SG11201901040WA - Automated 3-d measurement - Google Patents
Automated 3-d measurementInfo
- Publication number
- SG11201901040WA SG11201901040WA SG11201901040WA SG11201901040WA SG11201901040WA SG 11201901040W A SG11201901040W A SG 11201901040WA SG 11201901040W A SG11201901040W A SG 11201901040WA SG 11201901040W A SG11201901040W A SG 11201901040WA SG 11201901040W A SG11201901040W A SG 11201901040WA
- Authority
- SG
- Singapore
- Prior art keywords
- captured image
- international
- characteristic
- sample
- determining
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0028—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders specially adapted for specific applications, e.g. for endoscopes, ophthalmoscopes, attachments to conventional microscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9501—Semiconductor wafers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
- G06T7/571—Depth or shape recovery from multiple images from focus
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10056—Microscopic image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10141—Special mode during image acquisition
- G06T2207/10148—Varying focus
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Radiology & Medical Imaging (AREA)
- Surgery (AREA)
- Ophthalmology & Optometry (AREA)
- General Engineering & Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Control Or Security For Electrophotography (AREA)
Abstract
INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property :::` , MD HIM 0 11101 010 11111 01 II 0 0111E011 OHM 100 110 11110 ill 011 Organization International Bureau (10) International Publication Number 03 (43) International Publication Date .....•\"\"- WO 2018/031560 Al 15 February 2018 (15.02.2018) WIP0 I PCT (51) International Patent Classification: AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, G02B 21/00 (2006.01) G01N 21/95 (2006.01) CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, G02B 21/36 (2006.01) G06T 7/00 (2006.01) DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, (21) International Application Number: HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, PCT/US2017/045929 KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, (22) International Filing Date: OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, 08 August 2017 (08.08.2017) SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (25) Filing Language: English (26) Publication Language: English (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, (30) Priority Data: GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, 15/233,812 10 August 2016 (10.08.2016) US UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, (71) Applicant: KLA-TENCOR CORPORATION [US/US]; EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, Legal Department, One Technology Drive, Milpitas, Cali- MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, fornia 95035 (US). TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, (72) Inventors: XU, James Jianguo; 1029 Olmo Court, San KM, ML, MR, NE, SN, TD, TG). Jose, California 95129 (US). SOETARMAN, Ronny; _ 48353 Avalon Heights Terrace, Fremont, California 94539 Published: (US). — with international search report (Art. 2 I (3)) = (74) Agent: MCANDREWS, Kevin et al.; KLA-TENCOR = CORPORATION, Legal Department, One Technology Dri- ve, Milpitas, California 95035 (US). = (81) Designated States (unless otherwise indicated, for every = = kind of national protection available): AE, AG, AL, AM, (54) Title: AUTOMATED = - = = — _ = — _ E = = = ON = 111111111111111111 ' .: ) _ ill 11 .4 . ©' - 1 1 in ,—, M © co SEMI-AUTOMATED Il © ei 1 27 .47- -DrE METROLOGY ZETA WAFER / OFF 3111111111111 1.111 5 COMPUTER 4 3-D METROLOGY FIG. = further SEMI-AUTOMATED 3-D // 1 iNSTRUNIENTS SYSTEM \"/ MEASUREMENT 3-D SYSTEM (57) : A method of generating 3D information of a sample using an op- tical microscope includes: varying the distance between the sample and an objec- tive lens of the optical microscope at predetermined steps, capturing an image at each predetermined step. In one example, the method further includes: determin- ing a characteristic of each pixel in each captured image; determining, for each captured image, the greatest characteristic across all pixels in the captured image; and comparing the greatest characteristic for each captured image to determine if a surface of the sample is present at each step. In another example, the method includes: determining a characteristic of each pixel in each captured image; determining, for each captured image, a count of pixels that have a characteristic value within a first range; and determining if a surface of the sample is present at each step based on the count of pixels for each captured image. C
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/233,812 US20180045937A1 (en) | 2016-08-10 | 2016-08-10 | Automated 3-d measurement |
PCT/US2017/045929 WO2018031560A1 (en) | 2016-08-10 | 2017-08-08 | Automated 3-d measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201901040WA true SG11201901040WA (en) | 2019-03-28 |
