SG11201807177VA - Apparatus for exhaust cooling - Google Patents

Apparatus for exhaust cooling

Info

Publication number
SG11201807177VA
SG11201807177VA SG11201807177VA SG11201807177VA SG11201807177VA SG 11201807177V A SG11201807177V A SG 11201807177VA SG 11201807177V A SG11201807177V A SG 11201807177VA SG 11201807177V A SG11201807177V A SG 11201807177VA SG 11201807177V A SG11201807177V A SG 11201807177VA
Authority
SG
Singapore
Prior art keywords
california
international
exhaust
exhaust cooling
cooling apparatus
Prior art date
Application number
SG11201807177VA
Inventor
S Cox Michael
T West Brian
W Ho Dustin
m johnson Roger
Rozenzon Yan
Somanna Dinkesh
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of SG11201807177VA publication Critical patent/SG11201807177VA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32816Pressure
    • H01J37/32834Exhausting
    • H01J37/32844Treating effluent gases
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67063Apparatus for fluid treatment for etching
    • H01L21/67069Apparatus for fluid treatment for etching for drying etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/002Cooling arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/18Vacuum control means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30Electron or ion beam tubes for processing objects
    • H01J2237/317Processing objects on a microscale
    • H01J2237/31701Ion implantation
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02CCAPTURE, STORAGE, SEQUESTRATION OR DISPOSAL OF GREENHOUSE GASES [GHG]
    • Y02C20/00Capture or disposal of greenhouse gases
    • Y02C20/30Capture or disposal of greenhouse gases of perfluorocarbons [PFC], hydrofluorocarbons [HFC] or sulfur hexafluoride [SF6]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Drying Of Semiconductors (AREA)
  • Exhaust Gas After Treatment (AREA)
  • Chemical Vapour Deposition (AREA)
  • Treating Waste Gases (AREA)
  • Tires In General (AREA)

Abstract

INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property -, Organization 11111111011110111010101111101011111011101011101111100111111101111101111011111 International Bureau 0.. .... .. ..... ..,,,i (10) International Publication Number (43) International Publication Date WO 2017/177398 Al 19 October 2017(19.10.2017) WIPO I PCT (51) International Patent Classification: No. 48 Jia Zhichun Road, Haidian District, Beijing 100098 H01L 21/02 (2006.01) (CN). (21) International Application Number: (81) Designated States (unless otherwise indicated, for every PCT/CN2016/079153 kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, (22) International Filing Date: BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, 13 April 2016 (13.04.2016) DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, (25) Filing Language: English HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, (26) Publication Language: English MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, (71) Applicant: APPLIED MATERIALS, INC. [US/US]; PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, 3050 Bowers Avenue, Santa Clara, California 95054 (US). SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (72) Inventor; and (71) Applicant (for KP only): DUSTIN W., Ho [US/CN]; Rm (84) Designated States (unless otherwise indicated, for every 904, No. 2, Alley 99, FangLi Road, Shanghai 201802 kind of regional protection available): ARIPO (BW, GH, (CN). GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, (72) Inventors: MICHAEL S., Cox; 7090 Church, St.Gilroy, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, California 95020 (US). BRIAN T., West; 4780 Grimsby DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, Drive, San Jose, California 95130 (US). ROGER M., LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, _ Johnson; 1242 Deep Creek Road, Livermore, California SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, — 94550 (US). YAN, Rozenzon; 3383 Lubich Drive, Moun- GW, KM, ML, MR, NE, SN, TD, TG). _ taro View, California 94040 (US). DINKESH, Somanna; 400 East Remington Dr.Apt.D313, Sunnyvale, California Published: = 94087 (US). — with international search report (Art. 21(3)) (74) Agent: LECOME INTELLECTUAL PROPERTY _ — AGENT LTD.; Floor 16, Tower B of IN.DO Mansion, = = = = = = = = (54) Title: APPARATUS FOR EXHAUST COOLING = = — i ,— 170 = 190 117 I 193---„, 100 192 / 194 196 I I I 11 .4 -191 J r ----'- GC C:7 M Ir ... ' Ir...' 114 - ,-1 -115 -182 Fig. 1 IN 1-1 (57) : An exhaust cooling apparatus (117) includes at least one cooling plate (314,412,514,614,814,914) for introducing 0 turbulence to the exhaust flowing within the exhaust cooling apparatus (117). The device (318,518,618,818,918) may be a plurality \" of fins (320,322,324,326,328), a cylinder (518,618) with a curved top portion (544,644), or a diffuser (824,925) with angled blades C (826,926). The turbulent flow of the exhaust within the exhaust cooling apparatus (117) causes particles to drop out of the exhaust, minimizing particles forming in equipment downstream of the exhaust cooling apparatus (117).
SG11201807177VA 2016-04-13 2016-04-13 Apparatus for exhaust cooling SG11201807177VA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2016/079153 WO2017177398A1 (en) 2016-04-13 2016-04-13 Apparatus for exhaust cooling

