SG11201808609YA - System and method for imaging a surface defect on an object - Google Patents
System and method for imaging a surface defect on an objectInfo
- Publication number
- SG11201808609YA SG11201808609YA SG11201808609YA SG11201808609YA SG11201808609YA SG 11201808609Y A SG11201808609Y A SG 11201808609YA SG 11201808609Y A SG11201808609Y A SG 11201808609YA SG 11201808609Y A SG11201808609Y A SG 11201808609YA SG 11201808609Y A SG11201808609Y A SG 11201808609YA
- Authority
- SG
- Singapore
- Prior art keywords
- surface defect
- singapore
- connexis
- sensor assembly
- international
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/40—Analysis of texture
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10028—Range image; Depth image; 3D point clouds
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20016—Hierarchical, coarse-to-fine, multiscale or multiresolution image processing; Pyramid transform
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Health & Medical Sciences (AREA)
- Signal Processing (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Multimedia (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Ink Jet (AREA)
- Image Processing (AREA)
Abstract
INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property -, Organization MD 1111101110101011111 HO 111110111010 HE 01111011101101111111011 III International Bureau ... ..... ..Yi j (10) International Publication Number (43) ..... ..... International Publication Date WO 2017/171651 Al 5 October 2017 (05.10.2017) WI P0 I P CT (51) International Patent Classification: focomm Research, 1 Fusionopolis Way, #21-01, Connexis, GO1N 21/88 (2006.01) G01B 11/30 (2006.01) South Tower, Singapore 138632 (SG). (21) International Application Number: (74) Agent: SPRUSON & FERGUSON (ASIA) PTE LTD; PCT/SG2017/050175 P.O. Box 1531, Robinson Road Post Office, Singapore (22) International Filing Date: 903031 (SG). 30 March 2017 (30.03.2017) (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, (25) Filing Language: English AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, (26) Publication Language: English BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, (30) Priority Data: HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, 10201602496P 30 March 2016 (30.03.2016) SG KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, (71) Applicant: AGENCY FOR SCIENCE, TECHNOLOGY MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, AND RESEARCH [SG/SG]; 1 Fusionopolis Way, #20-10 NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, Connexis North Tower, Singapore 138632 (SG). RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, (72) Inventors: CHEN, Wenyu; c/o PKM, Institute for In- ZA, ZM, ZW. focomm Research, 1 Fusionopolis Way, #21-01, Connexis, South Tower, Singapore 138632 (SG). XIONG, Wei; c/o (84) Designated States (unless otherwise indicated, for every PKM, Institute for Infocomm Research, 1 Fusionopolis kind of regional protection available): ARIPO (BW, GH, Way, #21-01, Connexis, South Tower, Singapore 138632 GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, (SG). DU, Jia; c/o PKM, Institute for Infocomm Research, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, — _ 1 Fusionopolis Way, #21-01, Connexis, South Tower, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, Singapore 138632 (SG). CHENG, Jierong; c/o PKM, In- DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, stitute for Infocomm Research, 1 Fusionopolis Way, #21- LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, = 01, Connexis, South Tower, Singapore 138632 (SG). SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, WAN, Teck Sun Marcus; c/o PKM, Institute for In- GW, KM, ML, MR, NE, SN, TD, TG). = = [Continued on next page] (54) Title: SYSTEM AND METHOD FOR IMAGING A SURFACE DEFECT ON AN OBJECT = (57) : A system and a method for imaging a _ f\j Capturing, using a sensor assembly surface defect on an object are provided. The system in- = = 402 connected to an actuator, at least one image of the object dudes an actuator, a sensor assembly connected to the actuator, and a processor configured to control the actu- ator and the sensor assembly. The sensor assembly in- cludes at least one sensor configured to capture at least one image of the object. The processor is configured to control the actuator and the sensor assembly to identify - 4 = , Identifying using a processor configured to control = f \) the actuator and the sensor assembly, a region of a region of interest associated with the surface defect = = 404 interest associated with the surface defect using an image of the object using an image of the object and to repeatedly identify at least one subsequent region of interest associated the surface defect using at least a preceding region of interest such that the surface defect is identified ac- = Iwith _ Repeatedly identifying at least one subsequent cording to a predetermined criterion. _ region of interest associated with the surface defect 1\ i using at least a preceding region of interest such 1-1 406 that the surface defect is identified according to a predetermined criterion 1-1 ir) ,tD ( it FIG. 4 1-1 IN 400 1-1 -.... IN 1-1 0 ei O WO 2017/171651 Al MIDEDIMOMOIDERDEEMOMOINEHEMEM011111110110111111 Declarations under Rule 4.17: Published: — of inventorship (Rule 4.17(iv)) — with international search report (Art. 21(3))
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG10201602496P | 2016-03-30 | ||
PCT/SG2017/050175 WO2017171651A1 (en) | 2016-03-30 | 2017-03-30 | System and method for imaging a surface defect on an object |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201808609YA true SG11201808609YA (en) | 2018-10-30 |
