SG121898A1 - System for 2-D and 3-D vision inspection - Google Patents

System for 2-D and 3-D vision inspection

Info

Publication number
SG121898A1
SG121898A1 SG200405729A SG200405729A SG121898A1 SG 121898 A1 SG121898 A1 SG 121898A1 SG 200405729 A SG200405729 A SG 200405729A SG 200405729 A SG200405729 A SG 200405729A SG 121898 A1 SG121898 A1 SG 121898A1
Authority
SG
Singapore
Prior art keywords
vision inspection
vision
inspection
Prior art date
Application number
SG200405729A
Other languages
English (en)
Inventor
Yong Joo Puah
Hak Wee Tang
Original Assignee
Generic Power Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Generic Power Pte Ltd filed Critical Generic Power Pte Ltd
Priority to SG200405729A priority Critical patent/SG121898A1/en
Priority to PCT/SG2005/000301 priority patent/WO2006038885A1/en
Priority to US11/573,344 priority patent/US7573569B2/en
Priority to CN2005800301544A priority patent/CN101124453B/zh
Publication of SG121898A1 publication Critical patent/SG121898A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0813Controlling of single components prior to mounting, e.g. orientation, component geometry

Landscapes

  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
SG200405729A 2004-10-06 2004-10-06 System for 2-D and 3-D vision inspection SG121898A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SG200405729A SG121898A1 (en) 2004-10-06 2004-10-06 System for 2-D and 3-D vision inspection
PCT/SG2005/000301 WO2006038885A1 (en) 2004-10-06 2005-09-01 System for 2-d and 3-d vision inspection
US11/573,344 US7573569B2 (en) 2004-10-06 2005-09-01 System for 2-D and 3-D vision inspection
CN2005800301544A CN101124453B (zh) 2004-10-06 2005-09-01 用于二维和三维图像检测的系统

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200405729A SG121898A1 (en) 2004-10-06 2004-10-06 System for 2-D and 3-D vision inspection

Publications (1)

Publication Number Publication Date
SG121898A1 true SG121898A1 (en) 2006-05-26

Family

ID=36142857

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200405729A SG121898A1 (en) 2004-10-06 2004-10-06 System for 2-D and 3-D vision inspection

Country Status (4)

