SG11202009322QA - Methods and apparatus for microwave leakage reduction for semiconductor process chambers - Google Patents

Methods and apparatus for microwave leakage reduction for semiconductor process chambers

Info

Publication number
SG11202009322QA
SG11202009322QA SG11202009322QA SG11202009322QA SG11202009322QA SG 11202009322Q A SG11202009322Q A SG 11202009322QA SG 11202009322Q A SG11202009322Q A SG 11202009322QA SG 11202009322Q A SG11202009322Q A SG 11202009322QA SG 11202009322Q A SG11202009322Q A SG 11202009322QA
Authority
SG
Singapore
Prior art keywords
methods
semiconductor process
process chambers
microwave leakage
leakage reduction
Prior art date
Application number
SG11202009322QA
Inventor
Preetham P Rao
Ananthkrishna Jupudi
Ribhu Gautam
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of SG11202009322QA publication Critical patent/SG11202009322QA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67126Apparatus for sealing, encapsulating, glassing, decapsulating or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32513Sealing means, e.g. sealing between different parts of the vessel
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32192Microwave generated discharge
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00Heating by electric, magnetic or electromagnetic fields
    • H05B6/64Heating using microwaves
    • H05B6/6408Supports or covers specially adapted for use in microwave heating apparatus
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00Heating by electric, magnetic or electromagnetic fields
    • H05B6/64Heating using microwaves
    • H05B6/76Prevention of microwave leakage, e.g. door sealings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67115Apparatus for thermal treatment mainly by radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Constitution Of High-Frequency Heating (AREA)
  • Details Of Valves (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
SG11202009322QA 2018-04-20 2019-04-11 Methods and apparatus for microwave leakage reduction for semiconductor process chambers SG11202009322QA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862660415P 2018-04-20 2018-04-20
US16/363,537 US11670525B2 (en) 2018-04-20 2019-03-25 Methods and apparatus for microwave leakage reduction for semiconductor process chambers
PCT/US2019/026929 WO2019204110A1 (en) 2018-04-20 2019-04-11 Methods and apparatus for microwave leakage reduction for semiconductor process chambers

Publications (1)

Publication Number Publication Date
SG11202009322QA true SG11202009322QA (en) 2020-11-27

Family

ID=68238252

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202009322QA SG11202009322QA (en) 2018-04-20 2019-04-11 Methods and apparatus for microwave leakage reduction for semiconductor process chambers

Country Status (7)

Country Link
US (1) US11670525B2 (en)
JP (1) JP7032566B2 (en)
KR (1) KR102533888B1 (en)
CN (1) CN112005335B (en)
SG (1) SG11202009322QA (en)
TW (1) TWI734096B (en)
WO (1) WO2019204110A1 (en)

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2106360B (en) * 1981-09-25 1985-02-20 Hitachi Heating Appl Microwave heating apparatus
JPS61224289A (en) 1985-03-27 1986-10-04 松下電器産業株式会社 Radio wave leakage preventor for electronic oven range
KR0171337B1 (en) 1995-09-18 1999-05-01 배순훈 Microwave shielding structure for microwave oven door
KR100212856B1 (en) * 1996-02-23 1999-08-02 윤종용 Microwave oven
JP2001077088A (en) 1999-09-02 2001-03-23 Tokyo Electron Ltd Plasma processing device
KR20030065728A (en) 2002-01-30 2003-08-09 엘지전자 주식회사 Mwo door having attenuating filter
JP2005032805A (en) 2003-07-08 2005-02-03 Future Vision:Kk Microwave plasma processing method, microwave plasma processing equipment, and its plasma head
KR100652599B1 (en) * 2005-07-13 2006-12-01 엘지전자 주식회사 Cooking apparatus using microwave
JP5283835B2 (en) * 2006-07-06 2013-09-04 東京エレクトロン株式会社 Microwave plasma processing apparatus and gate valve for microwave plasma processing apparatus
US7502123B2 (en) 2007-02-05 2009-03-10 Palo Alto Research Center Incorporated Obtaining information from optical cavity output light
US9179506B2 (en) 2010-05-26 2015-11-03 Lg Electronics Inc. Door choke and cooking apparatus including the same
WO2012007842A2 (en) * 2010-07-15 2012-01-19 Goji Ltd. A choke for an oven
JP2013073947A (en) 2011-09-26 2013-04-22 Hitachi Kokusai Electric Inc Substrate processing apparatus
US20130228568A1 (en) * 2012-03-02 2013-09-05 Illinois Tool Works Inc. Multiple choke system for containing wide frequency band rf leakage
JP5955394B2 (en) 2012-09-06 2016-07-20 株式会社日立国際電気 Substrate processing apparatus, semiconductor device manufacturing method, and program
CN203112924U (en) * 2012-09-28 2013-08-07 无锡元坤新材料科技有限公司 Novel structure capable of preventing microwave leakage
JP6005549B2 (en) 2013-02-27 2016-10-12 東京エレクトロン株式会社 Heat treatment apparatus and heat treatment method
US10912166B2 (en) * 2016-11-30 2021-02-02 Illinois Tool Works, Inc. RF choke and interface structures for employment with an RF oven

Also Published As

Publication number Publication date
US11670525B2 (en) 2023-06-06
KR102533888B1 (en) 2023-05-18
TWI734096B (en) 2021-07-21
JP7032566B2 (en) 2022-03-08
US20190326141A1 (en) 2019-10-24
KR20200135558A (en) 2020-12-02
WO2019204110A1 (en) 2019-10-24
JP2021521598A (en) 2021-08-26
TW201944516A (en) 2019-11-16
CN112005335B (en) 2024-04-19
CN112005335A (en) 2020-11-27

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