TR200100892T2 - Madde homojensizliklerinin algılanması ve belirlenmesi için test aygıtı - Google Patents
Madde homojensizliklerinin algılanması ve belirlenmesi için test aygıtıInfo
- Publication number
- TR200100892T2 TR200100892T2 TR2001/00892T TR200100892T TR200100892T2 TR 200100892 T2 TR200100892 T2 TR 200100892T2 TR 2001/00892 T TR2001/00892 T TR 2001/00892T TR 200100892 T TR200100892 T TR 200100892T TR 200100892 T2 TR200100892 T2 TR 200100892T2
- Authority
- TR
- Turkey
- Prior art keywords
- inhomogeneities
- sample
- substance
- determination
- detection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
- G01R33/0354—SQUIDS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Measuring Magnetic Variables (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
Bu icat, elektriksel olarak iletken numunelerin içerisindeki madde homojensizliklerini algilayan ve tespit eden ve test edilecek numunelerin (10) üzerine konulacagi bir mesnet (30), numune (10) içerisindeki sicaklik dagilimini düzenleyici bir sicaklik düzenleyici aygit (30, 50, 60), numunenin (10) konumunu degistirmek için bir mesnede (30) bagli bir sürücü ve numunenin (10) disindaki manyetik alanin temas ettirilmeksizin ölçülmesi için en az bir ölçüm sensöründen (20) olusan bir test aygiti ile ilgilidir.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19846025A DE19846025C2 (de) | 1998-10-06 | 1998-10-06 | Prüfvorrichtung für Material-Inhomogenitäten |
Publications (1)
Publication Number | Publication Date |
---|---|
TR200100892T2 true TR200100892T2 (tr) | 2001-08-21 |
Family
ID=7883584
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TR2001/00892T TR200100892T2 (tr) | 1998-10-06 | 1999-10-05 | Madde homojensizliklerinin algılanması ve belirlenmesi için test aygıtı |
Country Status (11)
Country | Link |
---|---|
US (1) | US6781370B1 (tr) |
EP (1) | EP1119766B1 (tr) |
JP (1) | JP2002526770A (tr) |
AT (1) | ATE264502T1 (tr) |
AU (1) | AU6334599A (tr) |
CA (1) | CA2345126A1 (tr) |
DE (2) | DE19846025C2 (tr) |
NO (1) | NO20011776D0 (tr) |
PL (1) | PL347131A1 (tr) |
TR (1) | TR200100892T2 (tr) |
WO (1) | WO2000020856A1 (tr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004021450B4 (de) * | 2004-04-30 | 2006-08-10 | Hochschule Magdeburg-Stendal (Fh) | Messverfahren und Anordnung zur Bestimmung metallischer Oberflächenschichten auf metallischen Werkstücken |
US9513230B2 (en) * | 2012-12-14 | 2016-12-06 | Kla-Tencor Corporation | Apparatus and method for optical inspection, magnetic field and height mapping |
US9779872B2 (en) * | 2013-12-23 | 2017-10-03 | Kla-Tencor Corporation | Apparatus and method for fine-tuning magnet arrays with localized energy delivery |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE159276C (tr) | ||||
DD159276A3 (de) * | 1980-05-21 | 1983-03-02 | Guenter Steinert | Thermomagnetometer |
AT382458B (de) * | 1982-02-11 | 1987-02-25 | Voest Alpine Ag | Verfahren zur oberflaechenpruefung von ueber dem curie-punkt heissem stahlgut sowie einrichtung zur durchfuehrung des verfahrens |
IT1163522B (it) | 1983-06-15 | 1987-04-08 | Cise Spa | Misuratore di difetti superficiali e subsuperficiali di corpi metallici al di sopra della temperature di curie |
US4950990A (en) * | 1989-07-21 | 1990-08-21 | Iowa State University Research Foundation, Inc. | Method and apparatus for photoinductive imaging |
DE4003060A1 (de) * | 1990-02-02 | 1991-08-08 | Univ Schiller Jena | Einstufiger, hochempfindlicher, rauscharmer tieftemperaturverstaerker |
US5331278A (en) * | 1990-09-11 | 1994-07-19 | Hitachi, Ltd. | Apparatus for inspecting degradation/damage of a material using an AC magnet, a superconducting DC magnet and a SQUID sensor |
DE4032092C2 (de) * | 1990-10-10 | 1994-06-09 | Ind Tech Res Inst | DSC-Thermoanalysator und Verfahren zur Bestimmung der Curie-Temperatur eines ferromagnetischen Werkstoffs |
US5537037A (en) * | 1993-03-16 | 1996-07-16 | Hitachi, Ltd. | Apparatus with cancel coil assembly for cancelling a field parallel to an axial direction to the plural coils and to a squid pick up coil |
US5430376A (en) * | 1993-06-09 | 1995-07-04 | General Electric Company | Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects |
JP3133013B2 (ja) * | 1997-03-31 | 2001-02-05 | セイコーインスツルメンツ株式会社 | 超伝導量子干渉素子およびそれを用いた非破壊検査装置 |
-
1998
- 1998-10-06 DE DE19846025A patent/DE19846025C2/de not_active Expired - Fee Related
-
1999
- 1999-10-05 JP JP2000574923A patent/JP2002526770A/ja active Pending
- 1999-10-05 CA CA002345126A patent/CA2345126A1/en not_active Abandoned
- 1999-10-05 US US09/806,739 patent/US6781370B1/en not_active Expired - Fee Related
- 1999-10-05 EP EP99950634A patent/EP1119766B1/de not_active Expired - Lifetime
- 1999-10-05 AU AU63345/99A patent/AU6334599A/en not_active Abandoned
- 1999-10-05 TR TR2001/00892T patent/TR200100892T2/tr unknown
- 1999-10-05 AT AT99950634T patent/ATE264502T1/de not_active IP Right Cessation
- 1999-10-05 WO PCT/EP1999/007440 patent/WO2000020856A1/de active IP Right Grant
- 1999-10-05 DE DE59909195T patent/DE59909195D1/de not_active Expired - Fee Related
- 1999-10-05 PL PL99347131A patent/PL347131A1/xx not_active IP Right Cessation
-
2001
- 2001-04-06 NO NO20011776A patent/NO20011776D0/no not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
EP1119766B1 (de) | 2004-04-14 |
DE19846025C2 (de) | 2001-09-13 |
DE59909195D1 (de) | 2004-05-19 |
AU6334599A (en) | 2000-04-26 |
JP2002526770A (ja) | 2002-08-20 |
CA2345126A1 (en) | 2000-04-13 |
ATE264502T1 (de) | 2004-04-15 |
EP1119766A1 (de) | 2001-08-01 |
US6781370B1 (en) | 2004-08-24 |
NO20011776L (no) | 2001-04-06 |
NO20011776D0 (no) | 2001-04-06 |
PL347131A1 (en) | 2002-03-25 |
DE19846025A1 (de) | 2000-04-13 |
WO2000020856A1 (de) | 2000-04-13 |
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