FI20116329A - Measurement of the target - Google Patents

Measurement of the target Download PDF

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Publication number
FI20116329A
FI20116329A FI20116329A FI20116329A FI20116329A FI 20116329 A FI20116329 A FI 20116329A FI 20116329 A FI20116329 A FI 20116329A FI 20116329 A FI20116329 A FI 20116329A FI 20116329 A FI20116329 A FI 20116329A
Authority
FI
Finland
Prior art keywords
sensor
measured
row
sensor row
measurement
Prior art date
Application number
FI20116329A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI125119B (en
Inventor
Markku Maentylae
Jussi Graeffe
Karri Niemelae
Heimo Keraenen
Pekka Suopajaervi
Lauri Kurki
Original Assignee
Metso Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metso Automation Oy filed Critical Metso Automation Oy
Priority to FI20116329A priority Critical patent/FI125119B/en
Priority to US14/368,882 priority patent/US20150008346A1/en
Priority to CA 2861690 priority patent/CA2861690A1/en
Priority to EP12861226.4A priority patent/EP2805130B1/en
Priority to CN201280070883.2A priority patent/CN104136884B/en
Priority to PCT/FI2012/051293 priority patent/WO2013098482A1/en
Publication of FI20116329A publication Critical patent/FI20116329A/en
Application granted granted Critical
Publication of FI125119B publication Critical patent/FI125119B/en

Links

Classifications

    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21B—FIBROUS RAW MATERIALS OR THEIR MECHANICAL TREATMENT
    • D21B1/00—Fibrous raw materials or their mechanical treatment
    • D21B1/04—Fibrous raw materials or their mechanical treatment by dividing raw materials into small particles, e.g. fibres
    • D21B1/12—Fibrous raw materials or their mechanical treatment by dividing raw materials into small particles, e.g. fibres by wet methods, by the use of steam
    • D21B1/30—Defibrating by other means
    • D21B1/32—Defibrating by other means of waste paper
    • D21B1/325—Defibrating by other means of waste paper de-inking devices
    • D21B1/327—Defibrating by other means of waste paper de-inking devices using flotation devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21F—PAPER-MAKING MACHINES; METHODS OF PRODUCING PAPER THEREON
    • D21F7/00—Other details of machines for making continuous webs of paper
    • D21F7/06—Indicating or regulating the thickness of the layer; Signal devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/125—Digital circuitry
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
    • Y02W30/00—Technologies for solid waste management
    • Y02W30/50—Reuse, recycling or recovery technologies
    • Y02W30/64—Paper recycling

Abstract

A measuring device comprises a first optical sensor row (200) and a second optical sensor row (202) between which a planar object (204) to be measured is placed. The direction of the first sensor row (200) and the direction of the second sensor row (202) differ from one another. Each sensor (208) of the first sensor row (200) forms data representing a distance between the object (204) to be measured and the sensor (208). Each sensor (210) of the second sensor row (202) forms data representing a distance between the object (204) to be measured and the sensor (210) in order to determine at least one property of the object (204) to be measured on the basis of said data.
FI20116329A 2011-12-28 2011-12-28 Measurement of a flat measuring object FI125119B (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI20116329A FI125119B (en) 2011-12-28 2011-12-28 Measurement of a flat measuring object
US14/368,882 US20150008346A1 (en) 2011-12-28 2012-12-21 Measurement of object to be measured
CA 2861690 CA2861690A1 (en) 2011-12-28 2012-12-21 Measurement of object to be measured
EP12861226.4A EP2805130B1 (en) 2011-12-28 2012-12-21 Measurement of object to be measured
CN201280070883.2A CN104136884B (en) 2011-12-28 2012-12-21 The measurement of object to be measured
PCT/FI2012/051293 WO2013098482A1 (en) 2011-12-28 2012-12-21 Measurement of object to be measured

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20116329A FI125119B (en) 2011-12-28 2011-12-28 Measurement of a flat measuring object
FI20116329 2011-12-28

Publications (2)

Publication Number Publication Date
FI20116329A true FI20116329A (en) 2013-06-29
FI125119B FI125119B (en) 2015-06-15

Family

ID=48696399

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20116329A FI125119B (en) 2011-12-28 2011-12-28 Measurement of a flat measuring object

Country Status (6)

Country Link
US (1) US20150008346A1 (en)
EP (1) EP2805130B1 (en)
CN (1) CN104136884B (en)
CA (1) CA2861690A1 (en)
FI (1) FI125119B (en)
WO (1) WO2013098482A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111351791A (en) * 2018-12-24 2020-06-30 韦伯斯特生物官能(以色列)有限公司 Non-invasive measurement of the pitch of a fabric

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9147405B2 (en) * 2013-12-05 2015-09-29 Seagate Technology Llc Light source alignment
CN107209002A (en) * 2014-12-19 2017-09-26 犹他大学研究基金会 Noise measure system and associated method
US9470514B2 (en) * 2015-02-11 2016-10-18 Southwest Research Institute System and method for using laser scan micrometer to measure surface changes on non-concave surfaces
JP6398950B2 (en) * 2015-11-09 2018-10-03 東芝三菱電機産業システム株式会社 Device for photographing the surface of a plate-like body
JP6801573B2 (en) * 2017-05-10 2020-12-16 日立金属株式会社 Cable waterproof structure and wire harness
EP3450184B1 (en) * 2017-09-01 2021-04-21 Canon Production Printing Holding B.V. Deformation detection for print media

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06273162A (en) * 1993-03-18 1994-09-30 Sumitomo Metal Ind Ltd Flatness measuring device
US5798836A (en) * 1996-11-15 1998-08-25 Kabushiki Kaisha Toshiba Optical distance measuring apparatus and method therefor
DE10361161A1 (en) * 2003-12-22 2005-07-21 Voith Paper Patent Gmbh measuring device
US7199884B2 (en) * 2004-12-21 2007-04-03 Honeywell International Inc. Thin thickness measurement method and apparatus
CN101379366A (en) * 2005-12-22 2009-03-04 霍尼韦尔国际公司 Optical translation of triangulation position measurement
US7880156B2 (en) * 2006-12-27 2011-02-01 Honeywell International Inc. System and method for z-structure measurements using simultaneous multi-band tomography
DE112008002244B4 (en) * 2007-08-31 2013-07-25 Abb Ltd. Thickness Gauge Railway
CA2766843A1 (en) * 2009-07-02 2011-01-06 Voith Patent Gmbh Method and apparatus for the contactless determination of the thickness of a web of material, including correction of the alignment error
WO2011000667A1 (en) * 2009-07-02 2011-01-06 Voith Patent Gmbh Method for the contactless determination of the thickness of a web of material

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111351791A (en) * 2018-12-24 2020-06-30 韦伯斯特生物官能(以色列)有限公司 Non-invasive measurement of the pitch of a fabric
CN111351791B (en) * 2018-12-24 2023-12-05 韦伯斯特生物官能(以色列)有限公司 Non-invasive measurement of pitch of braid

Also Published As

Publication number Publication date
EP2805130A4 (en) 2015-04-15
CN104136884B (en) 2017-06-09
FI125119B (en) 2015-06-15
US20150008346A1 (en) 2015-01-08
EP2805130B1 (en) 2020-05-06
WO2013098482A1 (en) 2013-07-04
CA2861690A1 (en) 2013-07-04
CN104136884A (en) 2014-11-05
EP2805130A1 (en) 2014-11-26

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