SG11201905685XA - In-field multi core self-test controller with stored test pattern for safety critical automotive use cases - Google Patents

In-field multi core self-test controller with stored test pattern for safety critical automotive use cases

Info

Publication number
SG11201905685XA
SG11201905685XA SG11201905685XA SG11201905685XA SG11201905685XA SG 11201905685X A SG11201905685X A SG 11201905685XA SG 11201905685X A SG11201905685X A SG 11201905685XA SG 11201905685X A SG11201905685X A SG 11201905685XA SG 11201905685X A SG11201905685X A SG 11201905685XA
Authority
SG
Singapore
Prior art keywords
test
international
san diego
self
california
Prior art date
Application number
SG11201905685XA
Inventor
Arvind Jain
Singh Nishi Bhushan
Rahul Gulati
Pranjal Bhuyan
Rakesh Kumar Kinger
Roberto Averbuj
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of SG11201905685XA publication Critical patent/SG11201905685XA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G06F11/2242—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors in multi-processor systems, e.g. one processor becoming the test master
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G06F9/448—Execution paradigms, e.g. implementations of programming paradigms
    • G06F9/4498—Finite state machines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G11C2029/3602—Pattern generator

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Display Devices Of Pinball Game Machines (AREA)

Abstract

ELMT Cores JTAG Decoder 112 TAP 702 JTAG 704 Self Test Controller Power/RESET Controller 708 100 Config register LQ2 ROM Interconnect 710 ••!! cc O QC 1-1 00 O 1-1 r•i C PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) omit °nolo DID mil moll! ono En oimIE (10) International Publication Number WO 2018/148038 Al WIPO I PCT (12) INTERNATIONAL APPLICATION (19) World Intellectual Property Organization International Bureau (43) International Publication Date 16 August 2018 (16.08.2018) (51) International Patent Classification: G11C 29/36 (2006.01) GO6F 11/22 (2006.01) Gl1C 29/10 (2006.01) (21) International Application Number: PCT/US2018/015578 (22) International Filing Date: 26 January 2018 (26.01.2018) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 62/458,534 13 February 2017 (13.02.2017) US 15/835,227 07 December 2017 (07.12.2017) US (71) Applicant: QUALCOMM INCORPORATED [US/US]; Atten: International IP Administration, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). (72) Inventors: JAIN, Arvind; c/o Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). BHUSHAN SINGH, Nishi; c/o Qualcomm Incor- porated, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). GULATI, Rahul; c/o Qualcomm In- corporated, 5775 Morehouse Drive, San Diego, Califor- nia 92121-1714 (US). BHUYAN, Pranjal; c/o Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, Cali- fornia 92121-1714 (US). KINGER, Rakesh Kumar; c/ o Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). AVERBUJ, Roberto; c/o Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California 92121-1714 (US). (74) Agent: HODGES, Jonas J. et al.; c/o Arent Fox LLP, 1717 K Street NW, Washington, District of Columbia 20006-5344 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, (54) Title: IN-FIELD MULTI CORE SELF-TEST CONTROLLER WITH STORED TEST PATTERN FOR SAFETY CRITICAL AUTOMOTIVE USE CASES FIG. 7 (57) : A self-test controller (100) includes a memory (104) configured to store a test patterns, configuration registers (102), and a memory data component. The test patterns are encoded in the memory using various techniques in order to save storage space. By using the configuration parameters, the memory data component is configured to decode the test patterns and perform multiple built- in self-test on a multitude of test cores (706). The described techniques allow for built- in self-test to be performed dynamically while utilizing less space in the memory. [Continued on next page] WO 2018/148038 Al MIDEDIMOMOIDEIREEMOMMIUMOIMIOMMOVOIS KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Published: — with international search report (Art. 21(3))
SG11201905685XA 2017-02-13 2018-01-26 In-field multi core self-test controller with stored test pattern for safety critical automotive use cases SG11201905685XA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201762458534P 2017-02-13 2017-02-13
US15/835,227 US10481202B2 (en) 2017-02-13 2017-12-07 In-field self-test controller for safety critical automotive use cases
PCT/US2018/015578 WO2018148038A1 (en) 2017-02-13 2018-01-26 In-field multi core self-test controller with stored test pattern for safety critical automotive use cases

Publications (1)

Publication Number Publication Date
SG11201905685XA true SG11201905685XA (en) 2019-08-27

Family

ID=63104562

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201905685XA SG11201905685XA (en) 2017-02-13 2018-01-26 In-field multi core self-test controller with stored test pattern for safety critical automotive use cases

Country Status (6)

Country Link
US (1) US10481202B2 (en)
EP (1) EP3580762B1 (en)
CN (1) CN110291588B (en)
SG (1) SG11201905685XA (en)
TW (1) TWI710779B (en)
WO (1) WO2018148038A1 (en)

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Also Published As

Publication number Publication date
CN110291588A (en) 2019-09-27
EP3580762B1 (en) 2020-11-04
CN110291588B (en) 2023-05-30
TWI710779B (en) 2020-11-21
US20180231609A1 (en) 2018-08-16
US10481202B2 (en) 2019-11-19
WO2018148038A1 (en) 2018-08-16
TW201840995A (en) 2018-11-16
EP3580762A1 (en) 2019-12-18

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