SU1504504A1 - Optronic device for checking flaws on outer surfaces of parts - Google Patents

Abstract

The invention relates to a measurement technique and can be used to monitor defects on the outer surfaces of parts with the evaluation of defect parameters in three coordinates. The purpose of the invention is to increase the information content of the control due to the control of defects in depth, increase the reliability, monitor performance by increasing the scanning speed. The emitting region in the form of a rectangle of a semiconductor pulsed laser 1 is projected with the help of a spherical lens 2 onto a monitored surface of the part 8. Defect information is contained in the distortions of the light strip formed on the surface of the part 8. from which information is read in parallel by rows using block 5 of control and information processing. 1 hp f-ly, 2 ill.

Description

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The invention relates to the technique of mercury testing and can be used to control the flaw on the external surfaces of parts with an estimate of the parameters of defects in three coordinates.

The purpose of the invention is to increase the information content of the control due to the control of defects in depth, increasing the reliability and performance by increasing the scanning speed.

FIG. 1 shows a diagram of an opto-electronic device for monitoring defects on the external surfaces of cylindrical parts; in fig. 2 - light strip on the defect of the outer surface.

The device contains a sequentially mounted forming system consisting of a laser 1 with a radiating platform in the shape of a rectangle, the length of which is much longer than its width, and a spherical lens 2, the receiving system consisting of an anamorphic lens 3 and a two-dimensional photodetector 4, control unit 5 and processing of information, block 6 of executive devices and video control device 7.

The device works as follows.

The control and information processing unit 5 generates pumping pulses of duration L, which follow with a frame rate f |, which are fed to a 1-pulse semiconductor laser 1. During their operation, the Rp (or pp) transition of the laser 1 emits light pulses the required power and the radiating area using a spherical lens 2 is projected with a given linear increase f5 on the test surface of the part 8 at an angle to the plane perpendicular to the test surface, thereby forming a light strip, ra

warped in, the location of the projection in

according to the nature of the geometry of the controlled surface of the part 8.

Information about the depth and width of the surface defect is contained in the geometric parameters, respectively, of the li and g deformations of the light strip (see Fig. 2).

Anamorphic lens 3 is built in the image plane, where the mouth Q

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A two-dimensional photodetector 4 is introduced, an image of a portion of the monitored surface of the part 8 illuminated with a light strip with predetermined linear magnifications (A.

During the action of a radiation pulse of duration C, the photodetector ft converts the optical information into an electrical signal and stores it for the sampling time. Since t does not exceed 100, the monitored part B in the process of exposure practically remains motionless, while there is no effect of smearing the image on the photodetector for a large range of scanning speeds of the surfaces under test.

At the end of the pulse i, the information control and processing unit 5 generates information sampling pulses from the photodetector A, in order to increase the monitoring performance, a photoreceiver is used with data sampling parallel across the lines.

From the photodetector 4, the video signal on n channels (n is the number of lines of the photodetector) enters the information management and processing unit 5, where analogue digital information processing is performed in real time and a signal is generated. There is a defect, or no defect, entering unit 6 of actuators which controls the grading device and counters of usable and defective parts (not shown).

The control and information processing unit 5 also generates from the video signal taken from the photodetector 4 a television signal which is fed to the video monitoring device 7, which serves as an indicator during adjustment and adjustment of the control device.

Claims (1)

Invention Formula I. An optoelectronic device for monitoring defects on the external surfaces of parts, containing successively installed a forming system consisting of a radiator and an optical unit for forming a light strip in a plane. image bones, receiving system. optically conjugated to the forming system and installed so that the optical axes of the forming and optical systems are angled, consisting of successively installed projection lenses and photodetectors, and an electronic system electrically connected with the photoreceivers, in order to increase the information content control through the control of defects in depth, projection the lens is made anamorphic gm, n is a two-dimensional photodetector. 2 o The device according to claim 1, which is designed so that, with the aim of increasing the reliability and performance of the control, the radiator is made in the form of a pulsed semiconductor laser with a radiating platform in the shape of a rectangle, the length of which is much greater than its width, and the optical unit is designed as a spherical lens. Phie.g