SG65006A1 - Three-dimensional measuring apparatus and three-dimensional measuring method - Google Patents

Three-dimensional measuring apparatus and three-dimensional measuring method

Info

Publication number
SG65006A1
SG65006A1 SG1997002865A SG1997002865A SG65006A1 SG 65006 A1 SG65006 A1 SG 65006A1 SG 1997002865 A SG1997002865 A SG 1997002865A SG 1997002865 A SG1997002865 A SG 1997002865A SG 65006 A1 SG65006 A1 SG 65006A1
Authority
SG
Singapore
Prior art keywords
dimensional measuring
measuring apparatus
measuring method
dimensional
measuring
Prior art date
Application number
SG1997002865A
Other languages
English (en)
Inventor
Kazuhiro Ikurumi
Masaharu Tsujimura
Yoichiro Ueda
Original Assignee
Matsushita Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Ind Co Ltd filed Critical Matsushita Electric Ind Co Ltd
Publication of SG65006A1 publication Critical patent/SG65006A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SG1997002865A 1996-08-09 1997-08-08 Three-dimensional measuring apparatus and three-dimensional measuring method SG65006A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21091496A JP3373367B2 (ja) 1996-08-09 1996-08-09 ３次元計測装置及び３次元計測方法

Publications (1)

Publication Number Publication Date
SG65006A1 true SG65006A1 (en) 1999-05-25

Family

ID=16597162

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1997002865A SG65006A1 (en) 1996-08-09 1997-08-08 Three-dimensional measuring apparatus and three-dimensional measuring method

Country Status (4)

Country Link
US (1) US5841539A (zh)
JP (1) JP3373367B2 (zh)
CN (1) CN1069403C (zh)
SG (1) SG65006A1 (zh)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1137731A (ja) * 1997-07-24 1999-02-12 Sumitomo Kinzoku Erekutorodebaisu:Kk 画像取込みシステム
NO313113B1 (no) * 1999-07-13 2002-08-12 Metronor Asa System for scanning av store objekters geometri
US6618492B1 (en) * 2000-06-26 2003-09-09 Georgia-Pacific Resins, Inc. System and method for measurement of adhesive resin distribution on wood flakes using a scanner
US6870611B2 (en) * 2001-07-26 2005-03-22 Orbotech Ltd. Electrical circuit conductor inspection
US7375827B2 (en) * 2004-02-13 2008-05-20 Optimet, Optical Metrology Ltd. Digitization of undercut surfaces using non-contact sensors
KR100462358B1 (ko) * 2004-03-31 2004-12-17 주식회사 이오테크닉스 폴리곤 미러를 이용한 레이저 가공장치
US7525668B2 (en) * 2005-04-14 2009-04-28 Panasonic Corporation Apparatus and method for appearance inspection
CN1321340C (zh) * 2005-09-01 2007-06-13 上海交通大学 基于面阵投影的同步扫描双目视觉三维成像的方法
CN101033947B (zh) * 2007-03-29 2010-05-19 上海大学 基于旋转y型光纤的三维变形测量系统
DE112009000516T5 (de) * 2008-03-12 2011-02-10 Optimet Optical Metrology Ltd. Intraorales Abbildungssystem und Verfahren, das auf der konoskopischen Holographie beruht
CN101373134B (zh) * 2008-10-24 2010-06-23 天津大学 一种线状激光窄带滤光psd热辐射板厚测量方法
JP2011203156A (ja) * 2010-03-26 2011-10-13 Dainippon Screen Mfg Co Ltd 距離測定装置
EP2928305B1 (en) * 2012-12-04 2018-11-28 Stork genannt Wersborg, Ingo Method for heat treatment monitoring system
KR20150116512A (ko) * 2014-04-07 2015-10-16 삼성전자주식회사 검사 장치 및 검사 대상물 검사 방법
CN104215265A (zh) * 2014-08-18 2014-12-17 中国空间技术研究院 一种高精度的psd信号降噪方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2611539C3 (de) * 1976-03-18 1982-09-09 Agfa-Gevaert Ag, 5090 Leverkusen Verfahren zum Erkennen und Orten von sich in Längsrichtung einer laufenden Materialbahn erstreckenden Fehlern
JPH0739994B2 (ja) * 1988-10-12 1995-05-01 三菱電機株式会社 微細粒子測定装置
JP2671241B2 (ja) * 1990-12-27 1997-10-29 日立電子エンジニアリング株式会社 ガラス板の異物検出装置
JPH05312536A (ja) * 1992-05-08 1993-11-22 I N R Kenkyusho:Kk 三次元形状測定装置

Also Published As

Publication number Publication date
JPH1054708A (ja) 1998-02-24
US5841539A (en) 1998-11-24
CN1179535A (zh) 1998-04-22
CN1069403C (zh) 2001-08-08
JP3373367B2 (ja) 2003-02-04

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