SG106069A1 - Hybrid mode stirred and tuned chamber - Google Patents

Hybrid mode stirred and tuned chamber

Info

Publication number
SG106069A1
SG106069A1 SG200201886A SG200201886A SG106069A1 SG 106069 A1 SG106069 A1 SG 106069A1 SG 200201886 A SG200201886 A SG 200201886A SG 200201886 A SG200201886 A SG 200201886A SG 106069 A1 SG106069 A1 SG 106069A1
Authority
SG
Singapore
Prior art keywords
hybrid mode
mode stirred
tuned chamber
tuned
chamber
Prior art date
Application number
SG200201886A
Other languages
English (en)
Inventor
Erping Li
Sheng Wang
Daming Zhang
Original Assignee
Inst Of High Performance Compu
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inst Of High Performance Compu filed Critical Inst Of High Performance Compu
Priority to SG200201886A priority Critical patent/SG106069A1/en
Priority to US10/230,644 priority patent/US6885265B2/en
Priority to AU2003266982A priority patent/AU2003266982A1/en
Priority to PCT/SG2003/000066 priority patent/WO2003095970A2/fr
Publication of SG106069A1 publication Critical patent/SG106069A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Tests Of Electronic Circuits (AREA)
SG200201886A 2002-03-28 2002-03-28 Hybrid mode stirred and tuned chamber SG106069A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SG200201886A SG106069A1 (en) 2002-03-28 2002-03-28 Hybrid mode stirred and tuned chamber
US10/230,644 US6885265B2 (en) 2002-03-28 2002-08-29 Hybrid mode stirred and mode tuned chamber
AU2003266982A AU2003266982A1 (en) 2002-03-28 2003-03-28 Hybrid mode stirred and mode tuned chamber
PCT/SG2003/000066 WO2003095970A2 (fr) 2002-03-28 2003-03-28 Chambre hybride en mode regle et agite

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200201886A SG106069A1 (en) 2002-03-28 2002-03-28 Hybrid mode stirred and tuned chamber

Publications (1)

Publication Number Publication Date
SG106069A1 true SG106069A1 (en) 2004-09-30

Family

ID=28450343

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200201886A SG106069A1 (en) 2002-03-28 2002-03-28 Hybrid mode stirred and tuned chamber

Country Status (4)

Country Link
US (1) US6885265B2 (fr)
AU (1) AU2003266982A1 (fr)
SG (1) SG106069A1 (fr)
WO (1) WO2003095970A2 (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2906040B1 (fr) * 2006-09-14 2009-03-20 Eads Ccr Groupement D Interet Chambre reverberante
US7554339B2 (en) * 2006-12-01 2009-06-30 The Boeing Company Electromagnetic testing of an enclosure or cavity using a discrete frequency stir method
EP2135098A4 (fr) * 2007-04-11 2016-11-02 Ericsson Telefon Ab L M Dispositif et procédé de simulation d'un réseau d'accès radio
WO2009039481A1 (fr) * 2007-09-20 2009-03-26 University Of South Florida Chambre reconfigurable pour émuler un affaiblissement multivoie
ES2342958B2 (es) * 2008-09-03 2011-07-04 Emite Ingenieria Slne Analizador de multiples entradas y multiples salidas.
US8035370B2 (en) * 2009-03-10 2011-10-11 The Boeing Company Systems and methods to stir an electromagnetic (EM) field
EP2256507A1 (fr) * 2009-05-27 2010-12-01 Thales Nederland B.V. Chambre de réverbération double déformable
KR101869367B1 (ko) * 2011-01-18 2018-07-20 더 유니버시티 오브 홍콩 콤팩트형 전자파 잔향실
JP6076604B2 (ja) * 2012-02-09 2017-02-08 株式会社日立製作所 プリント回路基板における高周波電磁雑音を測定する装置およびその測定方法
DE102014001904B3 (de) * 2014-02-14 2015-04-09 Bundesrepublik Deutschland, vertreten durch das Bundesministerium der Verteidigung, vertreten durch das Bundesamt für Ausrüstung, Informationstechnik und Nutzung der Bundeswehr Modenverwirbelungskammer und entsprechendes Verfahren
RU2614454C1 (ru) * 2015-11-12 2017-03-28 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Московский авиационный институт (национальный исследовательский университет)" Реверберационная камера
KR101935259B1 (ko) * 2017-02-10 2019-01-07 한국전자통신연구원 전자파 잔향실
CA2974054C (fr) 2017-07-21 2018-10-02 Mpb Technologies Inc. Sources melangees et methode de test de radiofrequence
KR102656384B1 (ko) 2018-05-02 2024-04-15 한국전자통신연구원 잔향 챔버
CN109342829B (zh) * 2018-10-08 2020-10-30 中国人民解放军国防科技大学 电磁辐射源运动特性等效模拟方法
SE543050C2 (en) 2019-05-10 2020-09-29 Bluetest Ab OVER THE AIR MEASUREMENTS OF ERROR VECTOR MAGNITUDE

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4797681A (en) * 1986-06-05 1989-01-10 Hughes Aircraft Company Dual-mode circular-polarization horn
US5530412A (en) * 1993-09-03 1996-06-25 Emc Science Center, Inc. Enhanced mode stirred test chamber
US5631661A (en) * 1995-06-30 1997-05-20 Sanchez; Gabriel A. Geometrically optimized anechoic chamber
CA2179703C (fr) * 1996-06-21 2006-10-10 Andrew S. Podgorski Antenne cornet a large bande pour le spectroscopie de masse
NL1010745C2 (nl) * 1998-12-07 2000-06-08 Hollandse Signaalapparaten Bv Testruimte.
FR2809183B1 (fr) * 2000-05-16 2002-07-26 Inrets Dispositif d'essai en compatibilite electromagnetique
JP4586240B2 (ja) * 2000-06-01 2010-11-24 ソニー株式会社 電磁放射測定装置および電磁放射測定方法
US6437748B1 (en) * 2000-07-20 2002-08-20 The Ohio State University Tapered anechoic chamber
US6519321B2 (en) * 2001-01-03 2003-02-11 Alcatel 2nd level power fault testing apparatus for testing telecommunications equipment

Also Published As

Publication number Publication date
AU2003266982A1 (en) 2003-11-11
US20030184417A1 (en) 2003-10-02
US6885265B2 (en) 2005-04-26
AU2003266982A8 (en) 2003-11-11
WO2003095970A8 (fr) 2004-03-18
WO2003095970A3 (fr) 2007-10-18
WO2003095970A2 (fr) 2003-11-20

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