CN111289574A - Method and device for nondestructive testing of quality of conductive material based on conductive parameters - Google Patents
Method and device for nondestructive testing of quality of conductive material based on conductive parameters Download PDFInfo
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- CN111289574A CN111289574A CN201811496204.3A CN201811496204A CN111289574A CN 111289574 A CN111289574 A CN 111289574A CN 201811496204 A CN201811496204 A CN 201811496204A CN 111289574 A CN111289574 A CN 111289574A
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Abstract
The invention relates to a method and a device for conducting material quality nondestructive testing based on conducting parameters, and belongs to the technical field of nondestructive testing. The method comprises the following steps: during detection, the detection device and the detection material move relatively, and the quality of the detected conductive material is judged by continuously acquiring information and calculating conductive parameters; the information includes, but is not limited to, voltage, current, position, the information is continuous information; the electric conduction parameters comprise electric conductivity and/or electric conductivity, and are obtained by calculating continuously acquired voltage information and size information of the measured material in the area; comparing the obtained actual conductive parameter with the standard conductive parameter, judging that the area corresponding to the actual conductive parameter has a defect when the absolute value of the actual conductive parameter-the standard conductive parameter/the standard conductive parameter is greater than or equal to a defect judgment threshold value, and judging that the quality of the area corresponding to the actual conductive parameter is qualified when the absolute value of the actual conductive parameter-the standard conductive parameter/the standard conductive parameter is less than the defect judgment threshold value.
Description
Technical Field
The invention relates to a method and a device for conducting material quality nondestructive testing based on conducting parameters, belongs to the technical field of nondestructive testing, and particularly belongs to the technical field of continuous nondestructive testing.
Background
The quality requirements of modern industries on materials and products thereof are continuously increased, but the production quality is not guaranteed due to the lack of efficient online detection and monitoring systems. An on-line information acquisition and detection system in the material production process is established, the quality of products is improved through sensitive information feedback and production process control, and the system is always a very concerned problem for production units. Currently, the most used online quality detection methods are: infrared detection, eddy current detection, magnetic flux leakage detection, and image-based surface quality detection, all of which have certain limitations. The maximum detection depth of the infrared detection method is only 1mm, and the data fluctuation is large; the eddy current detection method can sensitively detect the defects of cracks, scratches, inclusions, pits and the like on the surface, but has slow response speed and is not suitable for materials moving at high speed or continuous material production lines; the magnetic flux leakage detection method is only suitable for magnetic substances such as iron, cobalt, nickel and the like, can not detect non-magnetic substances, has poor classification and identification capability on defects, and is easy to influence the measurement precision by the environment; image-based surface quality detection methods can accurately detect surface defects, but it is difficult to detect internal defects. Meanwhile, the detection device adopting the detection mode is mostly statically placed or is limited by the structure of the device to be inconvenient to move, and is not suitable for detection of materials which are difficult to move. In addition, high-temperature environment is often involved in production, and the detection method is difficult to realize continuous online high-temperature detection.
In a paper "Non-structural evaluation of grading in multilayered regions of semiconductors uniformity spectroscopy", an oblique square four-probe tester is used for testing the sheet resistance of a large silicon micro-region, so that the distribution rule of the silicon resistance value is obtained, the detection is discrete, only the rough analysis can be carried out by taking the measuring point distance as the minimum unit, and the reason of fluctuation of each resistance value cannot be analyzed due to lack of continuous information acquisition. Patent CN201310530795.2 discloses a resistance testing device capable of measuring the resistance change of a sample in a temperature-changing environment, but the patent does not relate to information collection and analysis, and the measured area is fixed. The resistance and Temperature variations of Pure aluminum in vertical furnaces were measured by the direct current four-point method in the paper Electrical resistance and Thermal Conductivity of Pure aluminum up to and above the longitudinal Temperature, which varies from 0 ℃ to 800 ℃, but the measuring device and the sample were static and the vertical furnace could not accommodate longer samples. In the prior art, the detection samples are detected one by one in a segmented or point-by-point manner, time and space are discrete, information of the detected material cannot be continuously acquired, loss of key information is likely to occur, and actual mutation points, change processes and change degrees of the information are difficult to accurately judge, so that certain characteristic data cannot be acquired or are directly averaged, and finally the quality and defect characteristics of the detected material are difficult to judge.
