SG11201709669TA - Memory cell and non-volatile semiconductor storage device - Google Patents
Memory cell and non-volatile semiconductor storage deviceInfo
- Publication number
- SG11201709669TA SG11201709669TA SG11201709669TA SG11201709669TA SG11201709669TA SG 11201709669T A SG11201709669T A SG 11201709669TA SG 11201709669T A SG11201709669T A SG 11201709669TA SG 11201709669T A SG11201709669T A SG 11201709669TA SG 11201709669T A SG11201709669T A SG 11201709669TA
- Authority
- SG
- Singapore
- Prior art keywords
- storage device
- memory cell
- semiconductor storage
- volatile semiconductor
- volatile
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/408—Electrodes ; Multistep manufacturing processes therefor with an insulating layer with a particular dielectric or electrostatic property, e.g. with static charges or for controlling trapped charges or moving ions, or with a plate acting on the insulator potential or the insulator charges, e.g. for controlling charges effect or potential distribution in the insulating layer, or with a semi-insulating layer contacting directly the semiconductor surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/401—Multistep manufacturing processes
- H01L29/4011—Multistep manufacturing processes for data storage electrodes
- H01L29/40117—Multistep manufacturing processes for data storage electrodes the electrodes comprising a charge-trapping insulator
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/4234—Gate electrodes for transistors with charge trapping gate insulator
- H01L29/42344—Gate electrodes for transistors with charge trapping gate insulator with at least one additional gate, e.g. program gate, erase gate or select gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/792—Field effect transistors with field effect produced by an insulated gate with charge trapping gate insulator, e.g. MNOS-memory transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/30—EEPROM devices comprising charge-trapping gate insulators characterised by the memory core region
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66833—Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a charge trapping gate insulator, e.g. MNOS transistors
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015111190A JP5934416B1 (en) | 2015-06-01 | 2015-06-01 | Memory cell and nonvolatile semiconductor memory device |
PCT/JP2016/065758 WO2016194827A1 (en) | 2015-06-01 | 2016-05-27 | Memory cell and non-volatile semiconductor storage device |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201709669TA true SG11201709669TA (en) | 2017-12-28 |
Family
ID=56120514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201709669TA SG11201709669TA (en) | 2015-06-01 | 2016-05-27 | Memory cell and non-volatile semiconductor storage device |
Country Status (9)
Country | Link |
---|---|
US (1) | US10381446B2 (en) |
EP (1) | EP3300103B1 (en) |
JP (1) | JP5934416B1 (en) |
KR (1) | KR20180014692A (en) |
CN (1) | CN107750397B (en) |
IL (1) | IL255820A (en) |
SG (1) | SG11201709669TA (en) |
TW (1) | TWI595602B (en) |
WO (1) | WO2016194827A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112712602B (en) * | 2020-12-11 | 2022-09-02 | 陇东学院 | Automatic charging device based on intelligent transportation |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6432773B1 (en) * | 1999-04-08 | 2002-08-13 | Microchip Technology Incorporated | Memory cell having an ONO film with an ONO sidewall and method of fabricating same |
JP4058232B2 (en) | 2000-11-29 | 2008-03-05 | 株式会社ルネサステクノロジ | Semiconductor device and IC card |
JP4477886B2 (en) * | 2003-04-28 | 2010-06-09 | 株式会社ルネサステクノロジ | Manufacturing method of semiconductor device |
JP2004342276A (en) | 2003-05-19 | 2004-12-02 | Sharp Corp | Semiconductor memory device and its programming method |
JP2005142354A (en) * | 2003-11-06 | 2005-06-02 | Matsushita Electric Ind Co Ltd | Non-volatile semiconductor storage device, its driving method, and manufacturing method |
JP4601316B2 (en) | 2004-03-31 | 2010-12-22 | ルネサスエレクトロニクス株式会社 | Nonvolatile semiconductor memory device |
US7547941B2 (en) * | 2006-05-04 | 2009-06-16 | Elite Semiconductor Memory Technology, Inc. | NAND non-volatile two-bit memory and fabrication method |
JP2010278314A (en) * | 2009-05-29 | 2010-12-09 | Renesas Electronics Corp | Semiconductor device and method of manufacturing the same |
JP2011129816A (en) * | 2009-12-21 | 2011-06-30 | Renesas Electronics Corp | Semiconductor device |
KR101979299B1 (en) * | 2012-12-26 | 2019-09-03 | 에스케이하이닉스 주식회사 | Nonvolatile memory device and method of fabricating the same |
US9111866B2 (en) * | 2013-03-07 | 2015-08-18 | Globalfoundries Singapore Pte. Ltd. | Method of forming split-gate cell for non-volative memory devices |
JP5911834B2 (en) * | 2013-09-11 | 2016-04-27 | 株式会社東芝 | Nonvolatile semiconductor memory device |
-
2015
- 2015-06-01 JP JP2015111190A patent/JP5934416B1/en active Active
-
2016
- 2016-05-27 CN CN201680025435.9A patent/CN107750397B/en active Active
- 2016-05-27 WO PCT/JP2016/065758 patent/WO2016194827A1/en active Application Filing
- 2016-05-27 US US15/577,147 patent/US10381446B2/en active Active
- 2016-05-27 EP EP16803262.1A patent/EP3300103B1/en active Active
- 2016-05-27 SG SG11201709669TA patent/SG11201709669TA/en unknown
- 2016-05-27 KR KR1020177031908A patent/KR20180014692A/en unknown
- 2016-05-31 TW TW105117078A patent/TWI595602B/en active
-
2017
- 2017-11-21 IL IL255820A patent/IL255820A/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN107750397B (en) | 2019-02-19 |
EP3300103A4 (en) | 2018-06-27 |
CN107750397A (en) | 2018-03-02 |
US10381446B2 (en) | 2019-08-13 |
IL255820A (en) | 2018-01-31 |
WO2016194827A1 (en) | 2016-12-08 |
JP2016225487A (en) | 2016-12-28 |
TWI595602B (en) | 2017-08-11 |
KR20180014692A (en) | 2018-02-09 |
EP3300103A1 (en) | 2018-03-28 |
EP3300103B1 (en) | 2022-01-12 |
JP5934416B1 (en) | 2016-06-15 |
US20180197958A1 (en) | 2018-07-12 |
TW201644007A (en) | 2016-12-16 |
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