SU634283A1 - Arrangement for simulating parameter variation processes in electronic circuits - Google Patents

Description

one

The invention relates to the field of computer technology and can be used in the study and evaluation of the reliability of low-frequency electronic circuits at the stage of their design, pilot testing and large-scale production.

A device for modeling 1 is known, which contains a generator, a control unit, elements AND, OR.

A disadvantage of the prior art is low functionality.

The closest in essence to the technical solution is a device for modeling 2, containing a sensor of uniformly distributed random numbers, the output of which is connected to the first inputs of blocks for setting initial values of parameters and blocks for setting current values of parameters through the descriptor, the outputs of which are connected to element And, a generator, the output of which through the element AND is connected to the first inputs of the memory counters, reversible counters and the input of the feedback element, the output of which is inn with the second inputs of the task setting initial values of the parameters ii of the blocks setting the current values of the parameters, the third inputs of which are connected to the switch output and the second inputs of the reversible counters, the third inputs of which are connected to the output of the control unit, the second inputs of the setting blocks initial values of parameters and blocks for setting the current values of parameters, the switch input and the sensor input of uniformly distributed random numbers, the outputs of the reversible counters are connected with the inputs of the corresponding type fields, the switch output is connected to the third inputs of the memory counters.

A disadvantage of the known device is the lack of accuracy of the simulation.

The aim of the invention is to improve the accuracy of the simulation.

The goal is achieved by the fact that the device has entered memory blocks of numbers, memory blocks of coefficients, multiplication blocks accumulating adders, registers, summators, variable frequency clock generators, a sensor of normally distributed random numbers, and

the output of the control unit through a sensor. |) of the randomly distributed random numbers is connected to the first inputs of the memory blocks of numbers, the second inputs of which are connected to the output of the control unit and the inputs of the memory blocks of the coefficients, the third inputs of the memory blocks of numbers are connected to the output of the switch, the outputs of the blocks the memory of coefficients and memory blocks of numbers are connected to the inputs of the corresponding multiplication blocks, the outputs of which and the outputs of the memory counters are connected to the inputs of the corresponding accumulating adders, the outputs of which are through the register are connected to respective inputs of adders clock generator of variable frequency outputs through respective modulo two adders are connected to fourth inputs of respective counters reversing, vEhod control unit connected with the control inputs of multipliers, accumulators, registers, adders.

The block diagram of the device shown in the drawing.

The device contains a sensor of uniformly distributed random numbers, decoupler 2, blocks 3i-3fi setting the initial values of parameters (they form the laws of the distribution of the initial values of the parameters of the elements), blocks setting the current values of the parameters (they form the laws of the distribution of average values: 1 speeds of change of the parameters elements), element 5 OR, element 6 feedback, comm switch 7, control block 8, generator 9, element 10 I, memory counters lli-1 In, blocks 12i - 12ri of coefficient memory, blocks of numbers memory, sensor 14 standards randomly distributed random numbers, blocks 15 | -15l multiply, accumulating sum.mators 16 | -16p, registers 7-17p, adders 18i-18-1, generators 19 | - Shp clock pulses of variable frequency, reversible counters 20i-20 ,,, composing field 21, -2 In.

The device works as follows.

Before the start of the simulation, the corresponding distribution laws are established in blocks 3 | - 3p and 4 | -4p. In blocks 12i-12p, the mc is scaled by m given coefficients. The working frequency of each of the generators 19 | -19p is set. Ordered rows of elements are installed on composable floors x 211 -21p. The command from block 8 moves the device to its original position.

Upon a command from block 8, switch 7 is set to the first position, and in sensor 1 a random number is generated, which through decipher 2 arrives at the input of current 3i. To obtain a given random value, the converted random number from you of the flow of block 3i is supplied

through element 5 to element 10 and barking)) - ... solution to | 1) the return of regular pulses from generator 9 to feedback element 6 and to counter 20i. When the signal corresponding to the formed probability and the signal from element 6 coincide in block 3, the permission for the passage of pulses through element 10 I is removed and the flow of pulses to the counter 20i stops. Thus, the number corresponding to the probability formed by block 3 is entered into the counter 20i. In accordance with this number, one element from the ordered set of elements installed on the dial field is connected to the electronic circuit.

