SG11201810530YA - Deposition apparatus and physical vapor deposition chamber - Google Patents
Deposition apparatus and physical vapor deposition chamberInfo
- Publication number
- SG11201810530YA SG11201810530YA SG11201810530YA SG11201810530YA SG11201810530YA SG 11201810530Y A SG11201810530Y A SG 11201810530YA SG 11201810530Y A SG11201810530Y A SG 11201810530YA SG 11201810530Y A SG11201810530Y A SG 11201810530YA SG 11201810530Y A SG11201810530Y A SG 11201810530YA
- Authority
- SG
- Singapore
- Prior art keywords
- physical vapor
- vapor deposition
- chamber
- deposition
- deposition apparatus
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3488—Constructional details of particle beam apparatus not otherwise provided for, e.g. arrangement, mounting, housing, environment; special provisions for cleaning or maintenance of the apparatus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
- C23C14/566—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases using a load-lock chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32559—Protection means, e.g. coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32899—Multiple chambers, e.g. cluster tools
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3426—Material
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610407585.8A CN107488832B (en) | 2016-06-12 | 2016-06-12 | Depositing device and physical vapor deposition chamber |
PCT/CN2016/101565 WO2017215154A1 (en) | 2016-06-12 | 2016-10-09 | Deposition device and physical vapour deposition chamber |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201810530YA true SG11201810530YA (en) | 2018-12-28 |
Family
ID=60642968
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201810530YA SG11201810530YA (en) | 2016-06-12 | 2016-10-09 | Deposition apparatus and physical vapor deposition chamber |
Country Status (7)
Country | Link |
---|---|
US (1) | US10984994B2 (en) |
KR (1) | KR102078326B1 (en) |
CN (1) | CN107488832B (en) |
MY (1) | MY193979A (en) |
SG (1) | SG11201810530YA (en) |
TW (1) | TWI652364B (en) |
WO (1) | WO2017215154A1 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110344018B (en) * | 2018-04-08 | 2020-09-08 | 北京七星华创集成电路装备有限公司 | Multi-cathode continuous coating chamber |
KR20200135550A (en) * | 2018-04-18 | 2020-12-02 | 어플라이드 머티어리얼스, 인코포레이티드 | Two-piece shutter disc assembly with self-centering feature |
CN111986976B (en) * | 2019-05-22 | 2022-04-22 | 北京北方华创微电子装备有限公司 | Process chamber and semiconductor processing equipment |
US11492700B2 (en) * | 2019-10-18 | 2022-11-08 | Taiwan Semiconductor Manufacturing Co. | Shutter disk having lamp, power, and/or gas modules arranged at the first side of the shutter disk of thin film deposition chamber |
CN110938807B (en) * | 2019-11-26 | 2022-10-21 | 北京北方华创微电子装备有限公司 | Control method and system for returning wafer of PVD sputtering equipment to disc according to specified path |
FR3116151A1 (en) * | 2020-11-10 | 2022-05-13 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | METHOD FOR FORMING A USEFUL SUBSTRATE TRAPPING STRUCTURE |
CN114369804B (en) * | 2022-01-11 | 2023-10-13 | 北京北方华创微电子装备有限公司 | Thin film deposition method |
CN114318286A (en) * | 2022-01-27 | 2022-04-12 | 北京青禾晶元半导体科技有限责任公司 | Preparation device and preparation method of composite substrate |
CN115074692B (en) * | 2022-06-24 | 2023-10-13 | 北京北方华创微电子装备有限公司 | Semiconductor process equipment and process chamber thereof |
