TW200301717A - Electrolytic processing apparatus and method - Google Patents

Electrolytic processing apparatus and method Download PDF

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Publication number
TW200301717A
TW200301717A TW092100219A TW92100219A TW200301717A TW 200301717 A TW200301717 A TW 200301717A TW 092100219 A TW092100219 A TW 092100219A TW 92100219 A TW92100219 A TW 92100219A TW 200301717 A TW200301717 A TW 200301717A
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Taiwan
Prior art keywords
processing
electrode
workpiece
substrate
electrolytic
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TW092100219A
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Chinese (zh)
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TWI271246B (en
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Yuzo Mori
Mitsuhiko Shirakashi
Masayuki Kumekawa
Hozumi Yasuda
Itsuki Kobata
Toma Yasushi
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Yuzo Mori
Ebara Corp
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23HWORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
    • B23H3/00Electrochemical machining, i.e. removing metal by passing current between an electrode and a workpiece in the presence of an electrolyte
    • B23H3/08Working media
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23HWORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
    • B23H3/00Electrochemical machining, i.e. removing metal by passing current between an electrode and a workpiece in the presence of an electrolyte
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23HWORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
    • B23H5/00Combined machining
    • B23H5/06Electrochemical machining combined with mechanical working, e.g. grinding or honing
    • B23H5/08Electrolytic grinding
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00Electrolytic etching or polishing
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F7/00Constructional parts, or assemblies thereof, of cells for electrolytic removal of material from objects; Servicing or operating

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)

Abstract

There is provided an electrolytic processing apparatus and method that can effect processing of a substrate with high processing precision and can produce an intended form of processed substrate with high accuracy of form. The electrolytic processing apparatus includes: a holder for holding a substrate; a processing electrode that can come close to the substrate; a feeding electrode for feeding electricity to the substrate; an ion exchanger disposed in the space between the substrate and the processing electrode, or the substrate and the feeding electrode; a fluid supply section for supplying a fluid into the space; a power source for applying a voltage between the processing electrode and the feeding electrode; a drive sections for allowing the substrate and the processing electrode, facing each other, to make a relative movement; and a numerical controller for effecting a numerical control of the drive sections.

Description

200301717 五:發明說明(1) [發明所屬之技術領域] 本發明係關於電解加工裝置及方法,尤指一種用於加 工基板(諸如半導體晶圓)表面之導電材料或用於移除黏 著在基板表面之雜質的電解加工裝置及方法。 [先前技術] 近年來,明顯傾向使用具有低電阻率與電子遷移阻抗 -(electromigration resistance)白勺銅(Cu)取代紹或銘 合金,以作為用於形成基板(諸如半導體晶圓)上之互連 1電路(i nt er conne t i on circuit)的材料°銅互連線 鲁n ter connect )通常藉由將銅填充於形成在基板表面中的 微細凹槽而形成,有多種習知之用於形成該銅互連線的技 術,包含化學氣相沈積(CVD)、濺鍍及電鍍,根據任一 種這樣的技術,銅膜係形成於基板之實質地整個表面中, 接.著以化學機械研磨(chemical mechanical polishing,CMP)移除多餘的銅。 第8A圖至第8C圖係以製程步驟的順序說明形成具有銅 互連線之該基板W的實例。如第8 A圖所示,諸如二氧化石夕 之氧化膜或低介電常數材料膜之絕緣膜2係沈積於導電層 1 a (半導體裝置形成於其中)上,其中該導電層丨a係形S成 #半導體基材1上,互連線用的接觸孔3與溝渠4係藉由微 影/蝕刻技術而形成於絕緣膜2中。之後,氮化鈕阻障層5 咸類似物係形成於整個表面上,且作為電鍍用之電供廣、I 的種子層7係形成於阻障層5上。 〜曰 然後,如第8 B圖所示,在基板W表面上進行鋼電⑬,200301717 V: Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to an electrolytic processing device and method, and particularly to a conductive material used for processing the surface of a substrate (such as a semiconductor wafer) or for removing adhesion to the substrate Electrolytic processing device and method for surface impurities. [Prior art] In recent years, it has been a clear tendency to use copper (Cu) with low resistivity and electron migration resistance (Cu) instead of Shao or Ming alloy as a substrate for forming a substrate (such as a semiconductor wafer). The material of the circuit (inner conne ti on circuit) ° copper interconnect is usually formed by filling copper into the fine grooves formed in the surface of the substrate. There are many known methods for forming The copper interconnect technology includes chemical vapor deposition (CVD), sputtering, and electroplating. According to any of these technologies, a copper film is formed on substantially the entire surface of the substrate, followed by chemical mechanical polishing ( chemical mechanical polishing (CMP) to remove excess copper. 8A to 8C illustrate an example of forming the substrate W with copper interconnections in the order of process steps. As shown in FIG. 8A, an insulating film 2 such as an oxide film or a low-dielectric-constant material film is deposited on a conductive layer 1a (a semiconductor device is formed therein), where the conductive layer 丨 a is In the semiconductor substrate 1, the contact holes 3 and the trenches 4 for interconnect lines are formed in the insulating film 2 by a lithography / etching technique. After that, the nitride button barrier layer 5 is formed on the entire surface, and a seed layer 7 is formed on the barrier layer 5 as a power supply for plating. ~~ Then, as shown in FIG. 8B, a steel electrode is performed on the surface of the substrate W,

200301717 五、發明說明(2) 而將接觸孔3與溝渠4填充以銅,並同時沈積銅膜6於絕緣 膜2上。其次,藉由化學機械研磨移除絕緣膜2上的銅膜6 與阻障層5,以使填充於接觸孔3與溝渠4中之互連線用銅 膜的表面與絕緣膜2表面實質上位於相同的平面上,因而 形成如第8 C圖所示之由銅膜6組成的互連結構 (interconnection)。 不同類型裝置中的元件近來已變得更微細且要求更高 的精度,由於次微米製造技術已廣泛地使用,所以材料性 質主要為加工方法所影響。在使用此種習知機械加工方法 的狀況下,在工件的所欲部位係以物理方式破壞,並藉由 工具而由工件表面移除,所以可能產生諸多缺陷而劣化工 件性質。因此,在未劣化材料性質的情況下進行加工變得 重要。 諸如化學研磨、電解加工及電解研磨等若干加工方法 一直在進行開發,以解決此問題。相對於習知的物理加 工,這些方法係藉由化學分解反應進行移除加工或類似加 工。因此,這些方法並不受塑性變形所造成之缺陷(諸如 變樣層(altered layer)與差排(dislocation))的影響, 以使得在未劣化材料性質的情況下可進行加工。 利用離子交換器之催化反應並於超純水中進行加工的 加工方法已開發成為電解加工方法,第9圖說明此電解加 工方法的原理。第9圖係表示當安裝於加工電極1 4上的離 子交換器1 2a及安裝於饋電電極1 6上的離子交換器1 2b與工 件1 0表面接觸或靠近時之離子狀態,其中電壓係由電源17200301717 V. Description of the invention (2) The contact hole 3 and the trench 4 are filled with copper, and a copper film 6 is deposited on the insulating film 2 at the same time. Next, the copper film 6 and the barrier layer 5 on the insulating film 2 are removed by chemical mechanical polishing, so that the surface of the copper film for interconnection lines filled in the contact holes 3 and the trenches 4 and the surface of the insulating film 2 are substantially They are located on the same plane, thereby forming an interconnection structure composed of a copper film 6 as shown in FIG. 8C. Components in different types of devices have recently become finer and require higher accuracy. Since sub-micron manufacturing techniques have been widely used, material properties are mainly affected by processing methods. In the case of using such a conventional machining method, a desired portion of a workpiece is physically destroyed and removed from the surface of the workpiece by a tool, so many defects may be generated to degrade the properties of the workpiece. Therefore, it becomes important to process without degrading the properties of the material. Several processing methods such as chemical grinding, electrolytic machining, and electrolytic grinding have been developed to solve this problem. In contrast to conventional physical processing, these methods use chemical decomposition reactions for removal processing or similar processing. Therefore, these methods are not affected by defects (such as altered layers and dislocations) caused by plastic deformation, so that processing can be performed without degrading the material properties. A processing method using a catalytic reaction of an ion exchanger and processing in ultrapure water has been developed as an electrolytic processing method. Fig. 9 illustrates the principle of this electrolytic processing method. FIG. 9 shows the ion state when the ion exchanger 12a mounted on the processing electrode 14 and the ion exchanger 12b mounted on the feeding electrode 16 are in contact with or close to the surface of the workpiece 10. The voltage is Powered by 17

«I1 314314.ptd 第11頁 200301717 五'發明說明(3) 施 > 於加工電極1 4與饋電電極1 6之間,且液體1 8 (諸如超 純水)係由液體供應部1 9供應至加工電極1 4、饋電電極1 6 與工件1 0之間。在本電解加工的狀況中’諸如超純水之液 體1 8中的水分子2 0係使用離子交換器1 2 a, 1 2 b而有效率地 解離成氫氧離子2 2與氫離子2 4。所產生的氫氧離子2 2係藉 由工件1 0與加工電極1 4間的電場並措由液體1 8的流動’而 傳送至正對於加工電極1 4的工件1 0表面,藉此提高工件1 0 周圍的氫氧離子2 2密度,且氫氧離子2 2係與工件1 0的原子 1 0 a發生反應,藉由此反應所產生的反應產物2 6係於液體 中分解,並藉由液體1 8的流動而沿著工件1 0表面由工件 1 0移除,因而完成工件1 0表面的移除加工。 在使用前揭方法藉由離子交換器進行導電材料之電解 加工的過程中,無法將習知機械加工所普遍使用的數值控 制機構直接應用於此電解加工中。在這方面,電解加工方 法係利用氫氧離子與工件原子間的化學交互作用。於是, 即使當工件與工具(電極)彼此並未接觸,加工現象仍發 生。因此,電解加工不同於藉由物理破壞工件而完成加工 之機械加工的加工原理。更具體地說,在一般的機械加工 中,係使彼此接觸的工件與工具得以進行相對運動,以便 _工件進行物理破壞而完成加工。當諸如加工量到達希冀 的加工量時,使工件與工具分開不接觸便可終止加工的進 、行,即使當工具越過工件表面時,也不會進行加工。另一 方面,根據利用反應物質與工件間之化學交互作用的電解 加工法,如前所述,即使當工具(電極)未與工件接觸,«I1 314314.ptd Page 11 200301717 Five 'Description of Invention (3) Application > Between the processing electrode 14 and the feed electrode 16 and the liquid 18 (such as ultrapure water) is provided by the liquid supply unit 1 9 It is supplied between the processing electrode 14, the feeding electrode 16 and the workpiece 10. In the state of this electrolytic processing, 'water molecules 2 in a liquid such as ultrapure water 1 8 are efficiently dissociated into hydroxide ions 2 2 and hydrogen ions 2 4 using ion exchangers 1 2 a, 1 2 b. . The generated hydroxide ions 22 are transmitted to the surface of the workpiece 10 facing the processing electrode 14 by the electric field between the workpiece 10 and the processing electrode 14 and the flow of the liquid 18, thereby improving the workpiece. 1 0 The density of surrounding hydroxide ions 2 2, and the hydroxide ions 2 2 react with the atom 10 0 a of the workpiece 10, and the reaction product 2 6 generated by the reaction is decomposed in the liquid, and The flow of the liquid 18 removes the workpiece 10 along the surface of the workpiece 10, thereby completing the removal process of the surface of the workpiece 10. In the process of electrolytically processing conductive materials by ion exchangers using the pre-exposure method, the numerical control mechanism commonly used in conventional machining cannot be directly applied to this electrolytic processing. In this regard, the electrolytic machining method utilizes chemical interactions between hydroxide ions and workpiece atoms. Therefore, even when the workpiece and the tool (electrode) are not in contact with each other, the machining phenomenon still occurs. Therefore, electrolytic machining is different from the machining principle of machining by physically destroying the workpiece. More specifically, in general machining, a workpiece and a tool that are in contact with each other can be moved relative to each other so that the workpiece can be physically destroyed to complete the processing. When the processing volume reaches the desired processing volume, the workpiece can be separated from the tool without contact to terminate the progress and progress of the processing. Even when the tool crosses the surface of the workpiece, processing will not be performed. On the other hand, according to the electrolytic processing method that utilizes the chemical interaction between the reactive material and the workpiece, as mentioned earlier, even when the tool (electrode) is not in contact with the workpiece,

