoresistive layer opening 17556 懋 .ptd page 21

Claims (1)

200524490 六、申請專利範圍 1. 一種增層電路板之導電盲孔(Electrically C〇n d u c t i v e V i a)製造方法,係包括以下步驟: • 預備一具有内層線路層之内層電路板,該内層電 路板之至少一表面上形成有一壓合層,且該壓合層包 含有至少一導電金屬層; 氧化處理該導電金屬層,以在該導電金屬層上形 成一粗面氧化層; 雷射熔蝕該粗面氧化層及該壓合層,以形成複數 個貫穿壓合層之盲孔;以及 φ 於各盲孔及該導電金屬層上形成一圖案化導電線 路層,以製成複數個電性連接該增層電路板層間之導 電盲孔。 2 .如申請專利範圍第1項之增層電路板之導電盲孔製造方 法,復包括於該導電金屬層上實施一表面微1虫( Surface Uni form Etching Process, SUEP)製程 o 3.如申請專利範圍第1項之增層電路板之導電盲孔製造方 法,復包括於該圖案化線路形成前,移除該粗面氧 層。 4 .如申請專利〜範圍第1項之增層電路板之導電盲孔製造方 ®法,其中,該導電金屬層係為銅箔。 5. 如申請專利範圍第1項之增層電路板之導電盲孔製造方 法,其中,該氧化處理係進行一棕化製程(Brown Oxidation) 〇 6. 如申請專利範圍第1項之增層電路板之導電盲孔製造方200524490 VI. Scope of patent application 1. A method for manufacturing electrically conductive blind vias of a build-up circuit board includes the following steps: • Preparing an inner-layer circuit board with an inner-layer circuit layer. A pressing layer is formed on at least one surface, and the pressing layer includes at least one conductive metal layer; the conductive metal layer is oxidized to form a rough oxide layer on the conductive metal layer; Surface oxide layer and the pressing layer to form a plurality of blind holes penetrating through the pressing layer; and φ forming a patterned conductive circuit layer on each of the blind holes and the conductive metal layer to make a plurality of electrical connections to the Conductive blind holes between layers of a build-up circuit board. 2. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 1 of the scope of patent application, which includes implementing a Surface Uni form Etching Process (SUEP) process on the conductive metal layer. 3. If applying The manufacturing method of the conductive blind hole of the layered circuit board of the first item of the patent scope includes removing the rough oxygen layer before the patterned circuit is formed. 4. The method for manufacturing a conductive blind hole of a build-up circuit board according to the first aspect of the patent application, wherein the conductive metal layer is a copper foil. 5. For example, the method for manufacturing a conductive blind hole of a build-up circuit board according to item 1 of the scope of patent application, wherein the oxidation treatment is performed by a browning process (Brown Oxidation). Manufacturing method of conductive blind hole of board 17556全懋.ptd 第22頁 200524490 六、申請專利範圍 法,其中,該氧化處理係進行一黑化製程(B 1 ack Oxidation) 。 7. 如申請專利範圍第1項之增層電路板之導電盲孔製造方 法,其中,該雷射光對於該粗面氧化層之反射性小於 該雷射光對於該導電金屬層之反射性。 8. 如申請專利範圍第1項之增層電路板之導電盲孔製造方 法,其中,該雷射係為二氧化碳雷射。 9. 如申請專利範圍第1項之增層電路板之導電盲孔製造方 法,其中,該導電盲孔係貫穿壓合層,並與覆蓋在該 壓合層下方之内層線路層電性連接。 1 〇 .如申請專利範圍第1項之增層電路板之導電盲孔製造方 法,其中,該圖案化導電線路層係以加成法(A d d i t i v e )製作。 1 1 .如申請專利範圍第1項之增層電路板之導電盲孔製造方 法,其中^該圖案化導電線路層係以減去法( Subtract i ve)製作。 1 2 · —種增層電路板之導電盲孔(E 1 e c t r i c a 1 1 y _ C〇n d u c t i v e V i a)製造方法,係包括以下步驟: 預備一具有内層線路層之内層電路板,該内層.電 路板之至少一表面上形成有一壓合層,且該壓合層包 含有至少一導電金屬層; 雷射熔蝕該壓合層,以形成複數個貫穿壓合層之 盲孔;以及 於各盲孔及該導電金屬層上形成一圖案化導電線17556 全懋 .ptd Page 22 200524490 6. Application for Patent Scope Method, in which the oxidation treatment is carried out by a blackening process (B 1 ack Oxidation). 7. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 1 of the application, wherein the reflectivity of the laser light to the rough oxide layer is less than the reflectivity of the laser light to the conductive metal layer. 8. The method for manufacturing a conductive blind hole of a layer-added circuit board according to item 1 of the patent application scope, wherein the laser is a carbon dioxide laser. 9. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 1 of the scope of patent application, wherein the conductive blind hole penetrates the bonding layer and is electrically connected to the inner circuit layer covering the bonding layer. 10. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 1 of the scope of patent application, wherein the patterned conductive circuit layer is made by an additive method (A d d i t i v e). 1 1. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 1 of the scope of patent application, wherein the patterned conductive circuit layer is made by a subtract method. 