The detection device and the detection material can move relatively, the information of the conductive material can be continuously collected, and systematic calculation and analysis are carried out based on the collected continuous information, so that defect judgment and quality detection are realized. The invention can detect moving or static materials, can realize continuous detection and discrete detection, and has all functions of the existing discrete detection technology.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides a method and a device for conducting material quality nondestructive testing based on conducting parameters.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; determining the quality of the measured conductive material by continuously collecting information and calculating conductive parameters; the information includes but is not limited to voltage, current and position, the information is continuous information, and the continuous information is information for continuously acquiring different positions of the conductive material; the conductivity parameters comprise conductivity and/or electric conductivity, and are calculated by voltage or current information and size information of the measured area material.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; when the actual conductive parameter is calculated by continuously acquired voltage or current information and the size information of the measured material in the interval, the calculation adopts at least one of the following formulas:
resistance (Ω) is voltage (V) ÷ current (a);
resistivity (Ω · m) is resistance (Ω) × cross-sectional area (m)2) Length (m);
conductivity (S/m) ÷ 1 ÷ resistivity (Ω · m);
international annealed copper standard specifies a density of 8.89g/cm31m long, 1g heavy and 0.15328 omega resistance, having a resistivity at 20 ℃ of 1.7241X 10-8Ω · m (or conductivity 58.0MS/m), corresponding to a conductivity of 100% IACS. The electrical conductivity (MS/m) and the electrical conductivity (% IACS) of the other materials can be converted as follows: conductivity (% IACS) — electric conductivity (MS/m) ÷ 0.58, and electric conductivity (MS/m) — electric conductivity (% IACS) × 0.58.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the detecting device and the detecting material have relative movement, and the following three conditions are included: the detection device is static, detects the movement of the material, defines the opposite direction of the movement direction of the detected material as the detection direction, and is mainly used for detecting the production material of the process; the detection device moves, the detection material is static, the movement direction of the detection device is defined as the detection direction, and the detection device is mainly used for detecting the material which is difficult to move; the detection device and the detection material move at different speeds simultaneously, the reverse direction of the detection material relative to the movement direction of the detection device is defined as the detection direction, and the detection device and the detection material are mainly used for assisting in adjusting the information acquisition frequency and detecting a specific area; the relative movement is preferably a continuous relative movement.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the detection device is contacted with the detection material through a contact end, and the contact mode includes but is not limited to point contact, array contact, line contact and surface contact; the contact area between any contact end and the detection material is less than or equal to 100mm2Preferably 25mm or less2More preferably 1mm or less2More preferably 0.01mm or less2The selection of the parameters is related to the detection precision, and for high-end detection, the optimal scheme is preferably selected while physical performance is ensured.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; in the contact ends, a distance between the contact ends for collecting information is less than or equal to 3000mm, preferably less than or equal to 1000mm, more preferably less than or equal to 500mm, even more preferably less than or equal to 100mm, and yet even more preferably less than or equal to 50mm or less than or equal to 25 mm.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; defining the area between the 2 information acquisition contact ends as a detection area, defining the 1 st information acquisition contact end as a positioning contact end in the detection direction, defining the state of the acquired 1 st information as an initial state, and in the initial state, defining the position of a detection material contacted with the positioning contact end as an information acquisition initial point (coordinate origin).
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the detection device automatically acquires information and calculates the conductive parameters in the process of detecting the material entering and exiting the detection area, and automatically draws a conductive parameter-distance (position) curve; the abscissa of the conductive parameter-distance (position) curve is the distance between the contact position of the detection material and the positioning contact end and the information acquisition starting point; the distance may be obtained by direct measurement, or by calculation based on time and velocity parameters.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; when the defect enters and leaves the detection area, the conductive parameter-distance curve is abnormal and returns to normal; FIG. 1 is a schematic diagram of a conductive parameter-distance curve corresponding to a defect and a position of a detected material, and a starting point (O point) of the conductive parameter-distance curve is obtained by calculation according to the collected 1 st information, wherein the distance between the corresponding position of the O point on the detected material and the information collection starting point is 0; the A state is a state that a defect is about to enter a detection area, when a detection material moves from an initial state to the A state, no defect exists in the detection area, an OA section correspondingly appears on a conductive parameter-distance curve, the conductive parameter of the OA section is in a normal parameter range, and the distance between the corresponding position of a point A on the detection material and an information acquisition starting point is 50 mm; the state B is a state that the defect just completely enters the detection area, the detection material moves from the state A to the state B, the defect passes through the processes of starting to enter and completely entering the detection area, an AB section correspondingly appears on a conductive parameter-distance curve, the conductive parameter is abnormal, and the distance between the corresponding position of a point B on the detection material and the information acquisition starting point is 60 mm; the state C is a state that the defect begins to leave the detection area, a BC section correspondingly appears on the conductive parameter-distance curve in the process that the detection material moves from the state B to the state C, and the distance between the corresponding position of the point C on the detection material and the information acquisition starting point is 90 mm; the state D is a state that the defect just completely leaves the detection area, the conduction parameter returns to normal in the process that the detection material moves from the state C to the state D, and the distance between the corresponding position of the point D on the detection material and the information acquisition starting point is 100 mm.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; and in a small part of cases, detecting that the front end of the material has a defect, wherein the parameter of the starting point of the conductive parameter-distance curve is an abnormal parameter, or detecting that the tail end of the material has a defect, and the parameter of the terminal point of the conductive parameter-distance curve is an abnormal parameter.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the acquired information can also comprise time and temperature, and when the acquired information comprises time, a conductive parameter-position-time curve can be acquired according to the acquired conductive parameters, positions and time.
