SG11201804177WA - Robot arm for transporting semiconductor substrates - Google Patents
Robot arm for transporting semiconductor substratesInfo
- Publication number
- SG11201804177WA SG11201804177WA SG11201804177WA SG11201804177WA SG11201804177WA SG 11201804177W A SG11201804177W A SG 11201804177WA SG 11201804177W A SG11201804177W A SG 11201804177WA SG 11201804177W A SG11201804177W A SG 11201804177WA SG 11201804177W A SG11201804177W A SG 11201804177WA
- Authority
- SG
- Singapore
- Prior art keywords
- shanghai
- international
- cups
- semiconductor substrate
- bld
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
Abstract
INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property - Organization International Bureau (43) International Publication Date ..... .....r ...) 26 May 2017(26.05.2017) WIPO I PCT (10) WO International 111111111111311111111111111111111111111111111111111111111111111111111311111111111111111 2017/084079 Publication Al Number (51) International Patent Classification: (81) Designated States (unless otherwise indicated, for every HO1L 21/677 (2006.01) HO1L 21/683 (2006.01) kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, (21) International Application Number: BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, PCT/CN2015/095089 DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, (22) International Filing Date: HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, 20 November 2015 (20.11.2015) KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, (25) Filing Language: English PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, (26) Publication Language: English SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (71) Applicant: ACM RESEARCH (SHANGHAI) INC. [CN/CN]; Bld. 4, No. 1690 Cailun Road, Zhangjiang (84) Designated States (unless otherwise indicated, for every High-tech Park, Shanghai 201203 (CN). kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, (72) Inventors: WANG, Hui; Bld. 4, No. 1690 Cailun Road, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, Zhangjiang High-tech Park, Shanghai 201203 (CN). WU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, Jun; Bld. 4, No. 1690 Cailun Road, Zhangjiang High-tech DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, Park, Shanghai 201203 (CN). FANG, Zhiyou; Bld. 4, No. LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, 1690 Cailun Road, Zhangjiang High-tech Park, Shanghai SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, 201203 (CN). GW, KM, ML, MR, NE, SN, TD, TG). (74) Agent: SHANGHAI PATENT & TRADEMARK LAW Published: OFFICE, LLC; 435 Guiping Road, Shanghai 200233 — with international search report (Art 21(3)) (CN). (54) Title: ROBOT ARM FOR TRANSPORTING SEMICONDUCTOR SUBSTRATES 300 301 303b 3021 -4, 1Zirl 1. o 0 r 1-1 302 303c .4t 303a 01 IC - - 0 71. FIG 4 GC (57) : A robot arm (300, 400, 500, 600) for transporting semiconductor substrates (304, 404) comprises a body portion C (301, 401, 501, 601), an end portion (302, 402, 502, 602) extending from the body portion (301, 401, 501, 601), a plurality of vacu - IN um cups disposed on the end portion (302, 402, 502, 602), and a plurality of vacuum lines connecting to the plurality of vacuum 1-1 O cups respectively. The distance between any two adjacent vacuum cups satisfies the following condition: a vertical displacement of el the semiconductor substrate (304, 404) produced by one of the two adjacent vacuum cups sucking down the semiconductor substrate 0 is greater than a warpage of the semiconductor substrate (304, 404) in the range of the two adjacent vacuum cups, so that once the ,-t one of the two adjacent vacuum cups sucks the semiconductor substrate (304, 404), the other vacuum cup of the two adjacent vacu - .,- um cups is followed to suck the semiconductor substrate (304, 404).
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2015/095089 WO2017084079A1 (en) | 2015-11-20 | 2015-11-20 | Robot arm for transporting semiconductor substrates |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201804177WA true SG11201804177WA (en) | 2018-06-28 |
Family
ID=58718038
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201804177WA SG11201804177WA (en) | 2015-11-20 | 2015-11-20 | Robot arm for transporting semiconductor substrates |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR102455772B1 (en) |
CN (1) | CN108292620B (en) |
SG (1) | SG11201804177WA (en) |
WO (1) | WO2017084079A1 (en) |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3172375B2 (en) * | 1994-10-03 | 2001-06-04 | 大日本スクリーン製造株式会社 | Substrate transfer device |
JP3850951B2 (en) * | 1997-05-15 | 2006-11-29 | 東京エレクトロン株式会社 | Substrate transport apparatus and substrate transport method |
JP2005012033A (en) * | 2003-06-20 | 2005-01-13 | Nikon Corp | Carrying device |
JP2006156616A (en) * | 2004-11-29 | 2006-06-15 | Jel:Kk | Substrate holding device |
JP4873895B2 (en) * | 2005-07-04 | 2012-02-08 | 東芝機械株式会社 | Method and apparatus for transporting flat plate-like conveyed product |
JP4740414B2 (en) * | 2007-04-24 | 2011-08-03 | 東京エレクトロン株式会社 | Substrate transfer device |
KR20100077523A (en) * | 2008-12-29 | 2010-07-08 | 윤점채 | A moving arm for wafer |
JP5581713B2 (en) * | 2009-02-12 | 2014-09-03 | 株式会社Sumco | Wafer surface measuring device |
KR20110101808A (en) * | 2010-03-10 | 2011-09-16 | 주식회사 엘지실트론 | A wafer transfer apparatus |
JP2012009751A (en) * | 2010-06-28 | 2012-01-12 | Fujikura Ltd | Vacuum tweezers |
DE102010026610A1 (en) * | 2010-07-09 | 2012-01-12 | Centrotherm Thermal Solutions Gmbh + Co. Kg | Vacuum suction unit and gripper |
JP2012033723A (en) * | 2010-07-30 | 2012-02-16 | Fujikura Ltd | Vacuum tweezer and vacuum suction method |
JP6186124B2 (en) * | 2012-12-14 | 2017-08-23 | 東京応化工業株式会社 | Transfer arm, transfer device, and transfer method |
KR20140102782A (en) * | 2013-02-14 | 2014-08-25 | 삼성전자주식회사 | Blade for transferring wafer and wafer transferring apparatus having the same |
US20150164187A1 (en) * | 2013-03-13 | 2015-06-18 | Georgia Ann NEBLETT | Twist Locking Apparatus |
JP6224437B2 (en) * | 2013-11-26 | 2017-11-01 | 東京エレクトロン株式会社 | Substrate transfer device |
-
2015
- 2015-11-20 SG SG11201804177WA patent/SG11201804177WA/en unknown
- 2015-11-20 CN CN201580084623.4A patent/CN108292620B/en active Active
- 2015-11-20 KR KR1020187014404A patent/KR102455772B1/en active IP Right Grant
- 2015-11-20 WO PCT/CN2015/095089 patent/WO2017084079A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
KR20180084809A (en) | 2018-07-25 |
WO2017084079A1 (en) | 2017-05-26 |
KR102455772B1 (en) | 2022-10-18 |
CN108292620A (en) | 2018-07-17 |
CN108292620B (en) | 2022-08-09 |
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