SG107102A1 - A method and apparatus for enabling extests to be performed in ac-coupled systems - Google Patents

A method and apparatus for enabling extests to be performed in ac-coupled systems

Info

Publication number
SG107102A1
SG107102A1 SG200203079A SG200203079A SG107102A1 SG 107102 A1 SG107102 A1 SG 107102A1 SG 200203079 A SG200203079 A SG 200203079A SG 200203079 A SG200203079 A SG 200203079A SG 107102 A1 SG107102 A1 SG 107102A1
Authority
SG
Singapore
Prior art keywords
extests
enabling
coupled systems
systems
coupled
Prior art date
Application number
SG200203079A
Other languages
English (en)
Inventor
E Moore Charles
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of SG107102A1 publication Critical patent/SG107102A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318577—AC testing, e.g. current testing, burn-in
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
SG200203079A 2001-11-01 2002-05-22 A method and apparatus for enabling extests to be performed in ac-coupled systems SG107102A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/035,654 US6662134B2 (en) 2001-11-01 2001-11-01 Method and apparatus for enabling extests to be performed in AC-coupled systems

Publications (1)

Publication Number Publication Date
SG107102A1 true SG107102A1 (en) 2004-11-29

Family

ID=21883980

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200203079A SG107102A1 (en) 2001-11-01 2002-05-22 A method and apparatus for enabling extests to be performed in ac-coupled systems

Country Status (4)

Country Link
US (1) US6662134B2 (enExample)
JP (1) JP2003194882A (enExample)
DE (1) DE10241389A1 (enExample)
SG (1) SG107102A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6763486B2 (en) * 2001-05-09 2004-07-13 Agilent Technologies, Inc. Method and apparatus of boundary scan testing for AC-coupled differential data paths
US6813737B1 (en) * 2001-10-31 2004-11-02 Cisco Technology, Inc. Short circuited capacitor detection in AC coupled links using boundary scan test methodology
US7089463B1 (en) * 2002-02-20 2006-08-08 Cisco Technology Inc. Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test
US7877652B1 (en) * 2003-03-31 2011-01-25 Qualcomm Incorporated Detection circuit and method for AC coupled circuitry
US7222278B2 (en) * 2003-09-17 2007-05-22 Avago Technologies General Ip (Singapore) Pte. Ltd. Programmable hysteresis for boundary-scan testing
US7149943B2 (en) * 2004-01-12 2006-12-12 Lucent Technologies Inc. System for flexible embedded Boundary Scan testing
KR100838808B1 (ko) 2006-11-14 2008-06-17 주식회사 준마엔지니어링 제이테그를 이용한 테스트 시스템 및 그 제어방법
CN103426288A (zh) * 2012-05-15 2013-12-04 苏州工业园区新宏博通讯科技有限公司 多功能交流电能采集终端
CN103424636A (zh) * 2012-05-15 2013-12-04 苏州工业园区新宏博通讯科技有限公司 多功能交直流电能采集终端
CN112285446B (zh) * 2019-07-12 2024-05-31 瑞昱半导体股份有限公司 执行多种测试的测试系统、传送装置与接收装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3372052B2 (ja) * 1991-06-06 2003-01-27 テキサス インスツルメンツ インコーポレイテツド 境界走査集積回路
US5497378A (en) * 1993-11-02 1996-03-05 International Business Machines Corporation System and method for testing a circuit network having elements testable by different boundary scan standards
US6000051A (en) * 1997-10-10 1999-12-07 Logic Vision, Inc. Method and apparatus for high-speed interconnect testing
US6601189B1 (en) * 1999-10-01 2003-07-29 Stmicroelectronics Limited System and method for communicating with an integrated circuit
US6594802B1 (en) * 2000-03-23 2003-07-15 Intellitech Corporation Method and apparatus for providing optimized access to circuits for debug, programming, and test

Also Published As

Publication number Publication date
US20030083841A1 (en) 2003-05-01
DE10241389A1 (de) 2003-05-22
JP2003194882A (ja) 2003-07-09
US6662134B2 (en) 2003-12-09

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