SG119223A1 - Lithographic apparatus and integrated circuit manufacturing method - Google Patents
Lithographic apparatus and integrated circuit manufacturing methodInfo
- Publication number
- SG119223A1 SG119223A1 SG200403782A SG200403782A SG119223A1 SG 119223 A1 SG119223 A1 SG 119223A1 SG 200403782 A SG200403782 A SG 200403782A SG 200403782 A SG200403782 A SG 200403782A SG 119223 A1 SG119223 A1 SG 119223A1
- Authority
- SG
- Singapore
- Prior art keywords
- integrated circuit
- lithographic apparatus
- circuit manufacturing
- manufacturing
- lithographic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03077013 | 2003-06-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG119223A1 true SG119223A1 (en) | 2006-02-28 |
Family
ID=34089663
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200403782A SG119223A1 (en) | 2003-06-27 | 2004-06-23 | Lithographic apparatus and integrated circuit manufacturing method |
Country Status (7)
Country | Link |
---|---|
US (2) | US7471373B2 (de) |
EP (1) | EP1491961B1 (de) |
JP (1) | JP4323388B2 (de) |
KR (1) | KR100757534B1 (de) |
CN (2) | CN101639632B (de) |
SG (1) | SG119223A1 (de) |
TW (1) | TWI251129B (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI251129B (en) * | 2003-06-27 | 2006-03-11 | Asml Netherlands Bv | Lithographic apparatus and integrated circuit manufacturing method |
US7714981B2 (en) | 2006-10-30 | 2010-05-11 | Asml Netherlands B.V. | Lithographic apparatus and method |
CN102445854A (zh) * | 2010-10-15 | 2012-05-09 | 上海微电子装备有限公司 | 工件台垂向位置测量系统 |
EP2492928A3 (de) | 2011-02-22 | 2017-08-30 | ASML Netherlands BV | Elektromagnetisches Stellglied, Gestellvorrichtung und lithografische Vorrichtung |
CN103673892B (zh) * | 2013-11-21 | 2016-03-30 | 清华大学 | 一种对称式光栅外差干涉二次衍射测量装置 |
DE102014006305B4 (de) * | 2014-04-30 | 2017-11-23 | Attocube Systems Ag | Optisches Längenmesssystem mit einem interferometrischen Wegsensor zur Integration in Werkzeugmaschinen und Halbleiter-Lithografiesystemen |
CN105278255A (zh) * | 2015-03-05 | 2016-01-27 | 杭州汇萃智能科技有限公司 | 一种磁浮平面电机非接触六自由度定位装置及方法 |
CN106773553B (zh) * | 2017-03-06 | 2018-11-30 | 重庆京东方光电科技有限公司 | 承载装置和曝光设备 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5523193A (en) | 1988-05-31 | 1996-06-04 | Texas Instruments Incorporated | Method and apparatus for patterning and imaging member |
ATE123885T1 (de) | 1990-05-02 | 1995-06-15 | Fraunhofer Ges Forschung | Belichtungsvorrichtung. |
US5229872A (en) | 1992-01-21 | 1993-07-20 | Hughes Aircraft Company | Exposure device including an electrically aligned electronic mask for micropatterning |
US6049792A (en) * | 1993-03-19 | 2000-04-11 | Ricoh Company Limited | Automatic invocation of computational resources without user intervention across a network |
US5835061A (en) * | 1995-06-06 | 1998-11-10 | Wayport, Inc. | Method and apparatus for geographic-based communications service |
JP3689949B2 (ja) * | 1995-12-19 | 2005-08-31 | 株式会社ニコン | 投影露光装置、及び該投影露光装置を用いたパターン形成方法 |
WO1997033205A1 (en) | 1996-03-06 | 1997-09-12 | Philips Electronics N.V. | Differential interferometer system and lithographic step-and-scan apparatus provided with such a system |
DE69735016T2 (de) | 1996-12-24 | 2006-08-17 | Asml Netherlands B.V. | Lithographisches Gerät mit zwei Objekthaltern |
ATE216091T1 (de) | 1997-01-29 | 2002-04-15 | Micronic Laser Systems Ab | Verfahren und gerät zur erzeugung eines musters auf einem mit fotoresist beschichteten substrat mittels fokusiertem laserstrahl |
SE509062C2 (sv) | 1997-02-28 | 1998-11-30 | Micronic Laser Systems Ab | Dataomvandlingsmetod för en laserskrivare med flera strålar för mycket komplexa mikrokolitografiska mönster |
JP3626504B2 (ja) | 1997-03-10 | 2005-03-09 | アーエスエム リソグラフィ ベスローテン フェンノートシャップ | 2個の物品ホルダを有する位置決め装置 |
AU1053199A (en) * | 1997-11-14 | 1999-06-07 | Nikon Corporation | Exposure apparatus and method of manufacturing the same, and exposure method |
JPH11219900A (ja) | 1997-11-14 | 1999-08-10 | Nikon Corp | 露光装置及び露光方法 |
US6940582B1 (en) * | 1999-09-20 | 2005-09-06 | Nikon Corporation | Parallel link mechanism, exposure system and method of manufacturing the same, and method of manufacturing devices |
US6768124B2 (en) * | 1999-10-19 | 2004-07-27 | Nikon Corporation | Reticle-focus detector, and charged-particle-beam microlithography apparatus and methods comprising same |
JP3762307B2 (ja) * | 2001-02-15 | 2006-04-05 | キヤノン株式会社 | レーザ干渉干渉計システムを含む露光装置 |
TWI251129B (en) | 2003-06-27 | 2006-03-11 | Asml Netherlands Bv | Lithographic apparatus and integrated circuit manufacturing method |
-
2004
- 2004-06-17 TW TW093117521A patent/TWI251129B/zh active
- 2004-06-22 EP EP04076818A patent/EP1491961B1/de active Active
- 2004-06-23 SG SG200403782A patent/SG119223A1/en unknown
- 2004-06-25 JP JP2004187216A patent/JP4323388B2/ja active Active
- 2004-06-25 US US10/876,786 patent/US7471373B2/en active Active
- 2004-06-25 CN CN2009101674528A patent/CN101639632B/zh active Active
- 2004-06-25 KR KR1020040047928A patent/KR100757534B1/ko active IP Right Grant
- 2004-06-25 CN CNB2004100618049A patent/CN100538522C/zh active Active
-
2008
- 2008-10-31 US US12/262,647 patent/US7804584B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20050024611A1 (en) | 2005-02-03 |
US7471373B2 (en) | 2008-12-30 |
CN101639632A (zh) | 2010-02-03 |
KR100757534B1 (ko) | 2007-09-11 |
JP4323388B2 (ja) | 2009-09-02 |
US20090061361A1 (en) | 2009-03-05 |
TW200510959A (en) | 2005-03-16 |
CN100538522C (zh) | 2009-09-09 |
KR20050001427A (ko) | 2005-01-06 |
EP1491961B1 (de) | 2011-12-14 |
EP1491961A1 (de) | 2004-12-29 |
JP2005020005A (ja) | 2005-01-20 |
US7804584B2 (en) | 2010-09-28 |
TWI251129B (en) | 2006-03-11 |
CN1577103A (zh) | 2005-02-09 |
CN101639632B (zh) | 2012-03-28 |
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