1 2 · —A method for manufacturing conductive blind holes (E 1 ectrica 1 1 y _ Conductive Via) of a build-up circuit board includes the following steps: preparing an inner circuit board with an inner circuit layer, and the inner layer circuit. A compression layer is formed on at least one surface of the board, and the compression layer includes at least one conductive metal layer; the laser is used to ablate the compression layer to form a plurality of blind holes penetrating the compression layer; A patterned conductive line is formed on the hole and the conductive metal layer 17556 全懋.ptd 第23頁 200524490 I六、申請專利範圍 路層,以形成複數個電性連接增層電路板層間之導電 盲孔。 1‘3 .如申請專利範圍第1 2項之增層電路板之導電盲孔製造 方法,復包括於該導電金屬層上實施一表面微蝕 (Surface Uni form Etching Process, S UEP)製程。 1 4 .如申請專利範圍第1 2項之增層電路板之導電盲孔製造 方法,其中,該導電金屬層係為銅箔。 1 5 .如申請專利範圍第1 2項之增層電路板之導電盲孔製造 方法,其中,該雷射光對於該粗面氧化層之反射性小 _於該雷射光對於該導電金屬層之反射性。 -1 6.如申請專利範圍第1 2項之增層電路板之導電盲孔製造 方法,其中,該導電盲孔係貫穿壓合層,並與覆蓋在 該壓合層下方之内層線路層電性連接。 1 7.如申請專利範圍第1 2項之增層電路板之導電盲孔製造 方法,其中,該圖案化導電線路層係以加成法( Additive)製作。 1 8 .如申請專秫範圍第1 2項之增層電路板之導電盲孔製 方法,其中」該圖案化導電線路層係以減去法( Subtractive)製作。 .如申請專利範圍第1 2項之增層電路板之導電盲孔製造 方法,其中,該導電金屬層係為銅箔。 2 〇 .如申請專利範圍第1 2項之增層電路板之導電盲孔製造 方法,其中,該雷射係為UV雷射。17556 Quan 懋 .ptd Page 23 200524490 I. Scope of patent application Road layer to form a plurality of conductive blind holes electrically connected to the layers of the build-up circuit board. 1′3. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 12 of the scope of patent application, further comprising performing a Surface Uniform Etching Process (S UEP) process on the conductive metal layer. 14. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 12 of the scope of patent application, wherein the conductive metal layer is a copper foil. 15. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 12 of the scope of patent application, wherein the laser light is less reflective to the rough oxide layer _ than the laser light is reflective to the conductive metal layer Sex. -1 6. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 12 of the scope of patent application, wherein the conductive blind hole penetrates the bonding layer, and is electrically connected to the inner layer circuit layer covering the bonding layer. Sexual connection. 1 7. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 12 of the scope of patent application, wherein the patterned conductive circuit layer is made by an additive method. 18. If you apply for the conductive blind hole manufacturing method for layer-added circuit boards in item 12 of the application, where "the patterned conductive circuit layer is made by Subtractive". The method for manufacturing a conductive blind hole of a build-up circuit board according to item 12 of the patent application scope, wherein the conductive metal layer is a copper foil. 20. The method for manufacturing a conductive blind hole of a build-up circuit board according to item 12 of the patent application scope, wherein the laser is a UV laser. 17556 全懋.ptd 第24頁17556 懋 .ptd Page 24
TW93100865A 2004-01-14 2004-01-14 Method for fabricating electrically conductive via of build-up type packaging substrate by laser drilling TWI260188B (en)

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CN103052253A (en) * 2011-10-12 2013-04-17 旭德科技股份有限公司 Circuit board structure and manufacturing method thereof
CN113630984A (en) * 2021-07-13 2021-11-09 广东世运电路科技股份有限公司 Method for filling copper plating hole with high thickness-diameter ratio and core plate

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Publication number Priority date Publication date Assignee Title
TWI372007B (en) 2008-08-07 2012-09-01 Unimicron Technology Corp Method for fabricating blind via structure of substrate

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103052253A (en) * 2011-10-12 2013-04-17 旭德科技股份有限公司 Circuit board structure and manufacturing method thereof
TWI419627B (en) * 2011-10-12 2013-12-11 Subtron Technology Co Ltd Circuit board structure and manufacturing method thereof
US8991043B2 (en) 2011-10-12 2015-03-31 Subtron Technology Co., Ltd. Manufacturing method of a circuit board structure
CN103052253B (en) * 2011-10-12 2015-10-28 旭德科技股份有限公司 Circuit board structure and manufacturing method thereof
CN113630984A (en) * 2021-07-13 2021-11-09 广东世运电路科技股份有限公司 Method for filling copper plating hole with high thickness-diameter ratio and core plate

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