Publications (1)

Publication Number Publication Date
SG11201807177VA true SG11201807177VA (en) 2018-10-30

Family

ID=60039529

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201807177VA SG11201807177VA (en) 2016-04-13 2016-04-13 Apparatus for exhaust cooling

Country Status (7)

Country Link
US (1) US11114285B2 (en)
JP (1) JP2019514222A (en)
KR (1) KR102520578B1 (en)
CN (1) CN108701583B (en)
SG (1) SG11201807177VA (en)
TW (1) TWI679698B (en)
WO (1) WO2017177398A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11221182B2 (en) 2018-07-31 2022-01-11 Applied Materials, Inc. Apparatus with multistaged cooling
US11306971B2 (en) 2018-12-13 2022-04-19 Applied Materials, Inc. Heat exchanger with multistaged cooling
FR3102680B1 (en) * 2019-11-06 2021-11-12 Pfeiffer Vacuum Trap for vacuum line, installation and use
CN113990730B (en) * 2020-07-27 2023-10-31 中微半导体设备(上海)股份有限公司 Plasma processing apparatus, gas flow regulating cover and gas flow regulating method thereof
CN115050623A (en) * 2021-03-08 2022-09-13 中微半导体设备(上海)股份有限公司 Plasma processing device

Family Cites Families (82)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2290323A (en) * 1941-05-10 1942-07-21 Clarence E Graham Water and gas separator
US2514894A (en) * 1947-12-04 1950-07-11 Ingersoll Rand Co Heat exchanger
US3081068A (en) * 1959-10-16 1963-03-12 Milleron Norman Cold trap
SE7309576L (en) * 1973-07-06 1975-01-07 Seco Tools Ab
US5456945A (en) 1988-12-27 1995-10-10 Symetrix Corporation Method and apparatus for material deposition
EP0393723B1 (en) 1989-04-21 1997-07-16 Asahi Kogaku Kogyo Kabushiki Kaisha A functional paper and its use as a deodorant, filtering medium or adsorbent
US5141714A (en) * 1989-08-01 1992-08-25 Kabushiki Kaisha Riken Exhaust gas cleaner
US5211729A (en) * 1991-08-30 1993-05-18 Sematech, Inc. Baffle/settling chamber for a chemical vapor deposition equipment
US5422081A (en) * 1992-11-25 1995-06-06 Tokyo Electron Kabushiki Kaisha Trap device for vapor phase reaction apparatus
JP3236137B2 (en) 1993-07-30 2001-12-10 富士通株式会社 Semiconductor element cooling device
KR100353020B1 (en) 1993-12-28 2003-01-10 쇼와 덴코 가부시키가이샤 Multilayer Heat Exchanger
US5453125A (en) * 1994-02-17 1995-09-26 Krogh; Ole D. ECR plasma source for gas abatement
US5427610A (en) * 1994-05-27 1995-06-27 Nec Electronics, Inc. Photoresist solvent fume exhaust scrubber
JP3246708B2 (en) * 1995-05-02 2002-01-15 東京エレクトロン株式会社 Trap device and unreacted process gas exhaust mechanism using the same
JP2872637B2 (en) * 1995-07-10 1999-03-17 アプライド マテリアルズ インコーポレイテッド Microwave plasma based applicator
EP0770417B1 (en) * 1995-08-14 1998-12-02 Ebara Corporation Apparatus for separating solids from gas streams
US5709263A (en) 1995-10-19 1998-01-20 Silicon Graphics, Inc. High performance sinusoidal heat sink for heat removal from electronic equipment
US5758418A (en) 1996-01-11 1998-06-02 International Business Machines Corporation Method of making an ultra high-density, high-performance heat sink
US5820641A (en) * 1996-02-09 1998-10-13 Mks Instruments, Inc. Fluid cooled trap
US5928426A (en) * 1996-08-08 1999-07-27 Novellus Systems, Inc. Method and apparatus for treating exhaust gases from CVD, PECVD or plasma etch reactors
US6156107A (en) * 1996-11-13 2000-12-05 Tokyo Electron Limited Trap apparatus
JP3991375B2 (en) * 1996-11-13 2007-10-17 東京エレクトロン株式会社 Trap device
US6015463A (en) * 1997-02-14 2000-01-18 Advanced Micro Devices, Inc. Method and system for trapping contaminants formed during chemical vapor deposition processing of semiconductor wafers
US5946190A (en) 1997-08-29 1999-08-31 Hewlett-Packard Company Ducted high aspect ratio heatsink assembly
US5937517A (en) 1997-11-12 1999-08-17 Eastman Kodak Company Method of manufacturing bonded dual extruded, high fin density heat sinks
