SG11201808609YA - System and method for imaging a surface defect on an object - Google Patents

System and method for imaging a surface defect on an object

Info

Publication number
SG11201808609YA
SG11201808609YA SG11201808609YA SG11201808609YA SG11201808609YA SG 11201808609Y A SG11201808609Y A SG 11201808609YA SG 11201808609Y A SG11201808609Y A SG 11201808609YA SG 11201808609Y A SG11201808609Y A SG 11201808609YA SG 11201808609Y A SG11201808609Y A SG 11201808609YA
Authority
SG
Singapore
Prior art keywords
surface defect
singapore
connexis
sensor assembly
international
Prior art date
Application number
SG11201808609YA
Inventor
Wenyu Chen
Wei Xiong
Jia Du
Jierong Cheng
Teck Sun Marcus Wan
Original Assignee
Agency Science Tech & Res
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency Science Tech & Res filed Critical Agency Science Tech & Res
Publication of SG11201808609YA publication Critical patent/SG11201808609YA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/40Analysis of texture
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/20Image preprocessing
    • G06V10/25Determination of region of interest [ROI] or a volume of interest [VOI]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8867Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10028Range image; Depth image; 3D point clouds
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20016Hierarchical, coarse-to-fine, multiscale or multiresolution image processing; Pyramid transform
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Ink Jet (AREA)
  • Image Processing (AREA)

Abstract

INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property -, Organization MD 1111101110101011111 HO 111110111010 HE 01111011101101111111011 III International Bureau ... ..... ..Yi j (10) International Publication Number (43) ..... ..... International Publication Date WO 2017/171651 Al 5 October 2017 (05.10.2017) WI P0 I P CT (51) International Patent Classification: focomm Research, 1 Fusionopolis Way, #21-01, Connexis, GO1N 21/88 (2006.01) G01B 11/30 (2006.01) South Tower, Singapore 138632 (SG). (21) International Application Number: (74) Agent: SPRUSON & FERGUSON (ASIA) PTE LTD; PCT/SG2017/050175 P.O. Box 1531, Robinson Road Post Office, Singapore (22) International Filing Date: 903031 (SG). 30 March 2017 (30.03.2017) (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, (25) Filing Language: English AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, (26) Publication Language: English BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, (30) Priority Data: HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, 10201602496P 30 March 2016 (30.03.2016) SG KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, (71) Applicant: AGENCY FOR SCIENCE, TECHNOLOGY MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, AND RESEARCH [SG/SG]; 1 Fusionopolis Way, #20-10 NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, Connexis North Tower, Singapore 138632 (SG). RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, (72) Inventors: CHEN, Wenyu; c/o PKM, Institute for In- ZA, ZM, ZW. focomm Research, 1 Fusionopolis Way, #21-01, Connexis, South Tower, Singapore 138632 (SG). XIONG, Wei; c/o (84) Designated States (unless otherwise indicated, for every PKM, Institute for Infocomm Research, 1 Fusionopolis kind of regional protection available): ARIPO (BW, GH, Way, #21-01, Connexis, South Tower, Singapore 138632 GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, (SG). DU, Jia; c/o PKM, Institute for Infocomm Research, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, — _ 1 Fusionopolis Way, #21-01, Connexis, South Tower, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, Singapore 138632 (SG). CHENG, Jierong; c/o PKM, In- DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, stitute for Infocomm Research, 1 Fusionopolis Way, #21- LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, = 01, Connexis, South Tower, Singapore 138632 (SG). SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, WAN, Teck Sun Marcus; c/o PKM, Institute for In- GW, KM, ML, MR, NE, SN, TD, TG). = = [Continued on next page] (54) Title: SYSTEM AND METHOD FOR IMAGING A SURFACE DEFECT ON AN OBJECT = (57) : A system and a method for imaging a _ f\j Capturing, using a sensor assembly surface defect on an object are provided. The system in- = = 402 connected to an actuator, at least one image of the object dudes an actuator, a sensor assembly connected to the actuator, and a processor configured to control the actu- ator and the sensor assembly. The sensor assembly in- cludes at least one sensor configured to capture at least one image of the object. The processor is configured to control the actuator and the sensor assembly to identify - 4 = , Identifying using a processor configured to control = f \) the actuator and the sensor assembly, a region of a region of interest associated with the surface defect = = 404 interest associated with the surface defect using an image of the object using an image of the object and to repeatedly identify at least one subsequent region of interest associated the surface defect using at least a preceding region of interest such that the surface defect is identified ac- = Iwith _ Repeatedly identifying at least one subsequent cording to a predetermined criterion. _ region of interest associated with the surface defect 1\ i using at least a preceding region of interest such 1-1 406 that the surface defect is identified according to a predetermined criterion 1-1 ir) ,tD ( it FIG. 4 1-1 IN 400 1-1 -.... IN 1-1 0 ei O WO 2017/171651 Al MIDEDIMOMOIDERDEEMOMOINEHEMEM011111110110111111 Declarations under Rule 4.17: Published: — of inventorship (Rule 4.17(iv)) — with international search report (Art. 21(3))
SG11201808609YA 2016-03-30 2017-03-30 System and method for imaging a surface defect on an object SG11201808609YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SG10201602496P 2016-03-30
PCT/SG2017/050175 WO2017171651A1 (en) 2016-03-30 2017-03-30 System and method for imaging a surface defect on an object

