SG11201900642VA - Three-dimensional surface roughness evaluating device, three-dimensional surface roughness evaluating method, three-dimensional surface roughness data acquiring device, and three-dimensional surface roughness data acquiring method - Google Patents

Three-dimensional surface roughness evaluating device, three-dimensional surface roughness evaluating method, three-dimensional surface roughness data acquiring device, and three-dimensional surface roughness data acquiring method

Info

Publication number
SG11201900642VA
SG11201900642VA SG11201900642VA SG11201900642VA SG11201900642VA SG 11201900642V A SG11201900642V A SG 11201900642VA SG 11201900642V A SG11201900642V A SG 11201900642VA SG 11201900642V A SG11201900642V A SG 11201900642VA SG 11201900642V A SG11201900642V A SG 11201900642VA
Authority
SG
Singapore
Prior art keywords
surface roughness
dimensional surface
dimensional
data
laser displacement
Prior art date
Application number
SG11201900642VA
Inventor
Hirohisa Mieno
Original Assignee
Chugoku Marine Paints
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chugoku Marine Paints filed Critical Chugoku Marine Paints
Publication of SG11201900642VA publication Critical patent/SG11201900642VA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D1/00—Measuring arrangements giving results other than momentary value of variable, of general application
    • G01D1/02—Measuring arrangements giving results other than momentary value of variable, of general application giving mean values, e.g. root means square values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/347—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
    • G01D5/3473—Circular or rotary encoders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

Abstract

THREE-DIMENSIONAL SURFACE ROUGHNESS EVALUATING DEVICE, THREE- DIMENSIONAL SURFACE ROUGHNESS EVALUATING METHOD, THREE- DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING DEVICE, AND THREE-DIMENSIONAL SURFACE ROUGHNESS DATA ACQUIRING METHOD A three-dimensional surface roughness evaluating device includes: a two-dimensional laser displacement meter; a movement mechanism which moves the two-dimensional laser displacement meter in an X-axis direction; a movement distance measuring device which measures a movement distance of the two- dimensional laser displacement meter in the X-axis direction; and a calculating device which generates three-dimensional surface roughness data of a measurement target on the basis of displacement data acquired by the two-dimensional laser displacement meter and movement distance data acquired by the movement distance measuring device, wherein the two- dimensional laser displacement meter is disposed so that the width direction of the two-dimensional laser displacement meter coincides with a Y-axis direction, to be able to measure displacement data of coordinates in the Y-axis direction at fixed intervals, the measuring width of the two-dimensional laser displacement meter is at least two or more times mean width of the roughness profile elements RSm of elements of the measurement target, and the calculating device is configured to generate reference surface data of each coordinate by averaging in the Y-axis direction the displacement data acquired at fixed intervals in the X-axis direction by the two- dimensional laser displacement meter, and generate three- dimensional surface roughness data of the measurement target by subtracting the reference surface data of each coordinate from the displacement data of each X-Y plane coordinate. Fig. 1
SG11201900642VA 2016-07-27 2017-07-24 Three-dimensional surface roughness evaluating device, three-dimensional surface roughness evaluating method, three-dimensional surface roughness data acquiring device, and three-dimensional surface roughness data acquiring method SG11201900642VA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016147605 2016-07-27
PCT/JP2017/026605 WO2018021210A1 (en) 2016-07-27 2017-07-24 Three-dimensional surface roughness evaluating device, three-dimensional surface roughness evaluating method, three-dimensional surface roughness data acquiring device, and three-dimensional surface roughness data acquiring method

Publications (1)

Publication Number Publication Date
SG11201900642VA true SG11201900642VA (en) 2019-02-27

Family

ID=61016331

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201900642VA SG11201900642VA (en) 2016-07-27 2017-07-24 Three-dimensional surface roughness evaluating device, three-dimensional surface roughness evaluating method, three-dimensional surface roughness data acquiring device, and three-dimensional surface roughness data acquiring method

Country Status (7)

Country Link
US (1) US11162786B2 (en)
EP (1) EP3492862B1 (en)
JP (3) JPWO2018021210A1 (en)
KR (1) KR102073803B1 (en)
CN (1) CN109477712A (en)
SG (1) SG11201900642VA (en)
WO (1) WO2018021210A1 (en)

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JP7152973B2 (en) * 2019-03-14 2022-10-13 株式会社Ｓｃｒｅｅｎホールディングス Inspection condition creation support device, inspection condition creation support method, inspection condition creation support program, and recording medium
CN112747698A (en) * 2019-10-29 2021-05-04 复盛应用科技股份有限公司 Golf club head measuring method
CN110969695B (en) * 2019-12-17 2022-09-23 厦门理工学院 Three-dimensional modeling method and device for determining roughness of surface of drill hole
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Also Published As

Publication number Publication date
KR102073803B1 (en) 2020-02-05
JPWO2018021210A1 (en) 2019-04-04
US11162786B2 (en) 2021-11-02
US20190162530A1 (en) 2019-05-30
EP3492862A1 (en) 2019-06-05
WO2018021210A1 (en) 2018-02-01
CN109477712A (en) 2019-03-15
EP3492862B1 (en) 2022-02-23
JP2022062213A (en) 2022-04-19
EP3492862A4 (en) 2020-04-01
JP2024026279A (en) 2024-02-28
KR20190028527A (en) 2019-03-18

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