US5933325A (en) 1998-06-17 1999-08-03 Hon Hai Precision Ind. Co., Ltd. Detachable fastening device for use with heat sink
US6217937B1 (en) * 1998-07-15 2001-04-17 Cornell Research Foundation, Inc. High throughput OMVPE apparatus
US5927386A (en) 1998-08-24 1999-07-27 Macase Industrial Group Ga., Inc. Computer hard drive heat sink assembly
JP2000114185A (en) * 1998-10-05 2000-04-21 Mitsubishi Electric Corp Trapping apparatus for unreacted sublimation gas, and its cleaning method
US20010031229A1 (en) * 1998-10-20 2001-10-18 Spjut Reed E. UV-enhanced, in-line, infrared phosphorous diffusion furnace
US6308771B1 (en) * 1998-10-29 2001-10-30 Advanced Thermal Solutions, Inc. High performance fan tail heat exchanger
US6238514B1 (en) * 1999-02-18 2001-05-29 Mks Instruments, Inc. Apparatus and method for removing condensable aluminum vapor from aluminum etch effluent
US6197119B1 (en) * 1999-02-18 2001-03-06 Mks Instruments, Inc. Method and apparatus for controlling polymerized teos build-up in vacuum pump lines
JP2000256856A (en) * 1999-03-11 2000-09-19 Tokyo Electron Ltd Treating device, vacuum exhaust system for treating device, vacuum cvd device, vacuum exhaust system for vacuum cvd device and trapping device
US6241793B1 (en) * 1999-08-02 2001-06-05 Taiwan Semiconductor Manufacturing Company, Ltd Cold trap equipped with curvilinear cooling plate
US6423284B1 (en) 1999-10-18 2002-07-23 Advanced Technology Materials, Inc. Fluorine abatement using steam injection in oxidation treatment of semiconductor manufacturing effluent gases
KR100688900B1 (en) * 1999-12-15 2007-03-08 캐논 아네르바 가부시키가이샤 Exhaust gas filtration apparatus, auxiliary filtration apparatus and trap apparatus
JP2002011319A (en) * 2000-06-29 2002-01-15 Kankyo Gijutsu Kaihatsu Kenkyu Kiko:Kk Exhaust gas cooling apparatus
US6488745B2 (en) * 2001-03-23 2002-12-03 Mks Instruments, Inc. Trap apparatus and method for condensable by-products of deposition reactions
KR20020086978A (en) * 2001-05-12 2002-11-21 삼성전자 주식회사 Cooling trap for cooling exhaust gas and Exhaust apparatus of facility for manufacturing semiconductor device having its
JP4236882B2 (en) * 2001-08-01 2009-03-11 東京エレクトロン株式会社 Gas processing apparatus and gas processing method
US6528420B1 (en) * 2002-01-18 2003-03-04 Chartered Semiconductor Manufacturing Ltd. Double acting cold trap
US6821347B2 (en) * 2002-07-08 2004-11-23 Micron Technology, Inc. Apparatus and method for depositing materials onto microelectronic workpieces
JP2004063866A (en) * 2002-07-30 2004-02-26 Nec Kansai Ltd Exhaust gas treatment apparatus
JP2005052786A (en) * 2003-08-07 2005-03-03 Japan Pionics Co Ltd Treating apparatus of exhaust gas
US7044997B2 (en) * 2003-09-24 2006-05-16 Micron Technology, Inc. Process byproduct trap, methods of use, and system including same
JP4642379B2 (en) * 2004-05-12 2011-03-02 東京エレクトロン株式会社 Exhaust collector
KR100631924B1 (en) * 2005-01-24 2006-10-04 삼성전자주식회사 Apparatus for caching residual products in semiconductor equipment
KR100558562B1 (en) * 2005-02-01 2006-03-13 삼성전자주식회사 Apparatus for caching products in semiconductor equipment
JP4592746B2 (en) * 2005-03-02 2010-12-08 株式会社日立国際電気 Semiconductor manufacturing apparatus, semiconductor device manufacturing method, and exhaust trap apparatus
GB0506089D0 (en) * 2005-03-24 2005-05-04 Boc Group Plc Trap device
KR100621660B1 (en) * 2005-07-01 2006-09-11 주식회사 뉴프로텍 Apparatus for trapping semiconductor residual product
JP5128168B2 (en) * 2006-04-24 2013-01-23 三菱電線工業株式会社 Exhaust system
US7988755B2 (en) * 2006-05-04 2011-08-02 Milaebo Co., Ltd. Byproduct collecting apparatus of semiconductor apparatus
JP2008082285A (en) * 2006-09-28 2008-04-10 Techno Takatsuki Co Ltd Dust collecting mechanism of air pump