Those skilled in the art can obtain the information and perform mathematical processing, theoretical calculation and physical meaning transformation according to the present invention, and the essence of the invention also belongs to the scope of the present invention.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; comparing the actual conductive parameter with the standard conductive parameter, judging that the area corresponding to the actual conductive parameter has a defect when the actual conductive parameter-standard conductive parameter/standard conductive parameter is greater than or equal to a defect judgment threshold value, and judging that the quality of the area corresponding to the actual conductive parameter is qualified when the actual conductive parameter-standard conductive parameter/standard conductive parameter is less than the defect judgment threshold value; the actual conductive parameters are conductive parameters calculated according to continuously acquired detection material information.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the defect judgment threshold value is DrIs represented by the formula DrThe value of (a) is 0.0001 or more, preferably 0.0001 to 0.1, more preferably 0.0001 to 0.01, and further preferably 0.0001 to 0.001.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; when actually conductingParameter-standard conductive parameter |/standard conductive parameter is greater than or equal to DrThen, the measured region is judged to include at least 1 or 1 defect, and D is calculatedySaid D isy＝(Ym-Ys)÷YsSaid Y issIs a standard electrical conductivity parameter, said YmIs the maximum or minimum value of the actual electrical conductivity parameter, DyIs a defect determination factor.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; according to a defect decision factor DyThe defect type can be judged; when D is presentyIf < 0, the defect types include but are not limited to scratches, depressions, smaller size, tears, cracks, corrosion, slag inclusions, bubbles, indentations, etc. different material defect types may be different, for example, in metal materials, possible defect types include scratches, depressions, smaller size, cracks, corrosion, slag inclusions, bubbles, indentations, etc., in carbon fiber materials, possible defect types include smaller fiber volume content, disordered fiber orientation and arrangement, smaller bundle number, broken filaments, insufficient plating material, incomplete carbonization, etc., in welded steel pipes, possible defect types include size defects, craters, lack of penetration, lack of fusion, undercut, etc.; when D is presentyAt > 0, the defect types include, but are not limited to, protrusions, ears, bends, large dimensions, and the defect types vary from material to material, for example, in metal materials, the defects may be protrusions, ears, bends, burrs, adhesion, large dimensions, etc., in long carbon fiber materials, the defects may be large fiber volume content, large bundle count, excessive plating, etc., and in welded steel pipes, the defects may be solder bumps, flash, rags, burrs, etc.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; according to the abscissa of the starting point and the ending point of the regression of the conductive parameters to be normal, the actual position of the defect on the detection material and the defect length can be determined, and the significance degree of the defect can be determined according to the difference value of the maximum value (or the minimum value) of the conductive parameters and the standard conductive parameters; FIG. 2 is a schematic view of a conductive parameter versus distance curve, the conductive parameter being represented by Y and the standard conductive parameter being represented by YsTo represent，Ys±(Dr×Ys) The normal value range of the conductive parameter is provided, and the error range mainly considers the measurement error of the system; the conductive parameter Y of the AB segment and BC segment shown in FIG. 2 satisfies | Y-Ys|＜Dr×YsThe corresponding material area has no defect, and the conductive parameter value Y of the C point satisfies | Y-Ys|＝Dr×Ys，Y＝YcThe actual conductivity parameter is at a critical value YcIndicating that a defect is about to enter the detection zone; the conductive parameter Y of the CD segment satisfies Y-Ys|≥Dr×YsThe actual conductive parameter exceeds the normal value range, and the corresponding defect gradually enters the detection area; the value of the actual electrical conductivity parameter Y of the DF section is relatively constant, Y ═ YmY in FIG. 2mThe highest value of the conductive parameter is the corresponding defect which is completely positioned in the detection area; the actual conductive parameter of FG section is continuously decreased, the corresponding defect gradually leaves the detection area, the abscissa of the point F is the distance between the initial point of the contact of the positioning contact end and the defect and the initial point of the information acquisition, the position corresponding to the detection material is the initial point of the defect, and the conductive parameter value Y of the point G meets the requirement of | Y-Ys|＝Dr×Ys，Y＝YcThe actual conductivity parameter is at a critical value YcThe abscissa of the point G is the distance between the positioning contact end and the end point of the defect contact and the information acquisition start point, the position corresponding to the detection material is the defect end point, and the abscissa difference value between the point F and the point G is the defect length; the conductive parameter Y of the GH and HI sections satisfies Y-Ys|＜Dr×YsAnd belongs to the normal parameter range, and the corresponding material area has no defect.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; defects that cause resistance changes are among the types of defects detectable by the present methods, and factors that cause resistance changes include, but are not limited to, changes in resistivity of the material, changes in cross-sectional area; when the defect is of the type having a reduced cross-section, the reduction in cross-sectional area at the defect results in an increase in resistance, as shown in FIG. 3, and the conductivity decreases, as shown by YmIs the minimum value of the actual conductivity, Ym＜Ys，DyLess than 0; when the defect belongs to the section becoming largerIn the case of (3), the resistance becomes smaller due to the increase in the cross-sectional area at the defect, and as shown in FIG. 4, the conductivity rises, and Y in the figuremIs the maximum value of the actual conductivity, Ym＞Ys，Dy＞0；YmAnd YsThe difference in (b) reflects the severity of the defect.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the number of defects can be judged by analyzing the change condition of the conductive parameter-distance curve; generally, the conductive parameter-distance curve is abnormal once and returns to normal, and at least 1 or 1 defect in the material in the corresponding area can be judged; in a few cases, the conducting parameter-distance curve is abnormal and returns to normal repeatedly, or the change rate is increased or reduced suddenly, and at least 2 or 2 defects in the corresponding area can be judged; in rare cases, the conducting parameter-distance curve is abnormal and returns to normal repeatedly, and finally the normal parameter range can not be returned, and the condition that a large number of defects exist in the corresponding area or the physical boundary of the detection material is obtained through information acquisition is judged.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the method can detect the continuous occurrence of various defects, and judges whether 2 or more than 2 defects exist in the detected region according to the slope of the conductive parameter-distance curve and the change condition of the slope if the conductive parameter-distance curve is abnormal and does not return for a long time or does not return until the detection is finished.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; there are many defect determination methods, and any defect determination method based on the present invention is considered to fall within the scope of protection of the present patent.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the standard conductive parameters are conductive parameters of a standard sample, the standard sample can be determined according to standards, and the standards are national standards, industry standards or enterprise standards;
the invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the standard conductivity parameter may also be determined by a user, or detected and/or calculated from a user-determined standard.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; when the standard conductive parameters are acquired, the detection environment of the standard sample is the same as the actual detection environment, and the detection environment comprises but is not limited to temperature, pressure, humidity and noise.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the applicable temperature range is 10K-the melting temperature or the liquefaction temperature or the gasification temperature of the material to be measured.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the cross-sectional area of the conductive material is 1000000mm or less2Preferably 10000mm or less2More preferably 100mm or less2Still more preferably not more than 1mm2More preferably 0.01mm or less2。
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the voltage or current information acquisition method includes, but is not limited to, a direct current four-point method, a single bridge method and a double bridge method.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; during detection, the relationship among the information acquisition frequency, the relative movement speed between the detection material and the detection device and the distance between the information acquisition contact ends is as follows: the relative movement speed ÷ information acquisition frequency < the information acquisition contact end distance can ensure that all areas of the material to be detected can be detected, the acquired information samples are enough for analysis, and the smaller the relative movement speed is, the larger the acquisition frequency is, and the more the acquired information samples are.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; the information acquisition frequency is more than or equal to 1 time/10 seconds, preferably more than or equal to 1 time/second, and more preferably more than or equal to 10 times/second; the information acquisition frequency can also be set according to the length of the detection interval, and the number of times of acquiring information in the detection interval of 10mm is more than or equal to 1, preferably more than or equal to 10, and more preferably more than or equal to 100; the information acquisition frequency can also be optimally adjusted according to the relative movement speed of the detection material and the detection device and the characteristics of the information acquisition device.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; for two-dimensional materials such as plates, strips and foils and three-dimensional materials such as blocks and bodies, the characteristics of the defects in different directions can be judged according to the conductive parameters in different detection directions.
The invention relates to a method for nondestructive testing of the quality of a conductive material based on conductive parameters; when the defect enters and leaves the detection area, the corresponding conductive parameters have a certain mapping relation, and the information acquisition system can be checked by utilizing the mapping relation; as shown in FIG. 2, the BD segment corresponds to the defect entering the detection area, the FH segment corresponds to the defect leaving the detection area, and the conduction parameters of the BD segment and the FH segment are ideally mapped to each other, i.e. any point (X, Y) of the BD segment(X)) In FH segment, there is a mapping point (X + l, Y)(X+l)) Existence of a relationship Y(X)'＝-Y(X+l)', where l is the length of the detection zone.
Based on the detection idea of the invention, the directly obtained information or the information obtained by conversion has advantages in application under different materials and different precision requirements.
The invention relates to a device for nondestructive testing of the quality of a conductive material based on conductive parameters; the device comprises P independent detection units, and the P units can be completely or partially contacted with a detection material during detection; the detection unit can be static or move according to a designed track, and the detection material can also be static or move according to a designed track; the detection unit and the detection material can move relatively; and P is an integer greater than or equal to 1.
The invention relates to a device for nondestructive testing of the quality of a conductive material based on conductive parameters; when the direct-current four-point method is adopted to detect the voltage information, each detection unit comprises 4 binding posts which are arranged side by side, a constant current providing module, a temperature measuring module and an information acquisition module; two binding posts at two ends of the 4 binding posts are connected with the constant current providing module through a lead, and two binding posts in the middle are connected with the information acquisition module through leads; the temperature measurement module is connected with the information acquisition module.
The invention relates to a device for nondestructive testing of the quality of a conductive material based on conductive parameters; the binding post is connected with the contact end, and when the binding post is used, the contact end is contacted with the detection material and moves relatively; the contact terminals include, but are not limited to, conductive strips, conductive balls, and conductive probes, and the electrical conductivity of the posts and the contact terminals is greater than or equal to 6MS/m, preferably greater than or equal to 30MS/m, and more preferably greater than or equal to 46 MS/m.
The invention relates to a device for nondestructive testing of the quality of a conductive material based on conductive parameters; and a pressure sensing device is arranged between the wiring terminal and the contact end and is used for adjusting the contact pressure of the contact end and the material so as to prevent the detection sample from being damaged due to overlarge contact pressure or poor contact due to undersize contact pressure.
Compared with the prior art, the invention provides a technical scheme for conducting material quality nondestructive testing based on conducting parameters, which has the technical advantages that:
1. the invention can realize the on-line continuous detection of the conductive material, and the detection device and the detection material can have various relative movement modes, thereby having great practical value for on-line detection.
2. The invention can detect various materials, is suitable for different detection places, can realize the on-line detection of different temperature environments, and can carry out the conversion of conductive parameters at different temperatures.
3. The invention can be used for detecting the defects causing resistance change, not only can detect the surface defects, but also can detect the internal defects, especially can detect the coexistence of 2 or more than 2 defects, and the prior art can not realize the function.