314314.ptd 第12頁 200301717 五、發明說明(4) 在反應物質數量達特定水平時,仍會發生加工現象。因 此,當工具(電極)越過已完成預定數量加工之工件部分 的表面時,仍無可避免地會發生加工現象。 因此,為了藉由利用反應物質與工件間之化學交互作 用的電解加工法,以將導電材料以高加工精度進行加工而 形成希冀的加工工件外形,需要一種控制系統,此種控制 系統不僅在機械加工的狀況中控制工件與工具間的接觸狀 態(工具的位置),且亦控制諸如氫氧離子之反應物質與 工件原子間的化學交互作用。 [發明内容] 本發明已鑑於前揭背景技藝的情形而完成。因此,本 發明之目的在於提供一種電解加工裝置與方法,可以高加 工精度完成表面具有導電材料(作為待加工的材料)之工 件的加工,並可形成具有高精度外形之希冀的加工工件外 形。 為達成前揭目的,本發明提供一種電解加工裝置,該 裝置包括:固定座,用於可拆卸自如地固持工件;加工電 極,可靠近或接觸為固定座所固持的工件;饋電電極,用 於將電力供應至為固定座所固持的工件;離子交換器,配 置於工件與加工電極間之空間以及工件與饋電電極間之空 間中的至少一個空間中;流體供應部,用於將流體供應至 其中存在有離子交換器之工件與加工電極及饋電電極中之 至少其中一個電極之間;電源,用於施加電壓於加工電極 與饋電電極之間;驅動部,用於使彼此面對且為固持座所314314.ptd Page 12 200301717 V. Description of the invention (4) When the amount of the reactant reaches a certain level, processing will still occur. Therefore, when the tool (electrode) passes over the surface of the part of the workpiece that has been processed in a predetermined amount, the machining phenomenon inevitably occurs. Therefore, in order to process the conductive material with high processing accuracy to form the desired shape of the processed workpiece by electrolytic processing using the chemical interaction between the reactive material and the workpiece, a control system is needed, not only in mechanical The state of processing controls the state of contact between the workpiece and the tool (the position of the tool), and also controls the chemical interaction between reactive materials such as hydroxide ions and the atoms of the workpiece. SUMMARY OF THE INVENTION The present invention has been completed in view of the circumstances of the background art disclosed previously. Therefore, an object of the present invention is to provide an electrolytic machining device and method that can complete the machining of a workpiece having a conductive material (as a material to be processed) on its surface with high machining accuracy, and can form the shape of a machining workpiece with a high-precision appearance. In order to achieve the purpose of the previous disclosure, the present invention provides an electrolytic processing device. The device includes: a fixing base for detachably holding a workpiece; a processing electrode, which can approach or contact the workpiece held by the fixing base; For supplying electric power to a workpiece held by a fixed base; an ion exchanger arranged in at least one of a space between the workpiece and the processing electrode and a space between the workpiece and the feeding electrode; a fluid supply unit for transferring fluid It is supplied between a workpiece having an ion exchanger therein and at least one of the processing electrode and the feeding electrode; a power source for applying a voltage between the processing electrode and the feeding electrode; and a driving part for facing each other Right and fixed

314314.ptd 第13頁 200301717 五、—發明說明(5) 固持的工件與加工電極得以進行相對運動;以及數值控制 器,用於完成驅動部的數值控制。 本電解加工裝置得以將加工前或加工期間的工件外形 與希冀的加工後工件外形做比較,而決定加工量(相當於 二種外形之間的座標差’將茶數貢料(相當於加工置) 輸入數值控制器並且根據所輸入的資料而完成驅動部的數 值控制,其中該驅動部用於使彼此面對之為固定座所固持 的工件與加工電極得以進行相對運動。在該數值控制下進 ~亍作業的電解加工裝置可製造成具有高精度外形之希冀的 工工件外形。 該電源可將控制在定值的電流或電壓供應至加工電極 與饋電電極之間。 在電解加工期間,當加工電極與饋電電極之間流動的 電流控制在定值時,加工速率便為固定。在該狀況中,加 工量係取決於電流值與加工時間的乘積。因此,在加工電 極與饋電電極之間流動的電流控制在定值的狀況下,僅藉 由數值控制加工時間(亦即工件與加工電極彼此面對的期 間),使得電解加工現象發生(停留時間),便可獲得具 有高精度外形之希冀的加工工件外形。 # 數值控制器可藉由驅動部而對諸如為固持座所固持之 工件與加工電極間的相對運動速度進行數值控制。 , 當在彼此面對且為固定座所固持之工件與加工電極間 的相對運動得以改變相對速度而進行電解加工時,可對可 1變的相對運動速度進行數值控制,此舉使電解加工得以在314314.ptd Page 13 200301717 V. Description of the invention (5) Relative movement of the fixed workpiece and the processing electrode; and a numerical controller for performing numerical control of the driving part. The electrolytic processing device can compare the shape of the workpiece before or during processing with the desired shape of the workpiece after processing, and determine the processing amount (equivalent to the coordinate difference between the two shapes. ) Input the numerical controller and complete the numerical control of the driving part according to the input data. The driving part is used to make the workpiece and the processing electrode held by the fixed seat facing each other to perform relative movement. Under the numerical control The electrolytic processing device for advanced operations can be manufactured into the desired shape of the work piece. The power supply can supply a current or voltage controlled at a fixed value between the processing electrode and the feeding electrode. During electrolytic processing, When the current flowing between the processing electrode and the feeding electrode is controlled at a fixed value, the processing rate is fixed. In this situation, the processing amount depends on the product of the current value and the processing time. Therefore, between the processing electrode and the feeding electrode The current flowing between the electrodes is controlled at a fixed value, and the machining time is controlled by only numerical values (that is, the workpiece and the machining electrode (During the correct period), so that the electrolytic machining phenomenon (dwell time) occurs, and the desired machining workpiece shape with a high-precision shape can be obtained. # The numerical controller can drive the workpiece and processing such as the workpiece held by the holder by the drive unit. The relative motion speed between the electrodes is numerically controlled. When the relative speed between the workpiece and the processing electrode facing each other and held by the fixed seat is changed to perform the electrolytic processing, the variable relative motion speed can be changed. Numerical control, which enables electrolytic processing

314314.ptd 第14頁 200301717 五、發明說明(6) 工件之加工表面的特定點上加工一段最佳化的加工時間 (停留時間)。 或者,數值控制器可藉由驅動部而對為固定座所固持 之工件與加工電極間的相對步進運動的止動時間進行數值 控制。 當在彼此面對且申固定座所固持之工件與加工電極間 得以做相對步進運動而進行電解加工時,該運動中的止動 時間係經數值控制,此舉使電解加工得以在工件之加工表 面的特定點上加工一段最佳化的加工時間(停留時間)。 在此所稱之'\相對步進運動〃意指工件與加工電極之 其中任一者或二者進行運動,以使加工電極在工件上反覆 進行特定距離之運動與停止的相對運動。 本發明提供一種電解加工方法,該方法包括:提供加 工電極、饋電電極與離子交換器,該離子交換器配置於為 固定座所固持之工件與加工電極間之空間及工件與饋電電 極間之空間中的至少一個空間中;當電力由饋電電極供應 至工件時,加工電極得以靠近或接觸為固定座所固持之工 件;將流體供應至其中存在有離子交換器之工件與加工電 極及饋電電極中之至少其中一個電極之間的空間;施加電 壓於加工電極與饋電電極之間;以及在以數值控制器數值 控制運動的情況下,使彼此面對且為固定座所固持的工件 與加工電極得以進行相對運動。 本電解加工方法可包括:量測加工前和/或加工期間 的工件外形;將所量測之外形與工件加工後之希冀外形的314314.ptd Page 14 200301717 V. Description of the invention (6) An optimized processing time (residence time) is processed at a specific point on the processing surface of the workpiece. Alternatively, the numerical controller may numerically control the stop time of the relative step motion between the workpiece held by the fixed seat and the processing electrode by the driving section. When the electrolytic machining is performed in a relative stepping motion between the workpiece and the processing electrode held by the fixed seat facing each other, the stopping time in the movement is numerically controlled, which enables electrolytic machining to be performed on the workpiece. Optimized machining time (dwell time) at a specific point on the machined surface. The “\ relative step motion” as used herein means that one or both of the workpiece and the processing electrode move to cause the processing electrode to repeatedly move and stop the relative motion on the workpiece over a specific distance. The invention provides an electrolytic processing method, which includes: providing a processing electrode, a feeding electrode, and an ion exchanger, the ion exchanger being disposed in a space between a workpiece and a processing electrode held by a fixed seat, and between the workpiece and the feeding electrode In at least one of the spaces; when power is supplied to the workpiece from the feeding electrode, the processing electrode can approach or contact the workpiece held by the fixed seat; supply fluid to the workpiece and the processing electrode in which the ion exchanger is present, and The space between at least one of the feeding electrodes; applying a voltage between the processing electrode and the feeding electrode; and in the case of numerically controlled movement by a numerical controller, facing each other and held by the fixed seat The workpiece and the processing electrode can be moved relative to each other. The electrolytic processing method may include: measuring the shape of the workpiece before and / or during the processing;

314314.ptd 第15頁 200301717 五'發明說明(7) 座摞資料輸入數值控制器中;以及根據量測外形與希冀外 形之間的座標差,而對為固定座所固持之工件與加工電極 間的相對運動速度進行數值控制。 本電解加工方法可包括:量測加工前和/或加工期間 的工件外形;將所量測之外形與工件加工後之希冀外形的 座標資料輸入數值控制器中;以及根據量測外形與希冀外 .形之間的座標差’而對為固定座所固持之工件與加工電極 間之相對步進運動中的止動時間進行數值控制。 ^ 本發明之前揭及其他目的、特徵與優點將以實例配合 •圖而由下列說明變得清楚,其中該附圖說明本發明的較 佳實施例。 [實施方式] - 現將參考圖式說明本發明的較佳實施例。雖然以下說 明的實施例係應用於使用基板作為待加工工件並移除(研 磨)形成於基板表面上之銅的電解加工裝置(電解研磨裝 置),但是本發明無疑可應用於其他工件及其他電解加 工 ° 第1圖表示根據本發明第一個實施例之電解加工裝 置。本電解加工裝置包括用於吸引並固持基板W正面朝上 _所謂的 '面朝上〃方式)之基板固定座3 0以及具有碟狀 電極部3 6 (由絕緣材料製成)的電極頭3 8。電極部3 6中嵌 ,有交錯配置且表面(下表面)暴露的扇形加工電極3 2與饋 電電極3 4,電極頭3 8則定位於基板固定座3 0上方。由層疊 1層(疊片)所組成的離子交換器4 0係安裝於電極部3 6的下314314.ptd Page 15 20031717 Description of the 5 'invention (7) The coordinate data is input into the numerical controller; and between the workpiece and the processing electrode held by the fixed base according to the coordinate difference between the measured shape and the desired shape The relative motion speed is numerically controlled. The electrolytic processing method may include: measuring a workpiece shape before and / or during processing; inputting coordinate data of the measured shape and a desired shape of the workpiece after processing into a numerical controller; and according to the measured shape and the desired shape The coordinate difference between the shapes is used to numerically control the stop time in the relative step motion between the workpiece and the processing electrode held by the fixed seat. ^ The previous disclosure and other objects, features, and advantages of the present invention will be coordinated with examples. The figure will become clear from the following description, which illustrates a preferred embodiment of the present invention. [Embodiment]-A preferred embodiment of the present invention will now be described with reference to the drawings. Although the embodiment described below is applied to an electrolytic processing apparatus (electrolytic polishing apparatus) using a substrate as a workpiece to be processed and removing (polishing) copper formed on the substrate surface, the present invention is undoubtedly applicable to other workpieces and other electrolytic processes. Processing ° Figure 1 shows an electrolytic processing apparatus according to a first embodiment of the present invention. The electrolytic processing device includes a substrate holder 30 for attracting and holding the substrate W facing up_the so-called 'face-up method' and an electrode tip 3 having a dish-like electrode portion 36 (made of an insulating material). 8. The electrode part 36 is embedded in the sector-shaped processing electrode 3 2 and the feeding electrode 3 4 which are staggered and exposed on the surface (lower surface), and the electrode head 38 is positioned above the substrate holder 30. The ion exchanger 40, consisting of one layer (laminate), is mounted below the electrode section 36.