Publications (1)

Publication Number Publication Date
SG11201808609YA true SG11201808609YA (en) 2018-10-30

Family

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Family Applications (2)

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SG11201808609YA SG11201808609YA (en) 2016-03-30 2017-03-30 System and method for imaging a surface defect on an object
SG10201913148YA SG10201913148YA (en) 2016-03-30 2017-03-30 System and method for imaging a surface defect on an object

Family Applications After (1)

Application Number Title Priority Date Filing Date
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Country Status (3)

Country Link
US (1) US10823681B2 (en)
SG (2) SG11201808609YA (en)
WO (1) WO2017171651A1 (en)

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CN108133473B (en) * 2017-12-21 2021-10-01 江南大学 Warp-knitted jacquard fabric defect detection method based on Gabor filtering and deep neural network
CN108010029B (en) * 2017-12-27 2020-11-03 江南大学 Fabric defect detection method based on deep learning and support vector data description
JP7073785B2 (en) * 2018-03-05 2022-05-24 オムロン株式会社 Image inspection equipment, image inspection method and image inspection program
CN108582416B (en) * 2018-04-25 2020-09-08 湖南筑巢智能科技有限公司 Manufacturing method of large and medium ceramic ware
CN108871197B (en) * 2018-04-27 2020-07-28 中国石油大学(北京) Displacement field measuring method, device, equipment and storage medium for material surface
CN108507476B (en) * 2018-04-27 2020-08-07 中国石油大学(北京) Displacement field measuring method, device, equipment and storage medium for material surface
CN109886912B (en) * 2018-10-09 2021-02-05 中国计量大学 Method for detecting surface defects of thrust bearing retainer
CN109410192B (en) * 2018-10-18 2020-11-03 首都师范大学 Fabric defect detection method and device based on multi-texture grading fusion
WO2020121784A1 (en) * 2018-12-11 2020-06-18 本田技研工業株式会社 Workpiece inspection device and workpiece inspection method
US11210770B2 (en) 2019-03-15 2021-12-28 Hitachi, Ltd. AI-based inspection in transportation
CN110310258B (en) * 2019-06-18 2022-03-29 深圳大学 Method for evaluating corrosion degree of concrete member steel bar
DE102019219269A1 (en) * 2019-12-10 2021-06-10 Peri Gmbh Computer-aided method and control device for determining the quality of fair-faced concrete
JP2022048904A (en) * 2020-09-15 2022-03-28 株式会社アイシン Abnormality detecting device, abnormality detecting program and abnormality detecting system
CN112434694B (en) * 2020-11-20 2021-07-16 哈尔滨市科佳通用机电股份有限公司 Method and system for identifying damage fault of outer ring of front cover of rolling bearing
JP2022187661A (en) * 2021-06-08 2022-12-20 富士フイルムビジネスイノベーション株式会社 Surface inspection apparatus and program
CN114581404B (en) * 2022-03-03 2022-08-30 常州市宏发纵横新材料科技股份有限公司 Broken yarn detection method for interweaving binding yarns
CN114663403B (en) * 2022-03-25 2022-11-18 北京城建设计发展集团股份有限公司 Prefabricated part assembling surface local defect identification method based on dense scanning data
CN114612469B (en) * 2022-05-09 2022-08-12 武汉中导光电设备有限公司 Product defect detection method, device and equipment and readable storage medium
CN116165216B (en) * 2023-03-16 2023-08-04 苏州鼎纳自动化技术有限公司 Liquid crystal display micro scratch flaw 3D detection method, system and computing equipment
CN116609345B (en) * 2023-07-19 2023-10-17 北京阿丘机器人科技有限公司 Battery cover plate defect detection method, device, equipment and storage medium
CN117214183B (en) * 2023-11-07 2024-01-30 山东泗水金立得纸业有限公司 Paper defect detection method based on machine vision

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Also Published As

Publication number Publication date
US10823681B2 (en) 2020-11-03
SG10201913148YA (en) 2020-02-27
US20190120770A1 (en) 2019-04-25
WO2017171651A1 (en) 2017-10-05

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