SG115613A1 - Lithographic apparatus comprising a gas flushing system - Google Patents

Lithographic apparatus comprising a gas flushing system

Info

Publication number
SG115613A1
SG115613A1 SG200400556A SG200400556A SG115613A1 SG 115613 A1 SG115613 A1 SG 115613A1 SG 200400556 A SG200400556 A SG 200400556A SG 200400556 A SG200400556 A SG 200400556A SG 115613 A1 SG115613 A1 SG 115613A1
Authority
SG
Singapore
Prior art keywords
lithographic apparatus
flushing system
gas flushing
gas
lithographic
Prior art date
Application number
SG200400556A
Other languages
English (en)
Inventor
Bokx Pieter Klaas De
Empel Tjarko Adriaan Rudol Van
Ronald Johannes Hultermans
Adrianus Cornelius Ant Jonkers
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of SG115613A1 publication Critical patent/SG115613A1/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
    • G03F7/70933—Purge, e.g. exchanging fluid or gas to remove pollutants

Landscapes

  • Health & Medical Sciences (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
SG200400556A 2003-02-12 2004-02-10 Lithographic apparatus comprising a gas flushing system SG115613A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP03075416 2003-02-12

Publications (1)

Publication Number Publication Date
SG115613A1 true SG115613A1 (en) 2005-10-28

Family

ID=33016929

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200400556A SG115613A1 (en) 2003-02-12 2004-02-10 Lithographic apparatus comprising a gas flushing system

Country Status (7)

Country Link
US (1) US7106412B2 (de)
EP (1) EP1447716A3 (de)
JP (1) JP4035510B2 (de)
KR (1) KR100748446B1 (de)
CN (1) CN1530756A (de)
SG (1) SG115613A1 (de)
TW (1) TWI243970B (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040158878A1 (en) * 2003-02-07 2004-08-12 Viresh Ratnakar Power scalable digital video decoding
US7072021B2 (en) * 2004-05-17 2006-07-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7148951B2 (en) 2004-10-25 2006-12-12 Asml Netherlands B.V. Lithographic apparatus
US20060119811A1 (en) * 2004-12-07 2006-06-08 Asml Netherlands B.V. Radiation exposure apparatus comprising a gas flushing system
US7352440B2 (en) 2004-12-10 2008-04-01 Asml Netherlands B.V. Substrate placement in immersion lithography
US7528931B2 (en) 2004-12-20 2009-05-05 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP3977377B2 (ja) * 2005-03-04 2007-09-19 キヤノン株式会社 露光装置およびデバイス製造方法
US7834974B2 (en) 2005-06-28 2010-11-16 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7522258B2 (en) 2005-06-29 2009-04-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method utilizing movement of clean air to reduce contamination
US7253875B1 (en) * 2006-03-03 2007-08-07 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US9477158B2 (en) * 2006-04-14 2016-10-25 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8654305B2 (en) * 2007-02-15 2014-02-18 Asml Holding N.V. Systems and methods for insitu lens cleaning in immersion lithography
NL1036181A1 (nl) * 2007-11-30 2009-06-04 Asml Netherlands Bv A lithographic apparatus, a projection system and a device manufacturing method.
EP2423749B1 (de) 2010-08-24 2013-09-11 ASML Netherlands BV Lithografische Vorrichtung und Verfahren zur Herstellung einer Vorrichtung
DE102011079450A1 (de) * 2011-07-20 2013-01-24 Carl Zeiss Smt Gmbh Optische Anordnung mit Degradationsunterdrückung
WO2016074876A1 (en) 2014-11-13 2016-05-19 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
CN105842997B (zh) * 2016-06-03 2018-03-06 中国科学院光电研究院 一种动态气体锁的试验装置和试验方法
CN109283797B (zh) * 2017-07-21 2021-04-30 上海微电子装备（集团）股份有限公司 物镜保护装置、物镜系统以及光刻设备
US11048178B2 (en) 2017-12-14 2021-06-29 Asml Netherlands B.V. Lithographic apparatus with improved patterning performance
CN108398858B (zh) * 2018-03-20 2019-05-10 李笛 一种气体隔离装置及隔离方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4801352A (en) * 1986-12-30 1989-01-31 Image Micro Systems, Inc. Flowing gas seal enclosure for processing workpiece surface with controlled gas environment and intense laser irradiation
KR100805142B1 (ko) * 1999-07-16 2008-02-21 가부시키가이샤 니콘 노광방법 및 노광장치
TW563002B (en) * 1999-11-05 2003-11-21 Asml Netherlands Bv Lithographic projection apparatus, method of manufacturing a device using a lithographic projection apparatus, and device manufactured by the method
US6933513B2 (en) * 1999-11-05 2005-08-23 Asml Netherlands B.V. Gas flushing system for use in lithographic apparatus
DE60130754T2 (de) * 2000-05-03 2008-01-24 Asml Holding, N.V. Apparat zur Erzeugung eines gespülten optischen Weges in einer photolithographischen Projektionsanlage sowie ein entsprechendes Verfahren
DE60117107T2 (de) * 2000-07-14 2006-10-05 Asml Netherlands B.V. Lithographischer Projektionsapparat, Verfahren zur Herstellung eines Artikel, dabei erzeugter Artikel und Gaszusammensetzung
US6391090B1 (en) 2001-04-02 2002-05-21 Aeronex, Inc. Method for purification of lens gases used in photolithography
US6954255B2 (en) * 2001-06-15 2005-10-11 Canon Kabushiki Kaisha Exposure apparatus
JP2002373852A (ja) * 2001-06-15 2002-12-26 Canon Inc 露光装置

Also Published As

Publication number Publication date
TWI243970B (en) 2005-11-21
KR100748446B1 (ko) 2007-08-10
US7106412B2 (en) 2006-09-12
KR20040073365A (ko) 2004-08-19
TW200428159A (en) 2004-12-16
JP4035510B2 (ja) 2008-01-23
JP2004247733A (ja) 2004-09-02
US20040212791A1 (en) 2004-10-28
CN1530756A (zh) 2004-09-22
EP1447716A2 (de) 2004-08-18
EP1447716A3 (de) 2005-01-05

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