314314.ptd 第16頁 ------ 五、發明說明(8) 表面,以便覆盍加工電極3 2與饋㊉略 基板固定座30係直接連接至=毛極34的表面 支撐軸42的上端部。馬達“作°,轉自如地進行支撐之 ^基板W與加工電極32之間發生相對由基板固定座30所固持 亚配,於支撐軸42旁邊。同&步皮•、運動的第一驅動部, 達(第一驅動部)44之間,以:6嚙合於支撐軸42與馬 :致動而使基板固定座30與為▲板第-驅動部)44 W一同轉動。 Q疋座3 0所固持之基板 電極頭3 8係向上連接至可 端,該旋轉臂48的基部係連接至*專動之旋轉臂48的自由 空心旋轉軸54係藉由垂直運動之:=旋轉軸54的上端,該 珠螺桿52進行垂直運動。馬達5^乍50的致動,而經由滾 所固持之基板W與加工電極32之門吝用於使由基板固座30 動,該馬達56定位於旋轉轴54旁曰生曰相對運動的第二驅 垂直地運動。同步皮帶58 旋轉轴54—同 動部)56之間,以藉由馬達(Π輪54與馬達(第二驅 旋轉轴54與旋轉臂48一同旋轉部)56的致動而使 再者,電極頭38係直接連接至*: 達作為用於使由基板固定座空心馬 極以之間產生相對運動的第三驅動與久工電 (第三驅動部)6 0的致動而進行旋轉。 曰二心馬達 上在本實施例中,離子交換器4〇為由一對強酸性 又換纖維62a,62b及插置於纖维62a 6, ^ 子 子夺抬“ 2 氧、,算bZa, 62b間的強酸性陽離 子又換溥膜62c所組成之三層結構(疊片)。離子交換器314314.ptd Page 16 ------ V. Description of the invention (8) Surface, so as to cover the processing electrode 3 2 and the feeding substrate fixing base 30 are directly connected to the surface support shaft 42 of the hair pole 34 Upper end. The motor "does °, and supports and rotates freely between the substrate W and the processing electrode 32. The sub-distribution is held by the substrate fixing base 30, and is next to the support shaft 42. The same as & step leather, the first drive of movement Between the (first drive section) 44 and: 6 meshes with the support shaft 42 and the horse: actuated to rotate the substrate fixing seat 30 and 44 W (the first drive section) of the board. Q 疋 座 3 The substrate electrode head 3 held by 0 is connected upward to the end, and the base of the rotating arm 48 is connected to the free hollow rotating shaft 54 of the special-purpose rotating arm 48 by vertical movement: = of the rotating shaft 54 At the upper end, the bead screw 52 performs vertical movement. Actuation of the motor 5 ^ 50 and the gate 吝 of the substrate W and the processing electrode 32 held by the roller are used to move the substrate holder 30, and the motor 56 is positioned to rotate The second drive, which is relatively moving next to the shaft 54, moves vertically. The timing belt 58 rotates between the shaft 54 and the synchronizing portion 56 so that the motor (Π wheel 54 and the motor (the second drive rotating shaft 54 and the rotation) The arm 48 rotates together) 56), and the electrode head 38 is directly connected to *: The hollow horse pole of the substrate fixing base rotates with the third drive that generates relative movement between and the actuation of Jiugongdian (third drive unit) 60. In this embodiment, the two-core motor is an ion exchanger. 40 is composed of a pair of strongly acidic fibers 62a, 62b and a fiber 62a, which is inserted into the fiber 62a, and the "2 oxygen" is calculated. The strong acidic cations between bZa and 62b are replaced by a membrane 62c. Three-layer structure (laminated). Ion exchanger

3 ⑷]4._3 ⑷] 4._

200301717 五;發明說明(9) (疊片)4 0具有良好的透水性及高硬度,此外,該離子交 換器4 0正對於基板W的暴露表面(下表面)具有良好的平 坦性。離子交換器4 0的結構可經配置以使得離子交換器薄 膜用於該暴露表面,而離子交換器纖維的疊片則配置於該 暴露之離子交換器薄膜的上方。 較佳方式係離子交換器4 0的各該疊層6 2 a,6 2 b,6 2 c帶 ,有強酸性陽離子交換基(磺酸基);然而,亦可使用帶有 弱酸性陽離子交換基(羧基)的離子交換器、帶有強鹼性 1陰離子交換基(季銨基)的離子交換器、或帶有弱鹼性陰 交換基(三級或更低等級之胺基)的離子交換器。 帶有強鹼性陰離子交換基的不織布可以諸如下列方法 製備:將纖維直徑2 0至5 0微米且孔隙率約9 0 %的聚烯烴不 織布進行所謂的射線嫁接聚合化處理(r a d i a t i ο n g r a f t p ο 1 y m e r i z a t i ο n ),該射線嫁接聚合化處理包含將7"射線 照射於不織布上及後續的嫁接聚合化處理上,藉此導入嫁 接鏈;以及接著將所導入的嫁接鏈進行胺化,而導入季銨 基於其中。所導入之離子交換基的容量可由所導入之嫁接 鏈的數量所決定。可使用諸如丙烯酸、苯乙烯、曱基丙烯 酸酯、對苯乙烯磺酸鈉或氯曱基苯乙烯 馨h loromethylstyrene )之單體進行嫁接聚合化處理,可 藉由調整單體濃度、反應溫度及反應時間而進行嫁接鏈數 *量的控制。因此,嫁接度(亦即嫁接聚合化處理後之不織 布重量對嫁接聚合化處理前之不織布重量的比例)最多可 、5 0 0%。總之,接枝聚合作用後所導入之離子交換基的200301717 5; Description of the invention (9) (laminate) 40 has good water permeability and high hardness. In addition, the ion exchanger 40 has good flatness to the exposed surface (lower surface) of the substrate W. The structure of the ion exchanger 40 may be configured such that an ion exchanger film is used for the exposed surface, and a laminate of ion exchanger fibers is disposed above the exposed ion exchanger film. Preferably, each of the stacked layers 6 2 a, 6 2 b, and 6 2 c of the ion exchanger 40 has a strongly acidic cation exchange group (sulfonic acid group); however, a weakly acidic cation exchange can also be used. Base (carboxy) ion exchanger, ion exchanger with strong basic 1 anion exchange group (quaternary ammonium group), or ion exchanger with weak basic anion exchange group (three or lower grade amine group) . The non-woven fabric with a strong basic anion exchange group can be prepared, for example, by subjecting a polyolefin non-woven fabric having a fiber diameter of 20 to 50 micrometers and a porosity of about 90% to a so-called ray graft polymerization (radiati ο ngraftp ο 1 ymerizati ο n), the ray graft polymerization treatment includes irradiating 7 " rays on the non-woven fabric and subsequent graft polymerization treatment to introduce the graft chain; and then the introduced graft chain is aminated and introduced into the quarter Ammonium is based on it. The capacity of the ion-exchange groups introduced can be determined by the number of graft chains introduced. Graft polymerization can be performed using monomers such as acrylic acid, styrene, fluorenyl acrylate, sodium p-styrene sulfonate or chlorofluorenyl styrene (lolomethylstyrene), and the monomer concentration, reaction temperature, and reaction Control the number of grafting chains in time. Therefore, the grafting degree (that is, the ratio of the weight of the non-woven fabric after the graft polymerization treatment to the weight of the non-woven fabric before the graft polymerization treatment) can be at most 500%. In short, the ion exchange groups introduced after graft polymerization

3]4314.ptd 第18頁 200301717 五、發明說明(10) 容量最大可為5 meq/g。 帶有強酸性陽離子交換基的不織布可以下列方法製 備:如同帶有強鹼性陰離子交換基之不織布的狀況,將纖 維直徑2 0至5 0微求且孔隙率約9 0 %的聚烯烴不織布進行所 謂的射線嫁接聚合化處理,該射線嫁接聚合化處理包含將 7射線照射於不織布上及後續的嫁接聚合化處理,因而產 生嫁接鏈;以及接著以熱硫酸將所導入的嫁接鏈進行處 理,以將磺酸基導入於其中。倘若嫁接鏈係以熱磷酸進行 處理,則可導入磷酸鹽基。嫁接度最多可達5 0 0%,且嫁 接聚合化處理後所導入之離子交換基的容量最大可達5 m e q / g ° 離子交換器4 0之各該疊層6 2 a,6 2 b,6 2 c的基材可為諸 如聚乙烯或聚丙烯之聚烯烴或任何其他有機聚合物。此 外,除了不織布的形式之外,離子交換器可為編織品、帶 材、多孔性材料、網材或短纖維等形式。 當使用聚乙烯或聚丙烯作為基材時,嫁接聚合化處理 可藉由下列方式完成:首先將放射線(T射線或電子束) 照射於基材上(預照射)而產生基,並接著使基與單體發 生反應,因而可獲得具有些許雜質之均句的嫁接鏈。另一 方面,當使用聚烯烴以外的有機聚合物作為基材時,可藉 由將基材浸滲以單體並將放射線(r射線、電子束或紫外 光射線)照射於基材上(同時照射),而完成基的聚合化 處理。雖然本方法未能提供均句的嫁接鏈,但其可應用於 諸多種基材。3] 4314.ptd Page 18 200301717 V. Description of the invention (10) The maximum capacity can be 5 meq / g. The non-woven fabric with a strongly acidic cation exchange group can be prepared by the following method: a polyolefin non-woven fabric having a fiber diameter of 20 to 50 micrometers and a porosity of about 90%, as in the case of a non-woven fabric with a strong basic anion exchange group. The so-called ray-graft polymerization process includes irradiating 7-rays on the non-woven fabric and subsequent graft-polymerization process, thereby generating graft chains; and then processing the introduced graft chains with hot sulfuric acid to A sulfonic acid group is introduced therein. If the graft chain is treated with hot phosphoric acid, phosphate groups can be introduced. The grafting degree can be up to 500%, and the capacity of the ion-exchange groups introduced after the graft polymerization treatment can be up to 5 meq / g ° each of the stacks of the ion exchanger 4 0 6 2 a, 6 2 b, The substrate of 6 2 c may be a polyolefin such as polyethylene or polypropylene or any other organic polymer. In addition to the non-woven fabric, the ion exchanger may be in the form of a knitted fabric, a tape, a porous material, a mesh or a short fiber. When polyethylene or polypropylene is used as the substrate, the graft polymerization can be performed by firstly irradiating radiation (T-ray or electron beam) on the substrate (pre-irradiation) to generate a base, and then making the base Reacts with the monomers, so that graft chains with even impurities can be obtained. On the other hand, when an organic polymer other than polyolefin is used as the substrate, the substrate can be impregnated with a monomer and irradiated with radiation (r-ray, electron beam, or ultraviolet light) on the substrate (while Irradiation), and the radical polymerization process is completed. Although this method does not provide a uniform graft chain, it can be applied to a variety of substrates.

314314.ptd 第19頁 200301717 五、發明說明(11) _ 藉由使用由不織布(液體可由此流過,並具有陰離子 交換基或陽離子交換基)製做之離子交換器4 0的各該疊層 6 2a,6 2b,6 2c,便得以在液體的離子與離子交換器的離子 交換基之間進行離子交換反應。 當離子交換器40的各該疊層62 a,62b,6 2 c僅具有陰離 子交換基及陽離子交換基的其中一者時,可進行電解的材 ,料會受限,此外可能因極性而形成雜質。為解決該問題, 可將陰離子交換器及陽離子交換器重疊,或可使離子交換 器4 0的各該疊層62a,62b,6 2 c本身帶有陰離子交換器及陽 籲子交換器二者,藉此可擴大待加工材料的範圍,並可抑 制雜質的形成。 再者,以離子交換材料之疊層所組成的多層結構(諸 如不織布、編織品及多孔性薄膜)製做離子交換器4 0,便 @以增加離子交換器4 0的總離子交換容量,藉此便可在諸 如銅的移除(研磨)加工中抑制氧化物的形成,以避免對 於加工速率產生負面影響。在這方面,在移除加工期間, 當離子交換器4 0的總離子交換容量小於離子交換器4 0所接 納的銅離子數量時,氧化物便無可避免地形成於離子交換 器4 0的表面上或内部中,此將對於加工速率產生負面影 •。因此,氧化物的形成係受離子交換器的離子交換容量 所影響,而超過容量的銅離子便會形成氧化物。因此,可 、使用離子交換材料(具有增加總離子交換容量之離子交換 材料)之疊層所組成的多層離子交換器作為離子交換器, 便可有效抑制氧化物的形成。314314.ptd Page 19, 20031717 V. Description of the invention (11) _ By using ion exchangers 40 each made of a non-woven cloth (a liquid can flow therethrough and having an anion exchange group or a cation exchange group) 6 2a, 6 2b, 6 2c, it is possible to perform an ion exchange reaction between the ions of the liquid and the ion exchange groups of the ion exchanger. When each of the stacks 62 a, 62 b, and 6 2 c of the ion exchanger 40 has only one of an anion-exchange group and a cation-exchange group, materials that can be electrolyzed are limited, and may be formed due to polarity. Impurities. To solve this problem, the anion exchanger and the cation exchanger may be overlapped, or each of the stacks 62a, 62b, and 6 2 c of the ion exchanger 40 may have both an anion exchanger and a cation exchanger. This can expand the range of materials to be processed, and can suppress the formation of impurities. Furthermore, a multilayer structure (such as a non-woven fabric, a knitted fabric, and a porous film) composed of a stack of ion exchange materials is used to make the ion exchanger 40, so as to increase the total ion exchange capacity of the ion exchanger 40, by This suppresses the formation of oxides during processing such as copper removal (milling) to avoid negatively affecting the processing rate. In this regard, during the removal process, when the total ion exchange capacity of the ion exchanger 40 is less than the number of copper ions accepted by the ion exchanger 40, oxides are inevitably formed in the ion exchanger 40. On the surface or inside, this will negatively affect the processing rate •. Therefore, the formation of oxides is affected by the ion exchange capacity of the ion exchanger, and copper ions exceeding the capacity will form oxides. Therefore, a multi-layer ion exchanger composed of a stack of ion-exchange materials (ion-exchange materials having an increased total ion-exchange capacity) can be used as an ion exchanger, and the formation of oxides can be effectively suppressed.