Country Link
US (1) US7573569B2 (zh)
CN (1) CN101124453B (zh)
SG (1) SG121898A1 (zh)
WO (1) WO2006038885A1 (zh)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7981702B2 (en) 2006-03-08 2011-07-19 Stats Chippac Ltd. Integrated circuit package in package system
USRE45575E1 (en) * 2007-03-29 2015-06-23 Carl Zeiss Microscopy Gmbh Optical arrangement for the production of a light-sheet
CN101387501B (zh) * 2008-10-06 2010-04-21 天津大学 超大型工件圆形截面形状与方位测量装置及方法
US8406619B2 (en) * 2009-03-23 2013-03-26 Vincent Pace & James Cameron Stereo camera with automatic control of interocular distance
KR101108672B1 (ko) * 2009-05-12 2012-01-25 (주)제이티 반도체소자 비전검사장치 및 그 방법
DE102010030883B4 (de) * 2009-07-03 2018-11-08 Koh Young Technology Inc. Vorrichtung zur Prüfung einer Platte und Verfahren dazu
CN102498453B (zh) * 2009-07-23 2016-04-06 惠普发展公司,有限责任合伙企业 具有光学传感器的显示器
US8090251B2 (en) * 2009-10-13 2012-01-03 James Cameron Frame linked 2D/3D camera system
US7929852B1 (en) * 2009-10-13 2011-04-19 Vincent Pace Integrated 2D/3D camera
EP2508871A4 (en) * 2009-11-30 2017-05-10 Nikon Corporation Inspection apparatus, measurement method for three-dimensional shape, and production method for structure
KR101121994B1 (ko) * 2010-02-02 2012-03-09 주식회사 고영테크놀러지 검사 프로그램의 생성 방법
JP5488179B2 (ja) * 2010-04-30 2014-05-14 ソニー株式会社 検査装置及び検査方法
US8797398B2 (en) * 2010-05-03 2014-08-05 United Technologies Corporation On-the-fly dimensional imaging inspection
US8879902B2 (en) 2010-10-08 2014-11-04 Vincent Pace & James Cameron Integrated 2D/3D camera with fixed imaging parameters
US9071738B2 (en) 2010-10-08 2015-06-30 Vincent Pace Integrated broadcast and auxiliary camera system
CA2738396C (en) * 2011-04-28 2013-12-24 Denis Lessard Optical inspection apparatus and method
CN103249295B (zh) * 2012-02-08 2017-07-07 Juki株式会社 电子部件安装方法、电子部件安装装置以及电子部件安装系统
US8655163B2 (en) 2012-02-13 2014-02-18 Cameron Pace Group Llc Consolidated 2D/3D camera
US10659763B2 (en) 2012-10-09 2020-05-19 Cameron Pace Group Llc Stereo camera system with wide and narrow interocular distance cameras
CN103197424B (zh) * 2013-03-08 2016-09-28 深圳奥比中光科技有限公司 基于正交视觉的数字图像相关装置
EP2787320B1 (de) * 2013-04-05 2017-09-20 Leica Geosystems AG Totalstation mit Scanfunktionalität und wählbaren Scanmodi
US10307912B2 (en) * 2013-07-15 2019-06-04 Lg Electronics Inc. Robot cleaner and method for auto-correcting 3D sensor of the robot cleaner
SG2013084975A (en) * 2013-11-11 2015-06-29 Saedge Vision Solutions Pte Ltd An apparatus and method for inspecting asemiconductor package
JP6387416B2 (ja) * 2013-11-29 2018-09-05 ネックスティン,インコーポレイテッド ウェーハ映像検査装置
US10688578B2 (en) 2014-08-04 2020-06-23 OK International, Inc Variable temperature controlled soldering iron
US9516762B2 (en) * 2014-08-04 2016-12-06 Ok International Inc. Soldering iron with automatic soldering connection validation
US10716220B2 (en) 2014-08-04 2020-07-14 Ok International, Inc. Variable temperature controlled soldering iron
CN104132621A (zh) * 2014-08-08 2014-11-05 广东威创视讯科技股份有限公司 一种拼接屏的拼接处的检查方法
CA2915654C (en) * 2015-07-08 2018-05-01 Delaware Capital Formation, Inc. An intelligent soldering cartridge for automatic soldering connection validation
CN106546597A (zh) * 2015-09-22 2017-03-29 泰科电子(上海)有限公司 焊接质量检测系统和方法
JP6997541B2 (ja) * 2017-05-31 2022-01-17 株式会社キーエンス 画像検査装置、画像検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器
CN109283188A (zh) * 2018-10-12 2019-01-29 成都精工华耀科技有限公司 一种轨道可视化巡检二维与三维一体化成像系统
TWI708041B (zh) * 2018-10-17 2020-10-21 所羅門股份有限公司 檢測與標記瑕疵的方法
US11029146B2 (en) * 2018-10-18 2021-06-08 Cyberoptics Corporation Three-dimensional sensor with counterposed channels
CN110987954B (zh) * 2019-12-30 2021-10-22 江南大学 一种消除皮革表面缺陷检测盲区的方法及系统
TWI768923B (zh) * 2021-05-24 2022-06-21 致伸科技股份有限公司 相機鏡頭與光源之對位方法
CN114280075B (zh) * 2021-12-28 2024-06-28 无锡维度机器视觉产业技术研究院有限公司 一种管类零件表面缺陷在线视觉检测系统及检测方法
CN114414487B (zh) * 2022-01-19 2024-04-16 北京科技大学设计研究院有限公司 一种二维与三维融合的圆钢表面成像系统

