SG11202005189YA - Kit-less pick and place handler - Google Patents

Kit-less pick and place handler

Info

Publication number
SG11202005189YA
SG11202005189YA SG11202005189YA SG11202005189YA SG11202005189YA SG 11202005189Y A SG11202005189Y A SG 11202005189YA SG 11202005189Y A SG11202005189Y A SG 11202005189YA SG 11202005189Y A SG11202005189Y A SG 11202005189YA SG 11202005189Y A SG11202005189Y A SG 11202005189YA
Authority
SG
Singapore
Prior art keywords
kit
place handler
less pick
pick
less
Prior art date
Application number
SG11202005189YA
Inventor
Larry Stuckey
Igor Shekhtman
John Lewis
Kent Blumenshine
Colin Scholefield
Original Assignee
Boston Semi Equipment Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boston Semi Equipment Llc filed Critical Boston Semi Equipment Llc
Publication of SG11202005189YA publication Critical patent/SG11202005189YA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/0001—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems
    • G02B6/0011—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being planar or of plate-like form
    • G02B6/0065—Manufacturing aspects; Material aspects

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Manufacturing & Machinery (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Control And Other Processes For Unpacking Of Materials (AREA)
SG11202005189YA 2017-12-19 2018-12-19 Kit-less pick and place handler SG11202005189YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762607748P 2017-12-19 2017-12-19
PCT/US2018/066582 WO2019126375A1 (en) 2017-12-19 2018-12-19 Kit-less pick and place handler

Publications (1)

Publication Number Publication Date
SG11202005189YA true SG11202005189YA (en) 2020-07-29

Family

ID=66993836

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202005189YA SG11202005189YA (en) 2017-12-19 2018-12-19 Kit-less pick and place handler

Country Status (10)

Country Link
US (1) US11474147B2 (en)
EP (1) EP3729115A4 (en)
JP (2) JP2021508061A (en)
KR (1) KR20200122296A (en)
CN (1) CN111742232A (en)
CA (1) CA3084671A1 (en)
PH (1) PH12020550802A1 (en)
SG (1) SG11202005189YA (en)
TW (1) TWI811276B (en)
WO (1) WO2019126375A1 (en)

Family Cites Families (34)

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TW379285B (en) * 1997-07-02 2000-01-11 Advantest Corp Testing device for semiconductor components and the testing trays used in the testing apparatus
US5905472A (en) * 1997-08-06 1999-05-18 Raytheon Company Microwave antenna having wide angle scanning capability
US6138369A (en) * 1998-04-08 2000-10-31 Mushin; Uriel Level indicator for a wall-mounted fixture
DE19983376T1 (en) * 1998-07-14 2001-06-28 Schlumberger Technologies Inc Device, method and system for a liquid-based temperature change stress control of electronic components with a wide range and quick response
JP2000111613A (en) * 1998-10-07 2000-04-21 Nippon Eng Kk Loader unloader device for burn-in board
KR20020005276A (en) * 2000-07-07 2002-01-17 이 창 세 Device for measuring electrical properties of wafer
JP2002048842A (en) * 2000-08-01 2002-02-15 Shibasoku:Kk Integrated circuit handler
JP4744689B2 (en) * 2000-12-11 2011-08-10 パナソニック株式会社 Viscous fluid transfer device and electronic component mounting device
US6628132B2 (en) * 2001-08-10 2003-09-30 Teradyne, Inc. Methods and apparatus for testing a semiconductor structure using improved temperature desoak techniques
US6626132B1 (en) * 2002-06-24 2003-09-30 Scott K. Mann Multiple pet leash
US6831454B2 (en) * 2003-02-20 2004-12-14 Mirae Corporation Indexing device in semiconductor device handler and method for operating the same
WO2004106953A1 (en) 2003-05-30 2004-12-09 Advantest Corporation Electronic component test instrument
US20050180844A1 (en) * 2004-02-18 2005-08-18 Delta Design, Inc. Device handling system and method
US7258703B2 (en) * 2005-01-07 2007-08-21 Asm Assembly Automation Ltd. Apparatus and method for aligning devices on carriers
JP4462140B2 (en) * 2005-07-27 2010-05-12 住友電気工業株式会社 Wafer prober chuck top, wafer holder, and wafer prober including the same
JP2007107941A (en) * 2005-10-12 2007-04-26 Fujifilm Corp Apparatus and method for transfer in inspection process
US8870244B2 (en) * 2006-06-29 2014-10-28 Vision Industries Group, Inc. Sash lock with signal
KR101042655B1 (en) * 2006-07-27 2011-06-20 가부시키가이샤 아드반테스트 Electronic component transfer method and electronic component handling device
SG154370A1 (en) * 2008-01-30 2009-08-28 Advanced Systems Automation Ltd Tray flattener
WO2010004623A1 (en) * 2008-07-08 2010-01-14 株式会社アドバンテスト Electronic component holding device and electronic component testing device with the same
CN201246580Y (en) * 2008-08-11 2009-05-27 王驹 Fixed base of portable electronic apparatus
US8037996B2 (en) * 2009-01-05 2011-10-18 Asm Assembly Automation Ltd Transfer apparatus for handling electronic components
WO2011038297A1 (en) * 2009-09-26 2011-03-31 Centipede Systems, Inc. Apparatus for holding microelectronic devices
JP2011226806A (en) * 2010-04-15 2011-11-10 Advantest Corp Electronic component handling device, electronic component testing device, and electronic component testing method
CN103841814B (en) * 2012-11-26 2016-08-10 台达电子电源(东莞)有限公司 For assembling the device and method of electronic device on socket
CN103037679B (en) * 2012-12-24 2015-07-08 华为技术有限公司 Internal storage inserting device
JP2014190708A (en) * 2013-03-26 2014-10-06 Seiko Epson Corp Electronic component-pressing device, temperature control method of electronic component, handler, and inspection device
JP2015055511A (en) * 2013-09-11 2015-03-23 合同会社Ｐｌｅｓｏｎ Semiconductor device inspection unit
EP3115794A1 (en) * 2013-11-11 2017-01-11 Rasco GmbH An assembly and method for handling components
JP6503772B2 (en) * 2015-02-12 2019-04-24 セイコーエプソン株式会社 Electronic component conveying apparatus and electronic component inspection apparatus
TWI551529B (en) * 2015-12-31 2016-10-01 Hon Tech Inc Electronic components operating machine
CN108351379A (en) * 2016-01-15 2018-07-31 罗斯柯公司 For by overturning the method and apparatus that the device under test is loaded on tester and is unloaded from tester
CN205944056U (en) * 2016-07-21 2017-02-08 环旭电子股份有限公司 Tight equipment of siP module test locating clip

Also Published As

Publication number Publication date
WO2019126375A1 (en) 2019-06-27
CA3084671A1 (en) 2019-06-27
CN111742232A (en) 2020-10-02
EP3729115A1 (en) 2020-10-28
PH12020550802A1 (en) 2021-05-17
TWI811276B (en) 2023-08-11
JP2024028858A (en) 2024-03-05
TW201930907A (en) 2019-08-01
US20200341054A1 (en) 2020-10-29
EP3729115A4 (en) 2021-12-22
US11474147B2 (en) 2022-10-18
JP2021508061A (en) 2021-02-25
KR20200122296A (en) 2020-10-27

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