314314.ptd 第20頁 200301717 五、發明說明(12) 較佳方式係離子交換器4 0具有透水性及吸水性,再者 希冀至少正對於工件的材料具有高硬度與良好的表面平坦 性。例如,通常使用市售發泡聚氨酯'' I C 1 0 0 0 〃(由 Rode 1公司所製造)作為CMP研磨墊,1C 1 0 0 0相當硬並具 有極佳的耐磨性。藉由提供多數個通孔,便可使用該製品 作為離子交換器4 0之各該疊層的材料,得以提供孔洞於樹 脂平板中,因而使平板具有離子交換器4 0所需的透水性, 而希冀材料性質具有 ''吸水性〃乃理所當然者。 根據本實施例,複數個扇形電極板6 4係於周緣方向上 配置於電極部3 6中,而電源6 8的陰極與陽極則經由集電環 6 6而交錯連接至電極板6 4。連接至電源6 8陰極的電極板6 4 變為加工電極3 2,而連接至電源6 8陽極的電極板6 4則變為 饋電電極3 4。此施加於諸如銅的加工,因為銅的電解加工 在陰極側進行。依據待加工的材料而定,陰極側可為饋電 電極,而陽極側可為加工電極。更具體地說,當待加工材 料為銅、鉬、鐵或類似材料時,電解加工在陰極側進行, 因此,連接至電源6 8陰極的電極板6 4應為加工電極3 2,而 連接至陽極的電極板6 4則應為饋電電極3 4。另一方面,在 鋁、矽或類似材料的狀況中,電解加工在陽極側進行。因 此,連接至電源陽極的電極板應為加工電極,而連接至陰 極的電極板則應為饋電電極。 因此,藉由將加工電極3 2與饋電電極3 4分開且交錯地 配置於電極部3 6的周緣方向上,便無須固定饋電部份以將 電力供應至基板導電膜(待加工部位),而可在基板的整314314.ptd Page 20 200301717 V. Description of the Invention (12) The preferred method is that the ion exchanger 40 has water permeability and water absorption, and hopes that at least the material of the workpiece has high hardness and good surface flatness. For example, as a CMP polishing pad, a commercially available foamed polyurethane `` IC 1 0 0 0〃 '' (manufactured by Rode 1) is generally used. 1 C 1 0 0 0 is quite hard and has excellent abrasion resistance. By providing a plurality of through holes, the product can be used as the material of each of the laminates of the ion exchanger 40, so that holes can be provided in the resin plate, so that the plate has the water permeability required for the ion exchanger 40, And hope that the material properties have `` water absorption '' is taken for granted. According to this embodiment, a plurality of fan-shaped electrode plates 64 are arranged in the electrode portion 36 in the peripheral direction, and the cathode and anode of the power source 68 are alternately connected to the electrode plate 64 through the slip ring 66. The electrode plate 6 4 connected to the cathode of the power source 6 8 becomes the processing electrode 32, and the electrode plate 6 4 connected to the anode of the power source 6 8 becomes the feed electrode 34. This is applied to processing such as copper because electrolytic processing of copper is performed on the cathode side. Depending on the material to be processed, the cathode side can be the feed electrode and the anode side can be the processing electrode. More specifically, when the material to be processed is copper, molybdenum, iron, or the like, the electrolytic processing is performed on the cathode side. Therefore, the electrode plate 64 connected to the cathode of the power source 6 8 should be the processed electrode 3 2 and connected to The anode electrode plate 6 4 should be the feeding electrode 34. On the other hand, in the case of aluminum, silicon, or the like, electrolytic processing is performed on the anode side. Therefore, the electrode plate connected to the anode of the power supply should be a processing electrode, and the electrode plate connected to the cathode should be a feed electrode. Therefore, by arranging the processing electrodes 32 and the feeding electrodes 34 separately and staggered in the peripheral direction of the electrode portion 36, there is no need to fix the feeding portion to supply power to the substrate conductive film (part to be processed) , And available in the entire substrate

314314.ptd 第21頁 200301717 五、發明說明(13) 個_表面上完成加工。此外,以脈衝方式或交錯地改變正極 與負極,便可分解電解產物,並可藉由多次重複加工而提 高加工表面的平坦性。 關於加工電極3 2與饋電電極3 4部分,因電解反應所發 生的加工電極3 2與饋電電極之氧化或分解通常為問題所 在,有鑑於此,較佳方式係使用碳、相當不活性的貴金 屬、導電氧化物或導電陶瓷作為饋電電極3 4的基材,而非 使用廣泛使用為電極的金屬或金屬化合物。貴金屬基電極 可為諸如以下列方式獲得者:將鉑或銥電鍍於或塗佈於鈦 |極上,並接著將經塗佈的電極在高溫下進行燒結以穩定 化並強化電極。陶瓷製品通常藉由將無機原料進行熱處理 而獲得,且具有各種性質的陶瓷製品係由包括金屬氧化 物、碳化物及氮化物與非金屬之各種原料所製做,而這些 原料中包含具有導電性的陶瓷。當電極氧化時,電阻率的 4 數值通常會增加,而造成所施加之電壓的增加。然而,以 諸如翻之非氧化性材料或以諸如氧化錶之導電氧化物保護 電極表面,便可避免因電極基材氧化所造成的導電率下 降。 純水喷嘴7 0作為用於將純水或超純水供應至為基板固 錄座3 0所固持的基板W與下降的電極頭3 8間之空間的純水 供應部,該純水喷嘴7 0配置於基板固定座3 0上方,因而得 以將純水或超純水供應至離子交換器4 0。在此的純水意指 導電率不超過10// S/crn的水,而超純水意指導電率不超過 0. 1" S/cm的水。本發明的導電率在此意指25°C、1大氣壓314314.ptd Page 21 200301717 V. Description of the invention (13) Finished on the surface. In addition, by changing the positive electrode and the negative electrode in a pulsed or staggered manner, the electrolytic product can be decomposed, and the flatness of the processed surface can be improved by repeating the process several times. Regarding the processing electrode 32 and the feeding electrode 34, the oxidation or decomposition of the processing electrode 32 and the feeding electrode due to the electrolytic reaction is usually a problem. In view of this, the preferred method is to use carbon, which is relatively inactive. Noble metal, conductive oxide or conductive ceramic is used as the substrate of the feeding electrode 34, instead of using a metal or metal compound widely used as an electrode. The noble metal-based electrode may be obtained, for example, by plating or coating platinum or iridium on a titanium electrode, and then sintering the coated electrode at a high temperature to stabilize and strengthen the electrode. Ceramic products are usually obtained by heat-treating inorganic raw materials. Ceramic products with various properties are made from various raw materials including metal oxides, carbides, nitrides and non-metals. These raw materials include conductive materials. Ceramics. When the electrode is oxidized, the value of the resistivity 4 usually increases, resulting in an increase in the applied voltage. However, by protecting the electrode surface with a non-oxidizing material such as a tumbler or a conductive oxide such as an oxidized surface, it is possible to avoid a decrease in conductivity due to oxidation of the electrode substrate. The pure water nozzle 7 0 is a pure water supply unit for supplying pure water or ultrapure water to a space between the substrate W held by the substrate holding base 30 and the lowered electrode tip 38. The pure water nozzle 7 0 is disposed above the substrate holder 30, so that pure water or ultrapure water can be supplied to the ion exchanger 40. Here, pure water means water having a conductivity of not more than 10 // S / crn, while ultrapure water means water having a conductivity of not more than 0.1 " S / cm. The conductivity of the present invention means 25 ° C, 1 atmosphere

II 哪画ίΐ陶 __ 314314.ptd 第22頁 200301717 五、發明說明(14) (a t m )下的導電率。除了純水或超純水以外,亦可使用導 電率不超過500// S/c m的液體或任何電解溶液。藉由在加 工期間供應該液體,便可移除諸如加工產物及溶解氣體等 加工的不穩定因子,並可以良好的再生性 (reproducibility)均勻地完成加工。 本電解加工裝置設有用於完成驅動部之數值控制的數 值控制器7 2,亦即馬達(第一驅動部)4 4、馬達(第二驅 動部)5 6及馬達(第三驅動部)6 0,以使彼此面對且為基 板固定座3 0所固持的基板W與加工電極3 2得以進行相對運 動。馬達(驅動部)44, 56, 6 0因而為可進行數值控制的 伺服馬達,且該等馬達(驅動部)4 4,5 6,6 0之旋轉角與轉速 係由來自數值控制器7 2的輸出訊號而進行數值控制。 根據本實施例,當加工電極3 2與饋電電極3 4之間的電 流流動為定值而進行電解加工時,數值控制器7 2進行數值 控制:藉由馬達(第一驅動部)4 4而控制之為基板固持座 3 0所固持之基板W的轉速;藉由馬達(第二驅動部)5 6將 旋轉臂4 8進行旋轉而控制之電極頭3 8的水平運動速度;以 及藉由馬達(第三驅動部)6 0而控制之電極頭3 8的轉速。 現將參考第2及第3圖而說明數值控制的實例。首先, 如第2圖所示,量測加工前的基板(工件)外形。具體地 說,加工前之外形的各座標點係於XYZ座標系統(其中Z軸 係與作為基準面的XY平面正交)中進行量測,將所量測之 加工前的外形資料輸入數值控制器7 2中。此外,關於加工 前之外形的座標點(X,y,z 〇部分,希冀之加工後外形的II Which painting? Ϊ́314314.ptd Page 22 200301717 V. Description of the invention (14) (a t m) Conductivity. In addition to pure water or ultrapure water, liquids or any electrolytic solution with a conductivity of not more than 500 // S / cm can also be used. By supplying the liquid during processing, processing instability factors such as processed products and dissolved gases can be removed, and processing can be performed uniformly with good reproducibility. The electrolytic processing device is provided with a numerical controller 7 2 for performing numerical control of the driving part, that is, a motor (first driving part) 4 4, a motor (second driving part) 5 6, and a motor (third driving part) 6 0, so that the substrate W and the processing electrode 32, which face each other and are held by the substrate fixing base 30, can be relatively moved. The motors (drive parts) 44, 56, 6 0 are therefore servo motors that can be numerically controlled, and the rotation angles and rotation speeds of these motors (drive parts) 4, 4, 6, 6, 0 are derived from the numerical controller 7 2 The output signal is controlled numerically. According to this embodiment, when the current flowing between the processing electrode 32 and the feeding electrode 34 is a constant value and the electrolytic processing is performed, the numerical controller 7 2 performs numerical control: by the motor (first driving section) 4 4 The control is the rotation speed of the substrate W held by the substrate holding base 30; the horizontal movement speed of the electrode head 38 controlled by the motor (second driving part) 56 rotating the rotating arm 48; and by The motor (third driving part) 60 controls the rotation speed of the electrode head 38. An example of numerical control will now be described with reference to FIGS. 2 and 3. First, as shown in Fig. 2, the outer shape of the substrate (workpiece) before processing is measured. Specifically, each coordinate point of the external shape before processing is measured in an XYZ coordinate system (where the Z axis system is orthogonal to the XY plane as a reference plane), and the measured shape data before processing is input into numerical control.器 7 2。 7 in the device. In addition, regarding the coordinate points (X, y, z 〇) of the external shape before processing,