Family
ID=61158795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201901040WA SG11201901040WA (en) | 2016-08-10 | 2017-08-08 | Automated 3-d measurement |
Country Status (6)
Country | Link |
---|---|
US (1) | US20180045937A1 (en) |
KR (2) | KR20210148424A (en) |
CN (1) | CN109716197A (en) |
SG (1) | SG11201901040WA (en) |
TW (1) | TWI751184B (en) |
WO (1) | WO2018031560A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI718557B (en) * | 2018-06-29 | 2021-02-11 | 美商伊路米納有限公司 | Method, system, and non-transitory computer-readable medium for predicting structured illumination parameters |
WO2020060501A1 (en) * | 2018-09-17 | 2020-03-26 | Koc Universitesi | A method and apparatus for detecting nanoparticles and biological molecules |
Family Cites Families (43)
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US5184021A (en) * | 1991-06-24 | 1993-02-02 | Siscan Systems, Inc. | Method and apparatus for measuring the dimensions of patterned features on a lithographic photomask |
DE69329554T2 (en) * | 1992-02-18 | 2001-05-31 | Neopath Inc | METHOD FOR IDENTIFYING OBJECTS USING DATA PROCESSING TECHNIQUES |
DE19819492A1 (en) * | 1998-04-30 | 1999-11-11 | Leica Microsystems | Measuring device for measuring structures on a transparent substrate |
DE10023954A1 (en) * | 2000-05-16 | 2001-11-29 | Daimler Chrysler Ag | Fine surface finished workpiece inspection method for cam shafts in internal combustion engine, involves generating two dimensional data set indicating position of chatter marks on workpiece surface by multicross correlation technique |
US6539331B1 (en) * | 2000-09-08 | 2003-03-25 | Peter J. Fiekowsky | Microscopic feature dimension measurement system |
US7321394B1 (en) * | 2000-09-29 | 2008-01-22 | Lucid, Inc. | Automatic gain control for a confocal imaging system |
WO2003038503A1 (en) * | 2001-11-02 | 2003-05-08 | Olympus Corporation | Scanning con-focal microscope |
JP5132867B2 (en) * | 2002-02-22 | 2013-01-30 | オリンパス アメリカ インコーポレイテツド | Method and apparatus for forming and using virtual microscope slide, and program |
US20040208385A1 (en) * | 2003-04-18 | 2004-10-21 | Medispectra, Inc. | Methods and apparatus for visually enhancing images |
TWI236562B (en) * | 2002-11-21 | 2005-07-21 | Hitachi Int Electric Inc | A method of detecting a pattern and an apparatus thereof |
JP2004317704A (en) * | 2003-04-15 | 2004-11-11 | Yokogawa Electric Corp | Three-dimensional confocal microscope |
JP4756819B2 (en) * | 2003-10-21 | 2011-08-24 | オリンパス株式会社 | Scanning microscope system |
US7564622B2 (en) * | 2003-12-12 | 2009-07-21 | Olympus Corporation | Methods for implement microscopy and microscopic measurement as well as microscope and apparatus for implementing them |
US7512436B2 (en) * | 2004-02-12 | 2009-03-31 | The Regents Of The University Of Michigan | Method of evaluating metabolism of the eye |
US7002737B1 (en) * | 2004-08-31 | 2006-02-21 | Yokogawa Electric Corp. | Three-dimensional confocal microscope |
CN1267721C (en) * | 2004-09-15 | 2006-08-02 | 中国科学院上海光学精密机械研究所 | Fully optical fiber probe scan type near-field optical microscope |
DE102005024063B3 (en) * | 2005-05-25 | 2006-07-06 | Soft Imaging System Gmbh | Method for optical scanning sample involves recording of individual image whereby in each case, it is evaluated by means of adaptive sensor unit with respect to contrast totally or partly |
WO2007035721A2 (en) * | 2005-09-19 | 2007-03-29 | The Trustees Of Columbia University In The City Of New York | Ultrasound method to open blood brain barrier |
US7532770B2 (en) * | 2005-09-23 | 2009-05-12 | Siemens Aktiengesellschaft | Method for combining two images based on eliminating background pixels from one of the images |
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DE102014216227B4 (en) * | 2014-08-14 | 2020-06-18 | Carl Zeiss Microscopy Gmbh | Method and device for determining a distance between two optical interfaces spaced apart from one another along a first direction |
US10533953B2 (en) * | 2016-04-04 | 2020-01-14 | Kla-Tencor Corporation | System and method for wafer inspection with a noise boundary threshold |
-
2016
- 2016-08-10 US US15/233,812 patent/US20180045937A1/en not_active Abandoned
-
2017
- 2017-08-08 SG SG11201901040WA patent/SG11201901040WA/en unknown
- 2017-08-08 KR KR1020217039066A patent/KR20210148424A/en not_active Application Discontinuation
- 2017-08-08 WO PCT/US2017/045929 patent/WO2018031560A1/en active Application Filing
- 2017-08-08 KR KR1020197006767A patent/KR20190029763A/en not_active Application Discontinuation
- 2017-08-08 CN CN201780057062.8A patent/CN109716197A/en active Pending
- 2017-08-10 TW TW106127066A patent/TWI751184B/en active
Also Published As
Publication number | Publication date |
---|---|
KR20190029763A (en) | 2019-03-20 |
TWI751184B (en) | 2022-01-01 |
CN109716197A (en) | 2019-05-03 |
TW201809592A (en) | 2018-03-16 |
US20180045937A1 (en) | 2018-02-15 |
KR20210148424A (en) | 2021-12-07 |
WO2018031560A1 (en) | 2018-02-15 |
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