CN116695086B (en) * | 2023-06-30 | 2024-04-16 | 北京北方华创微电子装备有限公司 | Process chamber, semiconductor process equipment and thin film deposition method |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5131460A (en) * | 1991-10-24 | 1992-07-21 | Applied Materials, Inc. | Reducing particulates during semiconductor fabrication |
JPH0711442A (en) | 1993-06-28 | 1995-01-13 | Fuji Electric Co Ltd | Sputtering device for producing semiconductor |
JPH07335552A (en) * | 1994-06-08 | 1995-12-22 | Tel Varian Ltd | Treatment device |
JP3537269B2 (en) * | 1996-05-21 | 2004-06-14 | アネルバ株式会社 | Multi-chamber sputtering equipment |
US6110821A (en) | 1998-01-27 | 2000-08-29 | Applied Materials, Inc. | Method for forming titanium silicide in situ |
US6132805A (en) * | 1998-10-20 | 2000-10-17 | Cvc Products, Inc. | Shutter for thin-film processing equipment |
JP4902052B2 (en) * | 2001-04-05 | 2012-03-21 | キヤノンアネルバ株式会社 | Sputtering equipment |
JP2004277773A (en) * | 2003-03-13 | 2004-10-07 | Murata Mfg Co Ltd | Inline sputtering system |
JP4263133B2 (en) | 2004-04-12 | 2009-05-13 | ヒタチグローバルストレージテクノロジーズネザーランドビーブイ | Magnetic recording medium and magnetic recording / reproducing apparatus |
WO2006063308A2 (en) * | 2004-12-08 | 2006-06-15 | Symmorphix, Inc. | DEPOSITION OF LICoO2 |
WO2008141106A1 (en) * | 2007-05-09 | 2008-11-20 | Applied Materials, Inc. | Transfer chamber with vacuum extension for shutter disks |
WO2008149891A1 (en) * | 2007-06-04 | 2008-12-11 | Canon Anelva Corporation | Film forming apparatus |
JP2011108603A (en) * | 2009-11-20 | 2011-06-02 | Ulvac Japan Ltd | Thin film lithium secondary battery, and forming method of thin film lithium secondary battery |
WO2011077653A1 (en) * | 2009-12-25 | 2011-06-30 | キヤノンアネルバ株式会社 | Method for manufacturing electronic device, and sputtering apparatus |
CN201648508U (en) * | 2010-03-05 | 2010-11-24 | 凌嘉科技股份有限公司 | Horizontal step-type sputtering device |
US20110240462A1 (en) * | 2010-04-02 | 2011-10-06 | Semiconductor Energy Laboratory Co., Ltd. | Deposition apparatus and method for manufacturing semiconductor device |
CN102560388A (en) * | 2010-12-09 | 2012-07-11 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Magnetic control sputtering equipment |
WO2013094171A1 (en) | 2011-12-22 | 2013-06-27 | キヤノンアネルバ株式会社 | Method for forming srruo3 film |
CN103173730B (en) | 2011-12-23 | 2015-04-15 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Magnetron sputtering apparatus and process |
CN103668095B (en) * | 2013-12-26 | 2015-12-02 | 广东工业大学 | A kind of high power pulse plasma enhancing combined magnetic-controlled sputter deposition apparatus and using method thereof |
-
2016
- 2016-06-12 CN CN201610407585.8A patent/CN107488832B/en active Active
- 2016-07-29 TW TW105124061A patent/TWI652364B/en active
- 2016-10-09 SG SG11201810530YA patent/SG11201810530YA/en unknown
- 2016-10-09 KR KR1020177035747A patent/KR102078326B1/en active IP Right Grant
- 2016-10-09 WO PCT/CN2016/101565 patent/WO2017215154A1/en active Application Filing
- 2016-10-09 MY MYPI2018002526A patent/MY193979A/en unknown
- 2016-10-09 US US15/551,493 patent/US10984994B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US10984994B2 (en) | 2021-04-20 |
KR102078326B1 (en) | 2020-04-07 |
WO2017215154A1 (en) | 2017-12-21 |
CN107488832A (en) | 2017-12-19 |
US20180247799A1 (en) | 2018-08-30 |
TW201742939A (en) | 2017-12-16 |
KR20180018554A (en) | 2018-02-21 |
CN107488832B (en) | 2019-11-29 |
MY193979A (en) | 2022-11-04 |
TWI652364B (en) | 2019-03-01 |
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