314314.ptd 第23頁 200301717 五、發明說明(15) 相爲座標點(X,y,ζ Ο亦輸入數值控制器7 2,以作為希冀 的外形資料。此外,諸如有關外形與加工速率的單元加工 外形資料(每個馬達控制訊號脈衝的傳送速度)係預先或 於任意時間輸入至數值控制器7 2。 當加工電極3 2與饋電電極3 4之間的電流流動控制為定 值而進行電解加工時,加工速率為固定,以藉此由電流值 .與加工時間的乘積決定加工量。因此,在加工電極3 2與饋 電電極3 4之間流動的電流控制在定值的狀況下’僅措由數 “值控制加工時間(亦即基板W與加工電極3 2彼此面對的期 φ),以使電解加工現象發生(停留時間),便可獲得具 有高精度外形之希冀的加工基板外形。 因此’根據本貫施例’各座標點在Ζ方向上的加工置Ζ 卜疵取決於輸入於數值控制器7 2中的資料。根據加工量Ζ 卜2,而決定各座標點上之:藉由馬達(第一驅動部)44而 控制之為基板固定座3 0所固持之基板W的轉速;藉由馬達 (第二驅動部)5 6將旋轉臂4 8進行旋轉而控制之電極頭3 8 的水平運動速度;以及藉由馬達(第三驅動部)6 0而控制 之電極頭3 8的轉速,而且將訊號輸入馬達(驅動部) 4 4,5 6,6 0中,以便對馬達(驅動部)4 4,5 6,6 0進行數值控 #。 接下來,將說明藉由本電解加工裝置所進行的電解加 成工 〇 首先,以基板固定座3 0吸引並固持基板W ’並以旋轉 1臂4 8將電極頭3 8移至為基板固定座3 0所固持之基板W正上314314.ptd Page 23 200301717 V. Description of the invention (15) The phase is the coordinate point (X, y, ζ) is also input to the numerical controller 7 2 as the desired shape information. In addition, such as the shape and processing rate of the unit The processing profile data (transmission speed of each motor control signal pulse) is input to the numerical controller 7 2 in advance or at any time. When the current flow between the processing electrode 3 2 and the feeding electrode 34 is controlled to a fixed value, In electrolytic processing, the processing rate is fixed so that the processing amount is determined by the product of the current value and the processing time. Therefore, the current flowing between the processing electrode 32 and the feed electrode 34 is controlled to a constant value. Only by controlling the processing time (that is, the period φ when the substrate W and the processing electrode 32 face each other) by a numerical value, in order to cause the electrolytic processing phenomenon (dwell time), the desired processing with a high-precision appearance can be obtained. The shape of the substrate. Therefore, according to the present embodiment, the processing of each coordinate point in the Z direction depends on the data input in the numerical controller 72. According to the processing amount Z2, each block is determined. Point: the rotation speed of the substrate W held by the substrate holder 30 is controlled by the motor (first driving section) 44; the rotating arm 4 8 is rotated by the motor (second driving section) 5 6 Control the horizontal movement speed of the electrode head 38; and the rotation speed of the electrode head 38 controlled by the motor (third driving section) 60, and input a signal to the motor (driving section) 4 4, 5 6, 6 0 In order to perform numerical control on the motor (driving unit) 4 4, 5 6, 6 0. Next, the electrolytic addition process performed by the electrolytic processing apparatus will be explained. First, the substrate fixing base 30 is attracted and Hold the substrate W 'and move the electrode head 3 8 to the substrate W held by the substrate holder 30 by rotating 1 arm 4 8

314314.ptd 第24頁 200301717 五 發明說明(16) — 方的加工位置,其中讀 ^ 有作為導體膜(待加::W為諸如第8B圖所示 由馬達50的致動而將命位)之銅膜6的基板w。苴甸一 裝於電極頭3 8之電極部^碩3 8下降以作垂直運動"^藉 固定座3 0所固持之基_ 下表面的離子交換器4 〇遍=文 接著,由電源6=的^表面接觸或接近其/、為基板 ,間,同時將加工電柘32:二:力:工電極32與饋電電極34 制在定值,並且將基板固^=包極34之間的電流流動押 者,會旋轉臂48進行旋轉,坐30與電極頭38進行旋轉。 時,由配置於基板固定^ 3而將電極頭38水平地移動。同 純水供應至基板W與電極 上方的純水噴嘴7 0將純水或超 填充於加工電極3 2、饋命带3 8之間,藉此將純水或超純水 此,形成於基板W上之導W極3 4與基板w之間的空間。因 子父換器4 0中的氫離子士卜 ' (銅膜6)的電解加工係由離 更具體地說,藉離子所完成。 助,而將純水或超純水解^換,40中之催化反應的輔 子在加工電極32附近傳遞命t虱乳離子與氫離子。氫氧離 與基板W的銅膜β反應,二=,而變成氲氧基,氫氧基會 加工。為將在饋電電極34;=成銅膜6的移除(研磨) 透氣的離子薄膜作為強酸性:公隔阻在外,可使用不 氫氣隔阻在外,並離子父換薄膜62,因而可將 的旋轉所產生)而=超純水的流動(由電極部36 器40中:足:純水或超純水得以流入離子交換 便Τ將足里的水供應至官能基(在帶有強酸性陽314314.ptd Page 24 200301717 Five invention descriptions (16) — square machining position, where ^ is read as a conductor film (to be added :: W is the life position by actuation of the motor 50 as shown in Figure 8B) Substrate w of the copper film 6. The potion is mounted on the electrode part of the electrode head 38. Shuo 3 8 descends for vertical movement. ^ The base held by the fixed seat 30. The ion exchanger on the lower surface 4 times. = ^ The surface is in contact with or close to it, and it is the substrate, and at the same time, the processing electrode 32: two: force: the working electrode 32 and the feeding electrode 34 are set to a fixed value, and the substrate is fixed between the cladding electrode 34 The electric current flowing to the person will rotate the rotating arm 48, and the seat 30 and the electrode head 38 will rotate. At this time, the electrode tip 38 is horizontally moved by being fixed on the substrate. The pure water is supplied to the substrate W and the pure water nozzle 70 above the electrode, and the pure water or ultra-filled is processed between the processing electrode 3 2 and the feed belt 38, thereby forming pure water or ultra-pure water on the substrate. The space between the conducting W pole 34 on W and the substrate w. The electrolytic processing of the hydrogen ion stub ′ (copper film 6) in the son-in- father converter 40 is performed by ionization, more specifically, by ions. When the pure water or ultrapure hydrolysis is replaced, the codon of the catalytic reaction in 40 transfers milk ions and hydrogen ions near the processing electrode 32. Hydrogen ion reacts with the copper film β of the substrate W, and becomes dioxy group, and the hydroxyl group will be processed. In order to remove (grind) the copper film 6 at the feeding electrode 34; the gas-permeable ionic film is strongly acidic: the male barrier is outside, and the hydrogen barrier can be used outside, and the ion-exchange membrane 62 can be used. Produced by the rotation of) and = the flow of ultrapure water (from the electrode part 36 to 40: foot: pure water or ultrapure water can flow into the ion exchange, and the water in the foot is supplied to the functional group (with strong acidity) Yang

200301717 五、發明說明(17) 離_子交換基之離子交換器的狀況中為續酸基),藉此增加 經解離之水分子的數量,而且由導體膜(銅膜6)與氫氧 離子(或氫氧基)間的反應所形成的加工產物(包含氣體 )可藉由水流移除,因而可提高加工效率。因此,純水或 超純水的流動為必要的,且希冀水流為穩定且均勻的。水 流的穩定性與均勻性將導致離子供應與加工產物移除的穩 ,定性與均勻性,並且接著將導致加工的穩定性與均勻性。 藉由製做由多層結構之疊片所組成的離子交換器4 0, f可增加離子交換器(疊片)4 0的總離子交換容量,藉此便 _避免電解反應的反應產物(氧化物與離子)在離子交換 器4 0中累積超過疊片累積容量的數量。在這方面,倘若累 積於疊片中的反應產物超過累積容量的數量,則所累積的 產物可能會改變其形式,且該經轉化的產物可對加工速率 及其分佈造成負面影響。再者,可使用具有高硬度或良好 表面平坦性或二者皆具的離子交換器4 0提高基板加工表面 的平坦性。 將預加工外形資料、希冀外形資料及單元加工外形資 料預先輸入數值控制器7 2,進行電解加工,並同時數值控 制:藉由馬達(第一驅動部)4 4而控制之基板固定座3 0所 籲持之基板W的轉速;藉由馬達(第二驅動部)5 6將旋轉 臂4 8進行旋轉控制之電極頭3 8的水平運動速度;以及藉由 “馬達(第三驅動部)6 0而控制之電極頭3 8的轉速。 在電解加工期間,於數值控制基板W與加工電極3 2間 n之相對運動的情況下,將在加工電極3 2與饋電電極3 4之間200301717 V. Description of the invention (17) The ion exchanger of ion exchange group is a continuous acid group in order to increase the number of dissociated water molecules, and the conductor film (copper film 6) and hydroxide ion The processing product (including gas) formed by the reaction between (or hydroxyl groups) can be removed by water flow, thereby improving processing efficiency. Therefore, the flow of pure water or ultrapure water is necessary, and the water flow is expected to be stable and uniform. The stability and uniformity of the water flow will lead to the stability, qualitative and uniformity of ion supply and removal of processed products, and then will lead to the stability and uniformity of processing. By making an ion exchanger 40, which is composed of a laminated structure of a multilayer structure, the total ion exchange capacity of the ion exchanger (laminate) 40 can be increased, thereby avoiding the reaction products (oxides of the electrolytic reaction) And ions) accumulated in the ion exchanger 40 exceeds the accumulated capacity of the lamination. In this regard, if the reaction products accumulated in the laminate exceed the cumulative capacity, the accumulated products may change their form, and the converted products may negatively affect the processing rate and its distribution. Furthermore, the flatness of the substrate processing surface can be improved by using an ion exchanger 40 having high hardness, good surface flatness, or both. Pre-processed profile data, desired profile data, and unit-processed profile data are input into the numerical controller 7 2 in advance for electrolytic processing and numerical control at the same time: the substrate holder 3 controlled by the motor (first drive section) 4 4 The rotation speed of the called substrate W; the horizontal movement speed of the electrode head 38 controlled by the motor (second driving part) 5 6 to rotate the rotating arm 4 8; and by the "motor (third driving part) 6 0 while controlling the rotation speed of the electrode tip 38. During the electrolytic processing, when the relative movement between the substrate W and the processing electrode 32 is numerically controlled, it will be between the processing electrode 32 and the feeding electrode 34.

314314.ptd 第26頁 200301717 五、發明說明(18) 流動的電流控制在定值,藉此固定加工速率,該電解加工 可形成具有高精度外形之希冀的加工基板W (工件)外 形。 在完成電解加工後,切斷電源6 8,停止基板固定座3 0 與電極頭3 8的旋轉,以及終止旋轉臂4 8的旋轉。然後,升 南電極頭3 8 ’並將為基板固定座3 0所固持的加工基板W幸命 送至下個製程。 本實施例揭示供應純水(最好為超純水)至電極部3 6 與基板W間之空間的狀況。在電解加工時,使用不含電解 質的純水或超純水可避免諸如電解質之額外的雜質黏著於 並留置於基板W的表面上。再者,在電解加工期間所溶解 的銅離子或類似物係藉由離子交換反應而立刻為離子交換 器4 0所捕捉,此舉可避免所溶解的銅離子或類似物再次析 出於基板W的其他部位上,或者避免所溶解的銅離子或類 似物氧化而變成污染基板W表面的微粒。 超純水具有高電阻率,因此電流難以流經超純水。藉 由縮短電極與工件間的距離,或將離子交換器置於電極與 工件之間,便使電阻率降低。再者,當一種電解溶液與多 種電解溶液一同使用時,便可進一步降低電阻率並降低電 源消耗。當使用電解溶液進行電解加工時,進行加工的工 件部位面積較加工電極面積猶微寬些。另一方面,在結合 使用超純水與離子交換器的狀況中,因為幾乎無電流流經 超純水,所以電加工僅於等於加工電極與離子交換器之面 積的工件面積中完成。314314.ptd Page 26 200301717 V. Description of the invention (18) The flowing current is controlled at a fixed value, thereby fixing the processing rate. The electrolytic processing can form the desired shape of the processing substrate W (workpiece) with a high-precision shape. After the electrolytic processing is completed, the power supply 68 is turned off, the rotation of the substrate holder 30 and the electrode head 38 is stopped, and the rotation of the rotation arm 48 is stopped. Then, the electrode tip 3 8 ′ is raised and the processed substrate W held by the substrate holder 30 is sent to the next process. This embodiment discloses the state of supplying pure water (preferably ultrapure water) to the space between the electrode portion 36 and the substrate W. In the electrolytic processing, the use of pure water or ultra-pure water containing no electrolyte can prevent additional impurities such as electrolytes from sticking to and remaining on the surface of the substrate W. Furthermore, the copper ions or the like dissolved during the electrolytic processing are immediately captured by the ion exchanger 40 through an ion exchange reaction, which can prevent the dissolved copper ions or the like from re-precipitating out of the substrate W. In other parts, or to prevent the dissolved copper ions or the like from oxidizing to become particles that contaminate the surface of the substrate W. Ultrapure water has high resistivity, so it is difficult for current to flow through ultrapure water. By reducing the distance between the electrode and the workpiece, or by placing the ion exchanger between the electrode and the workpiece, the resistivity is reduced. Furthermore, when one electrolytic solution is used with multiple electrolytic solutions, the resistivity can be further reduced and power consumption can be reduced. When an electrolytic solution is used for electrolytic processing, the area of the workpiece to be processed is slightly wider than the area of the processed electrode. On the other hand, in the case where ultrapure water is used in combination with the ion exchanger, since almost no current flows through the ultrapure water, the electric machining is performed only in the area of the workpiece equal to the area of the processing electrode and the ion exchanger.