Then, from block 8, the command lia is applied to transfer co.mutator 7 to the second curvature and to form in sensor 1 of a new random number. The above described parameters into the circuit under study are connected to one of the elements installed on the dial field 21), in accordance with the probability formed in block 3. Then the comm.m 7 switches to the following positions and The electronic circuit under study is similarly connected to the remaining p-2 elements. The values of the parameters of the components of the circuit under study to its output parameters will correspond to the initial moment of time (t 0).

To simulate the process of changing the parameters of a set of one of the elements, on command from block 8, the resolution for passing signals to blocks 3i-3 and reversible counters 20: -20 „is reduced. At the same time, the resolution for signals to blocks 4i-4,., blocks 13i - 13p and counters 111 -1 b. By the command from block 8, switch 7 is transferred to the first position.

Random numbers are generated in sensors 1 and and. Transform a random number from sensor 1 using block 4i, element 5, element 10, generator 9 and element 6 to the number corresponding to the probability formed by block 4 | . This number is entered into counter 111. The conversion is performed as described above for the case of forming the number entered into counter 20i. Random numbers from sensor 14 are entered directly in block 13 ,. It enters sequentially gp numbers, for which block 8 issues successively gp commands to generate these numbers in sensor 14 and to shift the numbers in block 13 |. Then, on command from block 8, switch 7 is transferred to the second position, and in sensors 1 and 14 new random numbers are formed, which are similarly entered into counter 11 and block 13 ,. Likewise, random numbers are added to the remaining p-2 counters Ih - llr, and blocks 13 | - 13p.

ZUTSM from blocha 8 issue :. teams to multiply numbers simultaneously in 1k-ex blocks 15 -15: 1 with the accumulation of results in the corresponding accumulators, and adders 16 | -16i. The accumulation result is summed with the number on the counters - lin. By the next command from block 8, the accumulated sums from all n accumulating IGi-16l accumulators are transferred to the corresponding registers 17; -17l.

At the command of block 8, adders 18i come in from the corresponding generators 19i-19m and from the corresponding registers 17i-17p. At each overflow, a pulse appears at the output of the 18o. Thus, the frequency of the pulses at the output of each adder 18i - 18h is proportional to the number entered in the corresponding register 17i -17p. Each of the 20i-20h chetchers recalculates the pulses appearing at its input from the corresponding: iuix adders ISi-18p. In accordance with the numbers in the counters 20; -20, elements installed on the composited floors x 21; -2 g are connected to the circuit under study; the connection speeds of the elements are directly proportional to the numbers in the corresponding registers 17 | -17 ;.

In order to obtain the values of the output parameters of the electronic circuit under study at given times, block 8, at a given time interval, submits a prohibition on the impulse propagation from the generators 19i -19., Adders 18: -18l. At the same time, it ceased issuing all the commands from block 8. Switching of electrical elements installed on keyboards x 21 is also terminated. The electronic circuit under study is energized and its output pairs are measured.

After that, at the operator's command, a repeated simulation cycle, etc. Thus, by measuring the output parameters of the electronic circuit at predetermined time intervals, one can obtain a series of values for each of the output parameters corresponding to specific points in time.

By connecting straight-line segments corresponding to the values of the output parameter at adjacent points in time, a piecewise-linear implementation of the process of changing this parameter with time can be obtained. By multiplying many times the repetition of the described simulation cycle, many implementations of the random process of changing the output parameters of the studied electronic circuit can be obtained, the necessary probability characteristics and reliability indices can be found.

If it is necessary to determine only the characteristics of the initial production spread of the output parameters of the studied

.1ekt; 5o1: Noah schelpl. The simulation of ii3MO} ieiiiiH 11–11 diameters of the component e. chips is not carried out. .but 1 ×) multiple repetition of simulation cycles allows to obtain a set of random values of the output parameters of the studied circuit. The probabilistic characteristics of the initial production spread of these parameters can be calculated from the set of values of the output parameters found in this way.

The device differs from the prototype by a significant increase in the reliability of the cut; 1, obtained by modeling the processes of changing the output parameters of electronic circuits, due to the possibility of modeling non-monotonic processes of changing the parameters of the component elements. The main point: the value of the installation is the study of the parametric reliability of the design of electronic circuits and, from this point of view, the stated advantage of the mTCBO allows a much more accurate op | ) e, 1e1 t and predict reliability indicators.

In addition, the implementation of a directly proportional dependence of the switching speed of elements on the number corresponding to this speed allows us to simplify the preparatory work for modeling.

Claims (2)

1. USSR author's certificate number 428386, cl. G About F 15/20, 1971. 2. Authors certificate of the USSR L 518775, cl. G06 F 15/20, 1974.