SU370454A1 - CONTACT INTERFEROMETER FOR MEASUREMENT OF LINEAR MOVEMENT OF OBJECT - Google Patents

CONTACT INTERFEROMETER FOR MEASUREMENT OF LINEAR MOVEMENT OF OBJECT

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Publication number
SU370454A1
SU370454A1 SU1641533A SU1641533A SU370454A1 SU 370454 A1 SU370454 A1 SU 370454A1 SU 1641533 A SU1641533 A SU 1641533A SU 1641533 A SU1641533 A SU 1641533A SU 370454 A1 SU370454 A1 SU 370454A1
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SU
USSR - Soviet Union
Prior art keywords
interferometer
measurement
linear movement
measuring
interference
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Application number
SU1641533A
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Russian (ru)
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Priority to SU1641533A priority Critical patent/SU370454A1/en
Application granted granted Critical
Publication of SU370454A1 publication Critical patent/SU370454A1/en

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Description

1one

Изобретение относитс  к области контрольно-измерительной техники, в частности к области измерени  линейных размеров в машиностроении .The invention relates to the field of instrumentation technology, in particular to the field of measuring linear dimensions in mechanical engineering.

Известен контактный интерферометр дл  измерени  линейного перемещени  объекта, содержащий источник света с конденсором, блок, раздел ющий световой пучок -на два пучка, неподвижное зеркало, установленное на пути одного пучка, подвижное зеркало, св занное с измерительным наконечником и установленное на пути другого пучка, окул р, фотоэлектрический преобразователь и счетчик интерференционных полос. Счет интерференционных полос может быть осуществлен визуально или фотоэлектрическими устройствами с электронными счетчиками.A contact interferometer for measuring the linear displacement of an object is known, which contains a light source with a condenser, a unit that separates a light beam — two beams, a fixed mirror mounted in the path of one beam, a movable mirror connected to the measuring tip and mounted in the path of the other beam, an eyepiece, a photoelectric converter and an interference meter counter. The counting of interference fringes can be carried out visually or by photoelectric devices with electronic counters.

Однако известный интерферометр имеет погрещ ость измерени  не менее единицы счета , т. е. не менее одной интерференционной полосы .However, the known interferometer has an measurement accuracy of at least one counting unit, i.e., at least one interference fringe.

С целью -повышени  точности измерени  предлагаемый интерферометр снабжен дополнительным неподвижным зеркалом, установленным относительно подвижного зеркала так, что в поле зрени  интерферометра наблюдаетс  интерференционна  картина в виде систем имтерференционных полос, и монохроматором, расположенным между источником света и светоделительным блоком и обеспечивающимIn order to increase the measurement accuracy, the proposed interferometer is equipped with an additional fixed mirror mounted relative to the movable mirror so that in the field of the interferometer an interference pattern is observed in the form of systems of interference bands, and a monochromator located between the light source and the beam-splitting unit and providing

образование интерференционной картины в различных длинах волн.the formation of an interference pattern in different wavelengths.

Такое выполнение позвол ет измер ть перемещение ло счету интерференционных полос с помощью счетчика, исключа  при этом ошибки счета полос по взаимному положению в различных длинах волн, и тем самым повыша  точность измерени  контактного интерферометра .This embodiment allows measuring the shift of the counting of interference fringes with the help of a counter, while eliminating errors in the counting of the fringes by relative position at different wavelengths, and thereby increasing the accuracy of measuring the contact interferometer.

Предлагаемый интерферометр может осуществл ть одновременно измерение как путем счета полос, так и «абсолютным методом.The proposed interferometer can simultaneously measure both by counting the bands and by the absolute method.

На фиг. 1 показана принципиальна  схема предлагаемого интерферометра; на фиг. 2 -FIG. 1 shows a schematic diagram of the proposed interferometer; in fig. 2 -

поле зрени  интерферометра.field of view of the interferometer.

Интерферометр содержит источник / света с конденсором, монохроматор 2, блок, раздел ющий световой пучо« на два пуска, в виде светоделительной пластины 3, неподвижное зеркало 4, измерительный наконечник 5 с подвижным зеркалом 6, дополнительное неподвижное зеркало 7, окул р 8, фотоэлектрический преобразователь 9 и счетчик 10.The interferometer contains a source / light with a condenser, a monochromator 2, a unit dividing the light beam into two starts, in the form of a beam-splitting plate 3, a fixed mirror 4, a measuring tip 5 with a movable mirror 6, an additional fixed mirror 7, an eye 8, a photoelectric converter 9 and counter 10.

Работает предлагаемый интерферометр следующим образом.Works proposed interferometer as follows.

При измерении иЗхмерительный наконечни-к 5 с зеркалом 6 перемещаетс . При этом в поле зрени  окул ра 8 -проходит соответствующее число полос интерференции, которые преобразуютс  фотоэлектрическим преобразоваWhen measuring, the measuring tip-to-5 with the mirror 6 moves. In this case, in the field of view, the ocular 8 is passed through a corresponding number of interference bands, which are converted by the photoelectric conversion

SU1641533A 1971-04-01 1971-04-01 CONTACT INTERFEROMETER FOR MEASUREMENT OF LINEAR MOVEMENT OF OBJECT SU370454A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU1641533A SU370454A1 (en) 1971-04-01 1971-04-01 CONTACT INTERFEROMETER FOR MEASUREMENT OF LINEAR MOVEMENT OF OBJECT

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU1641533A SU370454A1 (en) 1971-04-01 1971-04-01 CONTACT INTERFEROMETER FOR MEASUREMENT OF LINEAR MOVEMENT OF OBJECT

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SU370454A1 true SU370454A1 (en) 1973-02-15

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4132110A1 (en) * 1991-09-26 1993-04-01 Siemens Ag Optical force sensor load cell with interferometer - has elastically deformable body forming symmetrical force sensor with interference suppressed by opposite influences on distances between plate and discs

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4132110A1 (en) * 1991-09-26 1993-04-01 Siemens Ag Optical force sensor load cell with interferometer - has elastically deformable body forming symmetrical force sensor with interference suppressed by opposite influences on distances between plate and discs

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