SI3281022T1 - Električni sestav in merilno vezje ter merilni postopek za nadzorovanje komponente električnega sestava - Google Patents

Električni sestav in merilno vezje ter merilni postopek za nadzorovanje komponente električnega sestava

Info

Publication number
SI3281022T1
SI3281022T1 SI201631347T SI201631347T SI3281022T1 SI 3281022 T1 SI3281022 T1 SI 3281022T1 SI 201631347 T SI201631347 T SI 201631347T SI 201631347 T SI201631347 T SI 201631347T SI 3281022 T1 SI3281022 T1 SI 3281022T1
Authority
SI
Slovenia
Prior art keywords
electrical assembly
monitoring
component
measuring
measuring method
Prior art date
Application number
SI201631347T
Other languages
English (en)
Inventor
Gatica Carlos Paiz
Rico Schindler
Original Assignee
Weidmueller Interface Gmbh & Co. Kg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Weidmueller Interface Gmbh & Co. Kg filed Critical Weidmueller Interface Gmbh & Co. Kg
Publication of SI3281022T1 publication Critical patent/SI3281022T1/sl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G01R31/42—AC power supplies
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
    • H02M1/088—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters for the simultaneous control of series or parallel connected semiconductor devices
    • H02M1/096—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters for the simultaneous control of series or parallel connected semiconductor devices the power supply of the control circuit being connected in parallel to the main switching element
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00—Conversion of dc power input into dc power output
    • H02M3/22—Conversion of dc power input into dc power output with intermediate conversion into ac
    • H02M3/24—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters
    • H02M3/28—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac
    • H02M3/325—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac using devices of a triode or a transistor type requiring continuous application of a control signal
    • H02M3/335—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac using devices of a triode or a transistor type requiring continuous application of a control signal using semiconductor devices only
    • H02M3/33507—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac using devices of a triode or a transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of the output voltage or current, e.g. flyback converters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
SI201631347T 2015-04-09 2016-04-08 Električni sestav in merilno vezje ter merilni postopek za nadzorovanje komponente električnega sestava SI3281022T1 (sl)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE102015105354 2015-04-09
DE102015109285.9A DE102015109285A1 (de) 2015-04-09 2015-06-11 Elektrische Baugruppe sowie Messschaltung und Messverfahren zur Überwachung eines Bauelements der elektrischen Baugruppe
PCT/EP2016/057823 WO2016162517A1 (de) 2015-04-09 2016-04-08 Elektrische baugruppe sowie messschaltung und messverfahren zur überwachung eines bauelements der elektrischen baugruppe
EP16715527.4A EP3281022B1 (de) 2015-04-09 2016-04-08 Elektrische baugruppe sowie messschaltung und messverfahren zur überwachung eines bauelements der elektrischen baugruppe

Publications (1)

Publication Number Publication Date
SI3281022T1 true SI3281022T1 (sl) 2021-11-30

Family

ID=56986648

Family Applications (1)

Application Number Title Priority Date Filing Date
SI201631347T SI3281022T1 (sl) 2015-04-09 2016-04-08 Električni sestav in merilno vezje ter merilni postopek za nadzorovanje komponente električnega sestava

Country Status (10)

Country Link
US (1) US10627434B2 (sl)
EP (1) EP3281022B1 (sl)
CN (1) CN107430164A (sl)
DE (1) DE102015109285A1 (sl)
DK (1) DK3281022T3 (sl)
ES (1) ES2882664T3 (sl)
PL (1) PL3281022T3 (sl)
PT (1) PT3281022T (sl)
SI (1) SI3281022T1 (sl)
WO (1) WO2016162517A1 (sl)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9482698B2 (en) * 2010-10-07 2016-11-01 Raritan Americas, Inc. Methods and apparatus for resistive voltage sensing in an isolated power distribution unit
DE102015109285A1 (de) * 2015-04-09 2016-10-13 Weidmüller Interface GmbH & Co. KG Elektrische Baugruppe sowie Messschaltung und Messverfahren zur Überwachung eines Bauelements der elektrischen Baugruppe
CN108120915B (zh) * 2017-12-15 2020-05-05 京东方科技集团股份有限公司 应用于显示面板的老化处理方法及老化处理系统

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DE69433701T2 (de) * 1993-11-08 2005-03-17 Honda Giken Kogyo K.K. Gerät zur Prüfung der elektrischen Bauteile eines Wechselrichters
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KR100611111B1 (ko) * 2004-07-15 2006-08-10 삼성전자주식회사 고주파용 모오스 트랜지스터, 이의 형성 방법 및 반도체장치의 제조 방법
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ITVA20070061A1 (it) * 2007-07-09 2009-01-10 St Microelectronics Srl Metodo e relativo dispositivo di carica di almeno due condensatori in serie
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US7869235B2 (en) * 2008-04-28 2011-01-11 Fsp Technology Inc. Flyback converter having an active snubber
US7995359B2 (en) * 2009-02-05 2011-08-09 Power Integrations, Inc. Method and apparatus for implementing an unregulated dormant mode with an event counter in a power converter
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Also Published As

Publication number Publication date
WO2016162517A1 (de) 2016-10-13
ES2882664T3 (es) 2021-12-02
EP3281022A1 (de) 2018-02-14
US20180074100A1 (en) 2018-03-15
PL3281022T3 (pl) 2022-01-10
DK3281022T3 (da) 2021-08-30
EP3281022B1 (de) 2021-07-28
DE102015109285A1 (de) 2016-10-13
PT3281022T (pt) 2021-08-06
US10627434B2 (en) 2020-04-21
CN107430164A (zh) 2017-12-01

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