SG165131A1 - Moisture removal in semiconductor processing - Google Patents
Moisture removal in semiconductor processingInfo
- Publication number
- SG165131A1 SG165131A1 SG9605426-7A SG1996005426A SG165131A1 SG 165131 A1 SG165131 A1 SG 165131A1 SG 1996005426 A SG1996005426 A SG 1996005426A SG 165131 A1 SG165131 A1 SG 165131A1
- Authority
- SG
- Singapore
- Prior art keywords
- chamber
- substrate
- moisture
- evacuated
- heated
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 238000000034 method Methods 0.000 abstract 6
- 239000007789 gas Substances 0.000 abstract 4
- 239000000758 substrate Substances 0.000 abstract 4
- 238000011109 contamination Methods 0.000 abstract 1
- 238000002347 injection Methods 0.000 abstract 1
- 239000007924 injection Substances 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4408—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0209—Pretreatment of the material to be coated by heating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02046—Dry cleaning only
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Novel processes for improving uniformity, reliability, and throughput of processes used in semiconductor manufacturing. In one process of the present invention used to reduce moisture contamination, a substrate is placed in a chamber. The chamber is then evacuated. Next, the chamber is refilled with a dry, heated gas to desorb any moisture attached to the surface of the substrate. The chamber is then evacuated to remove the heated gas and any moisture desorbed from the surface of the substrate. The process can be repeated to insure complete removal of all moisture present in the chamber and on the substrate. In another process, used to precisely control gas temperature, gases used in a semiconductor process are heated to reaction temperature prior to injection into a reaction vessel.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US22945094A | 1994-01-27 | 1994-01-27 | |
US26692994A | 1994-06-27 | 1994-06-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG165131A1 true SG165131A1 (en) | 2010-10-28 |
Family
ID=26923315
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG9605426-7A SG165131A1 (en) | 1994-01-27 | 1995-01-12 | Moisture removal in semiconductor processing |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP0741909A4 (en) |
JP (1) | JPH09508494A (en) |
KR (1) | KR970700935A (en) |
AU (1) | AU1559195A (en) |
SG (1) | SG165131A1 (en) |
WO (1) | WO1995020823A1 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5992463A (en) | 1996-10-30 | 1999-11-30 | Unit Instruments, Inc. | Gas panel |
US6376387B2 (en) * | 1999-07-09 | 2002-04-23 | Applied Materials, Inc. | Method of sealing an epitaxial silicon layer on a substrate |
JP2001319885A (en) * | 2000-03-02 | 2001-11-16 | Hitachi Kokusai Electric Inc | Processing system for substrate and method for producing semiconductor |
US6436194B1 (en) | 2001-02-16 | 2002-08-20 | Applied Materials, Inc. | Method and a system for sealing an epitaxial silicon layer on a substrate |
JP2006147922A (en) * | 2004-11-22 | 2006-06-08 | Seiko Epson Corp | Apparatus for fabricating semiconductor device |
US20120298998A1 (en) * | 2011-05-25 | 2012-11-29 | Semiconductor Energy Laboratory Co., Ltd. | Method for forming oxide semiconductor film, semiconductor device, and method for manufacturing semiconductor device |
US10796935B2 (en) * | 2017-03-17 | 2020-10-06 | Applied Materials, Inc. | Electronic device manufacturing systems, methods, and apparatus for heating substrates and reducing contamination in loadlocks |
CN111627797B (en) * | 2020-06-08 | 2022-06-10 | 中国电子科技集团公司第二十四研究所 | Processing method for improving bonding reliability of semiconductor chip |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63141319A (en) * | 1986-12-03 | 1988-06-13 | Mitsubishi Electric Corp | Dry etching treatment device |
