SG11201603117VA - Arrangement and method for inspecting an object, in particular a building - Google Patents

Arrangement and method for inspecting an object, in particular a building

Info

Publication number
SG11201603117VA
SG11201603117VA SG11201603117VA SG11201603117VA SG11201603117VA SG 11201603117V A SG11201603117V A SG 11201603117VA SG 11201603117V A SG11201603117V A SG 11201603117VA SG 11201603117V A SG11201603117V A SG 11201603117VA SG 11201603117V A SG11201603117V A SG 11201603117VA
Authority
SG
Singapore
Prior art keywords
inspecting
building
arrangement
Prior art date
Application number
SG11201603117VA
Inventor
Marcel Poser
Malcolm Lim
Original Assignee
Tectus Dreamlab Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tectus Dreamlab Pte Ltd filed Critical Tectus Dreamlab Pte Ltd
Publication of SG11201603117VA publication Critical patent/SG11201603117VA/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/043—Analysing solids in the interior, e.g. by shear waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/12—Analysing solids by measuring frequency or resonance of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0232—Glass, ceramics, concrete or stone
SG11201603117VA 2013-10-30 2013-10-30 Arrangement and method for inspecting an object, in particular a building SG11201603117VA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2013/072705 WO2015062646A1 (en) 2013-10-30 2013-10-30 Arrangement and method for inspecting an object, in particular a building

Publications (1)

Publication Number Publication Date
SG11201603117VA true SG11201603117VA (en) 2016-05-30

Family

ID=49554222

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201603117VA SG11201603117VA (en) 2013-10-30 2013-10-30 Arrangement and method for inspecting an object, in particular a building

Country Status (7)

Country Link
US (1) US10551280B2 (en)
EP (2) EP4220506A1 (en)
JP (1) JP2017505444A (en)
CN (1) CN105723385B (en)
HK (1) HK1222936A1 (en)
SG (1) SG11201603117VA (en)
WO (1) WO2015062646A1 (en)

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JP7298921B2 (en) * 2020-08-12 2023-06-27 株式会社赤外線高精度技術利用機構 Infrared Investigation Analysis Diagnosis Device
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Also Published As

Publication number Publication date
JP2017505444A (en) 2017-02-16
CN105723385B (en) 2020-07-10
EP3063711A1 (en) 2016-09-07
US10551280B2 (en) 2020-02-04
US20160282230A1 (en) 2016-09-29
CN105723385A (en) 2016-06-29
WO2015062646A1 (en) 2015-05-07
EP4220506A1 (en) 2023-08-02
HK1222936A1 (en) 2017-07-14

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