Drawings
FIG. 1 is a schematic diagram of a conductive parameter-distance curve corresponding to a defect and a position of a detected material;
FIG. 2 is a schematic diagram of a conductivity parameter versus distance curve;
FIG. 3 is a schematic view of conductivity-distance curves corresponding to cross-sectional reduced defects;
FIG. 4 is a schematic view of conductivity-distance curves corresponding to cross-sectional grown-up defects;
FIG. 5 is a schematic view of the detecting device of the present invention, wherein FIG. 1 is an information collecting module; 2 is a binding post; 3 is a binding post lifting device; 4 is a pressure sensor; 5 is a temperature measuring probe; 6 is a lead; 7 is a contact end;
FIG. 6 is a conductivity-distance curve of example 1;
FIG. 7 is a photograph of a defect at position 1 in example 1;
FIG. 8 is a photograph of a defect at position 2 in example 1;
FIG. 9 is a conductivity-distance curve of example 2;
FIG. 10 is a graph of conductivity versus distance for example 3;
FIG. 11 is a photograph showing defects in examples 2 and 3;
FIG. 12 is a graph of conductivity versus distance for example 4;
FIG. 13 is a graph of conductivity versus distance for example 5;
FIG. 14 is a photograph showing defects in examples 4 and 5;
FIG. 15 is a conductivity versus distance curve for example 6;
FIG. 16 is a photograph of a defect in example 6;
FIG. 17 is a graph of conductivity versus distance for comparative example 1;
FIG. 18 is a conductivity versus distance curve for comparative example 2;
FIG. 19 is a conductivity versus distance curve for comparative example 3;
Detailed Description
In the following embodiments, the detection environment temperature is 20 + -2 deg.C, and the contact area between the contact end and the detection material is less than or equal to 9mm2. The detection system automatically acquires voltage information, position information and size information in the relative movement of the detection material and the detection device, automatically calculates the conductivity or the conductivity, and draws a conductivity-distance curve or a conductivity-distance curve.
The following formula is adopted for calculating the conductive parameter:
resistance (Ω) is voltage (V) ÷ current (a);
electrical resistivity of (Ω · m) resistance (Ω) × cross-sectional area (m)2) Length (m);
conductivity (S/m) ÷ 1 ÷ resistivity (Ω · m);
electrical conductivity (% IACS) — electrical conductivity (MS/m) ÷ 0.58.
Example 1:
detection materials: the aluminum alloy wire rod is 3.94mm in diameter and 1500mm in length;
terminal post spacing/detection zone length: 50 mm;
inputting a constant current: 0.1A;
the relative motion mode is as follows: detecting the movement of the material, and keeping the detection device static;
relative movement speed: 30 mm/s;
information acquisition frequency: 30 times/s;
standard conductivity: 61.50% IACS;
FIG. 6 is a graph of actual conductivity versus distance, Dr0.0005 according to | actual conductivity-standard conductivity |/standard conductivity ≧ DrAnd judging that 2 defects exist.
The conductivity is abnormally reduced within the position range of 580mm-610mm, corresponding to the 1 st defect entering the detection area, Ym1When the conductivity returns to normal within the position range of 630-660mm, determining that the defect is in the position range of 630-660mm, and the length of the defect area is 30mm, wherein the conductivity of the defect area returns to normal within the position range of 630-660 mm; defect decision factor Dy(61.08-61.50) ÷ 61.50 ═ 0.006829, due to the decision factor DyIf the defect type is less than 0, judging the defect type to be a scratch, a central crack or slag inclusion. Observing the corresponding area of the wire pole, wherein the surface has no obvious scratches, interrupting, grinding the cross section by using sand paper, and carrying out anodic film coating after polishing, wherein the picture shown in figure 7 shows that the defect is a central crack.
The conductivity is abnormally reduced within the range of 1074mm-1077mm, corresponding to the 2 nd defect entering the detection area, Ym2The conductivity returns to normal within the position range of 1124-1127mm, the defect is determined to be in the position range of 1124-1127mm, and the length of the defect region is 4 mm; defect decision factor Dy＝(61.35-61.5)÷61.5＝-0.002439Due to the determination factor DyIf < 0, the length of the defect region is short, and presumably, the defect is a point defect, and there may be a corrosion pit or slag inclusion. Observing the corresponding area of the wire pole, wherein the surface has no obvious corrosion pit, the corrosion pit is interrupted, the observation is carried out by a scanning electron microscope after the grinding and polishing by sand paper, and the photo shown in figure 8 shows that the defect is flocculent slag inclusion.
Example 2
Detection materials: extruding an aluminum rod with the diameter of 9.5mm and the length of 1100 mm;
terminal post spacing/detection zone length: 120 mm;
inputting a constant current: 2.0A;
the relative motion mode is as follows: detecting the movement of the material, and keeping the detection device static;
relative movement speed: 50 mm/s;
information acquisition frequency: 50 times/s;
standard conductivity: 61.2% IACS;
FIG. 9 is a graph of actual conductivity versus distance, Dr0.001307 according to actual conductivity-standard conductivity/standard conductivity |/standard conductivity ≧ DrJudging that 1 defect exists, abnormally increasing the conductivity within the range of 533mm-550mm, and enabling the defect to enter a detection area, YmThe conductivity returns to normal within the position range of 653mm-670mm, the defect is determined to be within the position range of 653mm-670mm corresponding to the defect leaving the detection area, and the length of the defect area is 17 mm; defect decision factor Dy(61.9-61.2) ÷ 61.2 ═ 0.01144, due to the decision factor DyIf the defect type is more than 0, judging that the possible defect type is a convex defect, and displaying the defect as a convex in the photo shown in FIG. 11.
