TW200402769A - Removal of plasma deposited surface layers by dilution gas sputtering - Google Patents
Removal of plasma deposited surface layers by dilution gas sputtering Download PDFInfo
- Publication number
- TW200402769A TW200402769A TW092121107A TW92121107A TW200402769A TW 200402769 A TW200402769 A TW 200402769A TW 092121107 A TW092121107 A TW 092121107A TW 92121107 A TW92121107 A TW 92121107A TW 200402769 A TW200402769 A TW 200402769A
- Authority
- TW
- Taiwan
- Prior art keywords
- gas
- reaction chamber
- doping
- plasma
- ions
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0057—Reactive sputtering using reactive gases other than O2, H2O, N2, NH3 or CH4
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32412—Plasma immersion ion implantation
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B21/00—Nitrogen; Compounds thereof
- C01B21/082—Compounds containing nitrogen and non-metals and optionally metals
- C01B21/083—Compounds containing nitrogen and non-metals and optionally metals containing one or more halogen atoms
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0063—Reactive sputtering characterised by means for introducing or removing gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0068—Reactive sputtering characterised by means for confinement of gases or sputtered material, e.g. screens, baffles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/48—Ion implantation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US40056002P | 2002-08-02 | 2002-08-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200402769A true TW200402769A (en) | 2004-02-16 |
Family
ID=31495837
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092121107A TW200402769A (en) | 2002-08-02 | 2003-08-01 | Removal of plasma deposited surface layers by dilution gas sputtering |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1525333A2 (fr) |
JP (1) | JP2005535131A (fr) |
KR (1) | KR20050034731A (fr) |
TW (1) | TW200402769A (fr) |
WO (1) | WO2004013371A2 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050287307A1 (en) * | 2004-06-23 | 2005-12-29 | Varian Semiconductor Equipment Associates, Inc. | Etch and deposition control for plasma implantation |
US20060040499A1 (en) * | 2004-08-20 | 2006-02-23 | Steve Walther | In situ surface contaminant removal for ion implanting |
EP1936656A1 (fr) * | 2006-12-21 | 2008-06-25 | Nederlandse Organisatie voor Toegepast-Natuuurwetenschappelijk Onderzoek TNO | Générateur de plasma et procédé de nettoyage d'un objet |
US8679960B2 (en) * | 2009-10-14 | 2014-03-25 | Varian Semiconductor Equipment Associates, Inc. | Technique for processing a substrate having a non-planar surface |
KR101898597B1 (ko) * | 2010-09-15 | 2018-09-14 | 프랙스에어 테크놀로지, 인코포레이티드 | 이온 소스의 수명 연장 방법 |
US9812291B2 (en) | 2012-02-14 | 2017-11-07 | Entegris, Inc. | Alternate materials and mixtures to minimize phosphorus buildup in implant applications |
KR101596466B1 (ko) | 2015-07-21 | 2016-02-22 | 농업회사법인 주식회사 아그로비즈 | 수용성 구형비료의 제조방법 |
US10460941B2 (en) * | 2016-11-08 | 2019-10-29 | Varian Semiconductor Equipment Associates, Inc. | Plasma doping using a solid dopant source |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57201527A (en) * | 1981-06-01 | 1982-12-10 | Toshiba Corp | Ion implantation method |
US5571576A (en) * | 1995-02-10 | 1996-11-05 | Watkins-Johnson | Method of forming a fluorinated silicon oxide layer using plasma chemical vapor deposition |
JP3080867B2 (ja) * | 1995-09-25 | 2000-08-28 | 日本電気株式会社 | Soi基板の製造方法 |
JP3099819B2 (ja) * | 1997-11-28 | 2000-10-16 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
GB2336603A (en) * | 1998-04-23 | 1999-10-27 | Metaltech Limited | A method and apparatus for plasma boronising |
US6300643B1 (en) * | 1998-08-03 | 2001-10-09 | Varian Semiconductor Equipment Associates, Inc. | Dose monitor for plasma doping system |
KR20010039728A (ko) * | 1999-07-22 | 2001-05-15 | 가와하라 하지메 | 이온 소스 |
EP1156511A1 (fr) * | 2000-05-19 | 2001-11-21 | Applied Materials, Inc. | Appareil de CVD assisté par plasma éloigné |
-
2003
- 2003-08-01 KR KR1020057001895A patent/KR20050034731A/ko not_active Application Discontinuation
- 2003-08-01 WO PCT/US2003/024158 patent/WO2004013371A2/fr active Application Filing
- 2003-08-01 JP JP2004526318A patent/JP2005535131A/ja not_active Withdrawn
- 2003-08-01 TW TW092121107A patent/TW200402769A/zh unknown
- 2003-08-01 EP EP03759186A patent/EP1525333A2/fr not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JP2005535131A (ja) | 2005-11-17 |
WO2004013371A2 (fr) | 2004-02-12 |
KR20050034731A (ko) | 2005-04-14 |
WO2004013371A3 (fr) | 2004-10-21 |
EP1525333A2 (fr) | 2005-04-27 |
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