SU124191A1 - Dual microscope with polarized optics - Google Patents

Dual microscope with polarized optics

Info

Publication number
SU124191A1
SU124191A1 SU600785A SU600785A SU124191A1 SU 124191 A1 SU124191 A1 SU 124191A1 SU 600785 A SU600785 A SU 600785A SU 600785 A SU600785 A SU 600785A SU 124191 A1 SU124191 A1 SU 124191A1
Authority
SU
USSR - Soviet Union
Prior art keywords
microscope
polarized optics
dual
dual microscope
optics
Prior art date
Application number
SU600785A
Other languages
Russian (ru)
Inventor
Н.В. Королев
Original Assignee
Н.В. Королев
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Н.В. Королев filed Critical Н.В. Королев
Priority to SU600785A priority Critical patent/SU124191A1/en
Application granted granted Critical
Publication of SU124191A1 publication Critical patent/SU124191A1/en

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Description

Известны двойные микроскопы с пол ризационной оптикой, предназначенные дл  изучени  прозрачных шлифов в проход щем свете и непрозрачных (аншлифов) в отраженном свете.Double polarized optics microscopes are known for the study of transparent thin sections in transmitted light and opaque (polished sections) in reflected light.

Недостатками известных двойных микроскопов  вл ютс  ограниченные возможности изучени  оптических свойств микрозерен по методу Друде, вы влени  микропрофил  зерен, определени  отражательной способности поверхностей их, измерени  толщины пленок интерференционным и др. методами.The disadvantages of the known double microscopes are the limited possibilities of studying the optical properties of micrograins by the Drude method, the detection of microprofile grains, the determination of the reflectivity of their surfaces, the measurement of film thickness by interference, and other methods.

В предлагаемом двойном микроскопе эти недостатки в значительной мере устран ютс  тем, что изучение зерен минералов и технических материалов в шлиф|ах и аншлифах проводитс  при больших углах падени  лучей На изучаемую пове рхность и тем, что в нем применена дополнительна  диафрагма со щелью и цилиндрическа  линза (в сочетании с пол ризацирнной оптикой). Это и позвол ет измер ть оптические константы микрозерен по методу Друде или путем сравнени   ркостей бликов, отрал :енных от границ шлиф-иммерси , иммерси -воздух, изучать микропрофиль зерен, наблюда  полосы равного наклона в тонкой пленке иммерсионной жидкости, нанесенной на исследуемую поверхность, измер ть толщину окисных и солевых пленок интерференционным способом (дл  толщин пленок до 4 мк) и по оценке рассто ний между изображени ми щели (дл  толщин более 4 мк). Все это позвол ет получать результаты оптических исследований, трудно достижимые другими известными методами и приборами.In the proposed double microscope, these deficiencies are largely eliminated by the fact that the study of mineral grains and technical materials in thin sections and polished sections is carried out at large angles of incidence of the rays. The surface under study is also connected with the additional diaphragm and cylindrical lens. (in combination with polarized optics). This makes it possible to measure the optical constants of micrograins according to the Drude method or by comparing the glare intensities that are: cut from the boundaries of polished-immersi, immersi-air, to study the microprofile of grains; measure the thickness of oxide and salt films by an interference method (for film thicknesses up to 4 microns) and by estimating the distances between the slit images (for thicknesses greater than 4 microns). All this allows to obtain the results of optical studies, which are difficult to achieve by other known methods and devices.

На фиг, 1 изображена оптическа  схема двойного мик1роскопа; на фиг. 2 - вид пол  зрени  микроскопа при введении цилиндрической линзы.Fig. 1 shows the optical layout of the dual microscope; in fig. 2 is a field view of the microscope with the introduction of a cylindrical lens.

Яркий источник света 1 (ртутна  лампа) посылает лучи через коллектор 2, светофильтр 5 и пол роид 4 и освещает горизонтальную щель 5. Изображение щели 5 через коллиматорный объектив 6 и микрообъектив 7 проектируетс  на поверхность изучаемого образца 8. Щель 9 шириной 1 мм, установленна  в передней фокальной плоскости микрообъекA bright light source 1 (a mercury lamp) sends rays through a collector 2, a light filter 5 and a polaroid 4 and illuminates a horizontal slit 5. An image of a slit 5 through a collimator lens 6 and a micro-lens 7 is projected onto the surface of the test sample 8. in the front focal plane microobje

SU600785A 1958-05-30 1958-05-30 Dual microscope with polarized optics SU124191A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU600785A SU124191A1 (en) 1958-05-30 1958-05-30 Dual microscope with polarized optics

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU600785A SU124191A1 (en) 1958-05-30 1958-05-30 Dual microscope with polarized optics

Publications (1)

Publication Number Publication Date
SU124191A1 true SU124191A1 (en) 1958-11-30

Family

ID=48395682

Family Applications (1)

Application Number Title Priority Date Filing Date
SU600785A SU124191A1 (en) 1958-05-30 1958-05-30 Dual microscope with polarized optics

Country Status (1)

Country Link
SU (1) SU124191A1 (en)

Similar Documents

Publication Publication Date Title
US4515445A (en) Optical system for transmitted-light microscopy with incident illumination
US2045124A (en) Apparatus fob measuring turbidity
GB1415397A (en) Optical measuring device
US3806257A (en) Operator viewing optics for a slide classification system
US2660923A (en) Phase contrast apparatus for metallographic microscopes
US2184750A (en) Comparison microscope
US1007346A (en) Spectroscope-prism with curved surfaces.
US2074106A (en) Metallographic illuminating system and prism therefor
SU124191A1 (en) Dual microscope with polarized optics
US3202041A (en) Optical device for orienting monocrystals along the axis of the crystal
US3563665A (en) Optical system for examining surface profiles of objects by the optical intersection method
GB966387A (en) Improvements in or relating to apparatus for examining the optical properties of a surface layer of a transparent material or medium
Capstaff et al. A compact motion picture densitometer
GB719700A (en) Method of and apparatus for testing lenses
US2425399A (en) Method and apparatus for measuring the index of refraction of thin layers of transparent material
SU408200A1 (en) DEVICE FOR DEFECTIC TRANSPARENTS
US2387581A (en) Refractometer for turbid liquids and pulpous substances
US2537846A (en) Knife-edge light stop for microscopes
US2319889A (en) Refractometer
US2989889A (en) Rangefinders and like optical instruments
Moore et al. Adaptation of combined interferometric and phaseplate gradient optics to electrophoresis
SU43751A1 (en) A lens focusing scaler for the infrared part of the spectrum
SU104294A2 (en) Optical device for densitometer
GB1286598A (en) Optical device for examining profile or roughness of a surface of a specimen by an optical intersection method
SU98163A1 (en) Optical flaw detector