Example 3
Detection materials: extruding an aluminum rod with the diameter of 9.5mm and the length of 1100 mm;
terminal post spacing/detection zone length: 120 mm;
inputting a constant current: 2.0A;
the relative motion mode is as follows: detecting the movement of the material, and keeping the detection device static;
relative movement speed: 50 mm/s;
information acquisition frequency: 50 times/s;
standard conductivity: 35.4348 MS/m;
the procedure of example 2 was repeated, except that the conductivity was used as the conductivity parameter.
FIG. 10 is a graph of actual conductivity versus distance, Dr0.001307 according to | actual conductivity-standard conductivity |/standard conductivity ≧ DrJudging that 1 defect exists, the conductivity is abnormally increased within the position range of 533mm-550mm, the corresponding defect enters a detection area, and Ym35.84MS/m, the conductivity returns to normal within the position range of 653mm-670mm, the defect is determined to be within the position range of 653mm-670mm corresponding to the defect leaving the detection area, and the length of the defect area is 17 mm; defect decision factor Dy35.84-35.4348/35.4348/0.01144 due to DyIf the defect type is more than 0, the possible defect type is judged to be a convex defect, and the photo shown in FIG. 11 shows that the defect type is convex.
Example 4
Detection materials: extruding an aluminum rod with the diameter of 9.5mm and the length of 1500 mm;
terminal post spacing/detection zone length: 120 mm;
inputting a constant current: 2.0A;
the relative motion mode is as follows: detecting the movement of the material, and keeping the detection device static;
relative movement speed: 50 mm/s;
information acquisition frequency: 50 times/s;
standard conductivity: 61.2% IACS;
FIG. 12 is a graph of actual conductivity versus distance, Dr0.001307 according to actual conductivity-standard conductivity/standard conductivity |/standard conductivity ≧ DrJudging that 1 defect exists, abnormally reducing the conductivity within the position range of 438mm-468mm, and enabling the defect to enter a detection area, YmThe conductivity returns to normal within the position range of 558mm-588mm under the condition of 60.9 percent IACS, the defect leaves the detection area, the defect is determined to be in the position area of 558mm-588mm, and the length of the defect area is 30 mm; defect decision factor Dy(60.9-61.2) ÷ 61.2 ═ -0.004902, due to Dy< 0, determination is possibleThe defect type of (2) is scratch or slag inclusion defect, and the photograph shown in fig. 14 shows defect type scratch.
Example 5
Detection materials: extruding an aluminum rod with the diameter of 9.5mm and the length of 1500 mm;
terminal post spacing/detection zone length: 120 mm;
inputting a constant current: 2.0A;
the relative motion mode is as follows: detecting the movement of the material, and keeping the detection device static;
relative movement speed: 50 mm/s;
information acquisition frequency: 50 times/s;
standard conductivity: 35.4348 MS/m;
the procedure was as in example 4 except that the conductivity was used as the conductivity parameter.
FIG. 13 is a graph of actual conductivity versus distance, Dr0.001307 according to | actual conductivity-standard conductivity |/standard conductivity ≧ DrJudging that 1 defect exists, abnormally reducing the conductivity within the position range of 438mm-468mm, and enabling the corresponding defect to enter a detection area, Ym35.2611MS/m, the conductivity returns to normal within the position range of 558mm-588mm, the defect leaves the detection area, the defect is determined to be in the position range of 558mm-588mm, and the length of the defect area is 30 mm; defect decision factor Dy(35.2611-35.4348) ÷ 35.4348 ═ 0.004902 due to DyIf < 0, the type of the possible defect is judged to be a scratch or slag inclusion defect, and the photograph shown in FIG. 14 shows that the defect is a scratch.
Example 6
Detection materials: an aluminum alloy wire with the diameter of 5mm and the length of 1400 mm;
terminal post spacing/detection zone length: 100mm
Inputting a constant current: 0.55A
The relative motion mode is as follows: detecting the movement of the material, and keeping the detection device static;
relative movement speed: 30mm/s
Information acquisition frequency: 60 times/s
Standard conductivity: 60.90% IACS
FIG. 15 is a graph of actual conductivity versus distance, Dr0.001642 according to actual conductivity-standard conductivity/standard conductivity |/standard conductivity ≧ DrJudging that 1 defect exists, abnormally reducing the conductivity within the position range of 710mm-764mm, and enabling the defect to enter the detection area, YmThe conductivity returns to normal within the position range of 810-864 mm under the condition of 60.01% IACS, the defect leaves the detection area correspondingly, the defect is determined to be in the position area of 810-864 mm, and the length of the defect area is 54 mm; defect decision factor Dy(61.01-60.90) ÷ 60.90 ═ -0.01461, due to Dy< 0 and the length of the defect area is long, and the possible defect type is judged to be scratch. It was further found that the slope of the actual conductivity parameter curve at the abnormal rising and falling phases changed significantly, in the position range of 710mm-734mm, the slope of the descending stage is about-0.0125% IACS/mm, over a position range of 760mm to 764mm, the slope of the descent phase is about-0.15% IACS/mm, in the position range of 810mm-834mm, the slope of the ascending stage is about 0.0125% IACS/mm, within the 860mm-864mm position range, the slope of the rise phase is about 0.15% IACS/mm, and the defect is judged to be composed of two types of defects, the first defect has a smaller absolute value of slope and a longer length, most likely to be a scratch, the second defect has a larger absolute value of slope and a shorter length, most likely to be an indentation or a bubble, the length of the middle plateau between the two slopes is 26mm, which indicates that the two defects are about 26mm apart, and the photograph shown in FIG. 16 shows that the defects are a scratch and an indentation.
