TW200509585A - Signal detecting circuit and method therefor - Google Patents

Signal detecting circuit and method therefor

Info

Publication number
TW200509585A
TW200509585A TW093113273A TW93113273A TW200509585A TW 200509585 A TW200509585 A TW 200509585A TW 093113273 A TW093113273 A TW 093113273A TW 93113273 A TW93113273 A TW 93113273A TW 200509585 A TW200509585 A TW 200509585A
Authority
TW
Taiwan
Prior art keywords
signal
generates
detecting circuit
base clock
clock signal
Prior art date
Application number
TW093113273A
Other languages
English (en)
Other versions
TWI249301B (en
Inventor
Yong-Jun Kim
Myung-Bo Kwak
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of TW200509585A publication Critical patent/TW200509585A/zh
Application granted granted Critical
Publication of TWI249301B publication Critical patent/TWI249301B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators
TW093113273A 2003-05-15 2004-05-12 Signal detecting circuit and method therefor TWI249301B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR10-2003-0030903A KR100518573B1 (ko) 2003-05-15 2003-05-15 신호 검출 회로 및 신호 검출 방법

Publications (2)

Publication Number Publication Date
TW200509585A true TW200509585A (en) 2005-03-01
TWI249301B TWI249301B (en) 2006-02-11

Family

ID=33411727

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093113273A TWI249301B (en) 2003-05-15 2004-05-12 Signal detecting circuit and method therefor

Country Status (3)

Country Link
US (1) US7123058B2 (zh)
KR (1) KR100518573B1 (zh)
TW (1) TWI249301B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112583539A (zh) * 2019-09-30 2021-03-30 瑞昱半导体股份有限公司 信号检测电路与信号检测方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100564593B1 (ko) * 2003-12-12 2006-03-28 삼성전자주식회사 반도체 메모리 소자의 입력신호 수신장치
US7627003B1 (en) * 2005-09-30 2009-12-01 The United States Of America As Represented By The Secretary Of The Navy Automatic clock synchronization and distribution circuit for counter clock flow pipelined systems
US7592844B2 (en) * 2007-01-19 2009-09-22 Power Integrations, Inc. Comparator with complementary differential input stages
US9531352B1 (en) * 2015-06-24 2016-12-27 Intel Corporation Latched comparator circuit
US9964597B2 (en) * 2016-09-01 2018-05-08 Texas Instruments Incorporated Self test for safety logic
US9911471B1 (en) * 2017-02-14 2018-03-06 Micron Technology, Inc. Input buffer circuit
TWI650567B (zh) * 2018-01-04 2019-02-11 瑞昱半導體股份有限公司 應用於比較器之自我測試電路及自我測試方法
TWI788592B (zh) * 2019-09-26 2023-01-01 瑞昱半導體股份有限公司 訊號偵測電路與訊號偵測方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5889419A (en) * 1996-11-01 1999-03-30 Lucent Technologies Inc. Differential comparison circuit having improved common mode range
JP4589496B2 (ja) 2000-08-07 2010-12-01 株式会社ハイニックスセミコンダクター 省電力用条件付き捕獲フリップフロップ
US6809566B1 (en) * 2003-07-30 2004-10-26 National Semiconductor Corporation Low power differential-to-single-ended converter with good duty cycle performance

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112583539A (zh) * 2019-09-30 2021-03-30 瑞昱半导体股份有限公司 信号检测电路与信号检测方法

Also Published As

Publication number Publication date
KR100518573B1 (ko) 2005-10-04
US20040230388A1 (en) 2004-11-18
US7123058B2 (en) 2006-10-17
TWI249301B (en) 2006-02-11
KR20040098690A (ko) 2004-11-26

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