SG11202009926YA - Sample analysis apparatus having improved input optics and component arrangement - Google Patents

Sample analysis apparatus having improved input optics and component arrangement

Info

Publication number
SG11202009926YA
SG11202009926YA SG11202009926YA SG11202009926YA SG11202009926YA SG 11202009926Y A SG11202009926Y A SG 11202009926YA SG 11202009926Y A SG11202009926Y A SG 11202009926YA SG 11202009926Y A SG11202009926Y A SG 11202009926YA SG 11202009926Y A SG11202009926Y A SG 11202009926YA
Authority
SG
Singapore
Prior art keywords
analysis apparatus
sample analysis
component arrangement
input optics
improved input
Prior art date
Application number
SG11202009926YA
Other languages
English (en)
Inventor
Russell Jurek
Kevin Hunter
Original Assignee
Adaptas Solutions Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2018901240A external-priority patent/AU2018901240A0/en
Application filed by Adaptas Solutions Pty Ltd filed Critical Adaptas Solutions Pty Ltd
Publication of SG11202009926YA publication Critical patent/SG11202009926YA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/20—Magnetic deflection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
SG11202009926YA 2018-04-13 2019-04-12 Sample analysis apparatus having improved input optics and component arrangement SG11202009926YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AU2018901240A AU2018901240A0 (en) 2018-04-13 Sample analysis apparatus having improved input optics and component arrangement
PCT/AU2019/050333 WO2019195896A1 (en) 2018-04-13 2019-04-12 Sample analysis apparatus having improved input optics and component arrangement

Publications (1)

Publication Number Publication Date
SG11202009926YA true SG11202009926YA (en) 2020-11-27

Family

ID=68163399

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202009926YA SG11202009926YA (en) 2018-04-13 2019-04-12 Sample analysis apparatus having improved input optics and component arrangement

Country Status (9)

Country Link
US (1) US20210151304A1 (zh)
EP (1) EP3776627A4 (zh)
JP (1) JP2021521591A (zh)
KR (1) KR20200141056A (zh)
CN (1) CN112106171A (zh)
AU (1) AU2019251517A1 (zh)
CA (1) CA3096266A1 (zh)
SG (1) SG11202009926YA (zh)
WO (1) WO2019195896A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210082464A (ko) 2018-10-05 2021-07-05 아답타스 솔루션즈 피티와이 엘티디 전자 증배기 내부 영역의 개선
WO2022157814A1 (ja) 2021-01-19 2022-07-28 株式会社日立ハイテク 粒子分離装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1255962A (en) * 1968-07-05 1971-12-08 Atomic Energy Authority Uk Improvements in or relating to gas chromatography-mass spectrometry
US4016421A (en) * 1975-02-13 1977-04-05 E. I. Du Pont De Nemours And Company Analytical apparatus with variable energy ion beam source
DE2754685C2 (de) * 1977-12-08 1982-04-15 Bruker - Franzen Analytik GmbH, 2800 Bremen Vorrichtung zum Überführen von Ionen aus einem Massenfilter in einen Ionendetektor
US4481415A (en) * 1982-10-27 1984-11-06 Shimadzu Corporation Quadrupole mass spectrometer
GB8917570D0 (en) * 1989-08-01 1989-09-13 Vg Instr Group Plasma source mass spectrometry
US5204530A (en) * 1991-12-27 1993-04-20 Philippe Chastagner Noise reduction in negative-ion quadrupole mass spectrometry
US5432343A (en) * 1993-06-03 1995-07-11 Gulcicek; Erol E. Ion focusing lensing system for a mass spectrometer interfaced to an atmospheric pressure ion source
DE4441972C2 (de) * 1994-11-25 1996-12-05 Deutsche Forsch Luft Raumfahrt Verfahren und Vorrichtung zum Nachweis von Probenmolekülen in einem Trägergas
JPH10116583A (ja) * 1996-10-09 1998-05-06 Shimadzu Corp イオン質量分析装置
JP2000067805A (ja) * 1998-08-24 2000-03-03 Hitachi Ltd 質量分析装置
EP0982757A1 (en) * 1998-08-25 2000-03-01 The Perkin-Elmer Corporation Carrier gas separator for mass spectroscopy
CA2317085C (en) * 2000-08-30 2009-12-15 Mds Inc. Device and method for preventing ion source gases from entering reaction/collision cells in mass spectrometry
US7465919B1 (en) * 2006-03-22 2008-12-16 Itt Manufacturing Enterprises, Inc. Ion detection system with neutral noise suppression
JP6456863B2 (ja) * 2016-03-04 2019-01-23 株式会社日立ハイテクノロジーズ イオン移動度分離部を備える分析装置
SG11202008683RA (en) * 2018-03-23 2020-10-29 Adaptas Solutions Pty Ltd Particle detector having improved performance and service life

Also Published As

Publication number Publication date
CN112106171A (zh) 2020-12-18
EP3776627A4 (en) 2022-01-05
EP3776627A1 (en) 2021-02-17
KR20200141056A (ko) 2020-12-17
AU2019251517A1 (en) 2020-11-05
CA3096266A1 (en) 2019-10-17
US20210151304A1 (en) 2021-05-20
WO2019195896A1 (en) 2019-10-17
JP2021521591A (ja) 2021-08-26

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