314314.ptd 第27頁 200301717 五;發明說明(19) _可使用藉由添加電解質至純水或超純水所獲得的電解 溶液以取代純水或超純水,使用此種電解溶液可進一步降 低電阻率並降低電源消耗。諸如氣化鈉或硫酸鈉等中性鹽 溶液、諸如氯化氫或硫酸等酸溶液,或諸如氨之驗溶液皆 可作為電解溶液,並可根據工件性質而選擇性地使用這些 溶液。當使用該電解溶液時,較佳方式係於基板W與離子 .交換器4 0之間提供些微的間距,以使該基板W與離子交換 1器4 0不會彼此接觸。 1 再者,亦得使用藉由添加界面活性劑或類似物至純水 #超純水所獲得的液體,以取代純水或超純水,其中該液 體具有不超500// S/cm的導電率,以不超過50// S/cm為較 佳,而不超過於0 · 1 // S / c m (不低於1 0 ΜΩ · c m的電阻率) 為更佳。因為界面活性劑存在於純水或超純水中,所以該 液體可在基板W與離子交換器4 0之間的界面上形成一薄 層,該薄層用於均勻地抑制離子遷移,藉此調節離子交換 (金屬溶解)的濃度,以提高加工表面的平坦性。界面活 性劑的濃度希冀不超過1 0 0 ppm。當導電率的數值太高時, 電流效率會下降,且加工速率會降低。使用導電率不超過 5 0 0 // S / c ιώ的液體可獲得希冀的加工速率,該液體之導電 以不超過50// S/cm為較佳,而不超過0.1// S/cm為更 佳。 - 根據本實施例,藉由將離子交換器4 0置於基板W、加 工電極3 2與饋電電極3 4之間,便可提高相當多的加工速 率。在這方面,使用超純水的電化學加工係藉由超純水中314314.ptd Page 27 20031717 V. Description of the invention (19) _ An electrolytic solution obtained by adding an electrolyte to pure water or ultrapure water can be used instead of pure water or ultrapure water. The use of this electrolytic solution can further reduce Resistivity and reduced power consumption. Neutral salt solutions such as vaporized sodium or sodium sulfate, acid solutions such as hydrogen chloride or sulfuric acid, or test solutions such as ammonia can be used as electrolytic solutions, and these solutions can be selectively used depending on the properties of the workpiece. When the electrolytic solution is used, it is preferable to provide a slight distance between the substrate W and the ion exchanger 40 so that the substrate W and the ion exchanger 1 40 do not contact each other. 1 Furthermore, a liquid obtained by adding a surfactant or the like to pure water # ultra-pure water may be used instead of pure water or ultra-pure water, wherein the liquid has a content of not more than 500 // S / cm The conductivity is preferably not more than 50 // S / cm, and not more than 0 · 1 // S / cm (resistivity not less than 10 megaΩ · cm) is more preferable. Because the surfactant is present in pure water or ultrapure water, the liquid can form a thin layer on the interface between the substrate W and the ion exchanger 40, and the thin layer is used to uniformly suppress ion migration, thereby Adjust the ion exchange (metal dissolution) concentration to improve the flatness of the processed surface. The concentration of surfactant is expected not to exceed 100 ppm. When the value of the conductivity is too high, the current efficiency will decrease and the processing rate will decrease. The desired processing rate can be obtained by using a liquid with a conductivity of not more than 5 0 0 // S / c. The conductivity of the liquid is preferably not more than 50 // S / cm, and not more than 0.1 // S / cm. Better. -According to this embodiment, by placing the ion exchanger 40 between the substrate W, the processing electrode 32, and the feed electrode 34, a considerable processing rate can be increased. In this regard, electrochemical processing using ultrapure water

314314.ptd 第28頁 200301717 五、發明說明(20) 的氫氧離子與加工材料間的化學交互作用而完成。然而, 在常溫與常壓的條件下,超純水中作為反應物之氫氧離子 的數量小至1 0 _7mo 1 /L,以使移除加工效率可因除了移除加 工反應以外的反應(諸如氧化膜形成反應)而降低。因 此,必須增加氫氧離子,以有效率地進行移除加工。增加 氫氧離子的方法係藉由使用催化材料增加超純水的解離反 應,而離子交換器可有效地作用為該催化材料。更具體地 說,水分子解離反應所需的活化能係藉由離子交換器中的 官能機基與水分子間的交互作用而降低,因而促使水解離 發生以藉此提高加工速率。 再者,根據本實施例,在電解加工時,離子交換器4 0 會與基板W接觸或靠近。當離子交換器4 0定位靠近基板W 時,電阻率會大到某個程度(依據其間的距離而定),因 此需要稍大的電壓以提供必要的電流密度。然而,另一方 面,因為非接觸性的關係,易於沿著基板W表面形成純水 流或超純水流,因而可有效率地移除形成於基板表面上的 反應產物。在離子交換器4 0與基板W接觸的狀況中,電阻 率變得非常小,因而僅需施加微小的電壓,而可藉此減少 電源消耗。 倘若為了提高加工速率而提高電壓以增加電流密度, 則當電極與基板(加工工件)間的電阻率很大時,可能會 發生放電。放電的發生會在工件表面上造成#坑(e t c h p i t),因而無法形成均勻且平坦的加工表面。相反地,因 為當離子交換器4 0與基板W接觸時,電阻率很小,所以可314314.ptd page 28 200301717 V. Description of the invention (20) The chemical interaction between the hydroxide ion and the processing material is completed. However, under normal temperature and normal pressure conditions, the number of hydroxide ions as reactants in ultrapure water is as small as 10 -7mo 1 / L, so that the removal processing efficiency can be affected by reactions other than the removal processing reaction ( Such as oxide film formation reactions). Therefore, it is necessary to add hydroxide ions for efficient removal processing. The method for increasing hydroxide ions is to increase the dissociation reaction of ultrapure water by using a catalytic material, and an ion exchanger can effectively act as the catalytic material. More specifically, the activation energy required for the dissociation reaction of water molecules is reduced by the interaction between the functional group in the ion exchanger and the water molecules, thereby promoting hydrolysis to occur to thereby increase the processing rate. Furthermore, according to this embodiment, during the electrolytic processing, the ion exchanger 40 is brought into contact with or approached the substrate W. When the ion exchanger 40 is positioned close to the substrate W, the resistivity becomes large to some extent (depending on the distance therebetween), so a slightly larger voltage is required to provide the necessary current density. However, on the other hand, due to the non-contact property, it is easy to form a pure water flow or an ultrapure water flow along the surface of the substrate W, so that the reaction products formed on the surface of the substrate can be efficiently removed. In a state where the ion exchanger 40 is in contact with the substrate W, the resistivity becomes very small, so that only a small voltage needs to be applied, thereby reducing power consumption. If the voltage is increased to increase the current density in order to increase the processing rate, a discharge may occur when the resistivity between the electrode and the substrate (workpiece) is large. The occurrence of electric discharge will cause # pits (e t c h p i t) on the surface of the workpiece, so it is impossible to form a uniform and flat machining surface. In contrast, since the resistivity is small when the ion exchanger 40 is in contact with the substrate W, it is possible to

314314.ptd 第29頁 200301717 五_、發明說明(21) 避免發生放電。 第4圖表示根據本發明第二個實施例的 置,該電解加工裝置的基板固定座3 衣 接點固定板80。作為饋電電極之複多數個向;: = 係以特定間距安裝至接點固定板8〇。再 = =電㈣’而非第i圖之實施例中所使用的電極員广 1垃=電極84經由集電環86而連接至電源68的陰極, 而接點(饋電電極)8 2則連接至雷调R s^ 才 係與第丨圖所示的裝置相同運接至…8的&極。其他結構 y :據本實施例’當基板w以基板固定a 3〇固持時,接 ,,卜i ί电電極)82係與如第8B圖所示之沈積在基板w表面 士 j銅胰6(作為待加工材料)接觸,電解加工可以如前 二只施^的相同方式進行。因此,將電極頭3 8下降,並將 ,值的電流由電源6 8施加至加工電極8 4與接點(饋電電極 )間,以及同時將基板固定座3 0與電極頭3 8進行旋 1 ’亚將旋轉臂4 8進行旋轉而水平地移動電極頭3 8。同 日守由純水喷嘴7 〇將純水或超純水供應至基板f與加工電 極8 4之間’因此完成基板…之導電膜(銅膜6)的電解加 達(第 二如同前揭的加工實施例,般,在電解加工之前,將加 丄七外办資料、希冀外形資科及單元加工外形資料輸入數 值控制器7 2,以便數值控制:藉由馬達(第一驅動部)4 4 才制之為基板固定座3 0所固持之基板W的轉速;藉由馬 驅動部)5 6將旋轉臂4 8進行旋轉而控制之電極頭314314.ptd Page 29 200301717 V. Description of the invention (21) Avoid discharge. Fig. 4 shows an arrangement according to a second embodiment of the present invention. The substrate fixing base 3 and the contact fixing plate 80 of the electrolytic processing apparatus. As a plurality of directions of the feeding electrode: = = Attached to the contact fixing plate 80 at a specific pitch. Again = = ㈣ 'instead of the electrode used in the embodiment of Fig. I = electrode 84 is connected to the cathode of the power source 68 via the slip ring 86, and the contact (feeding electrode) 8 2 The connection to the thunder tone R s ^ is the same as the device shown in Fig. 丨 and is connected to the & Other structures y: According to this embodiment, 'when the substrate w is fixed by the substrate a (a, 30, electric electrodes) 82 are deposited on the surface of the substrate w as shown in FIG. 8B. (As a material to be processed) Contact, electrolytic processing can be performed in the same manner as the first two methods. Therefore, the electrode tip 38 is lowered, and a value of current is applied from the power source 68 to the processing electrode 84 and the contact (feeding electrode), and the substrate holder 30 and the electrode tip 38 are rotated at the same time. 1'Asia rotates the rotating arm 4 8 to move the electrode head 3 8 horizontally. On the same day, the pure water nozzle 70 supplied pure water or ultrapure water between the substrate f and the processing electrode 8 4 ', thus completing the electrolysis of the conductive film (copper film 6) of the substrate ... (the second is as previously disclosed) Processing example, generally, before electrolytic processing, input the data of Jiaqi Seven Foreign Affairs Office, Hope Shape Materials Department and unit processing shape data into the numerical controller 7 2 for numerical control: by the motor (the first driving part) 4 4 It is only the rotation speed of the substrate W held by the substrate holder 30; the electrode head controlled by rotating the rotating arm 4 8 by a horse driving unit 5 6