JP5023646B2 (en) * 2006-10-10 2012-09-12 東京エレクトロン株式会社 Exhaust system, collection unit, and processing apparatus using the same
US8246705B2 (en) * 2009-04-23 2012-08-21 Bain Charles E Exhaust air mist separator
JP5136574B2 (en) * 2009-05-01 2013-02-06 東京エレクトロン株式会社 Plasma processing apparatus and plasma processing method
WO2012139125A2 (en) * 2011-04-07 2012-10-11 Life Technologies Corporation System and methods for making and processing emulsions
JP5874469B2 (en) * 2012-03-19 2016-03-02 東京エレクトロン株式会社 Trap apparatus and film forming apparatus
US9057388B2 (en) * 2012-03-21 2015-06-16 International Business Machines Corporation Vacuum trap
JP6007715B2 (en) * 2012-03-29 2016-10-12 東京エレクトロン株式会社 Trap mechanism, exhaust system, and film forming apparatus
US9867238B2 (en) * 2012-04-26 2018-01-09 Applied Materials, Inc. Apparatus for treating an exhaust gas in a foreline
US20130340681A1 (en) * 2012-06-21 2013-12-26 Tel Solar Ag Reduced pressure processing chamber and exhaust arrangement
US20150247658A1 (en) * 2012-09-26 2015-09-03 Trane International Inc. Low refrigerant high performing subcooler
JP6075381B2 (en) * 2012-10-25 2017-02-08 トヨタ自動車株式会社 Heat exchanger
US20140262033A1 (en) * 2013-03-13 2014-09-18 Applied Materials, Inc. Gas sleeve for foreline plasma abatement system
WO2014158529A1 (en) * 2013-03-14 2014-10-02 Kci Licensing, Inc. A fluid collection canister with integrated moisture trap
TWI672760B (en) * 2013-03-15 2019-09-21 美商應用材料股份有限公司 Temperature control systems and methods for small batch substrate handling systems
JP6196481B2 (en) * 2013-06-24 2017-09-13 株式会社荏原製作所 Exhaust gas treatment equipment
US20150187562A1 (en) 2013-12-27 2015-07-02 Taiwan Semiconductor Manufacturing Company Ltd. Abatement water flow control system and operation method thereof
CN203779727U (en) * 2014-02-07 2014-08-20 宁夏恒源晟达橡胶制品有限公司 Temperature-changing serial-connection manufacture device for manufacturing recycled powder by utilizing waste tyres
US9240308B2 (en) * 2014-03-06 2016-01-19 Applied Materials, Inc. Hall effect enhanced capacitively coupled plasma source, an abatement system, and vacuum processing system
KR102351585B1 (en) 2014-03-06 2022-01-13 어플라이드 머티어리얼스, 인코포레이티드 Plasma foreline thermal reactor system
US10115571B2 (en) 2014-06-04 2018-10-30 Applied Materials, Inc. Reagent delivery system freeze prevention heat exchanger
US20160018168A1 (en) * 2014-07-21 2016-01-21 Nicholas F. Urbanski Angled Tube Fins to Support Shell Side Flow
KR101641855B1 (en) * 2014-08-25 2016-07-22 주식회사 지앤비에스엔지니어링 Scrubber for treating processing waste gas
JP2017537435A (en) * 2014-10-15 2017-12-14 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated Corrosion resistance reduction system
CN104973603B (en) * 2015-07-29 2017-10-03 中国恩菲工程技术有限公司 Remove the device of the metal impurities of chlorosilane gas and the silicon production system with it
CN205127670U (en) * 2015-11-19 2016-04-06 浙江省林业科学研究院 Equipment of volatilize gasoline vapour is retrieved with active carbon adsorption
JP6910443B2 (en) * 2016-12-09 2021-07-28 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated Use of Quartz Crystal Microbalance Microbalance for Foreline Solid Formation Quantification
KR102306675B1 (en) * 2017-05-19 2021-09-28 어플라이드 머티어리얼스, 인코포레이티드 Apparatus for collection of liquid and solid effluents and subsequent reaction into gaseous effluents

Also Published As

Publication number Publication date
JP2019514222A (en) 2019-05-30
WO2017177398A1 (en) 2017-10-19
TWI679698B (en) 2019-12-11
KR102520578B1 (en) 2023-04-10
KR20180134986A (en) 2018-12-19
US20170301524A1 (en) 2017-10-19
TW201743379A (en) 2017-12-16
CN108701583B (en) 2023-12-01
CN108701583A (en) 2018-10-23
US11114285B2 (en) 2021-09-07

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