Family
ID=59964979
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201808609YA SG11201808609YA (en) | 2016-03-30 | 2017-03-30 | System and method for imaging a surface defect on an object |
SG10201913148YA SG10201913148YA (en) | 2016-03-30 | 2017-03-30 | System and method for imaging a surface defect on an object |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201913148YA SG10201913148YA (en) | 2016-03-30 | 2017-03-30 | System and method for imaging a surface defect on an object |
Country Status (3)
Country | Link |
---|---|
US (1) | US10823681B2 (en) |
SG (2) | SG11201808609YA (en) |
WO (1) | WO2017171651A1 (en) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102017107270A1 (en) * | 2017-04-05 | 2018-10-11 | Asmec Advanced Surface Mechanics Gmbh | Method for the analysis of surface measurements |
US10706524B2 (en) | 2017-11-28 | 2020-07-07 | Henkel IP & Holding GmbH | Systems and methods for analyzing stained fabric articles |
CN108133473B (en) * | 2017-12-21 | 2021-10-01 | 江南大学 | Warp-knitted jacquard fabric defect detection method based on Gabor filtering and deep neural network |
CN108010029B (en) * | 2017-12-27 | 2020-11-03 | 江南大学 | Fabric defect detection method based on deep learning and support vector data description |
JP7073785B2 (en) * | 2018-03-05 | 2022-05-24 | オムロン株式会社 | Image inspection equipment, image inspection method and image inspection program |
CN108582416B (en) * | 2018-04-25 | 2020-09-08 | 湖南筑巢智能科技有限公司 | Manufacturing method of large and medium ceramic ware |
CN108871197B (en) * | 2018-04-27 | 2020-07-28 | 中国石油大学(北京) | Displacement field measuring method, device, equipment and storage medium for material surface |
CN108507476B (en) * | 2018-04-27 | 2020-08-07 | 中国石油大学(北京) | Displacement field measuring method, device, equipment and storage medium for material surface |
CN109886912B (en) * | 2018-10-09 | 2021-02-05 | 中国计量大学 | Method for detecting surface defects of thrust bearing retainer |
CN109410192B (en) * | 2018-10-18 | 2020-11-03 | 首都师范大学 | Fabric defect detection method and device based on multi-texture grading fusion |
WO2020121784A1 (en) * | 2018-12-11 | 2020-06-18 | 本田技研工業株式会社 | Workpiece inspection device and workpiece inspection method |
US11210770B2 (en) | 2019-03-15 | 2021-12-28 | Hitachi, Ltd. | AI-based inspection in transportation |
CN110310258B (en) * | 2019-06-18 | 2022-03-29 | 深圳大学 | Method for evaluating corrosion degree of concrete member steel bar |
DE102019219269A1 (en) * | 2019-12-10 | 2021-06-10 | Peri Gmbh | Computer-aided method and control device for determining the quality of fair-faced concrete |
JP2022048904A (en) * | 2020-09-15 | 2022-03-28 | 株式会社アイシン | Abnormality detecting device, abnormality detecting program and abnormality detecting system |
CN112434694B (en) * | 2020-11-20 | 2021-07-16 | 哈尔滨市科佳通用机电股份有限公司 | Method and system for identifying damage fault of outer ring of front cover of rolling bearing |
JP2022187661A (en) * | 2021-06-08 | 2022-12-20 | 富士フイルムビジネスイノベーション株式会社 | Surface inspection apparatus and program |
CN114581404B (en) * | 2022-03-03 | 2022-08-30 | 常州市宏发纵横新材料科技股份有限公司 | Broken yarn detection method for interweaving binding yarns |
CN114663403B (en) * | 2022-03-25 | 2022-11-18 | 北京城建设计发展集团股份有限公司 | Prefabricated part assembling surface local defect identification method based on dense scanning data |
CN114612469B (en) * | 2022-05-09 | 2022-08-12 | 武汉中导光电设备有限公司 | Product defect detection method, device and equipment and readable storage medium |
CN116165216B (en) * | 2023-03-16 | 2023-08-04 | 苏州鼎纳自动化技术有限公司 | Liquid crystal display micro scratch flaw 3D detection method, system and computing equipment |
CN116609345B (en) * | 2023-07-19 | 2023-10-17 | 北京阿丘机器人科技有限公司 | Battery cover plate defect detection method, device, equipment and storage medium |
CN117214183B (en) * | 2023-11-07 | 2024-01-30 | 山东泗水金立得纸业有限公司 | Paper defect detection method based on machine vision |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
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US5517027A (en) * | 1993-06-08 | 1996-05-14 | Mitsubishi Denki Kabushiki Kaisha | Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these |
CN1247987C (en) * | 2001-07-09 | 2006-03-29 | 山田吉郎 | Surface inspection apparatus and method |
DE10343148A1 (en) * | 2003-09-18 | 2005-04-21 | Leica Microsystems | Method and device for inspecting a wafer |
US8244025B2 (en) * | 2006-03-20 | 2012-08-14 | Siemens Energy, Inc. | Method of coalescing information about inspected objects |
EP2006804A1 (en) * | 2007-06-22 | 2008-12-24 | Siemens Aktiengesellschaft | Method for optical inspection of a matt surface and apparatus for applying this method |
US8681211B2 (en) * | 2009-09-22 | 2014-03-25 | Cyberoptics Corporation | High speed optical inspection system with adaptive focusing |
US8111905B2 (en) * | 2009-10-29 | 2012-02-07 | Mitutoyo Corporation | Autofocus video tool and method for precise dimensional inspection |
US10068326B2 (en) * | 2016-03-18 | 2018-09-04 | Siemens Energy, Inc. | System and method for enhancing visual inspection of an object |
US10783624B2 (en) * | 2016-07-18 | 2020-09-22 | Instrumental, Inc. | Modular optical inspection station |
-
2017
- 2017-03-30 SG SG11201808609YA patent/SG11201808609YA/en unknown
- 2017-03-30 US US16/090,170 patent/US10823681B2/en active Active
- 2017-03-30 SG SG10201913148YA patent/SG10201913148YA/en unknown
- 2017-03-30 WO PCT/SG2017/050175 patent/WO2017171651A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
US10823681B2 (en) | 2020-11-03 |
SG10201913148YA (en) | 2020-02-27 |
US20190120770A1 (en) | 2019-04-25 |
WO2017171651A1 (en) | 2017-10-05 |
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