US5146869A (en) * | 1990-06-11 | 1992-09-15 | National Semiconductor Corporation | Tube and injector for preheating gases in a chemical vapor deposition reactor |
US5178651A (en) * | 1991-08-07 | 1993-01-12 | Balma Frank R | Method for purifying gas distribution systems |
US5244820A (en) * | 1990-03-09 | 1993-09-14 | Tadashi Kamata | Semiconductor integrated circuit device, method for producing the same, and ion implanter for use in the method |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58158392A (en) * | 1982-03-15 | 1983-09-20 | Matsushita Electronics Corp | Cold trapping apparatus used for dry etching |
US4981102A (en) * | 1984-04-12 | 1991-01-01 | Ethyl Corporation | Chemical vapor deposition reactor and process |
IT1198290B (en) * | 1986-12-02 | 1988-12-21 | Sgs Microelettronica Spa | METHOD OF DECONTAMINATION OF A CHAMBER USED IN PROCESSES UNDER VACUUM DEPOSITION, ATTACK OR GROWTH OF HIGH PURITY FILMS, OF PARTICULAR APPLICATION IN THE SEMICONDUCTOR TECHNOLOGY |
US5019409A (en) * | 1989-01-27 | 1991-05-28 | Microelectronics And Computer Technology Corporation | Method for coating the top of an electrical device |
JPH03234021A (en) * | 1990-02-09 | 1991-10-18 | Mitsubishi Electric Corp | Method and apparatus for cleaning semiconductor wafer |
US5048201A (en) * | 1990-07-13 | 1991-09-17 | Interlab, Inc. | Laminar flow system for drying parts |
JP3023982B2 (en) * | 1990-11-30 | 2000-03-21 | 東京エレクトロン株式会社 | Film formation method |
US5320680A (en) * | 1991-04-25 | 1994-06-14 | Silicon Valley Group, Inc. | Primary flow CVD apparatus comprising gas preheater and means for substantially eddy-free gas flow |
US5188979A (en) * | 1991-08-26 | 1993-02-23 | Motorola Inc. | Method for forming a nitride layer using preheated ammonia |
JP3553939B2 (en) * | 1993-05-13 | 2004-08-11 | インターユニヴァーシテアー マイクロエレクトロニカ セントラム フェレニギング ゾンデル ビンシュトベヤーク | Semiconductor processing method using a mixture of HF and carboxylic acid |
EP0632144B1 (en) * | 1993-06-30 | 1999-09-08 | Applied Materials, Inc. | Method of purging and pumping vacuum chamber to ultra-high vacuum |
JPH08125185A (en) * | 1994-10-21 | 1996-05-17 | Tadahiro Omi | Method and system for fabricating thin film transistor |
-
1995
- 1995-01-12 EP EP95907316A patent/EP0741909A4/en not_active Withdrawn
- 1995-01-12 WO PCT/US1995/000131 patent/WO1995020823A1/en not_active Application Discontinuation
- 1995-01-12 SG SG9605426-7A patent/SG165131A1/en unknown
- 1995-01-12 AU AU15591/95A patent/AU1559195A/en not_active Abandoned
- 1995-01-12 JP JP7520051A patent/JPH09508494A/en active Pending
-
1996
- 1996-07-27 KR KR1019960704068A patent/KR970700935A/en not_active Application Discontinuation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63141319A (en) * | 1986-12-03 | 1988-06-13 | Mitsubishi Electric Corp | Dry etching treatment device |
US5244820A (en) * | 1990-03-09 | 1993-09-14 | Tadashi Kamata | Semiconductor integrated circuit device, method for producing the same, and ion implanter for use in the method |
US5146869A (en) * | 1990-06-11 | 1992-09-15 | National Semiconductor Corporation | Tube and injector for preheating gases in a chemical vapor deposition reactor |
US5178651A (en) * | 1991-08-07 | 1993-01-12 | Balma Frank R | Method for purifying gas distribution systems |
Also Published As
Publication number | Publication date |
---|---|
EP0741909A1 (en) | 1996-11-13 |
JPH09508494A (en) | 1997-08-26 |
WO1995020823A1 (en) | 1995-08-03 |
AU1559195A (en) | 1995-08-15 |
EP0741909A4 (en) | 1998-01-07 |
KR970700935A (en) | 1997-02-12 |
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