314314.ptd 第30頁 200301717 五、發明說明(22) ^ ^---- 3 8的水平運動速度;以及藓由 叹措由馬達(罘二驅動部)6 0而控 制之電極頭38的轉速。在哕批以丁私、#〆从& 二、目亡古1 , 在3 L制下所進仃的電解加工可形 成/、f同知度外形之希冀的加工基板w外形。 ,5圖表示根據本發明第三個實施例之電解加工裝 置其電解加工裴置包括用於吸引並固持基板从 之基板固定座1 0 0,以乃阳罢+人e t门—— L 及配置於基板固疋座1 0 0上方之桶狀 或柱狀的力σ工電極1 〇 9。 、 υ ^ 加工電極1 0 2耦合於可旋轉且可垂 直運動之水平延伸旋,π &轴1 0 4的自由端,離子交換器1 〇 6緊 密安裝於加工電極1 〇 ^ ” 1 υ Ζ的外周面上,基板固定座1 0 〇與加工 電極1 0 2配置於填充右令Λ ^ _ 有4如超純水或純水之流體的加工槽 (未圖示)中,亦即鸦:$ # , 骑5亥基板固定座1 0 0及加工電極1 〇 2潛 浸於流體中。 基板固定座1 0 〇_馬人你祖^ P ^ ^ , Ί ΠδΑ, , . Ό欢對者Z軸而在0方向上旋轉之旋 轉ί肢1〇8的上表面,該旋轉本體108安裝於XY平台118的 = 包含有:χ基座ιι2,藉由馬達ιι〇 :弟驅動邛)白勺致動而在X方向上進行移動 Θ上谁彳+相科1 板w與加工電極102得以在x方 向上進仃相對運動,以及γ基座116 第二驅動部)的致動而在h Α μ、社〃稽田^ μ作為 固定座100所固持的基板w與加工 t 為基板 行相對運動。 电極102付以在Y方向上進 由笔源1 2 0之陰極延伸士姑给 1 02,而由陽極延伸出的線路:連係連接至加工電極 該饋電電極122係連接至電Ϊ”電電極122,其中 ♦ (亦即如第8B圖所示之形314314.ptd Page 30 200301717 V. Explanation of the invention (22) ^ ^ ---- 3 8 horizontal movement speed; and the rotation speed of the electrode head 38 controlled by the motor (the second driving part) 60 . In the batch of Ding Shui, # 〆 从 & II, Meng Gu Gu 1, the electrolytic processing performed in the 3 L system can form the desired shape of the processed substrate w with the same shape. Fig. 5 shows an electrolytic processing device according to a third embodiment of the present invention. The electrolytic processing device includes a substrate holder 100 for attracting and holding a substrate, and Naiyang + human et gate-L and configuration. A barrel-shaped or column-shaped force sigma electrode 109 above the substrate holder 100. , Υ ^ processing electrode 1 0 2 is coupled to a horizontally extending screw that can rotate and can move vertically, the free end of π & shaft 104, and the ion exchanger 1 〇6 is tightly mounted on the processing electrode 1 〇 ^ 1 υ ZZ On the outer peripheral surface, the substrate holder 100 and the processing electrode 102 are arranged in a processing tank (not shown) filled with a fluid such as ultra-pure water or pure water, which is: $ #, Riding the substrate holder 100 and processing electrode 1 〇2 submerged in the fluid. The substrate holder 100 〇_ 马 人 你 祖 ^ P ^ ^, Ί ΠδΑ,,. Ό 欢 对 者 Z The upper surface of the rotating limb 108 which rotates in the direction of axis 0, the rotating body 108 is mounted on the XY platform 118. It contains: x base ιι2, driven by a motor ιο: brother.) And move in the X direction Θ on the θ + phase 1 plate w and the processing electrode 102 relative movement in the x direction, and the activation of the γ base 116 second drive unit) in h Α μ The substrate w held by the fixed base 100 and the processing t are relative movements of the substrate 100. The electrode 102 is fed in the Y direction by the pen source 1 2 0 Skudai electrode extending to 102, and the line extending from the anode: associated with the machining electrode connected to the feeding line electrode 122 is electrically connected to the electrical Ϊ "electrode 122, wherein ♦ (i.e., as the shape shown in Figure 8B

200301717 五、發明說明(23) 成_於基板W中的銅膜6)並供應電力至該電導體。 加工槽設有流體噴嘴,該流體喷嘴作為用於將諸如純 水或超純水之流體供應至加工槽中的流體供應部。 本電解加工裝置設有用於完成驅動部之數值控制的數 值控制器1 2 4,亦即馬達1 1 0 (第一驅動部)與馬達1 1 4 (第二驅動部),該等馬達1 1 0、1 1 4使彼此面對之為基板 ,固定座1 0 0所固持的基板W與加工電極1 0 2得以進行相對運 1動。馬達(驅動部)1 1 0,1 1 4因而為可進行數值控制的伺 '月艮馬達,且該等馬達1 1 0,1 1 4之旋轉角與轉速係由來自數 φ控制器1 2 4的輸出訊號而進行數值控制。 現將參考第6圖而說明數值控制的實例。首先,如第2 圖所示,藉由在XY Z座標系統(其中Z軸係與作為基準面的 又Y平面正交)中量測加工前之外形的各座標點,而量測加 工前的基板(工件)外形。將所量測之加工前的外形資料 Λ 輸入數值控制器1 2 4中。此外,關於加工前之外形的座標 點(X,y,ζ 〇部分,希冀之加工後外形的相應座標點 (X,y,ζ Ο亦輸入至該數值控制器1 2 4中。此外,諸如有關 外形與加工速率的單元加工外形資料(每個馬達控制訊號 脈衝的傳送速度)係預先或於任意時間輸入至數值控制器 肇4。 根據本實施例,各座標點在Z方向上的加工量Z卜#取 •決於輸入數值控制器1 24中的資料。根據加工量Z卜2,決定 藉由馬達(第一驅動部)1 1 0與馬達(第二驅動部)1 1 4將 為基板固定座1 0 0所固持之基板W止動的期間,並且將訊號200301717 V. Description of the invention (23) The copper film 6) is formed in the substrate W and supplies electric power to the electric conductor. The processing tank is provided with a fluid nozzle as a fluid supply section for supplying a fluid such as pure water or ultrapure water to the processing tank. The electrolytic processing device is provided with a numerical controller 1 2 4 for performing numerical control of a driving part, that is, a motor 1 1 0 (a first driving part) and a motor 1 1 4 (a second driving part). These motors 1 1 0, 1 1 4 make the substrates facing each other the substrate, and the substrate W held by the fixed seat 100 and the processing electrode 102 can move relative to each other. The motor (drive unit) 1 1 0, 1 1 4 is a servo motor that can perform numerical control, and the rotation angle and speed of these motors 1 1 0, 1 1 4 are derived from the number φ controller 1 2 4 output signal for numerical control. An example of numerical control will now be described with reference to FIG. 6. First, as shown in Figure 2, by measuring each coordinate point of the shape before processing in the XY Z coordinate system (where the Z axis system is orthogonal to the Y plane as a reference plane), Substrate (workpiece) shape. Enter the measured profile data Λ before processing into the numerical controller 1 2 4. In addition, regarding the coordinate points (X, y, ζ 〇) of the external shape before processing, the corresponding coordinate points (X, y, ζ 〇) of the shape after processing are also input to the numerical controller 1 2 4. In addition, such as The unit processing profile data (transmission speed of each motor control signal pulse) regarding the profile and processing rate are input to the numerical controller Zhao 4 in advance or at an arbitrary time. According to this embodiment, the processing amount of each coordinate point in the Z direction Z ## is determined by inputting data from the numerical controller 1 24. According to the processing amount Z2, it is determined that the motor (first driving section) 1 1 0 and the motor (second driving section) 1 1 4 will be While the substrate W held by the substrate holder 100 is stopped, the signal

314314.ptd 第32頁 200301717 五、發明說明(24) 輸入馬達(驅動部)1 1 0,11 4中,以便對馬達1 1 0,11 4進行 數值控制。 根據本實施例,諸如第8 B圖所示之表面具有銅膜6 (作為導電膜(待加工的部位))的基板W係為基板固定 座1 0 0所吸引並固持,而安裝於加工電極1 0 2表面上的離子 交換器1 0 6係靠近基板W表面(上表面)或與該基板W表面 (上表面)接觸。然後,將定值的電流由電源1 2 0供應至加 工電極1 0 2與饋電電極1 2 2之間,並同時將加工電極1 0 2旋 轉,而進行電解加工。 在電解加工期間,藉由XY平台1 1 8進行步進運動,亦 即基板W在X或Y方向上反覆地運動與停止。就本操作而 言,如前所述,加工前外形資料、希冀外形資料及單元加 工外形資料係預先輸入數值控制器1 2 4,藉由馬達(第一 驅動部)1 1 0與馬達(第二驅動部)1 1 4而對為基板固定座 1 0 0所固持之基板W的止動時間進行數值控制,以該經控制 之相對步進運動所進行的電解加工可形成具有高精度外形 之希冀的加工基板外形。 在此所稱之 ''相對步進運動〃意指基板W與加工電極 1 0 2之任一者或二者進行運動,以使加工電極1 0 2在基板W 上反覆進行特定距離之運動與停止的相對運動。 第7圖表示根據本發明第四個實施例之電解加工裝 置。本實施例與第5圖所示之第三個實施例的差別在於使 用球形或橢圓形的加工電極1 0 2 a。當加工電極1 0 2 a下降 時,安裝於加工電極1 0 2 a表面的離子交換器1 0 6 a會與基板314314.ptd Page 32 200301717 V. Description of the invention (24) Enter the motor (drive part) 1 1 0, 11 4 in order to perform numerical control on the motor 1 1 0, 11 4. According to this embodiment, a substrate W having a copper film 6 (as a conductive film (part to be processed)) on the surface as shown in FIG. 8B is attracted and held by the substrate holder 100, and is mounted on the processing electrode The ion exchanger 1 0 6 on the surface of 102 is close to or in contact with the surface W of the substrate (upper surface). Then, a fixed value of current is supplied from the power source 120 to the processing electrode 102 and the feeding electrode 12 and the processing electrode 102 is rotated at the same time to perform electrolytic processing. During electrolytic processing, step motion is performed by the XY stage 1 1 8, that is, the substrate W is repeatedly moved and stopped in the X or Y direction. For this operation, as described earlier, the pre-processing profile data, the desired profile data, and the unit processing profile data are entered in advance by the numerical controller 1 2 4 by the motor (first drive section) 1 1 0 and the motor (section 2 driving parts) 1 1 4 and numerically control the stop time of the substrate W held by the substrate fixing seat 100, and the electrolytic processing by the controlled relative step motion can form a high-precision shape. I want to process the shape of the substrate. The `` relative stepping motion '' referred to herein means that one or both of the substrate W and the processing electrode 102 are moved to cause the processing electrode 102 to repeatedly move on the substrate W at a specific distance and Stopped relative motion. Fig. 7 shows an electrolytic processing apparatus according to a fourth embodiment of the present invention. This embodiment differs from the third embodiment shown in Fig. 5 in that a spherical or elliptical processing electrode 1 0 2 a is used. When the processing electrode 1 0 2 a is lowered, the ion exchanger 1 0 6 a mounted on the surface of the processing electrode 1 0 2 a and the substrate

314314.ptd 第33頁 200301717 五、發明說明(25) W接觸。當離子交換器如此接觸基板W時,加工電極1 0 2 a得 以進行旋轉。其他結構係與第三個實施例相同。 根據本實施例,加工部位(點)的面積很小,因此可 輕易地將超純水或純水供應至加工部位周圍,而得以進行 穩定的加工。 根據前揭實施例,驅動部可使為基板固定座所固持的 v基板與加工電極得以進行相對運動,並在加工電極與饋電 —電極之間流動的電流控制在定值的情況下進行數值控制。 ’然而,亦得以將施加於加工電極與饋電電極之間的電壓控 φ在定值,由電壓與電流之間的關係決定在加工電極與饋 電電極之間流動的電流,以及根據由此所決定的電流而對 驅動部進行數位控制。 基板(工件)外形的量測不僅可在加工前進行,亦可 在加工期間的任何時間進行任何次數。在此部分,會有實 ‘加工時間異於預定加工時間的狀況,該差異可使所完成 之加工基板的外形精確度降低。藉由在加工期間盡可能完 成多次的基板量測,便可消除或減少精確度的降低。因 此,增加加工期間的量測次數通常可提高加工精確度。 如前所述,本發明得以將加工前或加工期間的工件外 _與希冀的加工後工件外形做比較並決定加工量(相當於 二種外形之間的座標差):將參數資料(相當於加工量) ,輸入數值控制器,以及根據所輸入的資料而完成驅動部的 數值控制,其中該驅動部用於使彼此面對且為固定座所固 持的工件與加工電極得以進行相對運動,在該數值控制下314314.ptd Page 33 200301717 V. Description of the invention (25) W contact. When the ion exchanger contacts the substrate W in this manner, the processing electrode 102a is rotated. The other structures are the same as those of the third embodiment. According to this embodiment, the area of the processing portion (point) is small, so that ultrapure water or pure water can be easily supplied around the processing portion, and stable processing can be performed. According to the previously disclosed embodiment, the driving part can make the v substrate and the processing electrode held by the substrate holder relative to each other, and perform the value under the condition that the current flowing between the processing electrode and the feed-electrode is controlled at a fixed value. control. 'However, it is also possible to control the voltage φ applied between the processing electrode and the feeding electrode to a fixed value, and the relationship between voltage and current determines the current flowing between the processing electrode and the feeding electrode, and according to this The driving current is digitally controlled by the determined current. The measurement of the shape of the substrate (workpiece) can be performed not only before processing, but also at any time during the processing. In this section, there may be a case where the processing time is different from the predetermined processing time, and this difference may reduce the accuracy of the shape of the finished processed substrate. By making as many substrate measurements as possible during processing, the reduction in accuracy can be eliminated or reduced. Therefore, increasing the number of measurements during machining usually improves machining accuracy. As mentioned above, the present invention is able to compare the external shape of the workpiece before or during processing with the desired shape of the workpiece after processing and determine the processing amount (equivalent to the coordinate difference between the two shapes): Processing amount), input numerical controller, and complete the numerical control of the driving part according to the inputted data, wherein the driving part is used for relative movement of the workpiece and the processing electrode facing each other and held by the fixed seat, in Under the numerical control

