GB1286598A - Optical device for examining profile or roughness of a surface of a specimen by an optical intersection method - Google Patents
Optical device for examining profile or roughness of a surface of a specimen by an optical intersection methodInfo
- Publication number
- GB1286598A GB1286598A GB618470A GB618470A GB1286598A GB 1286598 A GB1286598 A GB 1286598A GB 618470 A GB618470 A GB 618470A GB 618470 A GB618470 A GB 618470A GB 1286598 A GB1286598 A GB 1286598A
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen
- optical
- examining
- images
- feb
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
Abstract
1286598 Optical devices for examining surfaces NIPPON KOGAKU K K 9 Feb 1970 [8 Feb 1969] 6184/70 Heading G2J In an optical device for examining surface irregularities of a specimen, which comprises a lamp 1, slit 5, semi-reflecting surface 6, eye-piece 11 and objective 7, light after passing through the objective 7 is divided and directed by a pair of intersecting reflecting surfaces 8 unto reflecting surfaces 9 to illuminate a specimen 10, each subsequently reflected beam returning along the path of the other incident beam, and the resultant images of the specimen's surface are observed in the same field of view. To facilitate comparison of the images which appear as wavy lines, the specimen 10 can be moved by an observer until it is perpendicular to the optical oris of the system 11, 7 resulting in images which are parallel, Fig. 5 (not shown). In a modification, Fig. 4 (not shown), the surfaces 9 are movable along an elliptical path and the surfaces 8 are movable, so that the angle of incidence of each beam on the specimen 10 may be adjusted. Selection of a smaller angle of incidence results in increased image magnification and hence examination is made easier. The surfaces 6, 8, 9 may be of mirrors or prisms.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP900569A JPS4925223B1 (en) | 1969-02-08 | 1969-02-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1286598A true GB1286598A (en) | 1972-08-23 |
Family
ID=11708526
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB618470A Expired GB1286598A (en) | 1969-02-08 | 1970-02-09 | Optical device for examining profile or roughness of a surface of a specimen by an optical intersection method |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS4925223B1 (en) |
GB (1) | GB1286598A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2299624A1 (en) * | 1974-09-26 | 1976-08-27 | Anvar | Surface roughness determination using coherent light - involves comparing specular reflection with light diffused by surface |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5484852U (en) * | 1977-11-28 | 1979-06-15 | ||
SG164292A1 (en) * | 2009-01-13 | 2010-09-29 | Semiconductor Technologies & Instruments Pte | System and method for inspecting a wafer |
-
1969
- 1969-02-08 JP JP900569A patent/JPS4925223B1/ja active Pending
-
1970
- 1970-02-09 GB GB618470A patent/GB1286598A/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2299624A1 (en) * | 1974-09-26 | 1976-08-27 | Anvar | Surface roughness determination using coherent light - involves comparing specular reflection with light diffused by surface |
Also Published As
Publication number | Publication date |
---|---|
JPS4925223B1 (en) | 1974-06-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PLNP | Patent lapsed through nonpayment of renewal fees |