Comparative example 1:
detection materials: an aluminum alloy wire rod with the diameter of 3.94mm and the length of 1500mm,
terminal post spacing/detection zone length: 150 mm;
inputting a constant current: 0.1A;
the relative motion mode is as follows: detecting the movement of the material, and keeping the detection device static;
relative movement speed: 30 mm/s;
information acquisition frequency: 30 times/s;
standard conductivity: 61.50% IACS;
the procedure was as in example 1 except that the post spacing/detection region length was different.
FIG. 17 is a graph of actual conductivity versus distance, Dr0.000488 according to the ratio of actual conductivity to standard conductivity/standard conductivity ≧ DrJudging that 1 defect exists, the conductivity is abnormally reduced within the position range of 480-m61.26% IACS, the conductivity returns to normal within the position range of 630-; defect decision factor Dy(61.26-61.50) ÷ 61.50 ═ 0.003902, due to DyIf < 0, the defect type is judged to be a scratch, a center crack or slag inclusion, and the picture shown in FIG. 7 shows that the defect is a center crack.
While the example 1 accurately detected the defects in the regions of 630mm to 660mm and 1124mm to 1127mm, the comparative example detected no defects in the regions of 1124mm to 1127mm, because the arrangement of the posts at longer intervals in the comparative example averaged the information of the detected regions. This comparative example shows that for tests with high accuracy requirements, the test conditions need to be modified appropriately, e.g. shortening the post pitch, increasing the current, decreasing DrAnd the like.
Comparative example 2:
the detection mode is as follows: carrying out segmented discrete detection;
detection materials: the aluminum alloy wire rod is 3.94mm in diameter and 1500mm in length, and is the same detection material as the aluminum alloy wire rod in example 1 and comparative example 1;
terminal post spacing/detection zone length: 150 mm;
inputting a constant current: 0.1A;
standard conductivity: 61.50% IACS;
FIG. 18 is a graph of actual conductivity versus distance, Dr0.000488, because the distance between the middle 2 binding posts is 150mm, 10 times of measurement are needed, the result of each detection is the result of averaging 150mm sections, and according to the absolute value of the actual conductive parameter-standard conductive parameter/the standard conductive parameter, the absolute value of the standard conductive parameter is more than or equal to DrJudging that 1 defect exists in the 600mm-750mm area, and because only 10 discrete data points cannot determine the specific degree and length of the defect, the possible defect cannot be judgedThe kind of the same. However, example 1 accurately detected defects at positions 630mm to 660 mm.
Comparative example 3:
the detection mode is as follows: carrying out segmented discrete detection;
detection materials: an aluminum alloy wire rod with the diameter of 3.94mm and the length of 1500mm is made of the same detection material as that of the embodiment 1, the comparative example 1 and the comparative example 2;
terminal post spacing/detection zone length: 50 mm;
inputting a constant current: 0.1A;
standard conductivity: 61.50% IACS;
FIG. 19 is a graph of actual conductivity versus distance, DrThe distance between the middle 2 binding posts is 50mm, the measurement needs 30 times, the result of each detection is the result of averaging 50mm segments, and the absolute value of the actual conductive parameter-standard conductive parameter/standard conductive parameter is more than or equal to DrAnd judging that the 600mm-700mm area and the 1100mm-1150mm area have defects, and because only 30 discrete data points can not determine the specific degree and length of the defects, the possible defect types cannot be judged. While example 1 accurately detects defects in two areas of 630mm-660mm and 1124mm-1127 mm.
Comparative examples 2, 3 both show the disadvantage of discrete detection: the method has the advantages of needing to be divided in advance, having many detection times, being slow in detection speed, being unobvious in information, being inaccurate in positioning, being incapable of further distinguishing types, being incapable of detecting the condition of extremely small defects and the like.
Claims (13)
1. A method for nondestructive testing of the quality of a conductive material based on conductive parameters is characterized in that: during detection, the detection device and the detection material move relatively, and the quality of the detected conductive material is judged by continuously acquiring information and calculating conductive parameters; the information comprises but is not limited to voltage, current and position, the information is continuous information, and the continuous information is information for continuously collecting different positions of the measured material; the conductive parameters comprise conductivity and/or conductivity, and are calculated by voltage or current and size information of the measured materials in the area; comparing the obtained actual conductive parameter with the standard conductive parameter, judging that the area corresponding to the actual conductive parameter has a defect when the absolute value of the actual conductive parameter-the standard conductive parameter/the standard conductive parameter is greater than or equal to a defect judgment threshold value, and judging that the quality of the area corresponding to the actual conductive parameter is qualified when the absolute value of the actual conductive parameter-the standard conductive parameter/the standard conductive parameter is less than the defect judgment threshold value.
