SG71726A1 - Optical disc inspection equalization system and method - Google Patents

Optical disc inspection equalization system and method

Info

Publication number
SG71726A1
SG71726A1 SG1997003695A SG1997003695A SG71726A1 SG 71726 A1 SG71726 A1 SG 71726A1 SG 1997003695 A SG1997003695 A SG 1997003695A SG 1997003695 A SG1997003695 A SG 1997003695A SG 71726 A1 SG71726 A1 SG 71726A1
Authority
SG
Singapore
Prior art keywords
optical media
inspection
optical disc
equalization system
air pressure
Prior art date
Application number
SG1997003695A
Other languages
English (en)
Inventor
William R Mueller
Lewis R Gensel
Van Peter Hoof
Original Assignee
Wea Mfg Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wea Mfg Inc filed Critical Wea Mfg Inc
Publication of SG71726A1 publication Critical patent/SG71726A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506—Optical discs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/002—Recording, reproducing or erasing systems characterised by the shape or form of the carrier
    • G11B7/0037—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs
    • G11B7/00375—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs arrangements for detection of physical defects, e.g. of recording layer
SG1997003695A 1996-10-16 1997-10-08 Optical disc inspection equalization system and method SG71726A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US2886196P 1996-10-16 1996-10-16
US08/920,299 US5940174A (en) 1996-10-16 1997-08-28 Optical disc inspection equalization system and method

Publications (1)

Publication Number Publication Date
SG71726A1 true SG71726A1 (en) 2000-05-23

Family

ID=26704178

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1997003695A SG71726A1 (en) 1996-10-16 1997-10-08 Optical disc inspection equalization system and method

Country Status (8)

Country Link
US (2) US5940174A (fr)
EP (2) EP0837321B1 (fr)
JP (1) JP4024909B2 (fr)
AT (1) ATE336719T1 (fr)
AU (1) AU744140B2 (fr)
DE (1) DE69732331T2 (fr)
HK (1) HK1010576A1 (fr)
SG (1) SG71726A1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE9504228L (sv) * 1995-11-27 1997-01-13 M2 Engineering Ab Förfaringssätt för automatisk avsyning av cirkulära informationsbärare
JP2000011470A (ja) * 1998-06-23 2000-01-14 Tdk Corp 樹脂ディスクの機械特性測定方法および光ディスクの機械特性測定方法
KR100334393B1 (ko) 1999-06-30 2002-05-03 박종섭 반도체소자의 제조방법
JP2002048716A (ja) * 2000-07-03 2002-02-15 Internatl Business Mach Corp <Ibm> 小型部品の外観検査治具およびその治具を用いた検査方法
KR100397255B1 (ko) * 2000-09-29 2003-09-13 대한민국(전남대학교총장) 티슈형 알루미늄 포일 생산공정에서의 공기압을 이용한홀딩장치
DE10313202B3 (de) * 2003-03-21 2004-10-28 HSEB Heinze & Süllau Entwicklungsbüro Dresden GmbH Vorrichtung und Verfahren zur Kanteninspektion an Halbleiterwafern
US7586595B2 (en) * 2003-11-17 2009-09-08 Tdk Corporation Method of scanning and scanning apparatus
US20050254381A1 (en) * 2004-04-28 2005-11-17 Desormeaux Joseph Jr System and method for detecting faulty media in a media player

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4069484A (en) * 1976-05-28 1978-01-17 Rca Corporation Defect plotting system
US4197011A (en) * 1977-09-22 1980-04-08 Rca Corporation Defect detection and plotting system
JPS57161640A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for surface
JPS60147945A (ja) * 1984-01-10 1985-08-05 Victor Co Of Japan Ltd 光デイスク検査装置
JPH0135354Y2 (fr) * 1984-11-20 1989-10-27
US4794265A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface pit detection system and method
US4794264A (en) * 1987-05-08 1988-12-27 Qc Optics, Inc. Surface defect detection and confirmation system and method
JPH01297542A (ja) * 1988-05-25 1989-11-30 Csk Corp 欠陥検査装置
JPH01310485A (ja) * 1988-06-08 1989-12-14 Dainippon Printing Co Ltd 欠陥情報検出装置
JPH0786470B2 (ja) * 1988-06-13 1995-09-20 富士写真フイルム株式会社 ディスク表面検査方法及び装置
JP2796316B2 (ja) * 1988-10-24 1998-09-10 株式会社日立製作所 欠陥または異物の検査方法およびその装置
JPH0776757B2 (ja) * 1990-12-14 1995-08-16 インターナショナル・ビジネス・マシーンズ・コーポレイション 光学的検査装置

Also Published As

Publication number Publication date
AU4102297A (en) 1998-04-23
EP0837321A3 (fr) 1998-12-16
EP1744150A3 (fr) 2016-11-30
US5940174A (en) 1999-08-17
DE69732331T2 (de) 2007-03-08
US6154275A (en) 2000-11-28
AU744140B2 (en) 2002-02-14
ATE336719T1 (de) 2006-09-15
EP1744150A2 (fr) 2007-01-17
HK1010576A1 (en) 1999-06-25
JPH10206279A (ja) 1998-08-07
EP0837321B1 (fr) 2006-08-16
DE69732331D1 (de) 2005-03-03
JP4024909B2 (ja) 2007-12-19
EP0837321A2 (fr) 1998-04-22

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