314314.ptd 第34頁 200301717 五、發明說明(26) 進行作業的電解加工可形成具有高精度外形之希冀的加工 工件外形。 雖然已揭示並詳細說明本發明的特定較佳實施例,但 是應瞭解地是可在不離開隨附申請專利範圍的範疇下對本 發明進行各種改變與修改。 產業利用性 本發明係關於電解加工裝置及方法,用於加工基板 (諸如半導體晶圓)表面之導電材料或用於移除黏著在基 板表面之雜質。314314.ptd Page 34 200301717 V. Description of the Invention (26) Electrolytic machining can be performed to form the shape of the workpiece with high precision. Although specific preferred embodiments of the invention have been disclosed and described in detail, it should be understood that various changes and modifications can be made to the invention without departing from the scope of the appended patent applications. Industrial Applicability The present invention relates to an electrolytic processing apparatus and method for processing a conductive material on a surface of a substrate (such as a semiconductor wafer) or for removing impurities adhering to the surface of a substrate.

314314.ptd 第35頁 200301717 圖-式簡單說明 [圖式簡單 說明 ] 第 1圖 係根 據本發 明 第一 個 實施例之電解加工裝 置 的 縱 剖 面 前視圖; 第 2圖 係說 明工件 之 力Π工 前 外形與希冀加工後外 形 間 之 關 係 的示意圖; 第 3圖 係說 明以第 1圖之電解加工裝置進行數值控制的 -實 例 的 方塊圖, 第 4圖 係根 據本發 明 第二 個 實施例之電解加工裝 置 的 '縱 剖 面 前視圖; • 第 5圖 係根 據本發 明 第三 個 實施例之電解加工裝 置 的 概 略 透 視圖, 第 6圖 係說 明以第 5圖之電解加工裝置進行數值控制的 實 例 的 方塊圖; 第 7圖 係根 據本發 明 第四 個 實施例之電解加工裝 置 的 概 略 透 視圖, 第 8 A至第8 C圖係以製程步驟順序說明形成銅互連線之 實 例 的 不意圖, 以及 第 9圖 係說 明使用 離 子交 換 器進行電解加工之原 理 的 示 意 圖 〇 W lc a 導電 層 1 半導體基材 • 2 絕緣 膜 3 接觸孔 4 溝渠 5 阻障層 •6 銅膜 7 種子層314314.ptd Page 35 200301717 Figure-Simplified Description [Simplified Illustration] Figure 1 is a front view of a longitudinal section of an electrolytic processing device according to a first embodiment of the present invention; Figure 2 is a diagram illustrating the force of a workpiece Schematic diagram of the relationship between the front shape and the shape after the machining; Figure 3 is a block diagram illustrating an example of numerical control performed by the electrolytic processing device of Figure 1. Figure 4 is an electrolysis according to the second embodiment of the present invention. Front view of a 'longitudinal section' of the processing apparatus; Figure 5 is a schematic perspective view of an electrolytic processing apparatus according to a third embodiment of the present invention, and Figure 6 illustrates an example of numerical control using the electrolytic processing apparatus of Figure 5 Block diagram; FIG. 7 is a schematic perspective view of an electrolytic processing apparatus according to a fourth embodiment of the present invention, and FIGS. 8A to 8C are diagrams illustrating the intent of an example of forming a copper interconnection line in order of process steps, and Figure 9 illustrates Schematic diagram of the principle of electrolytic processing using ion converters 〇 W lc a conductive layer 1 semiconductor substrate • 2 insulating film 3 contact hole 4 trench 5 barrier layer • 6 copper film 7 seed layer

314314.ptd 第36頁 200301717314314.ptd Page 36 200301717

圖式簡單說明 10 工件 10a 原 子 12a、 12b、 40、 .] _ oe i、 106a 離 子 交 換 器 14 力口工 電 極 16、 34、 122 饋 電 電 極 17、 68、 120 電 源 18 液體 19 液體 供 應 部 位 20 水 分 子 22 氫氧 離 子 24 氫 離 子 26 反應 產 物 30 基 板 固 定 座 32 力口工 電 極 36 電極 部 38 電 極 頭 42 支撐 轴 44、 50 > 56 ^ 1 1 ( 卜 114 馬 達 46、 58 同步 皮 帶 48 旋轉 臂 52 滾 珠 螺 桿 54 空心 旋 轉 轴 60 空 心 馬 達 6 2a, 62b 強酸 性 陽 離 子 交換纖維 62c 強酸 性 陽 離 子 交換薄 膜 64 扇形 電 極 板 6 6' 86 集電 環 70 純水 喷 嘴 72 數值 控 制 器 80 接 點 固 定 板 82 接點 84 加 工 電 極 100 基板 固 定 座 314314.ptd 第37頁 200301717Brief description of the drawing 10 Workpiece 10a Atom 12a, 12b, 40,.] _ Oe i, 106a Ion exchanger 14 Orifice electrode 16, 34, 122 Feed electrode 17, 68, 120 Power supply 18 Liquid 19 Liquid supply part 20 Water molecule 22 Hydroxide ion 24 Hydrogen ion 26 Reaction product 30 Substrate holder 32 Orifice electrode 36 Electrode section 38 Electrode head 42 Support shaft 44, 50 > 56 ^ 1 1 (114 motor 46, 58 timing belt 48 rotation Arm 52 Ball screw 54 Hollow rotating shaft 60 Hollow motor 6 2a, 62b Strongly acidic cation exchange fiber 62c Strongly acidic cation exchange film 64 Sector electrode plate 6 6 '86 Collector ring 70 Pure water nozzle 72 Numerical controller 80 Contact fixing plate 82 contacts 84 processed electrodes 100 substrate holder 314314.ptd page 37 200301717

314314.ptd 第38頁314314.ptd Page 38

Claims (1)

200301717 六、申請專利範圍 1. 一種電解加工裝置,包括: 固定座,用於可拆卸自如地固持工件; 加工電極,可靠近或接觸為該固定座所固持的該 工件; 饋電電極,用於將電力供應至為該固定座所固持 的該工件; 離子交換器,配置於該工件與該加工電極間之空 間及該工件與該饋電電極間之空間的至少一個空間 中; 流體供應部,用於將流體供應至其中存在有該離 子交換器之該工件與該加工電極及該饋電電極中之至 少其中一個電極之間; 電源,用於施加電壓於該加工電極與該饋電電極 之間; 驅動部,用於使彼此面對且為該固定座所固持的 該工件與該加工電極得以進行相對運動;以及 數值控制器,用於完成該驅動部的數值控制。 2. 如申請專利範圍第1項之電解加工裝置,其中該電源將 控制在定值的電流或電壓供應至該加工電極與該饋電 電極之間。 3. 如申請專利範圍第2項之電解加工裝置,其中該數值控 制器係藉由該驅動部而對為該固定座所固持之該工件 與該加工電極間的相對運動速度進行數值控制。 4. 如申請專利範圍第2項之電解加工裝置,其中該數值控200301717 VI. Application for patent scope 1. An electrolytic processing device, comprising: a fixing base for detachably holding a workpiece; a processing electrode that can approach or contact the workpiece held by the fixing base; a feeding electrode for Supplying power to the workpiece held by the fixed base; an ion exchanger arranged in at least one space between a space between the workpiece and the processing electrode and a space between the workpiece and the feeding electrode; a fluid supply unit, For supplying a fluid between the workpiece in which the ion exchanger is present and at least one of the processing electrode and the feeding electrode; a power source for applying a voltage between the processing electrode and the feeding electrode A driving section for making the workpiece and the processing electrode facing each other and held by the fixed base to perform relative movement; and a numerical controller for performing numerical control of the driving section. 2. The electrolytic processing device according to item 1 of the patent application scope, wherein the power supply supplies a current or voltage controlled at a fixed value between the processing electrode and the feeding electrode. 3. For the electrolytic processing device according to item 2 of the patent application scope, wherein the numerical controller uses the driving unit to numerically control the relative movement speed between the workpiece and the processing electrode held by the fixed base. 4. For the electrolytic processing device in the scope of patent application, the numerical control 314314.ptd 第39頁 200301717 六-、申請專利範圍 制器係藉由該驅動部而對為該固定座所固持之該工件 與該加工電極間的相對步進運動的止動時間進行數值 控制。 5. —種電解加工方法,包括: 提供加工電極、饋電電極與離子交換器,該離子 交換器配置於為固定座所固持之工件與該加工電極間 之空間及該工件與該饋電電極間之空間的至少其中一 個空間中; 當電力由該饋電電極供應至該工件時,該加工電 φ極得以靠近或接觸為該固定座所固持之該工件; 將流體供應至其中存在有該離子交換器之該工件 與該加工電極及該饋電電極中之至少其中一個電極之 ^ 間的空間; 施加電壓於該加工電極與該饋電電極之間;以及 在以數值控制器數值控制運動的情況下,使彼此 面對且為該固定座所固持的該工件與該加工電極得以 進行相對運動。 6. 如申請專利範圍第5項之電解加工方法,其中將控制在 定值的電流或電壓供應至該加工電極與該饋電電極之 •間。 7. 如申請專利範圍第6項之電解加工方法,包括: 量測加工前和/或加工期間的該工件之形; 將所量測之外形與該工件加工後之希冀外形的座 標資料輸入該數值控制器中;以及314314.ptd Page 39 200301717 VI. Patent application scope The controller uses the driving unit to numerically control the stop time of the relative step motion between the workpiece and the processing electrode held by the fixed seat. 5. An electrolytic processing method, comprising: providing a processing electrode, a feeding electrode, and an ion exchanger, the ion exchanger being arranged in a space between a workpiece held by a fixed base and the processing electrode, and the workpiece and the feeding electrode In at least one of the interspaces; when power is supplied to the workpiece by the feeding electrode, the processing electric φ pole can approach or contact the workpiece held by the fixed base; supply fluid to where the workpiece exists A space between the workpiece of the ion exchanger and at least one of the processing electrode and the feeding electrode; applying a voltage between the processing electrode and the feeding electrode; and controlling the movement numerically with a numerical controller In the case, the workpiece and the processing electrode facing each other and held by the fixing base can be relatively moved. 6. The electrolytic processing method according to item 5 of the patent application scope, wherein a current or voltage controlled at a fixed value is supplied between the processing electrode and the feeding electrode. 7. The electrolytic processing method according to item 6 of the patent application scope includes: measuring the shape of the workpiece before and / or during processing; entering the coordinate data of the measured outer shape and the desired shape of the workpiece after processing into the In a numerical controller; and 314314.ptd 第40頁 200301717 六、申請專利範圍 根據該量測外形與該希冀外形之間的座標差,而 對為該固定座所固持之該工件與該加工電極間的相對 運動速度進行數值控制。 8.如申請專利範圍第6項之電解加工方法,包括: 量測加工前和/或加工期間的該工件之形; 將所量測之外形與該工件加工後之希冀外形的座 標資料輸入該數值控制器中;以及 根據該量測外形與該希冀外形之間的座標差,而對 為該固定座所固持之該工件與該加工電極間之相對步 進運動中的止動時間進行數值控制。314314.ptd Page 40 200301717 VI. Application for Patent Range According to the coordinate difference between the measured shape and the desired shape, numerical control of the relative movement speed between the workpiece and the processing electrode held by the fixed base . 8. The electrolytic processing method according to item 6 of the scope of patent application, comprising: measuring the shape of the workpiece before and / or during processing; entering the coordinate data of the measured outer shape and the desired shape of the workpiece after processing into the A numerical controller; and numerically controlling a stop time in a relative step motion between the workpiece and the processing electrode held by the fixed base according to a coordinate difference between the measured shape and the desired shape . 314314.ptd 第41頁314314.ptd Page 41
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