SG158818A1 - Transferring tool - Google Patents

Transferring tool

Info

Publication number
SG158818A1
SG158818A1 SG200904813-3A SG2009048133A SG158818A1 SG 158818 A1 SG158818 A1 SG 158818A1 SG 2009048133 A SG2009048133 A SG 2009048133A SG 158818 A1 SG158818 A1 SG 158818A1
Authority
SG
Singapore
Prior art keywords
gap
supporting
supporting brackets
pair
vertical
Prior art date
Application number
SG200904813-3A
Inventor
Hong-Jun Yoo
Original Assignee
Jt Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jt Corp filed Critical Jt Corp
Publication of SG158818A1 publication Critical patent/SG158818A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

A transferring tool comprises: a first supporting bracket installed so as to be movable along a transferring tool guide of a semiconductor device handler; one pair of second supporting brackets coupled to the first supporting bracket with a gap therebetween, and having a plurality of pickers for picking-up semiconductor devices with a gap therebetween;and a vertical gap controller for controlling a gap of the pair of the second supporting brackets by moving the pair of second supporting brackets, wherein the vertical gap controller comprises: a vertical driving unit installed at the first supporting bracket for generating a vertical driving force; and a linear-motion unit installed at the first supporting bracket, and connected to the second supporting brackets, for controlling a gap between the second supporting brackets by being linearly-moved by the vertical driving unit.
SG200904813-3A 2008-07-16 2009-07-15 Transferring tool SG158818A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020080069123A KR101012137B1 (en) 2008-07-16 2008-07-16 Transferring tool

Publications (1)

Publication Number Publication Date
SG158818A1 true SG158818A1 (en) 2010-02-26

Family

ID=41575699

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200904813-3A SG158818A1 (en) 2008-07-16 2009-07-15 Transferring tool

Country Status (4)

Country Link
KR (1) KR101012137B1 (en)
CN (1) CN101630650B (en)
SG (1) SG158818A1 (en)
TW (1) TWI452647B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102189082B (en) * 2010-03-10 2013-06-26 鸿劲科技股份有限公司 Electronic component test classifier
KR101810505B1 (en) 2012-07-20 2017-12-20 (주)테크윙 Pick and place apparatus for test handler
CN104282606B (en) * 2013-07-11 2019-10-11 宰体有限公司 Transfer tool, the connecting component for transferring tool and the sorter for transferring tool
KR101873709B1 (en) * 2018-02-21 2018-07-03 주식회사 에스에이치엘 Secondary battery cell pouch gripper and transferring the same
KR102209062B1 (en) * 2020-03-03 2021-01-28 팸텍주식회사 Latch opening and closing control device of semiconductor device test socket

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW446582B (en) * 1997-05-13 2001-07-21 You Hong Jun Automatic multiple sorting apparatus for integrated circuit products
KR100439523B1 (en) * 2000-12-20 2004-07-12 내일시스템주식회사 Picker interval controller for handler
KR100446443B1 (en) * 2001-12-17 2004-09-01 미래산업 주식회사 Picker for transferring semiconductor in handler
KR100411297B1 (en) * 2002-01-17 2003-12-24 미래산업 주식회사 Picker for semiconductor test handler
KR100448510B1 (en) * 2002-03-13 2004-09-13 미래산업 주식회사 Apparatus for transmitting semiconductors in semiconductor test handler

Also Published As

Publication number Publication date
KR101012137B1 (en) 2011-02-07
CN101630650A (en) 2010-01-20
KR20100008572A (en) 2010-01-26
TWI452647B (en) 2014-09-11
CN101630650B (en) 2011-11-30
TW201005864A (en) 2010-02-01

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