SG148159A1 - Line light irradiation device - Google Patents

Line light irradiation device

Info

Publication number
SG148159A1
SG148159A1 SG200808227-3A SG2008082273A SG148159A1 SG 148159 A1 SG148159 A1 SG 148159A1 SG 2008082273 A SG2008082273 A SG 2008082273A SG 148159 A1 SG148159 A1 SG 148159A1
Authority
SG
Singapore
Prior art keywords
line
light
irradiation device
light irradiation
line light
Prior art date
Application number
SG200808227-3A
Other languages
English (en)
Inventor
Kenji Yoneda
Takashi Sugita
Original Assignee
C C S Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by C C S Inc filed Critical C C S Inc
Publication of SG148159A1 publication Critical patent/SG148159A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8983—Irregularities in textured or patterned surfaces, e.g. textiles, wood for testing textile webs, i.e. woven material

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Textile Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Wood Science & Technology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Light Guides In General And Applications Therefor (AREA)
  • Optical Fibers, Optical Fiber Cores, And Optical Fiber Bundles (AREA)
  • Non-Portable Lighting Devices Or Systems Thereof (AREA)
  • Optical Couplings Of Light Guides (AREA)
  • Instruments For Viewing The Inside Of Hollow Bodies (AREA)
SG200808227-3A 2003-08-06 2004-08-04 Line light irradiation device SG148159A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003288283 2003-08-06
JP2004106654 2004-03-31

Publications (1)

Publication Number Publication Date
SG148159A1 true SG148159A1 (en) 2008-12-31

Family

ID=34137919

Family Applications (2)

Application Number Title Priority Date Filing Date
SG200808228-1A SG148160A1 (en) 2003-08-06 2004-08-04 Line light irradiation device
SG200808227-3A SG148159A1 (en) 2003-08-06 2004-08-04 Line light irradiation device

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SG200808228-1A SG148160A1 (en) 2003-08-06 2004-08-04 Line light irradiation device

Country Status (8)

Country Link
US (1) US7631999B2 (de)
EP (1) EP1666872A4 (de)
JP (1) JP4480029B2 (de)
KR (1) KR100779133B1 (de)
CN (1) CN1833163B (de)
SG (2) SG148160A1 (de)
TW (1) TWI239377B (de)
WO (1) WO2005015186A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5219236B2 (ja) * 2007-02-26 2013-06-26 株式会社モリテックス ラインライトガイド
JP2010170835A (ja) * 2009-01-22 2010-08-05 Sanyo Electric Co Ltd 照明装置および投写型映像表示装置
US8134132B2 (en) * 2010-04-28 2012-03-13 Dymax Corporation Exposure device having an array of light emitting diodes
KR20140057365A (ko) * 2011-09-29 2014-05-12 인텔 코포레이션 광섬유 근접 센서
KR101316539B1 (ko) * 2011-11-29 2013-10-15 주식회사 힘스 유기발광다이오드 이물검사기
JP6571317B2 (ja) * 2014-07-02 2019-09-04 株式会社アイテックシステム ライン状照明装置、その製造方法および検査方法
JP6775273B2 (ja) * 2018-08-30 2020-10-28 株式会社アイテックシステム ライン状照明装置、その製造方法および検査方法
CN115327700B (zh) * 2022-09-09 2023-06-06 中国建筑材料科学研究总院有限公司 光学纤维丝的排列方法和光学纤维元器件的制备方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3941485A (en) * 1973-11-08 1976-03-02 Madden Richard A Device for continuously measuring a dimension of a workpiece by reflected light
JPS62251641A (ja) * 1986-04-25 1987-11-02 Fuji Electric Co Ltd 光学的検査装置
JPS63104872A (ja) 1986-10-23 1988-05-10 Kita Denshi:Kk 印刷エラ−検出方法
CA2055142C (en) * 1990-11-09 1995-03-28 Atsushi Asada Liquid crystal display apparatus
US5148303A (en) * 1991-01-31 1992-09-15 Honeywell Inc. Delay line fiber optic sensor
US5185638A (en) * 1991-04-26 1993-02-09 International Business Machines Corporation Computer controlled, multiple angle illumination system
US5222794A (en) * 1991-12-20 1993-06-29 Ford Motor Company Fiberoptic line-of-light illuminating device
US5260766A (en) * 1992-04-02 1993-11-09 Armitage Mark H Apparatus for detection of an imperfect seal and method therefore
US5432600A (en) * 1992-05-15 1995-07-11 Philip Morris Incorporated Systems for optically inspecting cylindrical surfaces
US5268977A (en) * 1992-07-06 1993-12-07 Miller Jack V Fiber optic zoom-and-dim pin-spot luminaire
US5596409A (en) * 1995-03-22 1997-01-21 Eastman Kodak Company Associated dual interferometric measurement method for determining a physical property of an object
JP2975893B2 (ja) 1996-07-08 1999-11-10 シーシーエス株式会社 照明装置の製造方法
DE19721915C1 (de) * 1997-05-26 1998-12-10 Stn Atlas Elektronik Gmbh Verfahren und Vorrichtung zur Messung von Unebenheiten in einer Objektoberfläche
US5953113A (en) * 1997-10-29 1999-09-14 Poffenbarger; Steven Lewis Device and method for detecting, characterizing and correcting flaws in optic fiber
US6757058B1 (en) * 1999-05-05 2004-06-29 Lucidyne Technologies, Inc. Fiber-optic light line for use in an inspection system
US6782337B2 (en) * 2000-09-20 2004-08-24 Kla-Tencor Technologies Corp. Methods and systems for determining a critical dimension an a presence of defects on a specimen
JP4262413B2 (ja) * 2001-01-29 2009-05-13 新日本製鐵株式会社 疵検査用照明装置
JP2003097931A (ja) * 2001-09-21 2003-04-03 Olympus Optical Co Ltd 光学検査方法及びその装置
JP2003202294A (ja) 2001-10-29 2003-07-18 Ccs Inc 検査用照明装置
DE10252523A1 (de) * 2001-11-16 2003-07-03 Ccs Inc Beleuchtungsvorrichtung zur optischen Prüfung
US6832849B2 (en) * 2001-12-04 2004-12-21 Ccs, Inc. Light radiation device, light source device, light radiation unit, and light connection mechanism
JP3927878B2 (ja) * 2002-04-16 2007-06-13 シーシーエス株式会社 検査等に用いる照明装置

Also Published As

Publication number Publication date
KR100779133B1 (ko) 2007-11-23
JP4480029B2 (ja) 2010-06-16
EP1666872A1 (de) 2006-06-07
US7631999B2 (en) 2009-12-15
SG148160A1 (en) 2008-12-31
KR20060035774A (ko) 2006-04-26
CN1833163B (zh) 2010-07-07
TWI239377B (en) 2005-09-11
CN1833163A (zh) 2006-09-13
WO2005015186A1 (ja) 2005-02-17
US20060215151A1 (en) 2006-09-28
TW200510672A (en) 2005-03-16
EP1666872A4 (de) 2011-05-25
JPWO2005015186A1 (ja) 2007-08-30

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