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4222804A1 (de) * 1991-07-10 1993-04-01 Raytheon Co Einrichtung und verfahren zur automatischen visuellen pruefung elektrischer und elektronischer baueinheiten
US5576948A (en) * 1992-07-28 1996-11-19 Robotic Vision Systems, Inc. Machine vision for adaptive laser beam steering
JP3180198B2 (ja) * 1992-10-29 2001-06-25 株式会社オーク製作所 ワークのバンプ検査方法およびその装置
JP3189500B2 (ja) * 1993-06-25 2001-07-16 松下電器産業株式会社 電子部品の外観検査装置および外観検査方法
JP2941658B2 (ja) * 1994-07-08 1999-08-25 株式会社三協精機製作所 電子部品表面実装装置
US6118540A (en) * 1997-07-11 2000-09-12 Semiconductor Technologies & Instruments, Inc. Method and apparatus for inspecting a workpiece
US5956134A (en) * 1997-07-11 1999-09-21 Semiconductor Technologies & Instruments, Inc. Inspection system and method for leads of semiconductor devices
SE514859C2 (sv) * 1999-01-18 2001-05-07 Mydata Automation Ab Förfarande och anordning för undersökning av objekt på ett substrat genom att ta bilder av substratet och analysera dessa
US6291816B1 (en) * 1999-06-08 2001-09-18 Robotic Vision Systems, Inc. System and method for measuring object features with coordinated two and three dimensional imaging
US6765666B1 (en) * 2000-08-03 2004-07-20 Semiconductor Technologies & Instruments, Inc. System and method for inspecting bumped wafers
US20040150822A1 (en) * 2003-01-30 2004-08-05 Samsung Electronics Co., Ltd. Soldering inspection apparatus
DE10309544A1 (de) * 2003-02-17 2004-09-02 Micro-Optronic-Messtechnik Gmbh Verfahren und Vorrichtung zur optischen Profilmessung eines Objektes mittels Linientriangulation
US7551272B2 (en) * 2005-11-09 2009-06-23 Aceris 3D Inspection Inc. Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an object

Also Published As

Publication number Publication date
WO2006038885A1 (en) 2006-04-13
CN101124453B (zh) 2012-09-05
CN101124453A (zh) 2008-02-13
US7573569B2 (en) 2009-08-11
US20070247614A1 (en) 2007-10-25

Similar Documents

Publication Publication Date Title
SG121898A1 (en) System for 2-D and 3-D vision inspection
EP1948002A4 (en) SYSTEM AND METHOD FOR VISUAL TESTING
IL187102A0 (en) System and method for 3 - d position determination using rfid
GB0400144D0 (en) Inspection system
EP1777485A4 (en) METHOD AND DEVICE FOR MEASURING THREE-DIMENSIONAL FORMS
EP1779167A4 (en) ANAMORPHIC IMAGING SYSTEM
EP2005233A4 (en) IMPROVED VISION SYSTEM
TWI347295B (en) Work-piece processing system
GB0616752D0 (en) Formulation evaluation system and method
GB0625653D0 (en) Systems and methods for fabricating 3-D objects
GB2420106B (en) An aircraft flightdeck system
EP1817655A4 (en) VISUAL SYSTEM
EP2220456A4 (en) SURFACE MEASUREMENT MEASUREMENT METHOD AND METHOD OF MEASURING SURFACE FORM
EP2005878A4 (en) SEHKRAFTTESTSYSTEM
EP1779058A4 (en) SYSTEM AND METHOD FOR OPTICAL MEASUREMENT
GB0517734D0 (en) Improved vision system
EP1743581B8 (en) Method and system for foetal weight evaluation
GB2427913B (en) Two colour vision system
GB2422019B (en) Beverage measurement system
GB0608016D0 (en) Imaging System And Method
EP1920710A4 (en) OVERVIEW CONTROLLER
EP1901028A4 (en) METHOD AND APPARATUS FOR POSITION OBSERVATION IN THREE DIMENSIONS
GB0525686D0 (en) Vehicle vision system
GB0608026D0 (en) Imaging System And Method
GB0608738D0 (en) System And Method For Providing Measurements