2. The method for conducting parameter-based nondestructive testing of the quality of the conducting material according to claim 1, wherein the method comprises the following steps: the defect judgment threshold value is DrIs represented by the formula DrThe value of (a) is 0.0001 or more, preferably 0.0001 to 0.1, more preferably 0.0001 to 0.01, and further preferably 0.0001 to 0.001.
3. The method for conducting parameter-based nondestructive testing of the quality of a conducting material according to claim 1 or 2, wherein the method comprises the following steps: when the actual conductive parameter-standard conductive parameter/standard conductive parameter is greater than or equal to DrThen, judging that the detected area at least comprises 1 or 1 defect; calculating DySaid D isy＝(Ym-Ys)÷YsSaid Y issIs a standard electrical conductivity parameter, said YmIs the maximum or minimum value of the actual electrical conductivity parameter, DyIs a defect judgment factor; dyIf < 0, the defect types include but are not limited to scratches, dents, smaller sizes, tears, cracks, corrosion, slag inclusions, bubbles, and indentations; dyAnd > 0, defect types include, but are not limited to, protrusions, ears, bends, and large sizes.
4. The method for conducting parameter-based nondestructive testing of the quality of the conducting material according to claim 1, wherein the method comprises the following steps: the standard conductive parameters are conductive parameters of a standard sample, the standard sample can be determined according to standards, and the standards are national standards, industry standards or enterprise standards.
5. The method for conducting parameter-based nondestructive testing of the quality of the conducting material according to claim 1, wherein the method comprises the following steps: the standard conductivity parameter may also be determined by a user, or detected and/or calculated from a user-determined standard.
6. The method for conducting parameter-based nondestructive testing of the quality of a conducting material according to claim 4 or 5, wherein the method comprises the following steps: when the standard conductive parameters are acquired, the detection environment of the standard sample is the same as the actual detection environment, and the detection environment comprises but is not limited to temperature, pressure, humidity and noise.
7. The method for conducting parameter-based nondestructive testing of the quality of the conducting material according to claim 1, wherein the method comprises the following steps: the cross-sectional area of the conductive material is 1000000mm or less2Preferably 10000mm or less2More preferably 100mm or less2Still more preferably not more than 1mm2More preferably 0.01mm or less2。
8. The method for conducting parameter-based nondestructive testing of the quality of the conducting material according to claim 1, wherein the method comprises the following steps: the voltage or current information acquisition method includes, but is not limited to, a direct current four-point method, a single bridge method and a double bridge method.
9. The method of claim 8, wherein the quality of the conductive material is detected nondestructively based on the conductive parameter; the detection device is contacted with the detection material through a contact end, and the contact mode of the contact end and the detection material includes but is not limited to point contact, array contact, line contact and surface contact; the contact area between any contact end and the detection material is less than or equal to 100mm2Preferably 25mm or less2More preferably 1mm or less2More preferably 0.01mm or less2(ii) a In the contact ends, the distance between the contact ends for collecting information is less than or equal to 3000mm, preferably less than or equal to 1000mm, more preferably less than or equal to 500mm, even more preferably less than or equal to 100mm, and yet even more preferably equal to or less than 100mmPreferably 50mm or less or 25mm or less.
10. The method for conducting parameter-based nondestructive testing of the quality of the conducting material according to claim 1, wherein the method comprises the following steps: during detection, the relationship among the information acquisition frequency, the relative movement speed between the detection material and the detection device and the distance between the information acquisition contact ends is as follows: the relative movement speed is divided by the information acquisition frequency and is less than the distance between the information acquisition contact ends; the information acquisition frequency is equal to or greater than 1/10 seconds, preferably equal to or greater than 1/second, and more preferably equal to or greater than 10/second.
11. The utility model provides a device based on electrically conductive parameter nondestructive test conducting material quality which characterized in that: the device comprises P independent detection units, and the P units can be completely or partially contacted with a detection material during detection; the detection unit can be static or move according to a designed track, and the detection material can also be static or move according to a designed track; the detection unit and the detection material can move relatively; and P is an integer greater than or equal to 1.
12. The apparatus of claim 11, wherein the apparatus for conducting parameter-based non-destructive testing of the quality of the conductive material comprises: when the direct current four-point method is adopted for detection, each independent detection unit comprises 4 binding posts which are arranged side by side, a constant current providing module, a temperature measuring module and an information acquisition module; two binding posts at two ends of the 4 binding posts are connected with the constant current providing module through a lead, and two binding posts in the middle are connected with the information acquisition module through leads; the temperature measurement module is connected with the information acquisition module.
13. The apparatus of claim 12, wherein the apparatus for conducting parameter-based non-destructive testing of the quality of the conductive material comprises: the binding post is connected with a contact end, the contact end comprises but is not limited to a conductive strip, a conductive ball and a conductive probe, and the conductivity of the binding post and the contact end is greater than or equal to 6 MS/m.
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| CN113295196A (en) * | 2021-05-28 | 2021-08-24 | 东华大学 | Three-in-one device for filtering equipment and calibration method thereof |
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